PUBLIKATSIOONID 2007 - Tallinna Tehnikaülikooli raamatukogu

PUBLIKATSIOONID* Tšahhirov, I., Laud, P. Application of dependency graphs to security protocolanalysis // Symposium on Trustworthy Global Computing : Sophia-Antipolis, France,November 5–6, 2007.Tšertov, A. Triple-triple redundant 777 primary flight computer // A & A (2007) 5, p.38-47.Ubar, R.-J., Devadze, S., Raik, J., Jutman, A. Ultra fast parallel fault analysis onstructurally synthesized BDDs // Proceedings 12 th IEEE European Test Symposium :ETS 2007 : 20–24 May 2007, Freiburg, Germany. Los Alamitos : IEEE ComputerSociety Press, 2007. p. 131-136.Ubar, R.-J., Devadze, S., Raik, J., Jutman, A. Parallel fault backtracing for calculationof fault coverage // 43 rd International Conference on Microelectronics, Devices andMaterials and the Workshop on Electronic Testing : September 12. – September14.2007, Bled, Slovenia : MIDEM conference 2007 proceedings. Ljubljana :MIDEM, 2007. p. 165-170.* Ubar, R.-J., Evartson, T., Lensen, H., Aarna, M. Hierarchical fault diagnosis inembedded digital systems with multi-level decision diagrams // Proceedings 5 thInternational Conference on Industrial Automation. Guebec : University of Quebec,2007. [6] p.Ubar, R.-J., Jervan, G., Raik, J., Jenihhin, M., Ellervee, P. Dependability evaluationin fault-tolerant systems with high-level decision diagrams // Computer ScienceMeets Automation : 10–13 September 2007 : proceedings. Volume II. Ilmenau :Technische Universität Ilmenau, 2007. p. 147-152. (InternationalesWissenschaftliches Kolloquium = International Scientific Colloquium / TechnischeUniversität Ilmenau ; 52).Ubar, R.-J., Jutman, A., Kruus, M., Orasson, E., Devadze, S., Wuttke, H.-D. Learningdigital test and diagnostics via internet // International journal of online engineering. 3(2007) 1, [9] p.Ubar, R.-J., Kostin, S., Raik, J., Evartson, T., Lensen, H. Fault diagnosis in integratedcircuits with BIST // Proceedings 10 th Euromicro Conference on Digital SystemDesign Architectures, Methods and Tools : DSD 2007 : 29–31 August 2007, Lübeck,Germany. Los Alamitos : IEEE, 2007. p. 604-610.Ubar, R.-J., Kostin, S., Raik, J., Kruus, M. Experimental comparison of differentdiagnosis algorithms in the BIST environment // Proceedings of the 16 th IASTEDInternational Conference on Applied Simulation and Modelling : August 29–31,2007, Palma de Mallorca, Spain. Anaheim : ACTA Press, 2007. p. 271-276.Ubar, R.-J., Kostin, S., Raik, J. Fault diagnosis in the BIST environment based onbisection of detected faults // LATW2007 : 8 th IEEE Latin-American Test Workshop :March 11–14, 2007, Cuzco, Peru. [S.l.], 2007. [6] p.* Ubar, R.-J., Kruus, M., Rang, T. Electronics design and test // Public service review: European Union. 13. Brussels : European Comission, Directorate-General XII forScience, 2007. p. 52-53.47