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Thin-Layer Chromatography

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28 2 Physical Methods of Detection<br />

The emission of thermal electrons is subject to statistical fluctuations (lead shot<br />

effect). It is influenced by the current strength, the number of electric charges<br />

liberated and the frequency of the radiation [55] (see [40] for further details).<br />

Range of application and spectral sensitivity: The photomultipliers most frequently<br />

employed in scanners possess antimony-caesium cathodes. These alloy cathodes<br />

are primarily sensitive to the short-wavelength part of visible light (Tab. 4).<br />

The long-wavelength limit which depends on the cathode material is ca. k = 650 nm<br />

in the red region of the spectrum. If this does not suffice for the determination an<br />

antimony-alkaline metal alloy is employed as the cathode material [56—58].<br />

The range of application into the short-wavelength region of the spectrum depends<br />

on the window material employed in the photomultipher. Borosilicate glass<br />

(KOVAR glass), for example, only transmits radiation down to about 280 nm,<br />

Suprasil down to 185 nm and fused quartz down to 160 nm. Hence fluorimeters<br />

which primarily detect long-wavelength radiation (fluorescent radiation) are often<br />

equipped with type S-4 detectors (Tab. 4), whose windows absorb a part of the<br />

short-wavelength radiations.<br />

Table 4. Characteristics of the most important photomultipliers with Sb-Cs cathodes and 9<br />

amplification steps [50].<br />

Type<br />

S-4<br />

S-5<br />

S-19<br />

RCA<br />

1P21<br />

931B<br />

1P28<br />

1P28/VI<br />

1P28A<br />

1P28A/VI<br />

4837<br />

Origin<br />

HAMAMATSU EMI<br />

1P21<br />

R105<br />

R105UH<br />

1P28<br />

R212<br />

R212UH<br />

R454<br />

R282<br />

R106<br />

R106UH<br />

9781A<br />

9661B<br />

9781B<br />

978 IB<br />

9781R<br />

9665A<br />

9783B<br />

Examples of scanners employing S-4 detectors:<br />

Spectral<br />

— response<br />

[nm]<br />

300.. 650<br />

3OO...65O<br />

300.. 650<br />

185...650<br />

185...650<br />

185...650<br />

185...650<br />

185...650<br />

160...650<br />

160. .650<br />

Wavelength<br />

maximum<br />

sensitivity<br />

400<br />

400<br />

400<br />

340<br />

340<br />

340<br />

450<br />

450<br />

340<br />

340<br />

Window<br />

material<br />

borosilicate<br />

borosilicate<br />

borosilicate<br />

UV glass<br />

UV glass<br />

UV glass<br />

UV glass<br />

UV glass<br />

fused silica<br />

fused silica<br />

• UV/VIS chromatogram analyzer for fluorescence measurements (FARRAND)<br />

• Spectrofluorimeter SPF (AMERICAN INSTRUMENT CO.)<br />

• TLD-100 scanner (VITATRON)<br />

/./ Detection oj Aosoroing zuosiances<br />

The majority of detectors, which are employed for the measurement of absorption,<br />

employ UV glass (e.g. Suprasil). All type S-5 photomultipliers possess sheaths of<br />

this material, so that they ought to be usable in the far UV region if N2 purging<br />

is employed (to remove O2) (Tab. 4).<br />

Scanners with S-5 detectors<br />

• KM 3 chromatogram spectrophotometer (C. ZEISS)<br />

• SD 3000 spectrodensitometer (KRATOS/SCHOEFFEL)<br />

• CD-60 densitometer (DESAGA)<br />

Photomultipliers of type S-19 employ fused quartz instead of UV glass; this<br />

transmits down to A = 160nm although this far UV range is not normally<br />

employed in scanners.<br />

Scanners with S-19 detectors<br />

• CS 920 scanner (SHIMADZU)<br />

• CS 930 scanner (SHIMADZU)<br />

Photoelements andphotodiodes: Both photoelements and photodiodes are photoelectric<br />

components depending on internal photoelectric effects.<br />

In the case of photoelements incident quanta of light produce free charge earners<br />

in the semiconductor layer; previously bound electrons become free. Thus, the<br />

nonconducting layer becomes conducting. In addition, the migrating electrons<br />

produce "holes" which increase the conductivity. The radiation energy is directly<br />

converted into electrical energy. The construction of a photoelement is illustrated<br />

in Figure 21.<br />

Fig. 21: Principle of construction of a photoelement [1]. - 1 light-transmitting metal layer,<br />

2 semiconductor layer, 3 metal plate.<br />

hv

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