Optimizing Test Cell Performance Using Probing Process Analysis ...
Optimizing Test Cell Performance Using Probing Process Analysis ...
Optimizing Test Cell Performance Using Probing Process Analysis ...
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Pass1: <strong>Test</strong> <strong>Cell</strong> vs. VX3 Probe Card Correlation<br />
VX3<br />
WWX Alignment Errors – Vector View<br />
• VX3 measures probe center of scrub ~= center of pad<br />
• WaferWoRx shows probes scrubbing short of pad center<br />
Vector pointing to<br />
the right = scrub<br />
center is to the<br />
right of pad center<br />
June 6 to 9, 2010 IEEE SW <strong>Test</strong> Workshop 17
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