Thermal Shock Chambers - MB Electronique

CharacteristicsThe pursuit of high performance, high accuracy, and ease of use.● Recovery rate & temperature uniformityTSA−202ES−W measurement example+123°C4.4 min.7.3 min.±1.0°Cor lowerHighly accurate temperaturerecoveryDampers with integrated rectifyingfunction minimize variation in exposureconditions due to specimen position withinthe test area. This reduces the overall testtime and shortens temperature recoverytime, especially during low-temperatureexposure. The uniformity in test conditionsbrought by this innovation also contributesto improved test reproducibility andreliability.–38°CTest conditionsHigh-temp. exposure: +125°C, 30 min.Pre-heating temperature: +145°CLow-temp. exposure: –40°C, 30 min.Pre-cooling temperature: –55°C±1.5°C or lowerSpecimen: Printed circuit boards 150 pcs.Measuring points: 10Even more reliable tests(option: specimen temperature control*)A single temperature sensor is attachedto the specimen in the test area and thechamber is controlled by this temperaturemeasurement.Even more accurate tests can be run bycontrolling the chamber with the specimentemperature because the air temperatureand the temperature inside the specimenare different when attaining the temperaturesetting. The chamber is controlled so thatthe specimen temperature achieves thetemperature setting even quicker and moreaccurately.* Cannot be combined with Eco operationmode.Test areaSpecimen temperaturemonitoring(option: specimen temperature monitorwith trigger function)Two temperature sensors are attached tothe specimen in the test area to measurethe specimen's temperature.This option features a trigger function thatswitches to the exposure test after the twotemperatures reach the temperature setting,so even more precise thermal tests can berun.* Cannot be combined with Eco operationmode.5