Crystal structure determination for CNHP4 - Institute of Solid State ...
Crystal structure determination for CNHP4 - Institute of Solid State ...
Crystal structure determination for CNHP4 - Institute of Solid State ...
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<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> Physics<strong>Crystal</strong> <strong>structure</strong> <strong>determination</strong> <strong>of</strong> 2-dimensionalpowdersthe example: <strong>CNHP4</strong>CNPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>1
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsIntroductioncooperation with H.-G. Rubahn 1 and M. Schiek 1• variety <strong>of</strong> functionalised quaterphenylenes• studied nonlinear optical properties• <strong>CNHP4</strong> showed largest second harmonic generation applicable <strong>for</strong> frequency doubling1 Syddansk University, Soenderborg, DenmarkPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>2
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsOverviewwhat is a 2d powder?diffraction prinicplesspecular scansgrazing incidence x-ray diffraction (GID)reciprocal space mapsindexation <strong>of</strong> <strong>CNHP4</strong>molecular packing <strong>of</strong> <strong>CNHP4</strong>theoretical <strong>structure</strong> factor / experimental intensitiesPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>3
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsOur motivation• thin films are key elements in organic electronics• surface induced phases (SIPs) different from bulk <strong>structure</strong>• crystal <strong>structure</strong> physical properties• established procedures exist <strong>for</strong> single crystals and powders• <strong>for</strong> thin films it‘s a new topicRecently solved thin film phases:• pentacene (5P): Nabok 1 , Schiefer 2 , Yoshida 3• tetraceno[2,3-b]thiophene: Q. Yuan 4• PTCDI-C8: T.N. Krauss, MPI-Stuttgart1 D. Nabok, P. Puschnig, C. Ambrosch-Draxl, O. Werzer, R. Resel, D.-M. Smilgies, Phys. Rev.B, 762S. Schiefer, M. Huth, A. Dobrinevski, B. Nickel, J. Am. Chem. Soc. 129 (2007) 10316-103173 H. Yoshida, K. Inaba, N. Sato, Appl. Phys. Lett. 90 (2007) 1819304 Q. Yuan, SCB Mannsfeld, ML. Tang, et al., J. Am. Chem. Soc. 130 (2008) 11Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>4
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsFundamental conditions <strong>for</strong> x-ray scattering Scattering vector : q = kElastic scattering :k0=− k0k =; d2πλ=n2πqnReciprocal space Condition : q =Laue• orientation <strong>of</strong> q Tilting sampleG hklReal spaceBragg equation : nλ= 2Symmetry: α = αif= θd hklsinθ• length <strong>of</strong> q Changing 2θPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>5
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsThe reciprocal lattice <strong>of</strong> …… a single crystal• Point lattice q=G hkl… a powder <strong>of</strong> crystallites• Spheres |q|=|G hkl|Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>6
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> Physics2d powder• controlled vacuum deposition + isotropic substrate <strong>of</strong>ten strong preferred orientation• one crystallographic plane || substrate surfaceno in-plane alignment reciprocal lattice rings on cylinder surfaces• q z=G zand q x2+q y2= G x2+G y2has to be fulfilledPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>7
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsX-ray diffraction <strong>Crystal</strong> <strong>structure</strong><strong>Crystal</strong> <strong>structure</strong> = translational lattice + motifTranslational lattice• Bragg peaks set <strong>of</strong> G hkl• Indexation Find a base (unit cell) <strong>for</strong> all G hkl• Positions <strong>of</strong> Bragg peaks translational latticeMotif• Intensity connected with the atomic positions in the unit cell• I ∝ |F| 2 (<strong>structure</strong> factor)• <strong>structure</strong> factor = Fourier Trans<strong>for</strong>m <strong>of</strong> Electron densityF = ρ ( r )exp( −iqr) dr∫UCe• Inverse trans<strong>for</strong>mation difficult because <strong>of</strong> phase problem• Intensity corrections not clear at the momentPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>8
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsExperimental methodsPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>9
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsSpecular Scans• laboratory equipment is sufficient• Θ and 2θ circle are moved synchronously diffraction conditions lattice planes || substrate surface• test if you have a 2d powder.• existing polymorphs• interplanar distance is determinedPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>10
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsThin film samples <strong>of</strong> <strong>CNHP4</strong>Nr. Substrate Thickness Temperature1 Si(100)/SiOx 178 [nm] 300-340 [K]2 Si(100)/SiOx 100 [nm] 340 [K]3 Si(100)/SiOx 35 [nm] RT-300 [K]4 Si(100)/SiOx 100 [nm] RT-300 [K]5 Si/SiOx/OTS 120 [nm] R T-300 [K]6 Si/SiOx/OTS 120 [nm] RT-300 [K]7/210 Glass 160 [nm] 300 [K]8/207 Glass 60 [nm] 360 [K]Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>11
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsSpecular scan - sample 6two phases are present only one dominatMeasured lattice plane distancesd00i’ d00i20.75 Å 23.39 Åd001=n2π| |q nn λ=d sinθ2 hklPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>12
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> Physicsspecular scan - sample 1Even three phases are present strong tendency <strong>for</strong> polymorphismMeasured lattice plane distancesd00i21.2 Åd00i*22.12 Åd00i‘23.02 Åd001=n2π| |q nn λ=d sinθ2 hklPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>13
