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Vertically Integrated Test/Calibration and Reliability Enhancement ...

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Vision<br />

• Research is needed at multiple levels of<br />

hierarchy<br />

– Circuit-level calibration<br />

– System-level compensation using digital<br />

computation<br />

ti<br />

– Defect-based testing <strong>and</strong> test evaluation<br />

– <strong>Reliability</strong> monitoring<br />

– <strong>Reliability</strong> enhancement<br />

– Re-configuration<br />

– Global optimization that takes all trade-offs into<br />

account<br />

19

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