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VLSI Test System Model 3360Most Flexible Configuration for Various Devices(Logic, LCD, LED, ADDA, ALPG, SCAN, Power and etc.)Smart CardOLED/CSTNDriver ICLED Driver ICChroma3360All Consumer ICPower IC(LDO, Class D... IC)MCU(Flash Embedded) ICKEY FEATURES 50 MHz Test Rate(100Mhz HSCLK) 608 I/O channels 8~16 M Pattern Memory Flexible Configuration (Interchangeable I/O,UVI, ADDA and LCD) Parallel Testing for 32 devices Real Parallel Trim/Match function Accepts SC312, TS670 probe card Test program/pattern converter (V7, TRI6020,V50, SC312, J750, ITS9K, TS670, ND1) Analog PE card option (16 bit~24bit) SCAN test option (512M) ALPG test option for Memory STDF tools support User friendly Windows XP environment CRAFT C/C++ programming language Real time pattern editor with fail pin/failaddress display Versatile test analysis tools:Shmoo plot, Waveform display,Wafer Map, Pin Margin, Scope tool,Histogramtool and etc.CRAFT (User Friendly and Powerful Test Development Software)The Craft Software ToolShmoo ToolWaveform ToolPattern Editor ToolThe Most Efficient Patterns/Test Program Converterfor V7, TRI6020, V50(scud-1a), SC312, J750, ITS9K, TS670, ND132 Sites Parallel Production CardMounting SC312/TS670 probe cards directly -In addition to patterns/program converter , Chroma 3360 has a special Pogo-ring tower to mountthe SC312/TS670 probe cards directly.6-3 All specifications are subject to change without notice.
VLSI Test System Model 3360SPECIFICATIONSModel 3360StandardTest Rate50MHz (high-speed clock 100MHz)IO Channel608 Pins (Max.)Pattern Memory8M ( 16 M Option)Parallel Testing CapabilityMaximum 32 DUTsEdge Placement Accuracy±625 psResource Per Pin ArchitectureYesDPS (±10V, ±2 A)24 (8 DPS, 16 PREF ±45V)PMU (±45V, ±100mA) 32PPMU (±0.5V ~ 6.5V, ±35mA)Per PinProgrammable Load (Active)Per Pin ( ±35 mA)Windows EnvironmentWindows XPProgramming LanguageC or C++Test OptionLCD ChannelMax. 544 LCD PinAD/DA Test Option4 AWG / 4 DGT (16 bits)High accuracy ADDA Option2 AWG/ 2 DGT (24 bits)SCAN Test Option512 M (Per I/O Board)ALPG Memory Test Option16X, 16Y, 16DUVI (±10V, ±500mA) 16System DimensionPower Consumption8KVA Max.Cooling systemForced air coolingTest Head (WxDxH)700 x 700 x 430 mmMainframe (WxDxH)960 x 670 x 1750 mm3360 / 3360-P / 3360-D VI SOURCE SPECIFICATIONSTDPS STPMU LXUVI LFUVI HVREF HVREF-48 HV-100 HCDPS LXREF-48 SPREF PMUVI-16 PMUVI-48V Range 10 V 48 V 10 V 24 V 60 V 48 V 100 V 32 V 48 V 48 V 16 V 48 VPMU : PMU :I Range 2 A 100 mA 500 200100mA 100mA/ 1.5A 2 A 500mA 6 A 250 mA 100 mAmAmAUVI :UVI :250mA 250mAChannel 8 /board 8 /board 16 /board 4 /board 8 /board 8 /board 8 /board 8 /board 16 /board 8 /board 8+8/board 8+8/boardSlot DPS slot PMU slot I/O slot I/O slot I/O slot I/O slot I/O slot DPS slot I/O slot PREF slot PMUVI slot PMUVI slotEPBNoneNone None None None Yes None Yes Yes None None Nonemodule(3360-D-48)3360-D X X O X X X X X O X S O3360-P S S O O O O O O O X X X3360 S S O O X X X X X S X XAccuracy 1.5mV 1.25mV 1.0mV 0.5mV 1.5mV 1.5mV 2.5mV 1.5mV 1.25mV 1.0mV 0.75mV 1.0mVS : StandardO : OptionX : NonePhotovoltaicTest EquipmentSemiconductor/ICTest EquipmentLEDTest EquipmentLCD/LCMTest EquipmentVideo & ColorTest EquipmentOptical InspectionEquipmentPower ElectronicsTest EquipmentPassive ComponentTest InstrumentsElectrical SafetyTest InstrumentsGeneral PurposeTest InstrumentsPXI Instruments& SystemsAll specifications are subject to change without notice.6-4