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> Physicsspecular scan - sample 4Measured lattice plane distanceOnly one phase Onset <strong>of</strong> 3d distributiond00i20.37 Åd001=n2π| |q nn λ=d sinθ2 hklPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>14
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsSurface DiffractionPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>15
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsGrazing incidence diffraction• Is needed <strong>for</strong> indexationGID advantages• Incidence angle ~ critical angle <strong>of</strong> total reflection diffracted intensity mainly from the surface• <strong>for</strong> ultra-thin films (down to a monolayer)• variaton <strong>of</strong> incidence angle variation penetration depth multilayer systems• Large area is illuminatedI ∝ N 2• non destructivePr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>16
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsOur grazing incidence experiment• α i~ 0.2°• diffracted beam α f= 0.2° … 30°, θ f= 10° … 50°Scattering vector in sample coordinate system q = k − kqqqxyz02π= (cos αfcosθf− cosαicosθi)λ2π= (cosαfsin θf+ cosαisin θi)λ2π= (sin αi− sin αf)λLattice planes (nearly) perpendicular tosubstrate surface are measuredPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>17
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsReciprocal space maps 2d pseudo color images q zand q pare used as coordinatesPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>18
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsHow we indexed• finding the unit cell by comparing calculated positions to the experimental data• q = G hkl<strong>for</strong> a Bragg reflex; integer coordinates hkl• hkl-combinations can be generated easily• <strong>Crystal</strong> coordinate system sample coordinate systemA* *⎛ a sin β sin γ⎜* *= ⎜−a sin β cosγ⎜ * *⎝ a cos βbb**0*sinα*cosα00c*⎞⎟⎟⎟⎠• c* is chosen parallel to e zbecause <strong>of</strong> preferred orientation• powder in plane no assumptions about q pPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>19
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> Physicsq=Ghkl* *⎛ a sin β sin γ⎜* *= ⎜−a sin β cosγ⎜ * *⎝ a cos βbb**0*sinα*cosα0 ⎞⎛h⎞⎟⎜⎟0 ⎟⎜k ⎟*c⎟⎜⎟⎠⎝l ⎠• q is a possible scattering vector• Manually change unit cell parameters coincidence with experimentWhy is this approach reasonable• Some preknowledge exists <strong>of</strong>ten• Characteristic patterns exist• But it would be nice to have something automaticalPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>20
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsReciprocal space map <strong>of</strong> sample 6Attenuator = 3 Attenuator = 0• Three left spots belong to the11L, 02L and the 12L rod herringbone <strong>structure</strong>• This gave the first hint about indexation• c was fixed at the 20L roda = 5.60b = 7.67c = 20.85α = 90.0°β = 97.4°γ = 90.0°Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>21
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsTowards the crystal <strong>structure</strong>Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>22
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsInternal Geometry optimizationby Dmitrii Nabok and Peter Puschnig (MU Leoben)• Force field calculations• Three possible arrangements <strong>of</strong> the molecule were found Calculation <strong>of</strong> <strong>structure</strong> factors is now possiblePr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>23
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> Physics• radius <strong>of</strong> rings = F• <strong>structure</strong> factors not correctedCHI = 0 CHI = 16 CHI = -16Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>24
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsCHI = 0CHI = 16CHI = -16Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>25
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsThe preliminary resultPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>26
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsIntensities <strong>Crystal</strong> Structure,Example Sexiphenylen• also measured at CHESS• well known baker <strong>structure</strong>a = 8.09b = 5.57c = 26.24α = 90.0°β = 98.17°γ = 90.0°• <strong>structure</strong> factors are known• match is quite goodPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>27
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsConclusion crystal <strong>structure</strong> solution <strong>for</strong> a 2-D powder unit cell <strong>determination</strong> by specular scans / GID molecular packing by <strong>for</strong>ce field calculations<strong>CNHP4</strong>: strong tendency <strong>of</strong> polymorphism onset <strong>of</strong> 3D distribution in thin film samplesbest 2D powders on OTS surfaces herringbone packing with antiparallel moleculesinterpenetration <strong>of</strong> layers ?internal torsion <strong>of</strong> molecules ?Pr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>28
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsAcknowledgementtheoretical calculations:D. Nabok, P. Puschnig, MU-LeobenGID:D.-M. Smilgies, G-line CHESS, Ithaca, New Yorksamples:M. Schiek, Sydansk University, SoenderborgI. Wallmann, University <strong>of</strong> Bonnmy group:O. Werzer, R. Resel, H.-G. Flesch, M. Koini, T. Djuric, K. MargucPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>29
<strong>Institute</strong> <strong>of</strong> <strong>Solid</strong> <strong>State</strong> PhysicsThank you <strong>for</strong> your attentionPr<strong>of</strong>essor Armin Moser Horst Cerjak, 19.12.2005Grazing incidence diffraction on <strong>CNHP4</strong>30