MXF-2400 - Shimadzu do Brasil Comércio

C142-E024AMXF-2400ShimadzuMulti-Channel X-rayFluorescence Spectrometer

An X-ray tube that supportsthe use of a 4 kW (Thin Window)has been installedto further enhance performance.MXF-2400

MXF-2400Shimadzu Multi-Channel X-ray Fluorescence SpectrometerSimultaneous determination of up to 36 majorand impurity elements in nondestructive analysis.(Analysis range: 4Be, 5B, 6C to 92U)The Shimadzu MXF-2400 is an improved version of the Shimadzu Multi-Channel X-rayfluorescence spectrometer, which has been rated highly in the overseas market as well as in thedomestic market.The latest hardware designed to fully utilize the principle of X-ray fluorescence spectrometry andthe data processing unit that uses various software programs to permit automatic management ofanalysis data combine to provide high analytical productivity both in R&D and production control.Up to 36 elements can be simultaneously determined by the fixed monochromator and up to 48elements can be determined sequentially by the optional scanning monochromator. High analyticalprecision is provided even in high sensitivity analysis of a few ppm quantity level.High level of automation and labor savingImpurity elements as well as major elements in various types of samplescan be readily determined, for the purpose of quality control and R&D.About 36 elements in a sample can be determined in a minute.The operation is stable enough to permit unattended operation to savelabor and running cost.The optional scanning monochromator is convenient for automatedqualitative analyses in R&D.Quality controlThe MXF-2400 presents analytical results in a short time with excellentstability in quality control. This minimizes the number of off-grade products.Production controlSamples may be taken form the production line and analyzed withoutdelay. The data are fed back to control the material mixing properly.The result is stable and high quality.ApplicationsIron and steel industryPig iron, stainless steels, low-alloy steels, slag, sintered ores, ferroalloys,special steels, surface-treated steel plates, plating solutions.Nonferrous metal industryCopper alloys, aluminum alloys, aluminum ingot, lead, zinc, magnesiumalloys.Ceramic industryCement raw mix, clinker, limestone, clays, glasses, bricks.Electric and electronic materialsSemiconductors, ceramics, magnetic disks, magnets batteries,PCBs.Chemical industrySynthetic fibers, catalyzers, paints, dyes, pharmaceuticals,cosmetics, cleanser, other organic and inorganic products.Petroleum and coal industryHeavy oils, lubrication oils, polymers, coals, cokes.Agriculture and food industrySoils, fertilizers, pasture, leaves, plants.PollutantsFactory waste water, sea water, river water, airborne dust, industrialwastes.Papers and pulpsContentsP 04 - Principle & ConstructionP 06 - FeaturesP 14 - High Level Data ProcessingP 20 - SpecificationsP 21 - AccessoriesP 27 - Installation Requirements

Principle & ConstructionPrinciple & ConstructionPrincipleWhen X-rays hit a sample, atoms in the sample are excited and release the secondary X-rays, which are alsocalled fluorescent X-rays. Since the wavelength of secondary X-rays is peculiar to the element concerned, thesample can be qualitatively determined by measuring that wavelength. Also, since the fluorescent X-ray intensity isproportional to the concentration of the element, quantitative determination is made by measuring the fluorescentX-ray intensity of the wavelength peculiar to each element.Spectrometer UnitThis unit disperses the fluorescent X-rays generated fromthe sample, measures the intensity of the X-rays of theparticular wavelength, and converts that intensity intoelectric signals. High quality curved crystals are used forDetectorX-ray tubeFocusing circledispersion.The MXF-2400 uses one monochromator for one element,Secondary slitDetectorSecondary slitand up to 36 monochromators can be installed together topermit simultaneous determination of up to 36 elements.2θ2Use of the optional scanning monochromator providesautomatic qualitative analysis and allows up to 30 elements toCurved crystalCurved crystalbe preset for quantitative analysis.Concentration (%)Si 3.1182Mn 0.2011P 0.0209SMg0.01730.0185Primary slitIntensitySampleConcentrationcalculationConcentrationPrimary slitX-ray intensity (kcps)SiMnPSMg34.797256.305880.458811.119120.11576Measuring ElectronicsThe electric pulses corresponding to the number of X-rayphotons are counted and recorded. — The output pulse signalof the detector is amplified and its interfering spectrum signalsare removed by the pulse height analyzer. Then the signal ismeasured by the scaler, processed by the microprocessor,and then transmitted to the data processing unit.X-ray Power SourceThis unit supplies power to the X-ray tube which emits theX-ray power sourceSpectrometerunitMonochrometerX-ray tubeDetectorAmplifierMeasuring electronicsPHA scalerMicroprocessorData processing unitDisplayPrinterKeyboardexcitation X-rays (primary X-rays). It consists of a highvoltagetransformer and an X-ray power controller.Data Processing UnitX-ray intensities are converted into concentration values ofthe elements concerned through the use of the conversionequations (calibration curves) predetermined using standardsamples. The results are presented on the display or theprinter.4

