Angular dependence of FMR measurements in exchange ... - PiTP
Angular dependence of FMR measurements in exchange ... - PiTP
Angular dependence of FMR measurements in exchange ... - PiTP
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Fabrication<br />
• The bilayer was prepared by the group <strong>of</strong><br />
Ko‐Wei L<strong>in</strong> at the National Chung Hs<strong>in</strong>g University <strong>in</strong><br />
Taiwan us<strong>in</strong>g a dual ion‐beam sputter<strong>in</strong>g technique<br />
at room temperature.<br />
L<strong>in</strong> et al Appl. Phys. Lett. 100, 122409(2012)<br />
• The NiFe/NiO film was fabricated on a SiO 2 substrate<br />
and no external field was applied dur<strong>in</strong>g any stage <strong>of</strong><br />
the growth<br />
epoxy<br />
SiO 2<br />
6