New Products - Chroma Systems Solutions

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Solar Wafer Inspection System Model 3710KEY FEATURES Good for 5 inches and 6 inches wafer High throughput and low breakage rate≤0.2% 2D Geometry Inspection Surface Inspection Micro Crack Inspection Saw Mark Inspection Resistively/ Thickness Tester Lifetime Tester Easy trouble shooting Loader : Coin stack / Cassette Unload : Coin stack / CassetteIntegrated with 2D Geometry, Surface, MicroCrack, Saw mark inspection system and Resistively& Thickness, Lifetime tester by customer defined,Chroma 3710 is a fully user configuration wafersorter system with very low breakage rate andhigh throughput.Chroma 3710 solar waferinspection system is ideal for PV incomingprocess. Plus wafer can be sorted by user definedalgorithm fully automatically into coin stack orcassette. The unique auto coin stack/cassetteexchange feature eliminates system down timewhen changing full coin stack/cassette to emptycoin stack/cassette manually.For the breakage rate that is one of the keyconcern for PV wafer handling system. Chroma3710 uses state-of-the-art cell transportationtechnique to ensure minimum breakage rate.Loading Auto-unloading Manual-unloadingORDERING INFORMATION3710 : Solar Wafer Inspection SystemLoading Auto-unloading Manual-unloading5-1 All specifications are subject to change without notice.
Page 4 and 5: Functional IndexPhotovoltaic Test E
Page 6 and 7: Model Index➊1061A Precision LCR M
Page 8 and 9: Model Index62015B-80-18 Modular DC
Page 10 and 11: New ProductsSolar Wafer Inspection
Page 12 and 13: New ProductsESD Test SystemModel 58
Page 14 and 15: New ProductsVideo Pattern Generator
Page 16 and 17: New ProductsProgrammable AC Source
Page 18 and 19: Photovoltaic Test EquipmentSolar Wa
Page 22 and 23: Solar Cell Inspection Test/Sorting
Page 24 and 25: Automatic Optical Solar Cell Inspec
Page 26: c-Si Solar Cell Tester Model 58301K
Page 29: OverviewLCD Driver IC Test SystemVL
Page 32 and 33: VLSI Test System Model 3360Most Fle
Page 34 and 35: LCD Driver IC Test System Model 352
Page 37 and 38: SoC Test SystemModel 3650-CXKEY FEA
Page 39 and 40: SoC Test System Model 3650Scope Too
Page 41 and 42: Four-quadrant DUT Power Supply Mode
Page 43 and 44: Automatic System Function Tester Mo
Page 46 and 47: xSD Card Tester and Handler Model 3
Page 48: CMOS Image Sensor Inspection System
Page 51 and 52: OverviewESD Test SystemLED Test Sys
Page 53 and 54: ESD Test SystemModel 58154 SeriesKE
Page 55 and 56: LED Total Power Test System Model 5
Page 57 and 58: LED Total Power Test System Model 5
Page 59 and 60: AC/DC LED Test System Model 58158KE
Page 61 and 62: LED Light Bar Electrical Test Syste
Page 63 and 64: OverviewIn-line ApplicationSignal G
Page 65 and 66: LCD Shorting Bar Pattern Generator
Page 67 and 68: LCM Tester Model 27011KEY FEATURESL
Page 69 and 70: LCM Tester Model 27013KEY FEATURES
Page 71 and 72:
LCM ATS Model 29130/29132/29133/291
Page 73:
LCM ATS Model 29152915 System Appli
Page 76 and 77:
DC Power Supply for LCM Burn-in App
Page 78 and 79:
Video & Color Test EquipmentSelecti
Page 80 and 81:
Selection GuidesVideo Pattern Gener
Page 82 and 83:
Video Pattern Generator Model 22293
Page 84 and 85:
Page 86 and 87:
Page 88 and 89:
Page 90 and 91:
Video Pattern Generator Model 2233T
Page 92 and 93:
Video Pattern Generator Model 2233-
Page 94 and 95:
Page 96 and 97:
Video Pattern Generator Model 2234T
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Page 100 and 101:
Page 102 and 103:
Page 104 and 105:
Video Pattern Generator Model 2401/
Page 106:
HDMI DistributorModel A222907KEY FE
Page 109 and 110:
Display Color Analyzer Model 7123KE
Page 111 and 112:
Spectrocolorimeter Model 71611KEY F
Page 113 and 114:
Front Projector ATS Model 7600KEY F
Page 115:
Display Multi-probe ATS Model 7660S
Page 118:
Video Microscope Model 7310FUNCTION
Page 121 and 122:
3D Optical Profiler Model 7503Appli
Page 123 and 124:
OverviewAutomatic Test SystemAC Ele
Page 125 and 126:
