Vertically Integrated Test/Calibration and Reliability Enhancement ...

More documents

Recommendations

Info

Defect Manifestation Defects Physical Phenomena Catastrophic Faults Parametric Faults Circuit Manifestations Specification Violation Acceptable Specifications Effect on Specifications • Most physical defects will result in complete loss of functionality – e.g. most open-circuit or short circuit defects that fall in the signal path • Some defects result in a shift in the overall behavior – e.g. broken finger of a transistor – e.g. inductor coil shorts
How do defects affect the test process • Traditional specification-based testing – If all specifications are measured, then there is no problem with initial quality – Almost certainly will not be the case – <strong>Test</strong> selection is typically y based on learned statistical information – Defective circuits do not follow the statistics – Defect-based selection techniques are needed • New techniques for testing – Techniques that rely on the measurement of correlated parameters (e.g. bias current, or DC voltages) – Techniques developed for BIST applications (e.g. sensorbased testing) – Techniques that rely on correlations among specifications (e.g. machine-learning i based testing) ti – … need to be evaluated for defect response 11
Page 1 and 2: Vertically Integrated Test/Calibrat
Page 3 and 4: Trends • Integration of digital,
Page 5 and 6: Post-production Calibration • Ana
Page 7 and 8: Digital Processing • With million
Page 9: Increasing Defectivity • Use of h
Page 13 and 14: Reliability • Not much attention
Page 15 and 16: Analog/RF Reliability • Wearout m
Page 17 and 18: Re-calibrating for Reliability Enha
Page 19: Vision • Research is needed at mu

Vertically Integrated Test/Calibration and Reliability Enhancement ...

Create successful ePaper yourself

Delete template?

Save as template?