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Basics and applications of low-loss EELS

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EFTEM versus STEM<br />

Surface plasmon detection with electrons<br />

STEM–<br />

<strong>EELS</strong><br />

J. Nelayah et al., Nature Physics 3 (2007) 348.<br />

ω = 0.9 eV<br />

ω = 1.5 eV<br />

ω = 2.0 eV<br />

EFTEM<br />

100 nm<br />

100 nm 100 nm 100 nm<br />

J. Nelayah et al., Proc.14th EMC (2008) 243.<br />

J. Nelayah et al., Optics Letters 34 (2009) 1003.<br />

STEM <strong>and</strong> EFTEM give qualitatively same results ….<br />

22<br />

MPI for Intelligent Systems

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