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Basics and applications of low-loss EELS

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Volume plasmon<br />

Charge oscillations<br />

Free-electron density<br />

- + - + - + - +<br />

E P<br />

<br />

<br />

<br />

2<br />

ne<br />

m<br />

0<br />

0<br />

e – electron charge<br />

o – vacuum<br />

permittivity<br />

38<br />

MPI for Intelligent Systems

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