Cascade Microtech Overview - H TEST a.s.

Cascade MicrotechOverview

Making Technological ContributionsCascade Microtech began with the teamwork of two people, Eric Strid andReed Gleason, who in 1983 developed the first microwave wafer probe. It wasan innovation that rocked the high-speed semiconductor industry.Before 1983, high-speed, integrated circuit (IC) designers could only speculateas to why a particular design worked. The true electrical performance ofthese tiny microwave circuits was impossible to measure at the wafer level. Butby using Cascade’s revolutionary probes and probe stations, design engineerscould actually test and characterize their circuits on-wafer, before the ICs werediced and packaged. This halved research and development times and loweredthe tremendous cost of developing newchips. Semiconductor manufacturers, bigand small, could now get their products tomarket faster and cheaper.The explosion in wireless communicationproducts you enjoy today was acceleratedby Cascade’s collaboration with itscustomers. The cellular phone, the LCDon your laptop, the electronics in yourpersonal digital assistant (PDA), all requirethe successful operation of the complex circuitslocated within: the ASICs, MMICs,power amplifiers, receivers, and mixedsignalICs. New products such as GlobalPositioning Systems (GPS), optical fibernetworking equipment, and new personalcommunication systems (PCS) all benefitfrom Cascade’s commitment to advancedresearch. This is what Cascade’s vision is all about: to create a continuous, balancedgrowth of expertise, resources and contributions that aid society.For their contribution to the semiconductor industry, Eric and Reedwere presented with an award in 1991 by the IEEE Microwave Theory andTechniques Society.Continuous InnovationThe same team spirit that enabled Eric and Reed to develop their first productcan be seen today in the numerous patents awarded to us over the years.Cascade’s MicroChamber ® was the direct result of a challenge from our customersto be able to test wafers over a wide temperature range. Problems withprobing over low and high temperatures had long plagued the semiconductorindustry. Probe stations were placed in large, cumbersome, light-tight boxes.But with Cascade’s MicroChamber enclosure to keep water from condensingon the wafers, heating and cooling is much faster and convenient, savingour customers time and money, while extraneous electrical noise in the chamberis reduced by 1,000 times.Semiconductor manufacturers can now design smaller geometry circuitsand be confident that their circuits will perform reliably even during extremetemperature ranges such as those found in satellites and automobiles.Another patent, Cascade’s Air Coplanar ® Probe, was developed in responseto the need for a rugged microwave probe with a compliant tip for accurate,repeatable measurements on-wafer. Air Coplanar Probes feature vastlyimproved probe-tip visibility and the lowest loss available.CascadeMicrotech:Being There Firstwith the RightProductRight: The S300, for wafer probing up to 300mm,improves upon the unmatched performance ofCascade’s Summit line.Left: Eric Strid, Founder and President/CEOwith Reed Gleason, Founder and Directorof Advanced Research.Below left: In 1983, Cascade introduced theworld’s first 18 GHz wafer probe.Below right: Our patented Air Coplanar Probestouch down on a wafer. The durable tips arehighly compliant to assure precise contact. ACPsnow probe to 110 GHz, a world first.Cover: Customersuse our solutionsto develop and testintegrated circuits andoptoelectronic devicesfor a broad rangeof communications,consumer electronics,and computingproducts.

Respondingwith InnovativeTechnologyto CustomerNeedsRight: The REL-6100 Series Probe Stationcombines dc/cv characterization with failureanalysis capability.Left: The Summit 12861 probe station enables theelectrical and lightwave measurements required todevelop next-generation semiconductors.Below: New Edge-Emitter Probe Station supportsphotonic measurements including LIV, DC andRF responsivity and modulation to 110 GHz for acomplete solution.Right: High performance thermal DCPprobes provide a -65°C to 300°C operatingtemperature range.Complete Solutions for Customer SatisfactionA wafer probe solution typically involves a station, probe positioners, probes,software, a microscope, accessories, test equipment, and the applicationexperience to specify, integrate, and support the system.We pride ourselves on our superior knowledge of the measurementinstruments and test systems to which we interface and our ability to help ourcustomers solve their toughest measurement problems.Cascade configures a unique solution to exactly fit each customer’sapplication. Probing a microwave circuit on a 4-inch gallium-arsenide waferrequires a completely different system solution than probing a microprocessorchip on a 12-inch (300mm) silicon wafer, or dissecting an IC for failure analysis.Our S300 probe station offers all the superiormeasurement capability of our 8-inch wafer stations,plus new software features that enhance performancedramatically.Our RF/microwave stations are ideal for overtemperatureS-parameter, load-pull, noise parameter,RF, and mm-wave measurements. Powerful WinCalcalibration software ensures accurate, repeatable onwafermeasurements with a vector network analyzer.Cascade’s dc/cv parametric probing systems areideal for wafer-level reliability, e-test, modeling, andyield enhancement applications. These stations areused to help test and characterize the microprocessorsand DRAMs that go into a personal computer.Our Alessi line stations offer superior features forIC failure analysis. These stations are able to probe the smallest internal IC features,yet still provide a cost-effective, general purpose probing solution.Creating Stakeholder ValueCascade is committed to vigorously investing in new probing technologies.Over the years, our state-of-the-art thin-film processing lab, precision machineshop, and 3-D simulation tools have enabled us to develop innovative technologiessuch as the Pyramid Probe card. More importantly, we have on staff thetechnical experts to create better probing solutions usingthese tools. Under the guidance of the industry’s top R&Dengineers and a seasoned, professional management team,Cascade continues to lead the world into new areas ofwafer probing.Through the years, Cascade has developed a close partnershipwith Agilent Technologies (formerly Hewlett-Packard)that manufactures vector network analyzers and semiconductorparameter analyzers used to test wafers. In 1990, Agilentpurchased a minority equity position in Cascade. This partnershiphas resulted in the seamless integration of Agilent test equipment withCascade’s probing systems.The acquisition of Alessi, Inc. in 1995, the industry leader in device failureanalysis for the discrete, hybrid, analog, and liquid crystal display (LCD) markets,broadened our expertise and expanded our product line. Alessi’s test systems havebeen integrated into Cascade’s current line of products, giving our customersaccess to the most versatile test solutions in the marketplace – just one reason whyour customers include the top-ten semiconductor manufacturers in the industry.

