Agilent B1500A Semiconductor Device Analyzer
Agilent B1500A Semiconductor Device Analyzer
Agilent B1500A Semiconductor Device Analyzer
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Minimum timing parameters for voltage measurement 1Voltage applied to DUT 5V 10 VApplied voltage Recommended minimum 105 ns 130 nsconditionpulse width 2Measurement Range 5 V 10 VRecommended minimum 20 ns 20 nsVoltage measurementmeasurement windowconditionSettling time 3 85 ns 110 nsNoise (rms) 4 1.4 mV 1.4 mV1. Measurement conditions: The DUT is a resistive load between 1 kΩ and 10 MΩ. The capacitanceof the cable between the RSU and the DUT is 20 pF. Voltage is applied to the DUT by a channel ofWGFMU/RSU, and voltage measurement is performed by the same channel. (PG mode for 5 V,Fast IV mode for 10 V)2. Recommended minimum pulse width = settling time + recommended minimum measurementwindow.3. The time until the measured value settles to within ± 0.6 % of the final result value after theoutput voltage is changed from the initial value (0 V). Minimum rise/fall time of 70 ns for 10 V, or30ns for 5 V is recommended for minimizing overshoot.4. RMS noise measured over the recommended minimum measurement window.SoftwareInstrument library for WGFMU controlOperating system:Microsoft Windows XP Professional SP3or later, Windows Vista Business SP2or later (32bit only), and Windows 7Professional SP1 or later (32 bit and 64bit)Supported language: English (US)NBTI and general-purpose EasyEXPERTApplication TestsSample programs (NBTI and generalpurposemeasurement using WGFMU andRTS data analysis)WGFMU supported prober vendorsCascade MicrotechSuss MicroTecVector SemiconNote: The maximum number of installableRSUs for a given prober depends uponthe available space. Please contact yourlocal sales representative for details onconnecting and mounting the WGFMUand RSU.15