Electrical characterisation of Transistors - Stallinga.org
Electrical characterisation of Transistors - Stallinga.org
Electrical characterisation of Transistors - Stallinga.org
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Where are located (in the device geometry ) the stress inducedcharges ?Organic Layer+/- +/- +/- +/- +/-+ + + + +SiO 2Induced interface states ?Oxide Charges ?Both ?The degradation in conventionaln-MOS can be described by apower-law over time, with theexponent usually being in therange <strong>of</strong> 2/3.Log Im=2/3Log (Time)
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