Construction163247859X-ray Spectrometer(Installed in the case)1 6Up to 36 monochromators are radially arranged around theX-ray tube. The case of the X-ray spectrometer is temperaturecontrolled.2Sample Turntable(with dust-proof cover)Up to eight samples may be loaded together for automatedsuccessive analysis. An external automatic sample feederand/or automatic sample pretreatment unit may be connectedto this turntable.3Sample Feeding Unit(Installed behind the panel)The swing arm system accurately positions the sample.Data Processing UnitThe operation of the MXF-2400 is made via the keyboard of thisunit. This unit has various high-level data handling functions,which provides advanced analysis by easy operation.7X-ray Power Control Unit andProcessor UnitThe X-ray power control unit controls the output power of theX-ray tube with such a high stability that it is not necessary touse a motor generator in most cases. The processor unitincorporates the X-ray intensity measuring circuit and themicroprocessor, which counts X-ray pulses and controls all theother units.8DC Power Source UnitThis unit supplies DC power to the control units.4Maintenance Panel9SwitchboardThis unit displays the status of each part and has manualswitches for checking.The necessary power source is one three phase 200 VACor 220 VAC line.5X-ray Tube Cooling UnitThis unit circulates cool, distilled water to the X-ray tube.The distilled water is cooled externally.5

FeaturesFeatures1.The World's First Multi-Channel Fluorescent X-ray Spectrometer to be Installed witha 4 kW (Thin Window) X-ray TubeSensitivity has been enhanced to approximately 1.3 times for heavy elements and 1.7 times or more for lightelements (elements lighter than Cl).S1.5PMnNi: X-ray intensityMo1.0: BEC: Detection limit0.71525 35 45Atomic Number2.Excellent Analytical Accuracy from Minute Regional Areas to Whole AreasThe converging spectrometer system is one of Shimadzu’s original designs. The fluorescent X-ray focus doesn't bediverged, and becomes extremely small at the secondary slit so that reflected X-ray intensity is extremely high, andresolution is good in comparison with other systems.Secondary slit2θCurved crystalPrimary slit6

3.Excellent Long-term Stability and Maintenance-free CharacteristicsThrough the development of original technology by Shimadzu an excellent gas sealed detector (SPC) is used toobtain long-term stability and maintenance-free characteristics over a wide range (11Na to 92U) of light elementsincluding Na which normally only could be analyzed using a gas flow detector (FPC).Shimadzu’s own original gas sealed detector has the following features.1) Starting up X-ray signals is fast, and a large number of X-ray signals can be counted at a high speed.2) CO2 is mixed in with the inert gases (Ne, Ar, Kr) to give good gas stability, and the core wire does not becomecontaminated as there is no resolution deterioration due to ionization.3) As there is no gas piping, consideration of the surroundings is not required, and excellent long-term stability isassured. (The device is ideal for process control and automatic analysis as the number of calibration curveadjustments and α/ßcorrection can be minimized.)4) As the gas is sealed in the device, there is no maintenance, which makes the product extremely permanent.Moreover, the whole spectrometer unit is kept stable as a thermostat in the device continually maintains thetemperature to within ±0.2°C of the set temperature.Exatron for detection ofheavy and light elementsCaOConcentration44.7%%+0.4+0.20–0.2–0.4Statistical error 1s (C.V. 0.084%)0.084%Multitron for detection ofheavy elementsScintillation counter forheavy elementsFe2O3Concentration2.1%%+0.8+0.40–0.4–0.8(C.V)Statistical error 1s (C.V. 0.22%)1st day 5th day 10th day 15th day 20th day 25th day 30th day0.22%4.The Effect of Nearby or Interfering Elements can be ReducedA detector suitable for each element can be selected from between the gas sealed detector sealed with gasappropriate for elements such as Ne, Ar and Kr (selection can be made over a broad range from 11Na to 92U),the scintillation detector, and the gas flow detector.The effect of nearby or interfering elements can be minimized as the optimum detector can be selected to provideexcellent detection efficiency and good resolution for each element.Scintillation counterCounting efficiency (%)100806040Kr multitronXe exatronAr multitronAr exatronKr exatronGas flow proportionalcounter (6µ Mylar)Ne exatron (Be)Gas flow proportional counter(5µ polypropylene)Ne exatron (Al)Ne multitron200 1 2 3 4 5 6 7 8 9 10 11 12K lineBa MoCu Fe Cr Ti Ca K Cl S P Si Al Mg NaL lineUPbWCe Ba Sn Cd MoCounting efficiency of detectors7

