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Supplement Annual Report 2005 - Helmholtz-Zentrum Berlin

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Publications HMI<br />

SF4.BESSY<br />

Darowski N. ; Zizak I ; Schumacher G.<br />

Surface and bulk structural changes in InP single crystals induced by 350 MeV Au ion irradiation<br />

Physica B<br />

357 (<strong>2005</strong>) 118 - 121<br />

Darowski N. ; Zizak I. ; Schumacher G. ; Klingelhöffer H. ; Chen W. ; Neumann W.<br />

Temperature dependence of x-ray intensity profile FWHM of the gamma' phase in the creep-deformed<br />

single crystal superalloy SC16<br />

Journal of Physics D<br />

38 (<strong>2005</strong>) A200 - A203<br />

Eiper, E. ; Martinschitz, K.J. ; Gerlach, J.W. ; Lackner, J.M. ; Zizak, I. ; Darowski, N. ; Keckes, J.<br />

X-ray elastic constants determined by the combination of sin 2 Ψand substrate-curvature methods<br />

Zeitschrifft für Metallkunde<br />

96 (<strong>2005</strong>) 1069 - 1073<br />

Hellhammer R. ; Sobocinski P. ; Pesic Z.D. ; Bundesmann J. ; Fink D. ; Stolterfoht N.<br />

Interaction of slow highly charged ions with the inner surface of nanocapillaries<br />

Nuclear Instruments and Methods in Physics Research B<br />

232 (<strong>2005</strong>) 235 - 243<br />

Hossain S. ; Landers A.L. ; Stolterfoht N. ; Tanis J.A.<br />

Interference phenomena associated with electron-emission from H2 by (1-5)-MeV H* impact<br />

Physical Review A<br />

72 (<strong>2005</strong>) 010701/1 - 4<br />

Schumacher G. ; Chen W.<br />

Mechanical behaviour of single crystal superalloy SC16 under hold time LCF loading<br />

In: Creep & fracture in high temperature components : design & life assessment issues ; proceedings ;<br />

September 12-14, <strong>2005</strong>, London, eds. Shibli I.A.<br />

DEStech Publ, Lancaster, Pa., <strong>2005</strong>, 662 - 671<br />

Tökesi K. ; Sulik B. ; Stolterfoht N.<br />

Fermi-shuttle type multiple electron scattering in atomic collisions<br />

Nuclear Instruments and Methods in Physics Research B<br />

233 (<strong>2005</strong>) 187 - 190<br />

SF - BESSY<br />

Addenda to 2004<br />

SF2.BESSY<br />

Genzel Ch.<br />

Diffraction stress analysis in thin films and coatings--problems, methods and perspectives<br />

Journal of Neutron Research<br />

12 (2004) 233 - 241<br />

Genzel Ch. ; Stock C. ; Reimers W.<br />

Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the<br />

intermediate zone between surface and volume<br />

Materials Science and Engineering A<br />

372 (2004) 28 - 43<br />

A 20 <strong>Annual</strong> <strong>Report</strong> <strong>2005</strong>

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