Agilent Continuous Stiffness Measurement (CSM) Option - H TEST a.s.

Agilent Continuous Stiffness Measurement(CSM) OptionData SheetFeatures and Benefits• Accurate, repeatable resultscompliant with ISO 14577 standards• Dynamic properties characterizationvia continuous measurement ofstiffness by indentation depth• Seamless compatibility withAgilent Nano Indenter XP andDCM indentation heads• Ability to fully characterize dynamicproperties in the nanometer rangeas well as accurately characterizeviscoelastic materials• Ability to control indentation testswith a constant strain rateApplications• Semiconductor, thin films,MEMs (wafer applications)• Hard coatings, DLC films• Composite materials,fibers, polymers• Metals, ceramics• Biomaterials, biologyOverviewNano Indenters from AgilentTechnologies make it possible tocharacterize mechanical properties(such as modulus of elasticity,loss factor, and fracture behavior)in the nanometer range usingboth quasi-static and dynamicdepth-sensing indentation methods.The accuracy and reliabilityof mechanical propertiescharacterization depends on morethan the accuracy of the tip geometryand the force and displacementmeasurements. To accuratelycalculate the contact area andmechanical property values, thestiffness of the contact between theindenter tip and the sample materialmust also be accurately determined.Quasi-Static and DynamicMethodsAgilent Nano Indenters supportboth quasi-static and dynamicdepth-sensing indentation methods.In conventional quasi-staticindentation testing, the stiffnessof contact is determined byanalyzing the force vs. displacementcurve during unloading. Thisdepth-sensing method provides asingle measurement for the givenindentation depth. The Agilent

A.B.C.Figure 1. A. Schematic of free-hangingindenter. B. Dynamic model of instrumentalone (no contact). C. Dynamic systemmodel during testing.Continuous Stiffness Measurement(CSM) option, which is compatiblewith both the Agilent Nano IndenterXP and DCM indentation heads,satisfies application requirementsthat must take into account dynamiceffects, such as strain rate andfrequency.With the CSM option, the AgilentNano Indenter applies a load tothe indenter tip to force the tip intothe surface while simultaneouslysuperimposing an oscillating forcewith a force amplitude generallyseveral orders of magnitude smallerthan the nominal load. The CSMoption offers a means of separatingthe in-phase and out-of-phasecomponents of the load-displacementhistory. This separation providesan accurate measurement of thelocation of initial surface contactand continuous measurement ofcontact stiffness as a function ofdepth or frequency, thus eliminatingthe need for unloading cycles. Sincethe contact stiffness is determineddirectly, no assumptions (such asmechanical equilibrium) are requiredto correct for elasticity.As a result, property measurementsare inherently more accurate usingCSM. Obtaining the same data wouldrequire tens or even hundreds oftests using the conventional method.This makes CSM a powerful toolnot only for stiff materials such asmetals, alloys, and ceramics but alsofor time-dependent materials likepolymers, structural composites,and biomedical materials.The state-of-the-art CSM optionprovides the only means availableto both fully characterize dynamicproperties in the nanometer rangeand accurately characterizeviscoelastic materials providingvalues such as storage modulus.Indentation tests using CSM can becontrolled with a constant strain rate,a critical test parameter for materialsystems such as pure metals orlow-melting-point alloys, and polymerfilms and film/substrate systems.This level of control is not possiblewith the conventional method.Nano IndentersThe culmination of decades ofresearch and development, AgilentNano Indenters are the world’s mostaccurate, flexible, and user-friendlyinstruments for nanoscale mechanicaltesting. Electromagnetic actuationallows Nano Indenters to achieveunparalleled dynamic range in forceand displacement. These advancedFigure 2. CSM can accurately characterize viscoelastic materials reporting values suchas storage modulus and tan .2