FeaturesFeatures5.Excellent Measuring Reproducibility for Light ElementsUsing Shimadzu’s original vacuum stabilizer (patented), a constant vacuum can be maintained during measuring.And as the change in X-ray intensity due to the change in the degree of vacuum (change due to air absorption) canbe suppressed, excellent measuring reproducibility can be achieved for light elements (such as Al and Si) andsuperlight elements (such as Be, B and C).100Degree of vacuum PaApprox. 15Vacuum stabilizing pointWith vacuum stabilizerWithout vacuum stabilizerThe point of starting analysisTime (sec.)6.Excellent Long-term Stability for Superlight Elements (Be, B, C, N, O, F)The gas flow detector (FPC) has excellent long-term stability as pulse height distribution is stabilized through the useof an automatic core wire winding system (Shimadzu patent) and a gas density stabilizer with CPU control system.The automatic core wire winding system is different to the previous core wire cleaning system and manual core wirewinding system in that core wire winding is continuously automatic (5 mm per day) so that the core wire does notbecome contaminated, analysis can be conducted always with a new core wire, and maintenance is not needed.Furthermore, the PR gas flow and density necessary for the gas flow detector achieves stability in the gas densitystabilizer with CPU control system.AnodeWindow for X-raysPR gasNew core wireUsed core wire8

7.Enhanced Sensitivity for Superlight ElementsThe layered structure analyzer (LSA), which uses curved crystals for convergence, provides almost ten times highersensitivity for X-rays than conventional detectors.Unlike the conventional dispersing crystals, the LSA has synthetic multilayer structures.The spacer is made of the material and has the thickness that gives the best lattice constant to sense X-rayintensities at the highest sensitivity for such elements as Be, B, C, N, O, F, Na, and Mg.TAP. (Mg, Na, F)12LSA dispersing elementLSA dispersing elementX-ray intensity ratio111098765432Monochromator for LSA1Mg Ma F ON C B BeElementX-ray Intensity Comparison between LSA Dispersing Elementand TAP Crystal Total Reflection8.Wide Dynamic RangeThe Shimadzu’s original pulse counting circuit and the counting error correcting circuit combine to provide a widedynamic range: one calibration curve can cover the concentration range more than 3,000,000 cps, from 0% to 100%.High accuracy is ensured even in high concentration region where the X-ray intensity is very high.( x 10 4 CPS)300X-ray tube voltage: 40 kVX-ray:CuKαX-ray intensity2001000 10 20 3040 50 60Linear Calibration Curve more than 3,000,000 cpsX-ray tube current (mA)9

FeaturesFeatures9.Analytical Information can be set for Each Individual Sample Form andEach Individual ElementAnalytical conditions such as optimal X-ray output and PHA (pulse height analyzer) range can be freely set for eachindividual sample form and element.Also, an automatic sensitivity correction function (counting loss correction) can be used.10.Simultaneous Determination of up to 36 Major and Impurity ElementsThe 36 fixed monochromators detect impurity elements as well as major elements with high reliability. The detectionlimit is a few ppm concentration level.The scanning monochromator permits automatic qualitative determination and may also be used for quantitativedetermination.There is a strong demand for the method to analyze not only major elements but also impurity elements, in order toenhance the quality of the final products. The technique of X-ray fluorescence spectrometry has detection limits ofa few ppm concentration level and is applicable to various types of samples.10

11.Automatic Startup and Stop (Standby) of Device is PossibleThe X-ray unit can be automatically started up by registering the device startup date and time in advance.Automatic stop (standby) can be set in the same way.12.Good Operability from Eight Sample Turrets with Dust-proof CoverStandard samples and control samples can be safely set on the turrets for long periods as the device comes witha dust proof cover.11

FeaturesFeatures13.High Sensitivity and High PrecisionThe adoption of the new X-ray tube of the end-window type and the short distance between the X-ray output port ofthe X-ray tube and the sample provides high intensity of the fluorescent X-rays; this enhances the sensitivity for traceelements and improves the detection limits.The use of curved crystals and curved dispersion elements enhances the resolution, while the adoption of a gassealed proportional counter, an automatic core wire winding type detector, temperature control unit for thespectrometer, and the high-performance counting circuit provides high precision.The degree of vacuum is controlled and stabilized by the CPU, which also enhances the stability of light-elementanalysis.Typical Detection Limits and RepeatabilityLow-alloy steelIntegration time: 40 sec.SiMnPSNiCrCuMoDetection limit0.00130.00060.000450.00040.00080.00020.00060.00045RepeatabilityConcentrationStandard deviationCoefficient of variation0.2230.00110.50.660.00080.130.0150.00021.30.0170.000221.31.990.00160.080.690.00070.10.0420.00030.70.190.000250.13Cast ironIntegration time: 40 sec.CSiMnPSMgRepeatabilityConcentrationStandard deviationCoefficient of variation3.570.0170.491.70.170.10.5030.00040.080.0470.000250.550.0420.00020.470.0410.00082Copper alloyIntegration time: 40 sec.CuZnMnSiAlSnPbFeRepeatabilityConcentrationStandard deviationCoefficient of variation57.00.010.01838.00.010.0260.260.000350.130.0140.000684.80.060.000420.70.170.00070.40.0110.0003330.0190.000271.4Ceramic cementIntegration time: 40 sec.SiO2Al2O3Fe2O3CaOMgOSO3Na2OK2ORepeatabilityConcentrationStandard deviationCoefficient of variation14.00.00630.0453.00.00240.082.00.00080.0443.00.0060.0140.80.0040.52.00.00140.071.00.0060.60.40.00050.1312

