MVS and CVS-R - Optex FA
MVS and CVS-R - Optex FA
MVS and CVS-R - Optex FA
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<strong>MVS</strong> Series<strong>MVS</strong> Series <strong>CVS</strong> Series APPLICATION<strong>MVS</strong>-PM/EM <strong>MVS</strong>-OCR OPTIONS21. Checking lead pitch of parts22. Check printing on transistors23. Check the marking on chip parts 24. Checking position of orientation flat25. Checking existence of solder balls27. Checking wafer position in FOUP29. Checking condition of vacuum collet tip<strong>MVS</strong>-EM-Measurepitch ofmultiple leadsin max., min.<strong>and</strong> mean.<strong>MVS</strong>-PM-Checkexistence ofmark<strong>MVS</strong>-OCR-Check thecharactersprinted onthe chip<strong>MVS</strong>-PM-Check colorarea of thesolder balls byutilizingmultipleinspectionwindows (max.16)<strong>MVS</strong>-PM-Check waferposition by colorarea utilizingmultiple inspectionwindows (max.16)<strong>MVS</strong>-EM-Check distancebetween wafers<strong>MVS</strong>-PM-Check theshape by patternmatching26. Checking position of wafer on h<strong>and</strong>ling machine28. Checking position of reference mark on PWB glass30. Checking segments of LCD display<strong>MVS</strong>-OCR-Check thecharactersprinted ontransistors<strong>MVS</strong>-PM-Check thearea<strong>MVS</strong>-EM-Check thedistancebetweenedges<strong>MVS</strong>-PM-Check itsposition inthe inspectionwindow<strong>MVS</strong>-EM-Check thedistancebetween edges<strong>MVS</strong>-PM-Check itsposition bypattern matching<strong>MVS</strong>-EM-Measuredistancebetween edges<strong>MVS</strong>-PM-Check itscondition bycontourmatching05