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Angular dependence of FMR measurements in exchange ... - PiTP

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Fabrication<br />

• The bilayer was prepared by the group <strong>of</strong><br />

Ko‐Wei L<strong>in</strong> at the National Chung Hs<strong>in</strong>g University <strong>in</strong><br />

Taiwan us<strong>in</strong>g a dual ion‐beam sputter<strong>in</strong>g technique<br />

at room temperature.<br />

L<strong>in</strong> et al Appl. Phys. Lett. 100, 122409(2012)<br />

• The NiFe/NiO film was fabricated on a SiO 2 substrate<br />

and no external field was applied dur<strong>in</strong>g any stage <strong>of</strong><br />

the growth<br />

epoxy<br />

SiO 2<br />

6

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