AC Power Source Selection GuideStep
Page 127 and 128:
Automatic Test System Selection Gui
Page 129 and 130:
DC Electronic Load SystemModel 6300
Page 131 and 132:
Programmable DC Electronic LoadMode
Page 133 and 134:
Page 135 and 136:
Page 137 and 138:
High Power DC Electronic LoadModel
Page 139 and 140:
Page 141 and 142:
Page 143 and 144:
High Speed DC Electronic LoadModel
Page 146 and 147:
High Speed DC Electronic LoadModel
Page 148 and 149:
High Slew Rate DC Electronic Load M
Page 150 and 151:
Page 152 and 153:
Programmable AC&DC Electronic LoadM
Page 154 and 155:
Programmable AC SourceModel 61500 S
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Page 158 and 159:
Page 160 and 161:
Page 162 and 163:
Page 164 and 165:
Programmable AC SourceModel 6400 Se
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Page 168 and 169:
Page 170 and 171:
Digital Power MeterModel 66200 Seri
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Programmable DC Power SupplyModel 6
Page 175 and 176:
Page 177 and 178:
Page 179 and 180:
Page 181 and 182:
Page 183 and 184:
Page 185 and 186:
Modular DC Power SupplyModel 62000B
Page 188 and 189:
Switching Power Supply ATS Model 80
Page 190 and 191:
Switching Power Supply ATS Model 80
Page 192 and 193:
PC Power Supply ATS Model 8010New t
Page 194 and 195:
Adapter/Charger ATS Model 802020UKE
Page 196:
LCD Inverter ATS Model 8490KEY FEAT
Page 199 and 200:
LCD Inverter ATS Model 8490DMM Card
Page 201 and 202:
LED Power Driver ATS Model 8491SPEC
Page 203 and 204:
LED Power Driver ATS Model 8491SPEC
Page 205 and 206:
OverviewBias CurrentTest SystemComp
Page 207 and 208:
Milliohm Meter Selection GuideModel
Page 209 and 210:
LCR Meter Model 11022/11025KEY FEAT
Page 211 and 212:
Capacitance Meter Model 11020KEY FE
Page 213 and 214:
Automatic Transformer Tester Model
Page 215 and 216:
Transformer Test System Model 3250/
Page 217 and 218:
Test Fixture of Auto Transformer Sc
Page 220 and 221:
Electrolytic Capacitor Analyzer Mod
Page 222 and 223:
Ripple Current Tester Model 11800/1
Page 224 and 225:
Programmable HF AC Tester Model 118
Page 226 and 227:
Milliohm Meter Model 16502KEY FEATU
Page 228 and 229:
Component Test Scanner Model 13001K
Page 230 and 231:
Electrical Double Layer Capacitor A
Page 232 and 233:
Component ATS Model 8800In recent y
Page 234 and 235:
EDLC ATS Model 8801KEY FEATURES Sui
Page 236 and 237:
EDLC LC Monitoring System Model 880
Page 238 and 239:
Options of Passive Component Test I
Page 240 and 241:
Electrical Safety Test InstrumentsS
Page 242 and 243:
Selection GuidesElectrical Safety T
Page 244 and 245:
Electrical Safety AnalyzerModel 190
Page 246 and 247:
Wound Component EST ScannerModel 19
Page 248 and 249:
Multi-Channel Hipot TesterModel 190
Page 250 and 251:
Hipot AnalyzerModel 19055/19055-CFU
Page 252 and 253:
AC/DC/IR/SCAN Hipot TesterModel 905
Page 254 and 255:
Electrical Safety Test Scanner Mode
Page 256 and 257:
High Voltage MeterModel 900A/900BHi
Page 258 and 259:
Electrical Equipment ATS Model 8900
Page 260 and 261:
High Capacitance Electrolytic Capac
Page 262 and 263:
General Purpose Test Instruments6½
Page 264 and 265:
6½ Digital Multimeter Model 12061K
Page 266 and 267:
Multifunction Calibrator Model 1680
Page 268 and 269:
Multipath Fading Channel Simulator
Page 270 and 271:
GNSS Signal Simulator Model 49003Ap
Page 272 and 273:
PXI Instruments and SystemsPXI Gene
Page 274 and 275:
PXI General Purpose ChassisModel 52
Page 276 and 277:
PXI 3U/6U Super Chassis Model 52022
Page 278 and 279:
PXI BackplanesModel 52200 SeriesKEY
Page 280 and 281:
Programmable DC Power Supply Model
Page 282 and 283:
Leakage Test Module Model 52958Syst
Page 284 and 285:
Extension Card Model 52906KEY FEATU
Page 286 and 287:
6U cPCI Hot Swap Power SupplyModel
Page 288 and 289:
Customer Support & ServiceWARRANTY
Page 290 and 291:
Global Service NetworkThe areas and
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New Products - Chroma Systems Solutions

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