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How Bad's the Damage?

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<strong>How</strong> Bad’s <strong>the</strong> <strong>Damage</strong>?<br />

Innovating Test<br />

Technologies<br />

for production<br />

probe cards<br />

Under Bump Metal (UBM under<br />

solder balls)<br />

• Key probing requirement is to not damage<br />

<strong>the</strong> UBM or barrier metal<br />

– Preliminary analytical work has shown<br />

feasibility<br />

• Status: Not much activity here<br />

• We believe this is viable and appropriate<br />

for applications sensitive to contact<br />

resistance (especially RF and high speed)

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