14.Rapid and Precise Sample SettingThe swing arm system sets a sample precisely within 5 seconds, in a single motion. This simple design minimizesdown time and ensures stable performance even in high-duty operation.X-ray ON40 kV95 mAScanner 1120.32 deg.Scanner 290.23 deg.Sample chamberpressure35 PaTurretDevice temperature35˚CCooling water conductivity0.23 uS15.Automatic Qualitative DeterminationThe scanning monochromator permits automatic qualitative analysis.The 2θ-PHA linkage system (detector high voltage linkage system) excludes the influence of higher-order lines toprovide easy-to-read profiles.In qualitative analysis, 8 samples many be continuously analyzed, and then the peaks are identified and the resultsare displayed and printed out.13

High Level Data ProcessingHigh Level Data ProcessingThe data processing unit, which uses an IBMPC/AT compatible personal computer, performs allof the control, operation, and processing of data ofthe MXF-2400.The operation is all carried out through a personalcomputer. The available functions include controland operation of the instrument, calculation ofconcentrations, and filling of analysis data.Quantitative CalculationVarious calculation methods are selectable; you can select the method that is most suitable for your sample typeand purpose of analysis.X-ray intensitymeasurementDrift correction I = αIo + ß α/ ß correction of X-ray intensity (kcps)Quantitative AnalysisOverlap correctionBackground suppressionCorrection with internalstandard (Ratio method)I = Io – K1I1 – K2I2R =IoIr nSpectrum overlapping is corrected and backgroundsuppressed.The ratio of scattered X-ray intensity and elementconcentration is obtained.Calibration curve Wi = aI 2 + bI + c X-ray intensities are converted into concentration values.Correction for absorptionand enhancementWi = Xi + ∑KjIjWi = Xi (l + ∑djWj) ∑ljWjCorrection is made for absorption, enhancement,and overlapping due to matrix effects.Presentation(Printout) of dataI : X-ray intensity K : Coefficient α,ß : Drift correction factors dj : Absorption/enhancement correction factora, b, c, d : Calibration factors Ij : Overlap correction factor W : Element concentration j : Coexisting elemeni : Analytical element n : Ratio coefficient14

Operation for Data ProcessingAll the operation is made via a personal computer. The operation is exceedingly easy. Shown below are sometypical display images.1. MenuLarge icon display makes for excellent operability.2. Analysis ScreenThe analysis screen mainly comprises three windows:sample name input, analysis schedule and resultdisplay. Just input the analysis group and sample nameand click on the Start button to effortlessly performanalysis.3. Handy Sample RegisteringIn routine analysis there is no need to re-input asample name once it has been registered along withthe analysis conditions.Sample names can be simply input with consecutivenumbers.Automatic operation possible by registering the devicehalt (standby) and start up in the schedule.15

High Level Data ProcessingHigh Level Data ProcessingOperation for Data Processing4. Network Function and Auto Mail FunctionAnalysis results can be transmitted via LAN.Analysis completion notifications, analysis resulttransfer and error notifications can be e-mailed tospecified addresses using the e-mail notificationfunction.5. Self-Diagnostic FunctionA self-diagnostic check corresponding to the alarm inquestion can be instantaneously displayed to enablespeedy countermeasures.6. Report FunctionAnalysis results (quantitative and qualitative/quantitative)can be easily compiled in daily and monthlyreport formats.Also editing is possible through the use of CSV outputfunction to enable reading into spreadsheet softwaresuch as EXCEL.16

7. X-R Administration Diagram(α-ß Administration Diagram)The change in analytical values over time can bedisplayed graphically to enable observation of whetheror not analysis values have stably entered the specifiedrange.8. Automatic Operation SystemUnmanned operation is possible through the use offunctions such as a timer to automatically start up thesystem and halt it (put it on standby) after analysis iscompleted.9. Calibration CurveThe optimal calibration curve coefficient is calculated bythe method of least squares using the standard sample.W = aI 2 + bI + cW : Element concentrationI : X-ray intensitya, b, c : Calibration constantsAs well as being displayed in graph form, the calibrationcurve shows the calibration constants, precision andcorrelation coefficient, etc.Graph display size also can be freely expanded andreduced.17

