SoC Design Flow & Tools: SoC Testing

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Test BuslAn example.10 72CoreCore1248322422Input Test Bus101210Core72Core1248322472 3272Output Test Bus40
Page 1 and 2: SoC Design Flow & Tools:SoC Testing
Page 3 and 4: SoC Test Challenges
Page 5 and 6: The Role of Testingl The role of te
Page 7 and 8: l Fabrication defects (caused by im
Page 9 and 10: Characterization Testingl For desig
Page 11 and 12: Burn-In Testingl Occurrence of pote
Page 13 and 14: Incoming Inspectionl Type of tests-
Page 15 and 16: Test QualityNumber of acceptable pa
Page 17 and 18: Technology Trend:System-on-Board to
Page 19 and 20: Separation of Responsibilitiesl The
Page 21 and 22: Distributed Design & Testl In gener
Page 23 and 24: Test Accessl Direct access to deepl
Page 25 and 26: A Conceptual SoC TestArchitecture
Page 27 and 28: A Conceptual Test ArchitectureDACmP
Page 29 and 30: Test Access Mechanism(TAM)
Page 31 and 32: TAM Widthl Determines the test data
Page 33 and 34: TAM ImplementationslllllDirect acce
Page 35 and 36: Direct Access SchemelModification t
Page 37 and 38: Remarksl Advantages- Embedded cores
Page 39: Test BuslArchitecture overview.TDI/
Page 45 and 46: Remarksl Advantages- Reusing system
Page 47 and 48: Transparencyl Transparent path- A p
Page 51 and 52: Test RaillIC level view.Core A116 1
Page 53 and 54: Test RaillAn example.- A: 4 scan ch
Page 55 and 56: Multiplexing ArchitectureCore A Cor
Page 57 and 58: Distributed ArchitectureCore A Core
Page 59 and 60: Core Test Wrapper
Page 61 and 62: Functional Only ConnectionScan Chai
Page 63 and 64: Normal OperationBypassBypassBypassS
Page 65 and 66: ExTestBypassBypassBypassScan ChainS
Page 67 and 68: IEEE P1500Standard for Embedded Cor
Page 69 and 70: P1500 OverviewllIEEE P1500 SECT is
Page 71 and 72: P1500 Wrapperl Modes- Transparent f
Page 73 and 74: The P1500 Wrapper Boundary CellllCe
Page 75 and 76: Test Optimization
Page 77 and 78: Test Scheduling Techniquesl Co-opti
Page 79 and 80: t 1t 8 t 3 t 5 t g1t 7t 4 t 2 t g2t

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