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Conference 8706 · Room: Conv. Ctr. 319SESSION 5Room: Conv. Ctr. 319 . . . . . . . . . . . . Wed 2:00 pm to 2:40 pmModeling IIISession Chairs: Ronald G. Driggers, U.S. Naval Research Lab. (USA);Terrence S. Lomheim, The Aerospace Corp. (USA); Joseph P. Reynolds,U.S. Army Night Vision & Electronic Sensors Directorate (USA)2:00 pm: What good is SWIR? part I: passive day comparison of SWIR, NIR,and Vis, Ronald G. Driggers, U.S. Naval Research Lab. (USA); Van A. Hodgkin,U.S. Army Night Vision & Electronic Sensors Directorate (USA); Richard H.Vollmerhausen, Univ. of Delaware (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-23]2:20 pm: Local-area imaging of objects in near-geostationary orbits via LWIRsensing, Paul McCall, Florida International Univ. (USA); Madeleine Naudeau,Air Force Research Lab. (USA); Thomas Farrell, Schafer Corp. (USA) and AirForce Research Lab. (USA); Marlon E. Sorge, The Aerospace Corp. (USA); MalekAdjouadi, Florida International Univ. (USA) . . . . . . . . . . . . . . . . . . . . . . . . . [8706-25]Coffee/Exhibition Break. . . . . . . . . . . . . . . . . . . . . . . . . . . . Wed 2:40 pm to 3:40 pmSESSION 6Room: Conv. Ctr. 319 . . . . . . . . . . . . Wed 3:40 pm to 4:40 pmModeling IVSession Chairs: Hector M. Reyes, Raytheon Co. (USA);James A. Dawson, Dynetics, Inc. (USA);Michael A. Soel, FLIR Systems, Inc. (USA)3:40 pm: Producing a color target acquisition metric, Assaf Asbag, RacheliHayoon, Ricky Shama, Neta Gadot, Stanley R. Rotman, Ben-Gurion Univ. of theNegev (Israel). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-28]4:00 pm: Image enhancement technology research for Army applications, PietB. W. Schwering, Rob A. W. Kemp, Klamer Schutte, TNO Defence, Security andSafety (Netherlands) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-29]4:20 pm: Multisensor fusion of electro-optic and infrared signals forhigh-resolution visible images, part I, Xiaopeng Huang, Stevens Institute ofTechnology (USA); Ravi Netravali, Columbia Univ. (USA); Hong Man, Victor B.Lawrence, Stevens Institute of Technology (USA) . . . . . . . . . . . . . . . . . . . [8706-42]WORKSHOPRoom: Conv. Ctr. 319 . . . . . . . . . Wed 4:40 pm to 5:40 pmNight Vision-Integrated Performance Model (NV-IPM)Workshop Leaders: Brian Teaney, Joseph Reynolds,U. S. Army Night Vision &Electronic Sensors DirectorateThe Night Vision Integrated Performance Model (NV-IPM) was recently releasedby NVESD. The aim of this new model is to provide a flexible and extensibleengineering tool for system design which encapsulates all of the capabilitiesof the existing Night Vision model suite along with many new design tools andfeatures. These features include a more intuitive interface, the ability to performtrade studies, and a library of standard and user generated components. Bycombining the previous model architectures in one interface the new design isalso better suited to capture emerging sensor modalities and technologies. Thisworkshop will introduce some common NV-IPM modeling cases and discussesthe model features and capabilities in greater detail.Thursday 2 MaySESSION 7Room: Conv. Ctr. 319 . . . . . . . . . . . . . Thu 8:00 am to 9:40 amTargets/Backgrounds/ATMSession Chairs: Endre Repasi, Fraunhofer-Institut für Optronik,Systemtechnik und Bildauswertung (Germany);Bernard M. Rosier, ONERA (France); Richard L. Espinola,U.S. Army Night Vision & Electronic Sensors Directorate (USA)8:00 am: Climatic data analysis for input to ShipIR, David A. Vaitekunas,W. R. Davis Engineering, Ltd. (Canada); Yoonsik Kim, Korean Ocean Research andDevelopment Institute (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . [8706-30]8:20 am: Range and contrast imaging improvements using circularly polarizedlight in scattering environments, John D. van der Laan, College of OpticalSciences, The Univ. of Arizona (USA); Shanalyn A. Kemme, David A. Scrymgeour,Sandia National Labs. (USA); Eustace L. Dereniak, College of Optical Sciences, TheUniv. of Arizona (USA) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-31]8:40 am: Simulation