High Level Data ProcessingHigh Level Data ProcessingOperation for Data Processing10. Matrix CorrectionFor samples with multiple elements, different measuringX-ray intensities will occur depending on thecomposition ratio of the main components, which maycause analysis errors. Analysis precision is enhanced ifmatrix correction is used.11. Qualitative AnalysisThe scanner is used to perform qualitative analysis andthe profiles will be displayed and can be printed out.Also, analysis result reports can be created with profileimages if the data is combined with a tool like WordPad.12. Quantitative Analysis Possible usingFP MethodQuantitative analysis is possible with the FP method –which does not need a standard sample – using thescanner and fixed beam monochromators.18

13. Four Types of Matching Functions1) Impurity JudgmentCompares the unknown sample with standard samplevalues to judge whether or not it belongs to the sameform.2) Product Type ClassificationRegisters element standard values and tolerance ofmultiple forms to judge what form the unknownsample is.3) Form JudgmentRegisters the element content range for multipleforms to judge what form the unknown sample is.4) Matching SearchRegisters the standard values for multiple forms andsearches for a match with the least differencesbetween unknown sample and standard values.19

SpecificationsSpecifications1. X-ray Fluorescence SpectrometerElements to be determined: 4Be ~ 92UElements determined simultaneously: Up to 36 elementsMode of analysis: Simultaneous determination of many elementsAtmosphere: Vacuum, air, helium (optional)■Spectrometer UnitFixed monochrometer: Converging method with curved crystal.Vacuum type for all the elements.Crystal: SX, TAP, PET, Ge, NaCl, LiFDetector: Gas sealed detector for 11Na ~ 92UNe, Ar, Kr exatronNe, Ar, Kr multitronFPC for 5B, 6C, 8O, 9FScanning monochrometer (optional): Parallel beam method with flat crystal.Used for heavy elementsCrystal: LiFDetector: Scintillation counter (SC)Elements to be determined: 22Ti ~ 92U (with crystal for heavy element determination)Present mechanism: Up to 30 elements may be preset■Measuring ElectronicsType: Pulse counting system for all the elements controlled with a microprocessorCounting capacity: 4 x 10 9 counts/elementCounting method: integration for the preset timeIntegration time: Adjustable for each group, from 1 to 999 secondsHigh voltage supply for detector: 1,550 to 2,150 V■X-ray GeneratorX-ray tube: End window type with Rh target.X-ray window: Beryllium window (Thin Window)Maximum output: 4 kWX-ray power controllerRectification: Full wave rectification and smoothing with a capacitorControl method: Secondary side detection, primary side control, control with the CPUMaximum rating: 50 kV, 100 mA, 4 kWStability: ±0.01% (for 10% source fluctuation), both the current and voltageTube voltage setting: 5 kV steps from 20 to 50 kVTube current setting: 50 kA steps form 5 to 100 mASafety circuit: Against overvoltage, overcurrent, overload, and abnormal cooling watersupply■Sample Feeding MechanismType: Accurate sample positioning with a swing arm type sample feederTurntable: Accepts 8 samples togetherSpinner: 60 rpm (50/60 Hz)Sample holder: 64 mmf, 43 mm highMax. sample size: 51 mmf, 38 mm high■Evacuation SystemOil rotary pump:Evacuation rate: About 130 L / 160 L /min. (50/60 Hz)Oil mist filter providedVacuum gauge: Pirani gauge, constant temperature typeVacuum stabilizer: Controlled with a microcomputer. The degree of vacuum canbe stabilized at an arbitrary point.■Gas Supply System for Flow Proportional CounterUse: Used of determination of B, C, N, O, and FGas: PR gas (Ar 90% and CH4 10%)Gas flow consumption: 10 to 15 mL /min.Gas density stabilizer: Controlled by a microcomputerFlow control: Needle valve and flow meterGas cylinder: A 6 Nm 3 cylinder (If light elements (4Be~9F) are attached)■X-ray ProtectionWarning: Yellow lamp on the front panel and red lamp on the X-ray control panel.Safety device: If the sample setter and the X-ray shutter are opened at thesame time, the X-ray tube will be automatically turned off.Also the moment the panel is opened the X-ray output is cutoff.■X-ray Tube Cooling Unit (CWC-16, incorporated in the main body)Type: Circulation of distilled water (a 18-liter tank is attached.)Method of heat exchange: Carried out in a dual tube between externalcooling water and the distilled water.Heat exchange capacity: 4 kW (3.440 kcal / hour)Water purity maintenance: By ion exchangeAlarm: Temperature, flow rate, and electric conductivityExternal cooling water: Necessary (Not necessary if using HYCOOL 30)2. Data Processing Unit■Hardware (IBM PC / AT compatible)OS: Windows XPMain Memory: 256MB or moreKeyboard: Full keyboardFloppy disk: 3.5"double-sided, double density (1.44 MB / disk). Single drive.Hard disk: 10GB or morePrinter: Laser printer■SoftwareProgram for quantitative analysisMaximum number of elements to be processed: Arbitrary number of elementsMaximum number of elements to be simultaneously determined: 36 per sampleNumber of analysis groups: Arbitrary number of groupsRepeated analysis: Arbitrary number of timesPriority interrupt analysis: Possible, automatic return to sequential analysisPrintout: Printout order can be specified for each group. Compound names andelement names may be printed out. Pass and fail marks may be printed out.Number of calibration curves: Per each group, per each elementType of calibration curve: Second-order polynomialCorrection for dead timeCorrection for absorption and enhancement: Per each group, per each elementMaximum number of elements to be corrected for absorption and enhancement: Arbitrarynumber of elements per equationCorrection for drift: 2-point method or 1-point methodCorrection for overlapping: 2-point method or 1-point methodInternal standard method: Available for each group or each elementChemical correction: 2-point method or 1-point methodNumber of calculation formula: Arbitrary channels for concentration calculationProgram for scanner: Arbitrary number of elementsProgram for qualitative analysisScanner: For heavy element determinationMethod: Step scanningMethod of processing: Automatic peak search and automatic peak element determinationData output: 0n display and printerFactor calculationCalibration factor: By the method of least squares, up to second-order polynomialFactor for correcting absorption and enhancement: By the method of multiple regression(concentration correction and sensitivity correction)Maintenance programPulse height distribution: Graphic displayMonochromator alignment aid: Graphic displayCounter unit: Graphic displayAlarm: Display of alarm number, cause, and measure.Manual instrument diagnosis: Parts by part check is possible.External transmission program: Analysis data may be transmitted externally, in qualitativeanalysis.External transmission (analysis results, errors, etc.)LAN and RS-232C (optional)Automatic notification via e-mail possible20