A.Figure 3. Accurate measurement of mechanical properties of Agarose is very importantbecause it has been found that the storage modulus of these gels affect the form andfunction of the resulting cells. Three different gels were tested and as seen in the plotabove viscoelastic characterization of the Agarose gels was achieved down to E’= 500Pa.instruments not only enable usersto measure Young’s modulus andhardness in compliance with ISO14577 standards but also enablemeasurement of deformation oversix orders of magnitude (fromnanometers to millimeters).Agilent Nano Indenters arecapable of characterizing even themost compliant materials. Thesemeasurements are possible becauseNano Indenters are designed so thatthey can be modeled by the simpleharmonic oscillator model, whichmakes system characterizationsimple. When testing compliantsamples, Agilent characterizesthe indenter in free air so thatthe machine contribution can besubtracted from the system responsewhere only the desired sampleproperties remain.Every Nano Indenter is backedby highly responsive AgilentTechnologies customer servicepersonnel. Knowledgeable andexperienced regional applicationsengineers are available to guide usersthrough more advanced testing,provide outstanding technicalsupport, and offer unmatchedapplications expertise.B.Figure 4. A. Concentric-cylinder sampleholder. B. Agarose gel as supplied in awell plate.Nano Indenters are carefully designedto account for the dynamics ofindentation testing. Each systemis individually calibrated andcharacterized over its full dynamicrange of operation to ensuremaximum accuracy and reliability.Figure 5. Characterization of function of depth on thin film thatwas applied to sample using CSM.3

SpecificationsFrequency RangeLoad Coupled Frequency RangeVoltage SensitivityTypical Operating Frequency RangeThe Min and Max Load AmplitudesDCM MaxDCM MinXP MaxXP Min0.001Hz to 120kHz0.001Hz to 1kHz2nV to 1V full scale1Hz to 300Hz0.9mN0.9nN5.0mN1.0nNNote: There is a complex interplay between the frequency, the transfer function,the sample properties, and the depth of contact and contact area of theindentation. There is no simple answer as to “can I test my sample at a givenfrequency”. The answer is “it depends on the sample, the depth of indentation,contact area of indentation, frequency, and the transfer function.”Nanoindentation instruments from Agilent Technologies conformto ISO 14577 standards, delivering confidence in test accuracyand repeatability. These state-of-the-art solutions ensure reliable,high-precision measurement of nanomechanical properties forresearch and industry.Nano Mechanical Systems fromAgilent TechnologiesAgilent Technologies, the premiermeasurement company, offers highprecision,modular nano-measurementsolutions for research, industry, andeducation. Exceptional worldwide supportis provided by experienced applicationscientists and technical service personnel.Agilent’s leading-edge R&D laboratoriesensure the continued, timely introductionand optimization of innovative, easy-to-usenanomechanical system technologies.www.agilent.com/find/nanoindenterAmericasCanada (877) 894 4414Latin America 305 269 7500United States (800) 829 4444Asia PacificAustralia 1 800 629 485China 800 810 0189Hong Kong 800 938 693India 1 800 112 929Japan 0120 (421) 345Korea 080 769 0800Malaysia 1 800 888 848Singapore 1 800 375 8100Taiwan 0800 047 866Thailand 1 800 226 008Europe & Middle EastAustria 43 (0) 1 360 277 1571Belgium 32 (0) 2 404 93 40Denmark 45 70 13 15 15Finland 358 (0) 10 855 2100France 0825 010 700**0.125 €/minuteGermany 49 (0) 7031 464 6333Ireland 1890 924 204Israel 972-3-9288-504/544Italy 39 02 92 60 8484Netherlands 31 (0) 20 547 2111Spain 34 (91) 631 3300Sweden 0200-88 22 55Switzerland 0800 80 53 53United Kingdom 44 (0) 118 9276201Other European Countries:www.agilent.com/find/contactusProduct specifications and descriptions in thisdocument subject to change without notice.© Agilent Technologies, Inc. 2011Printed in USA, April 1, 20115990-4183EN RevA