of laser-beam reflection at the sea surface modeling andvalidation, Frédéric Schwenger, Endre Repasi, Fraunhofer-Institut für Optronik,Systemtechnik und Bildauswertung (Germany) . . . . . . . . . . . . . . . . . . . . . [8706-32]9:00 am: IR signature management for the modern navy, David A. Vaitekunas,W. R. Davis Engineering, Ltd. (Canada); Yoonsik Kim, Korean Ocean Research andDevelopment Institute (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . [8706-33]9:20 am: Hyperspectral imaging spectro-radiometer improves radiometricaccuracy, Florent M. Prel, Louis Moreau, Robert Bouchard, ABB AnalyticalMeasurement (Canada); Ritchie D. Bullis Jr., Naval Air Warfare Ctr. (USA); ClaudeB. Roy, Christian A. Vallieres, Luc E. Lévesque, ABB Analytical Measurement(Canada) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-34]Coffee/Exhibition Break. . . . . . . . . . . . . . . . . . . . . . . . . . . .Thu 9:40 am to 10:30 amPLAN TO ATTENDRoom: Conv. Ctr. 319 . . . . . . . . . . . . . 10:30 am to 4:30 pmPlan to attend conference of interest, Technologies forSynthetic Environments: Hardware-in-the-Loop, whichbegins in this room right after the Coffee Break.POSTERS-THURSDAYRoom: Conv. Ctr. Hall D . . . . . . . . . . . Thu 6:00 pm to 7:30 pmAll symposium attendees are invited to attend the poster sessions. Come view thehigh-quality papers that are presented in this alternative format and interact withthe poster author, who will be available for discussion. Enjoy light refreshmentswhile networking with colleagues in your field. Attendees are required to wear theirconference registration badges to the poster sessions.Authors may set-up their posters between 10:00 am and 5:00 pm the day oftheir poster session. Posters that are not set-up by the 5:00 pm cut-off time willbe considered no-shows, and their manuscripts may not be published. Posterauthors should be at their papers from 6:00 to 7:30 pm to answer questionsfrom attendees. All posters and other materials must be removed no later than8:00 pm. Any papers left on the boards at the close of the poster session will beconsidered unwanted and will be discarded. <strong>SPIE</strong> assumes no responsibility forposters left up after the end of each poster session.Simultaneous measurement of the thickness profile and refractive indexdistribution of silicon wafers, Jungjae Park, Korea Research Institute ofStandards and Science (Korea, Republic of); Jonghan Jin, Jae Wan Kim, KoreaResearch Institute of Standards and Science (Korea, Republic of) and Univ. ofScience and Technology (Korea, Republic of); Jong-Ahn Kim, Korea ResearchInstitute of Standards and Science (Korea, Republic of); Chu-Shik Kang, KoreaResearch Institute of Standards and Science (Korea, Republic of) and Univ. ofScience and Technology (Korea, Republic of) . . . . . . . . . . . . . . . . . . . . . . [8706-36]Uncertainty evaluation of the geometrical thickness and refractive index ofsilicon wafers, Jonghan Jin, Korea Research Institute of Standards and Science(Korea, Republic of) and Univ. of Science and Technology (Korea, Republic of);Jungjae Park, Korea Research Institute of Standards and Science (Korea, Republicof); Jae Wan Kim, Korea Research Institute of Standards and Science (Korea,Republic of) and Univ. of Science and Technology (Korea, Republic of); Jong-AhnKim, Korea Research Institute of Standards and Science (Korea, Republic of); Chu-Shik Kang, Korea Research Institute of Standards and Science (Korea, Republic of)and Univ. of Science and Technology (Korea, Republic of) . . . . . . . . . . . . [8706-37]Characterization of nonuniformity and bias self-heating for uncooled FPAdetectors using simulator, Jungeon Lee, Chong-Min Kyung, KAIST (Korea,Republic of) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-38]The analysis and experiments of ghost image for solid catadioptric mid-waveIR system, Qun Wei, Changchun Institute of Optics, Fine Mechanics and Physics(China) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . [8706-40]+1 360 676 3290 · help@spie.org · (Twitter) #DSS 33

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