AccessoriesAccessoriesSample preparation for X-ray fluorescence analysisType of sampleSampleTreatmentSample HolderPurpose of treatmentSolidIron, cast ironSteelHigh alloy steelFerroalloyCopper alloyAluminum alloyAmorphous substanceCut Polish with emery paper Solid sample holderCut Lathe Solid sample holderCentrifugal casting Polish/lathe Solid sample holderSurface smoothingPowerMetal powderChemicalsHigh polymersPlantsCeramic materialsOresSoilsDepositsOxidesGrind Briquet Solid sample holderGrind Melt Solid sample holderDensity uniformingand surface smoothingSuppression of grainsize effect andsuppression of influenceof matrix elementOilWaterNo treatmentLiquid sample holder(No treatment)LiquidOil/water Drop on filter paper DryWaterCollect on ion exchange filter paperSettle/concentrate on DDTCDryDrySolid sampleholder withfilter holderSolidifyingConcentrating andsolidifying21

AccessoriesAccessoriesOptional Accessories for Sample PreparationMillSample containerUsed to mix or grind samples such as slag, cement,ore, glass, and ferroalloy.T-100 Disk Type Vibration MillCat. No. 210-15014Standard content:Mill main and timerPower requirements:3ø 200V ±10%, 50/60Hz, 5ADimensions and weight:435dia. x 558mm high, 120kgAny of the following sample containers isadditionally required:Sample Container made of tungsten carbide(Cat. No. 210-15016)Used for analyses with Fe as a target element.Sample Container made of chrome steel(Cat. No. 210-15015)Used for analyses without Fe as a target element.Sample containerUsed to mix or grind samples such as slag, cement,ore, glass, and ferroalloy. Two grinding units can beinstalled together for simultaneous use.MillTI-100 Vibration MillCat. No. 044-31004-01 for 60 HzCat. No. 044-31004-02 for 50 HzStandard content:Mill main and timerInner volume of grinding unit:100mL x 2Power requirements:1ø 100V ±10%, 50/60 Hz,2ADimensions and weight: 580W x 620D x 400Hmm,70kgThe following sample container is additionally required:Sample Container made of tungsten carbide(Cat. No. 044-31004-11)Mainly used for analyses with Fe as a targetelement.Pt crucibleGlass beadsampleCruciblepolishingunitTong forcrucibleEffective for minimizing the effects of thermal historyand mineralogical effects in ores, rocks, clays, andsoils. Also useful for producing glass beads fromcement, ceramics, iron ores, and sintered ores.TR-1000S Automatic Bead Fusion FurnaceCat. No. 044-33301-01Fusion temperature: 1,000°C (1,100°C at the maximum)Heating method: Electric furnace with stirrerSample preparation time: 7 to 15 minutesPower requirements: 3ø 200V ±10%,50/60Hz,22.5 ADimensions and weight:1,215W x 800D x 1,350H mm, about 460kgThe following options are additionally required:Platinum crucible with lid (Cat. No. 210-15022)Tongs for crucible (Cat. No.044-33301-12)Flux (Cat. No.044-40521-01)Crucible polishing unit (Cat. No. 044-33301-11)22

