Basics and applications of low-loss EELS
Basics and applications of low-loss EELS
Basics and applications of low-loss EELS
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Interb<strong>and</strong> transitions<br />
counts x 10^4<br />
Dark-field techniques<br />
200<br />
GaN<br />
180<br />
160<br />
BF<br />
12 mrad<br />
140<br />
120<br />
100<br />
80<br />
60<br />
40<br />
20<br />
0<br />
-0 5 10 15 20 25 30 35<br />
eV<br />
0 5 10 15 20 25 30 35<br />
Energy <strong>loss</strong> (eV)<br />
Spectra demonstrate validity <strong>of</strong> the DF<br />
collection. Main spectroscopic features<br />
remain intact even if a large transverse<br />
momentum transfer is involved.<br />
36<br />
Gu et al., Ultramicroscopy 109 (2009) 1164<br />
MPI for Intelligent Systems
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