New Products - Chroma Systems Solutions

SoC Test System Model 3600KEY FEATURES 50/ 100 MHz Test Rate 256 I/O channels 16M Pattern Memory Flexible Resource Per Pin Architecture Parallel Testing of 4 DUT Hardware Algorithmic Pattern Generator ADC/DAC Test Capability Very Small footprint 76cm x 73cm x 48cm User friendly Windows ® NT environment Flexible MS C Programming language Real time pattern editor with fail pin/failaddress display Credence ® test pattern converter Powerful test analysis tool: Shmoo plot,Waveform display, Wafer Map, Pin Margin,Scope tool, Histogram tool etc. Cost effective solution for production testingof VLSI and consumer mixed signal devicesPerformanceIntegrated systems-on-a-chip (SoC), combininga wide variety of functions is a challenge to anydevice tester. This demanding mixture of digital,analog and power features call for a highlyversatile ATE system. The Chroma 3600 is designedto meet this challenge today and for years tocome. It offers powerful, integrated and flexibleresources, such as 100MHz, 16V and 400mA, in asingle test head.100MHz True Test-Per-Pin ArchitectureProgrammable driver/comparator levels from-2Vto +7V. Up to 16M Words of vector memory perpin-deep enough for complex test vectors orsophisticated serial data streams. Test patternrates up to 100MHz resource per pin design.Timing, format and period changes can beperformed on the fly. For enabling parallel andmulti-site testing, PMU per pin design(PPMU)can be performed in fully parallel test mode.Preprogrammed operating modes can be storedfor short set-up times between tests.Parallel Test CapacityThe powerful, versatile parallel pin electronicsresources can simultaneously perform identicalparametric tests on multiple pins. Local controllercircuitry manages resources set-up and resultreadout, therefore cuts the test system controlleroverhead time.Multi Site TestMulti-site testing increases the number ofdevices tested by simultaneously measuringmultiple devices in a test cycle on one test head.This requires more than just parallel resources.Devices, especially those in digital tests withlooped or nested vectors or sequential datastreams, may need varying test sequences. Thedigital pin electronics contains local controllerscapable of independently managing patternsequence, timing and formatting for smallpin increments. Using this capability, theChroma3600 can split up the test head intomultiple test sites for a further throughput boost.FlexibilityThe semiconductor industry is a fast movingone, and capital equipment must be built tooutlive several device generations. With selectiveoptions, like ALPG, Converter Test, High VoltagePE Options. Chroma 3600 employed pro-activeplanning during the design of its architecture tomake sure that it will serve you for years to come.RAISE (Software Test Environment)The software test environment for Chroma 3600is based on the software platform called RAISE.This environment covers the needs for bothdevelopment engineers and the productions testpersonnel. Software panels are provided for fastproduct characterizations and debug. Statistics,security and factory integration tools aid themanufacturing engineers to easily integrate thesystems in the test floor. Using industry standardtools based on Windows ® NT and C keeps thelearning curve to a minimum. Comprehensivedebug tools for on-line debugging of digitalwaveforms and Shmoo plot capabilities can iteratevirtually any test parameter including timing,voltage and current for an assessment of processand test stability.Statistical Analysis3600 provides histogram tool for statisticalanalysis purpose. It can collect the measured dataof selected test items from mass DUT samplesat run-time. Analyze the logged data by statisticmethod to show basic information about the dataset, such as mean value, maximum / minimumvalue, standard deviation and normal distributioncurve at off-line. Display the measurement andstatistical result by histogram chart to show howthe logged data distributed at off-line.Time To MarketTe s t i n g c a n b e a b o t t l e n e c k i n b r i n g i n gyour products to market - it takes time tog e n e r a t e c o m p r e h e n s i v e t e s t p r o g r a m sand circuitr y. Through the use of power fulgraphic programming and debugging tools,comprehensive hardware resources and a highlyversatile pin electronics design, Chroma 3600dramatically reduces the time needed to createyour test programs and eliminates the need fordevice specific test circuitry.Lowest Cost of Test SolutionToday's complex devices call for powerful andversatile test systems. Low test costs can only beachieved by reducing test times and overall cost,not just by simply reducing the system price.The design of Chroma 3600 is to suit for all kindof application environment, like engineeringverification, wafer sorting, and final testing.Small FootprintClean room space is scarce and costly. To avoidthe need for expensive clean room expansion,only compact test systems should be considered.The Chroma 3600 delivers high throughput in ahighly integrated package, offering an unrivalledcombination of throughput and test capabilities.Application SupportChroma offers wide bandwidth of applicationsupport solutions to its new and establishedcustomers, all designed to accurately meetuser needs. Whether you need fast productionramp-up, want to capitalize on emerging marketopportunities, enhance productivity, lowertesting costs with innovative strategies or requireadditional capacity for peak load situations,the Chroma worldwide customer support staffis committed to generate timely and efficientsolutions for you.PhotovoltaicTest EquipmentSemiconductor/ICTest EquipmentLEDTest EquipmentLCD/LCMTest EquipmentVideo & ColorTest EquipmentOptical InspectionEquipmentPower ElectronicsTest EquipmentPassive ComponentTest InstrumentsElectrical SafetyTest InstrumentsGeneral PurposeTest InstrumentsPXI Instruments& SystemsAll specifications are subject to change without notice.• Continued on next page ➟6-6