Flat press headBriquets samples using a cup or a ring.MP-35-02 Briquet PressCat. No. 210-15062-02Operation: AutomaticPress: HydraulicMaximum pressure: 35 tonsPressure setting: Arbitrary with a valveMethod: Place the sample in the cup or the ring andpress it.Press head: Plane typePower requirements: 3ø 200V ±10%, 50/60 Hz, 3 ADimensions and weight:500W x 500D x 1,210Hmm,240kgCupSample producedMP-35-01 Briquet PressCat. No. 210-15062-01Briquets samples without using a cup or a ring.Briquetting Cup (No. 9)Cat. No. 200-34844-09Used for briquetting power samples.Materials: SteelDimensions: 39.7dia. x 11.3mm highBriquetting RingMade of aluminum(Cat. No. 202-82397-03)Made of vinyl chloride resin(Cat. No. 210-05010-01)The vinyl chloride resin rings are used for silicatesamples, while the aluminum rings are used for othertypes of samples, such as cement.Dimensions: 35dia. x 5mm thickUsed to polish metal samples.Sample Polishing Machine(with dust collector)Cat. No. 085-50201-12Power requirements: 3ø 200V ±10%, 4ADimensions and weight: 560W x 750D x 995Hmm,165kgEndless polishing belt: 915mm long and 100mm vide(No.136)The following endless polishing belt set(10 pcs./set) is additionally requiredZirconia No.80 (Cat.No.085-35122-05)(Not applicable to determination of Al and Zr.)23

AccessoriesAccessoriesSample HoldersMaskSolid Sample HolderCat. No. 212-20890-01Mask diameter: 30mmMask material: Stainless steel as standard;titaniumand aluminum as optional.Dimensions: 64dia. x 38mm highMaximum sample size:51mm in diameter and 38mm in height.Note: For a mask of a different material or a diameter,contact us or your local distributor. Masks ofsmaller diameters are available for samplessmaller than the standard.MylarHolds a liquid sample, such as river water, factorywaste water, general waste water, chemical treatmentwaste water, and plating solution, to be analyzed withan atmosphere of air or helium.Liquid Sample Holder(for air or helium atmosphere)Cat. No. 202-86996-03Mylar,6µm thick(Cat.No.202-86501-56)(500 sheets/set)Material of inner container: Fluoro-resinMaterial of outer container: Stainless steelDimensions: 64dia. x 43mm highMask for Solid Sample HolderMasks for solid sample holder, which is suitable for thesample size or analytical purpose, can be selected.Mask diameter: 5, 10, 15, 20, 25, 30, 35mmøMask material: Al, Ti, Ni, Cu, Zr, Mo, Stainless steel24

Outer container(Cat. No. 205-11179)Be and Mylar filmInner container(Cat.No. 205-15110)Holds a liquid sample in vacuum during analysis. Theirradiation surface is covered with beryllium to keep theliquid surface stable, hence high stability of analysis isensured.Liquid Sample Holder(for vacuum atmosphere)Cat. No. 205-11179Mask material: Titanium as standardMaterial of inner container: Fluoro-resin andstainless steelMaterial of outer container: Titanium and stainlesssteelDimensions: 64dia. x 43mm highIt is recommendedto use an outer container for each group of analyses,and to use more than one inner container for oneouter container; this will enhance the analyticalproductivity.Inner container: Cat. No. 205-15110Mylar,6µm thick(Cat.No. 202-86501-56)(500 sheets/set)Holder(Cat. No. 205-15030)Filter paper(Cat. No. 210-16043-50)Ion exchange filter paper(Cat. No. 210-16167-1~3)Spotting Filter Paper, Ion Exchange FilterPaper, and HolderDrop a liquid sample on the filter paper, dry, andanalyze.Filter paper: Cat. No. 210-16043-50; 50 sheets/setDrop a liquid sample on the ion exchange filter paper,condense, adjust its pH, and analyze. The ionexchange filter paper is available in three types.Note: A filter paper holder (Cat. No. 205-15030) anda solid sample holder are necessary.25

AccessoriesAccessoriesOthersCooling capacity(kcal)Cooling systemWater supply capacityRequired power supplyHYCOOL 304400(50 Hz)5400(60 Hz)forced air cooling, refrigerating system40 L / min3-phase 200 / 220V ±10%50 / 60Hz17ACooling Water Circulation Device HYCOOL 30Cat. No. 044-01807-05 HYCOOL 30These are air-cooled water supply devices. Thesedevices are used to supply cooled water to the externalunit of the X-ray tube when a suitable tap water supply isnot available.*1 Install HYCOOL30 at a reasonable distance from themain unit as considerable calorific power (4.5 kW) isgenerated.26

