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2004-01-1240 An Overview of Hardware-In-the-Loop ... - dSPACE

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input from simulated sensor different types <strong>of</strong> sensorfailure can be simulated. To simulate failures for PCMoutputs, however, this involves using electronic relays toprovide open circuits, short circuits to battery voltage orground, or even pin-to-pin short circuits. <strong>In</strong> addition,PCM outputs generally expect to have a specific loadattached, and failures are triggered if this is not <strong>the</strong> case.process [6]. This allows for <strong>the</strong> following standard testsequence:1. Place PCM in desired performance state2. <strong>In</strong>ject a failure3. Evaluate <strong>the</strong> PCM performance during <strong>the</strong> faultcondition4. Debrief <strong>the</strong> diagnostics tool to determine if <strong>the</strong> faultwas properly detected5. Reset <strong>the</strong> fault codes to allow for fur<strong>the</strong>r testingThe above test sequence is fully repeatable and byusing it, full lights-out testing sequences are possible.All <strong>of</strong> <strong>the</strong> diagnostic codes for a PCM may be evaluatedin a single test run (with a combination <strong>of</strong> sequences)and a complete test report will be automaticallygenerated to record <strong>the</strong> results. Once this process isimplemented, <strong>the</strong> daunting task <strong>of</strong> test regression foriterative s<strong>of</strong>tware releases is easily contained.BENEFITS – HIL IN EVERY DEVELOPMENTALPHASEFigure 4 Failure <strong>In</strong>sertion Unit Block DiagramTest scripting interfaceThe control <strong>of</strong> <strong>the</strong> FIU system is done using a pythonlibrary in <strong>the</strong> test automation environment. A PCMoutput channel is wired to a HIL load interface, but first itis routed through a FIU channel (See Figure 4). Thisallows for exposing <strong>the</strong> channel to <strong>the</strong> failures neededfor testing. The <strong>dSPACE</strong> FIU interface is based on aserial communications protocol, which can becommanded directly from <strong>the</strong> Host PC. Simple functioncalls are used in order to control a particular FIUchannel, which eliminates <strong>the</strong> need for <strong>the</strong> user to learn<strong>the</strong> details <strong>of</strong> <strong>the</strong> FIU serial communication protocol.With our experience during <strong>the</strong> developmental andimplementation stages <strong>of</strong> <strong>the</strong> HIL systems we foundseveral advantages <strong>of</strong> using HIL systems in testing andvalidating our s<strong>of</strong>tware product. Although, <strong>the</strong> initialscope for using <strong>the</strong> HIL system was limited, we now use<strong>the</strong> system in every phase <strong>of</strong> <strong>the</strong> PCM s<strong>of</strong>twaredevelopment process. Figure 5 illustrates <strong>the</strong> SystemEngineering V with <strong>the</strong> phases <strong>of</strong> s<strong>of</strong>tware developmentand highlights how HIL is being used in every stage <strong>of</strong><strong>the</strong> s<strong>of</strong>tware development.<strong>In</strong>tegration <strong>of</strong> diagnostic tools for closed loop testingIt is sometimes enough to simulate failures duringtesting only for <strong>the</strong> analysis <strong>of</strong> <strong>the</strong> effects on systemperformance. However, in order to fully read systemdiagnostics and also reset <strong>the</strong> error conditions, it isnecessary to connect a diagnostic tester/device. Thisdevice is used to debrief <strong>the</strong> error codes registered in<strong>the</strong> PCM following any diagnostic error and report <strong>the</strong>secodes back to <strong>the</strong> tester. The python test automationlibraries also include functions to interface to and control<strong>the</strong>se diagnostic devices. These testers generally use astandard serial or CAN-based protocol for interfacing to<strong>the</strong> PCM. O<strong>the</strong>rs utilize <strong>the</strong> ASAM/MCD standard forexternal operation <strong>of</strong> <strong>the</strong> device. By providing <strong>the</strong>capabilities for controlling <strong>the</strong>se diagnostic tools,ControlDesk can fully close <strong>the</strong> loop on <strong>the</strong> testingFigure 5 HIL used in every step <strong>of</strong> developmentcycle.Broadly, <strong>the</strong> HIL applications for PCM testing in <strong>the</strong>design phase can be classified as Open <strong>Loop</strong> Testing(OLT) and Closed-<strong>Loop</strong> Testing (CLT). <strong>In</strong> <strong>the</strong> OLT a

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