PATENTS OFFICE JOURNAL - Irish Patents Office
PATENTS OFFICE JOURNAL - Irish Patents Office
PATENTS OFFICE JOURNAL - Irish Patents Office
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3342<br />
(No. 1987) <strong>Patents</strong> <strong>Office</strong> Journal (11/02/2004)<br />
hydraulic systems for earth<br />
movement machineries,<br />
tractors and agricultural<br />
machinery.<br />
Priority Date Claimed: 8 July, 2003 Italy<br />
FL SELENIA, S.p.A., Via Santena, 1, I-10029<br />
VILLASTELLONE (TORINO), Italy<br />
Representative: STUDIO TORTA S.R.L., Via<br />
Viotti, 9, I-10121 TORINO,<br />
Italy<br />
0814027 28/08/2003<br />
L.O.T.<br />
Class 9. Instruments for scientific and<br />
metrological purposes;<br />
electro-optical metrological<br />
instruments; instruments for<br />
measurement of optical,<br />
magnetic and electronic<br />
properties; laser instruments;<br />
ellipsometers; instruments for<br />
measurement of physical<br />
properties of thin films and<br />
layer systems; optical<br />
equipment for optical<br />
laboratories, namely optical<br />
filters, lasers, optical<br />
metrological instruments;<br />
metrological instruments for<br />
the semiconductor industry;<br />
positioning and fine tuning<br />
devices for optical and<br />
electro-optical metrological<br />
instruments; radiation<br />
detectors and radiation<br />
detector assemblies; infrared<br />
cameras; non-optical<br />
microscopes and instruments<br />
for surface metrology; optical<br />
lenses, optical windows,<br />
optical mirrors; particle<br />
analyzers; monochromators<br />
and spectrographs; fiber<br />
optical components and<br />
metrological instruments;<br />
instruments for measurement<br />
and proof of biological<br />
properties of organic<br />
substances; radiometric and<br />
photometric instruments; Xray<br />
spectrometers; parts of all<br />
these instruments; software.<br />
Class 11. Light sources for<br />
metrological purposes,<br />
namely Deuterium light<br />
sources, beam light sources,<br />
halogen light sources,<br />
infrared sources, spectral<br />
calibration lamps with<br />
discrete spectral lines for<br />
wavelengths calibration,<br />
calibrated light sources as<br />
flux standards, homogenous<br />
light sources as radiance<br />
standards or radiant intensity<br />
standards, monochromic light<br />
sources, light sources with<br />
fiber optics, light sources for<br />
solar simulation, light sources<br />
for photo resist exposure;<br />
special lamps for scientific<br />
and technical purposes; parts<br />
of all these products.<br />
Class 42. Measurement and inspection<br />
with electro optical<br />
instruments; technical<br />
application consulting in the<br />
field of metrology.<br />
L.O.T.-Oriel Laser Optik Technologie GmbH & Co.<br />
KG, Im Tiefen See 58, D-64293 Darmstadt,<br />
Germany<br />
Representative: KATSCHER Helmut and<br />
HABERMANN Jan, Katscher<br />
Habermann Patentanwälte,<br />
Fröbelweg 1, D-64291<br />
Darmstadt, Germany<br />
TAZIO NUVOLARI<br />
0814034 08/09/2003<br />
Class 12. Vehicles; apparatus for
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