Page 4 and 5: Functional IndexPhotovoltaic Test E
Page 6 and 7: Model Index➊1061A Precision LCR M
Page 8 and 9: Model Index62015B-80-18 Modular DC
Page 10 and 11: New ProductsSolar Wafer Inspection
Page 12 and 13: New ProductsESD Test SystemModel 58
Page 14 and 15: New ProductsVideo Pattern Generator
Page 16 and 17: New ProductsProgrammable AC Source
Page 18 and 19: Photovoltaic Test EquipmentSolar Wa
Page 20: Solar Wafer Inspection System Model
Page 23 and 24: Automatic Optical Solar Cell Inspec
Page 25 and 26: c-Si Solar Cell Tester Model 58301S
Page 28 and 29: Semiconductor/IC Test EquipmentVLSI
Page 31: VLSI Test System Model 3360-PKEY FE
Page 35: SoC Test System Model 3600KEY FEATU
Page 38 and 39: SoC Test System Model 365050/100 MH
Page 40 and 41: Programmable Pin Electronics Module
Page 42 and 43: Automatic System Function Tester Mo
Page 44: Miniature IC Handler Model 3270KEY
Page 47 and 48: Touch Panel Multi-sites Test Handle
Page 50 and 51: LED Test EquipmentLED Test System 7
Page 52 and 53: LED Test System Model 58151KEY FEAT
Page 54 and 55: LED Total Power Test System Model 5
Page 56 and 57: LED Total Power Test System Model 5
Page 58 and 59: LED Die Inspection System Model 793
Page 60 and 61: LED Light Bar Test System Model 581
Page 62 and 63: LCD/LCM Test EquipmentLCD Shorting
Page 64 and 65: LCD Shorting Bar Pattern GeneratorM
Page 66 and 67: LCM Pattern Generator CardModel 270
Page 68 and 69: LCM Tester Model 27012KEY FEATURESS
Page 70 and 71: LCM ATS Model 29130/29132/29133/291
Page 72 and 73: LCM ATS Model 2915automatically acc
Page 75 and 76: LCM ATS Model 2916SPECIFICATIONSMod
Page 77 and 78: PhotovoltaicTest EquipmentSemicondu
Page 79 and 80: OverviewAll other brand and logo an
Page 81 and 82: Distributor Selection GuideDistribu
Page 83 and 84:
Video Pattern Generator Model 22293
Page 85 and 86:
Page 87 and 88:
Page 89 and 90:
Page 91 and 92:
Video Pattern Generator Model 2233S
Page 93 and 94:
Video Pattern Generator Model 2233-
Page 95 and 96:
Page 97 and 98:
Video Pattern Generator Model 2234S
Page 99 and 100:
Page 101 and 102:
Page 103 and 104:
Page 105 and 106:
Video Pattern Generator Model 2401/
Page 108 and 109:
Digital Video Distributor Model 281
Page 110 and 111:
Display Color Analyzer Model 7123SP
Page 112 and 113:
Spectrocolorimeter Model 71611SPECI
Page 114 and 115:
Display Multi-probe ATS Model 7660K
Page 117 and 118:
OverviewVideo MicroscopeSub-nanomet
Page 120 and 121:
3D Optical Profiler Model 7503KEY F
Page 122 and 123:
Power Electronics Test EquipmentSel
Page 124 and 125:
Selection GuidesDC Electronic Load
Page 126 and 127:
Selection GuidesDC Power Supply Sel
Page 128 and 129:
DC Electronic Load SystemModel 6300
Page 130 and 131:
Programmable DC Electronic LoadMode
Page 132 and 133:
Page 134 and 135:
Page 136 and 137:
Page 138 and 139:
High Power DC Electronic LoadModel
Page 140 and 141:
High Power DC Electronic LoadModel
Page 142 and 143:
High Speed DC Electronic LoadModel
Page 144:
Page 147 and 148:
Page 149 and 150:
Page 151 and 152:
Page 153 and 154:
Programmable AC&DC Electronic LoadM
