New Products - Chroma Systems Solutions

SoC Test System Model 365050/100 MHzKEY FEATURES 50 /100 MHz 512 digital I/O pins 16/32 MW vector memory 16/32 MW pattern instruction memory Multi-site testing up to 32 sites Per-pin test architecture Up to 8 16-bit ADDA channels option Up to 2Gbit X 8 CH scan depth option ALPG option for memory test Up to 32 high-voltage pins 32 high-performance DPS channels Overall timing accuracy < 550ps 8 ~ 32-CH / board for VI-45 analog option 2 ~ 8-CH / board for PVI-100 analog option Microsoft Windows® XP OS C++ and GUI programming interface CRISP full suite of intuitive software tools Test template for test program creation Test program and pattern converters for otherplatforms Accept DIB and probe card of other testersdirectly Support STDF data output Air-cooled, small footprint tester-in-a-test-headdesignChroma 3650 brings you the mostcost-effective SoC testerWhen the cost of devices keep going downand profit margin keep shrinking, how to finda good test solution for reducing the cost oftesting, raising the yield and also keepingthe good quality of devices has never beenmore important than it is today. Chroma 3650is a SoC tester with high throughput andhigh parallel test capabilities to provide themost cost-effective solution for fabless, IDMand testing houses. With the full functionsof test,high accuracy, powerful softwaretools and excellent reliability,3650 has theversatile test capabilities for high-performancemicrocontroller, consumer SoC devices, theperipheral IC devices of PC and digital wafer sortapplications.Power ICsSTBLED Driver ICsHigh performance in a low-cost productionsystemThe 3650 achieves lower test cost not only byreducing the cost of tester system but also bytesting more devices faster and the high paralleltest capability. With the Chroma PINF IC andthe sophisticated calibration system, 3650 hasthe excellent overall timing accuracy within 550ps. The pattern generator of 3650 has upto 32M pattern instruction memory. By havingthe same depth as the vector memory, Chroma3650 allows to add pattern instruction for eachvector. Moreover, the powerful sequentialpattern generator provides the variety of patterncommands to meet the demands of complex testvectors. The true test-per-pin architecture and theflexible site mapping with no slot boundaries aredesigned for multi-site test with high throughput.Up to 512 digital pins, 32 device power supplies,per-pin PMU and the analog test capability, 3650delivers a combination of high test performanceand throughput with cost-effective test solution.High parallel test capabilityThe powerful, versatile parallel pin electronicsresources of 3650 can simultaneously performidentical parametric tests on multiple pins. The3650 integrates 64 digital pins onto one singleLPC board. In each LPC board, it contains 16 highperformance Chroma PINF ICs which owns 4channelstiming generator within 50ps accuracy. Theintegration of local controller circuitry managesresources setup and result readout, andtherefore cuts the overhead time of the systemcontroller. With the any-pin-to-any-site mappingdesign,3650 provides up to 32 sites highthroughput parallel testingcapabilities to enlarget h e m a s s p r o d u c t i o nperformance with moreflexible and easy layout.64 channel Digital Pin CardFlexibilityThe semiconductor industry is a fast moving one,and capital equipment must be built to outliveseveral device generations. With selective options,like AD/DA converter test, ALPG for memory test,high voltage PE and multiple scan chain testoption,Chroma 3650 makes sure that it will serveyou for years to come.CP Docking Solution for other Tester PlatformPowerful suite of software tools – CRISPThe 3650 features the powerful suite of softwaretools using Chroma I ntegrated S oftwarePlatform, CRISP. Not only provides the rapid testdevelopment function, CRISP covers all needs fortest debugging, production and data analysis.The CRISP integrates the software functionsof test development, test execution control,data analysis and tester management together.Based on the Microsoft Windows XP® operationsystem and C++ programming language, CRISPprovides the powerful, easy-to-use, intuitive, andfast-runtime GUI tools for users. In the ProjectIDE tool, test developer can easily shift betweenstandard template, user-defined template and C++code-based editor to create their test programquickly and automatically scale to multi-site forparallel test. Besides, CRISP also provides the testprogram and test pattern converters to facilitatethe test conversion from other tester platforms to3650.For the test program execution controller, user canselect the System Control tool or Plan Debuggertool for normal mode or debugging mode. Inthe Plan Debugger tool, user can control theexecution of test program by setting break point,step, step-into, step-over, resume execution,variable-watch and variable-modify, etc. For thetest debugging and data analyzing purposes, 3650provides abundant software utility tools. Datalog,Waveform and Scope tools are designed tosupport the measured data and digital waveformdisplay. To find the parametric margin, SHMOOand Pin Margin tools can easily accomplish debugSystem ControlChroma 3650PC I/OSoC Moreover, Chroma 3650 platform architectureallows development of focused instruments byTCON/High Performance third-party suppliers that can be easily added forLCD ControllerMCUConsumer ICspecific applications. It can stretch the boundariesof test by covering a broader range of devicesthan ever before possible in a low-cost production6-9test system.Test Program DebuggerAll specifications are subject to change without notice.