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Detector PHA Scan Si Kα SCA Scan Si Kα 15kv 25 nA Bias 1632 Volts, SCA Peak at 4 Volts Counts per 1 sec 2500 2000 1500 1000 500 TAP1, 64x, 1632 Bias 0 0 1 2 3 4 5 6 7 8 9 10 Volts For Si Kα there is good separation between baseline and Si pulses. Nominal baseline is 0.5 V with 9.5 V window (integral mode) MSFC Spec 1, P-10 flow counter, TAP, 64x gain, Si Kα on SiO 2 @ 10k cps. UO EPMA Workshop 2008
Calibration of PHA Using Bias vs. ln(E) plots • For JEOL microprobe want SCA pulse at 4 volts, Cameca at 2 volts • Spectrometer at peak position • Bias scan with 3.8v base, 0.2v window gives bias for 4 volt SCA • Plot of bias vs ln of x-ray energy is linear • Calibration performed for minimum element set which spans energy range of spectrometer for all analyzing crystals • Detector should give same bias for Ti Kα on PET vs. LIF, others • Calibration confirms systematic behavior of x-ray counter • As P-10 tank empties and Ar/CH 4 changes, requires recalibration • Use y = mx + b fit to bias data to provide quick calibration • Similar plot for escape peak as function of x-ray energy UO EPMA Workshop 2008
Page 1 and 2: Electron-Probe Microanalysis: Instr
Page 3 and 4: Washington University, Saint Louis
Page 5 and 6: Pulse-Height Analysis Wavelength-di
Page 7: Detector Bias Scan Si Kα Vary Bias
Page 11 and 12: Gain Shift Due to Count Rate 5K cps
Page 13 and 14: Carbon Kα PHA Scans Graphite, Fe3C
Page 15 and 16: WDS Deadtime Issues in EPMA • Dea
Page 17 and 18: Deadtime Losses Input - Output Curv
Page 19 and 20: Deadtime Relations Calculation of D
Page 21 and 22: Verification of Probe Current vs. A
Page 23 and 24: Deadtime Variation with Count Rate
Page 25 and 26: Alignment and Quantitative Analysis
Page 27 and 28: Electron Microprobe Column Spectrom
Page 29 and 30: CMASTF Standard Inventory: Natural
Page 31 and 32: Ag Lα NIST SRM 481 AgAu Alloy (ψ=
Page 33 and 34: Historical CMAS Data Caltech MAC Pr
Page 35 and 36: Caltech JEOL 733 1990’s Spectrome
Page 37 and 38: Caltech JEOL 733 1990’s Spectrome
Page 39 and 40: Intercomparison of Measured vs. Acc
Page 41 and 42: WU JXA-8200 CMASTF Data Set Spectro
Page 47 and 48: Accuracy, 1σ % Error in K meas / K
Page 49 and 50: Washington University Earth and Pla
Page 51 and 52: Lunar Meteorite SAU169 Stage map 10
Page 53 and 54: WU8200 JEOL SDD 55 Fe Source Mn Kα
Page 55 and 56: SDD Performance Data: WU8200 SDD Mn
Page 57 and 58: WU8200 SDD Mn K Spectra T1, 100 sec
Page 59 and 60:
WU8200 SDD Mn L Spectra T1, 100 sec
Page 61 and 62:
WU8200 SDD Deadtime vs. Count Rate
Page 63 and 64:
WU8200 SDD Count Rate vs. Resolutio
Page 65 and 66:
Washington University JXA-8200 SDD
Page 67 and 68:
CMASTF Standard Analyses WU8200 SDD
Page 69 and 70:
CMASTF Standard Analyses WU8200 SDD
Page 71 and 72:
EPMA Standards UO EPMA Workshop 200
Page 73 and 74:
Basalt Glass Indian Ocean USNM 1137
Page 75 and 76:
Olivine Standards: Mn, Fe, Ni Stand
Page 77 and 78:
Fayalite Standards Oxide MnO FeO* N
Page 79 and 80:
Systematic Error Using Oxide Standa
Page 81 and 82:
Accuracy of EPMA: Quantitative Anal
Page 83 and 84:
Olivine Alpha Factor Study: Compari
Page 85 and 86:
Analysis of Mg Kα in Shankland For
Page 87 and 88:
Mg Kα in Olivine Using Forsterite
Page 89 and 90:
EPMA of San Carlos Olivine Correcti
Page 91 and 92:
Inconel Spheres: Diameter ~ 30 um U
Page 93 and 94:
Inconel Sphere Low Energy EDS Regio
Page 95 and 96:
Al Kα Peak Intensity at -10º to +
Page 97 and 98:
Problem Systems UO EPMA Workshop 20
Page 99 and 100:
WDS Background Selection (Natural P
Page 101 and 102:
WDS Scan LIF: Al, Cr, Ni, and NiCrA
Page 103 and 104:
Zn Kα ΙΙ V Kα Ce Lα La Lα Ti
Page 105 and 106:
WDS Scan: PET Crystal 95IRV Green,
Page 107 and 108:
WDS Scan: PET Crystal Sr Lα Peaks,
Page 109 and 110:
Elevated and Uncertain MAC Values f
Page 111 and 112:
Mass Absorption Coefficients for Si
Page 113 and 114:
Silicon Kα MAC at L-edge of Absorb
Page 115 and 116:
Error Analysis Ta Lα in TaSi 2 All
Page 117 and 118:
Calculated Compositions of TaSi2 Re
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