Page 155 and 156:
Programmable AC SourceModel 61500 S
Page 157 and 158:
Page 159 and 160:
Page 161 and 162:
Page 163 and 164:
Page 165 and 166:
Programmable AC SourceModel 6400 Se
Page 167 and 168:
Programmable AC SourceModel 6500 Se
Page 169 and 170:
Power Analyzer Model 6630/6632KEY F
Page 171 and 172:
Digital Power MeterModel 66200 Seri
Page 174 and 175:
Programmable DC Power SupplyModel 6
Page 176 and 177:
Page 178 and 179:
Page 180 and 181:
Page 182 and 183:
Page 184 and 185:
Modular DC Power SupplyModel 62000B
Page 186:
Switching Power Supply ATS Model 60
Page 189 and 190:
Page 191 and 192:
Page 193 and 194:
PC Power Supply ATS Model 8010SPECI
Page 195 and 196:
Adapter/Charger ATS Model 8020SPECI
Page 198 and 199:
LCD Inverter ATS Model 8490SPECIFIC
Page 200 and 201:
LED Power Driver ATS Model 8491KEY
Page 202 and 203:
LED Power Driver ATS Model 8491SPEC
Page 204 and 205:
Passive Component Test InstrumentsS
Page 206 and 207:
Selection GuidesLCR Meter Selection
Page 208 and 209:
LCR MeterModel 11021/11021-LKEY FEA
Page 210 and 211:
Precision LCR MeterModel 1061A/1062
Page 212 and 213:
Automatic Transformer Tester Model
Page 214 and 215:
Transformer Test System Model 3250/
Page 216 and 217:
Telecom Transformer Test System Mod
Page 218:
Bias Current SourceModel 1310/1320/
Page 221 and 222:
Electrolytic Capacitor Analyzer Mod
Page 223 and 224:
CLC/IR Meter Model 11200KEY FEATURE
Page 225 and 226:
Programmable HF AC Tester Model 118
Page 227 and 228:
Milliohm Meter Model 16502SPECIFICA
Page 229 and 230:
Magnetic Component Test System Mode
Page 231 and 232:
Electrical Double Layer Capacitor A
Page 233 and 234:
Component ATS Model 8800SPECIFICATI
Page 235 and 236:
EDLC ATS Model 8801SPECIFICATIONSAc
Page 237 and 238:
EDLC LC Monitoring System Model 880
Page 239 and 240:
Options of Passive Component Test I
Page 241 and 242:
OverviewElectrical Equipment ATSHig
Page 243 and 244:
Electrical Safety Tester Selection
Page 245 and 246:
Electrical Safety AnalyzerModel 190
Page 247 and 248:
Wound Component EST ScannerModel 19
Page 249 and 250:
AC/DC/IR/SCAN Hipot TesterModel 190
Page 251 and 252:
AC/DC/IR Hipot TesterModel 19070 Se
Page 253 and 254:
Electrical Safety Test Scanner Mode
Page 255 and 256:
Ground Bond Tester Model 19572KEY F
Page 257 and 258:
Hipot Calibrator Model 9102KEY FEAT
Page 259 and 260:
Medical Electrical Safety ATS Model
Page 261 and 262:
Options of Electrical Safety Test I
Page 263 and 264:
Overview6½ Digital MultimeterMulti
Page 265 and 266:
6½ Digital Multimeter Model 12061S
Page 267 and 268:
Multifunction Calibrator Model 1680
Page 269 and 270:
Multipath Fading Channel Simulator
Page 271 and 272:
PhotovoltaicTest EquipmentSemicondu
Page 273 and 274:
OverviewProgrammable DC Power Suppl
Page 275 and 276:
PXI Portable Chassis Model 52151KEY
Page 277 and 278:
PXI Mini Chassis Model 52131KEY FEA
Page 279 and 280:
Four Quardrant SourceModel 52400 Se
Page 281 and 282:
Current Source/Measure Module Model
Page 283 and 284:
Dual Channel NANO-AMP Meter Model 5
Page 285 and 286:
3U cPCI Hot Swap Power SupplyModel
Page 287 and 288:
PhotovoltaicTest EquipmentSemicondu
Page 289 and 290:
• Service WarrantyChroma's ser vi
Page 291:
All contacts are subject to change
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