Advancing The Technological RoadmapThe established method of probing a wafer with a needle-probe card hasbecome increasingly difficult, expensive, and in some cases, impossible. ICcomplexity will continue to increase over the next ten years. This will requireprobing a greater number of circuits at tighter pitches and higher frequencies.Cascade answers this challenge by continuing to invest in the developmentand research of innovative products such as the Pyramid Probe Card, a secondgenerationmembrane probe.The Pyramid Probe Card, in use today by major IC manufacturers, is ableto probe wafers at-speed in production with superior reliability and signalintegrity. It is designed for onwafertesting of the industry’s mostadvanced ICs.Using thin-film technology, themembrane probe provides hundredsof probe contacts in userdefinedconfigurations previouslyunattainable with needle probes.The design is lithographicallyreproduced for production applicationsand the easy-to-replace coreensures less production down-timewhile improving yields. These arejust a few examples of Cascade’scommitment to invest in technologiesto meet the future demands of the technological roadmap.The Industry ExpertsCustomer training and worldwide seminars are a big part of Cascade’scommitment to increase our customers’ productivity. Cascade offers responsive,in-depth, superior, analytical test experience and applications support.A wide range of technical bulletins, application notes, and technical briefscan be accessed on our web site. One-on-one application support is availableon the phone and through on-site visits. Plus, on-site installation and trainingis available worldwide.A worldwide presence enables us to respond quickly and comprehensivelyto the changing needs of an international marketplace. Cascade MicrotechJapan and Cascade Microtech Europe, Ltd. plus our U.S. headquarters offerworldwide sales, service, and support. This allows us to provide flexible, expertassistance when, where, and how you need it to maximize productivity.Cascade offers a partnership for success in a changing, challengingenvironment.Responsive,ExpertAssistance…When, Where,and HowYou Need ItRight: Our Pyramid Probe team, experts inthe microwaves and RF field, worked closelywith thin-film technicians to develop amembrane probe that delivers on its promiseto economically probe wafers at-speed inproduction. Just one example of Cascade’scommitment to advanced research.Left: Our on-site customer service techniciansare ready to help with your toughest probingchallenges.Above: Pyramid Probe Cards economically testmicrowave/RF, analog, and high-speed digitalICs.Below: Pyramid Probe core. Our thin filmfab builds precision microscopic probe tips,smaller than a human hair, on each PyramidProbe core, the heart of the probe card,which contact the integrated circuits onsemiconductor wafers.

Our Vision:To create a continuous andbalanced growth of expertise,resources, and contributionsthat aid society.Our Values:ContributionCustomer SatisfactionStakeholder ValueInnovationLearning OrganizationSocial ResponsibilityCorporate HeadquartersCascade Microtech, Inc.Toll Free: +1-800-550-3279Phone: +1-503-601-1000Email: sales@cmicro.comCustomer Service: cmisupport@cmicro.comEuropeCascade Microtech Europe, Ltd.Phone: +44-1295-812828Email: cmesales@cmicro.comCustomer Service: cmesupport@cmicro.comAsiaCascade Microtech (Shanghai) Co., Ltd.Phone: +86-21-6340-4183Email: cmc_sales@cmicro.comCustomer Service: cmc_support@cmicro.comCascade Microtech Japan, Inc.Phone: +81-3-5478-6100E-mail: cmjsales@cmicro.comCustomer Service: cmjsupport@cmicro.comCascade Microtech Singapore, Pte., Ltd.Phone: +65-6873-7482Email: cms_sales@cmicro.comCustomer Service: cmssupport@cmicro.comCascade Microtech Taiwan, Co., Ltd.Phone: +886-3-5722810Email: cmt_sales@cmicro.comCustomer Service: cmt_support@cmicro.comCascade Microtech, Inc.2430 NW 206th Ave., Beaverton, Oregon 97006, USAToll Free: +1-800-550-3279 Phone: +1-503-601-1000Europe: +44-1295-812828 China: +86-21-6340-4183Japan: +81-3-5478-6100 Singapore: +65-6873-7482Taiwan: +886-3-5722810Email: sales@cmicro.comhttp://www.cascademicrotech.comCopyright © 2006 Cascade Microtech, Inc. MicroChamber, FemtoGuard,AttoGuard, Pyramid Probe, Air Coplanar Probe and the Cascade Microtechlogo are trademarks of Cascade Microtech, Inc. All other trademarks are theproperty of their respective owners. All specifications subject to change.CMIOV-0706Data subject to changewithout notice