Installation RequirementsInstallation RequirementsEnvironmentTemperature: 18 to 28°CHumidity: 70% or lowerVibration:Displacement (single swing): 80µm or lessFrequency: 30 Hz or lessSpace: 3 x 4 m or largerLaboratory4 m 4 mCooling waterTable for chemical treatment HYCOOLPower Airsource conditionerPower requirementsMain body: Three phase, 200/220 V ±10%, 60 A, 50/60 HzData processing unit: Powered from the main body, as standard. Whenan independent power line is used, it shall be single-phase 100 V±10%, 3 AOptional accessories: Require a power described on pages 18 through20.Grounding: 30 ohms or less; and independent grounding line isrequired.5 mGlass beadfusion furnaceSwitchboardBriquet pressMillShelfBalanceand table10001160700MXF-24001130DeskSample 1000reception table645600Data processing unit1800ShelfCooling waterPrimary cooling water: For cooling X-ray tube. 18 liters (to be replacedevery 4 to 6 months). To be poured into the tank of the X-ray tubecooling unit.Secondary cooling unit: For cooling the primary cooling water and thehigh voltage generator. The water shall be tap water or high-purityindustrial water.Supply pressure: 0.15 to 0.3 MPaDrain: Free flowFlow rate/temperature: Refer to the following tableTemp(°C) Below 10 20 30Flow rate (L/min.) 4 5.5 10Caution: Entrance size is required more than 1200 W x 1800 H mm.DimensionsFrontal view167296315501130600Unit: mmFaucet: 1/2” and 14 mmø hose nippleNote: The secondary cooling water is not necessary when theHYCOOL30 is attached.Side view860645Gas9631550700PR gas: 10 to 15 mL /min.A 6 Nm 3 cylinder (If light elements (4Be~9F)are attached)1160Unit: mmHeat emissionMain body: 600 kgData processing unit: 80 kgMain body: 1,960 kcalData processing unit: 240 kcalDimensions and WeightMain body: 1,130W x 1,160D x 1,672H mm, 600 kgData processing unit: 600W x 645D x 1,400H mm,80 kg (including the table)NoteSince X-rays are used in the MXF-2400, please check all local lawsand regulations, in advance.Necessary matters for safety are displayed by warning labels.WARNINGHAZARDOUS VOLTAGETo avoid electric shock. tum offthe power supply before openingthis cover.The contents of this catalog are subject to change without notice.27

JQA-0376SHIMADZU CORPORATION. International Marketing Division3. Kanda-Nishikicho 1-chome, Chiyoda-ku, Tokyo 101-8448, Japan Phone: 81(3)3219-5641 Fax. 81(3)3219-5710Cable Add.:SHIMADZU TOKYOKRATORS ANALYTICAL, INC.100 Red Schoolhouse Road. Building A Chestnut Ridge. New York 10977. U.S.A.Phone: 1(845)426-6700 Fax. 1(845)426-6192SHIMADZU EUROPA GmbHAlbert-Hahn-Strasse 6-10, 47269 Duisburg, F.R. Germany Phone: 49(203)7687-0 Fax. 49(203)766625SHIMADZU (ASIA PACIFIC) PTE LTD.16 Science Park Drive #01-01 Singapore Science Park, Singapore 118227, Republic of SingaporePhone: 65-6778-6280 Fax. 65-6779-2935SHIMADZU SCIENTIFIC INSTRUMENTS (OCEANIA) PTY. LTD.Units F, 10-16 South Street Rydalmere N.S.W. 2116, AustraliaPhone: 61(2)9684-4200 Fax. 61(2)9684-4055SHIMADZU DO BRASIL COMÉRCIO LTDA.Avenida Marquês de São Vicente, 1771. Barra Funda CEP : 01139-003-São Paulo-SP, BrasilPhone: (55)11-3611-1688 Fax. (55)11-3611-2209SHIMADZU (HONG KONG) LIMITEDSuite 1028 Ocean Center, Harbour City, Tsim Sha Tsui, Kowloon HONG KONGPhone: (852)2375-4979 Fax. (852)2199-7438SHIMADZU INTERNATIONAL TRADING (SHANGHAI) Co., LTD. SHANGHAI OFFICE24th Floor, Shanghai Xin Hualian Building, No.755 Huaihai Zhong Lu, Shanghai, ChinaPhone: 86-21-6472-8442 Fax. 86-21-6472-8648Overseas OfficesIstanbul, MoscowURL http://www.shimadzu.comURL http://www.kratos.comThe contents of this brochure are subject to change without notice.Printed in Japan 4701-02605-20A-IK