SoC Design Flow & Tools: SoC Testing

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Types of <strong>Testing</strong>System specificationsArchitecture designLogic & Circuit designPhysical designLayoutFabricationPackagingllllTransformation of customer requirementsto system specifications is audited.The design is verified against the systemspecifications to ensure its correctness.Fabricated parts are subjected tocharacterization/production testing and/orincoming inspection to detect processdefects.Failure mode analysis (FMA) is applied tofailed parts8
Characterization <strong>Testing</strong>l For design debug and verification– Usually performed on a new design prior to massproduction.– Verify the correctness of the design & determineexact device limits.– Comprehensive functional, DC and AC parametrictests are applied to a set of samples.– Use of specialized equipment• Scanning electron microscope (SEM)• Electron beam testerl Results are used for setting final spec. anddeveloping production testing program.9
Page 1 and 2: SoC Design Flow & Tools:SoC Testing
Page 3 and 4: SoC Test Challenges
Page 5 and 6: The Role of Testingl The role of te
Page 7: l Fabrication defects (caused by im
Page 11 and 12: Burn-In Testingl Occurrence of pote
Page 13 and 14: Incoming Inspectionl Type of tests-
Page 15 and 16: Test QualityNumber of acceptable pa
Page 17 and 18: Technology Trend:System-on-Board to
Page 19 and 20: Separation of Responsibilitiesl The
Page 21 and 22: Distributed Design & Testl In gener
Page 23 and 24: Test Accessl Direct access to deepl
Page 25 and 26: A Conceptual SoC TestArchitecture
Page 27 and 28: A Conceptual Test ArchitectureDACmP
Page 29 and 30: Test Access Mechanism(TAM)
Page 31 and 32: TAM Widthl Determines the test data
Page 33 and 34: TAM ImplementationslllllDirect acce
Page 35 and 36: Direct Access SchemelModification t
Page 37 and 38: Remarksl Advantages- Embedded cores
Page 39 and 40: Test BuslArchitecture overview.TDI/
Page 44 and 45: AMBA Bus-Based Testing44
Page 46 and 47: TransparencyDACmPSRAMSourcePCICUTSi
Page 48: Remarksl Advantages- Low area overh
Page 52 and 53: Test RaillCore level view.CoreParal
Page 54 and 55: Remarksl Advantages- FlexibleEnable
Page 56 and 57: Daisy Chain ArchitectureCore A Core
Page 58 and 59:
Remarksl Different types of TAMs ma
Page 60 and 61:
Core Test Wrapperl Function- Interf
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Wrapper & TAMBypassBypassBypassScan
Page 64 and 65:
InTestBypassBypassBypassScan ChainS
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BypassBypassBypassBypassScan ChainS
Page 68 and 69:
Core-Based Testl The core provider
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A System Chip with P1500 Wrapped Co
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The P1500 Wrapper Architecture72
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P1500 Wrapper Parametersl Bandwidth
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Problem Statementl Given the test r
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Tree Growing Approaches[Jone et al.
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ILP Formulation[Chakrabarty et al.
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