Type Test Record for Digital Impulse Analyzers, Type MIA(S) - Highvolt

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Rise Time The measuring procedure has been carried out according to clause 1.5.5 of the standard IEC 61083-1. Test signal: step impulse Measured with Tektronix TDS5054 • input of internal divider tr = 1.3 ns • output of internal divider tr ≤ 1.8 ns Measured with MIAS 200-12/2 Sampling rate: 2GS/s (random interleaved sampling) The rise and fall time are measured with different values of the voltage. Requirements Rise time tr ≤ 15 ns (8.75 ns) Result tr = 2.75 ns Noise Level The measuring procedure was carried out according to clause 1.5.9.1 of the standard IEC 61083-1. Test signal: sine UPP = 1 V f = 9.83 MHz Requirements Noise level average ≤ 0.1 % Result Noise level average ≤ 0.001% Interference The measuring procedure was carried out according to clause 1.5.10 of the standard IEC 61083-1. Moreover, the crosstalk of two channels was tested. The test signal was connected to one channel. The second channel has been hot-wired. The FFT has been calculated and compared for both curves. Requirements Result Interference ≤ 1% Interference ≤ 0.1% Electromagnetic Compatibility (EMC) The measuring procedure has been carried out according to Annex B of the standard, performed and certified at TU Dresden / GWT. The EMC was tested regarding to: • Emitted interference This test is divided in: - Conducted emission - Rayed emission - Electromagnetic shielding • Electrostatic discharge (ESD) • High frequency fields (HF-fields) • Burst immunity test (level 3) • High frequency asymmetric © HIGHVOLT Prüftechnik Dresden GmbH - 0812 - 5-60-1-3.doc - Subject to change without prior notice
Summary of the Test During these tests no defects were observed. The digital impulse analyzer fulfils all requirements of IEC 61083-1 and IEC 61000-4-4. Voltage Drop The measuring procedure was carried out according to Annex B of the standard IEC 61083-1. Test conditions Duration of breaks: 0.5; 5; 50; 250 cycles Duration of tests: 5 breaks During the voltage drop of 0.5 and 5 cycles no failures were registered. After the voltage drop of 50 and 250 cycles the internal computer restarted and the connection for operating could be recovered. The test was passed. Surge Voltage - Input Voltage (Umax): 1000 V and 2000 V - Test signal Pulse form: LI, LIC - Voltages: 1 · Umax, 2 · Umax, 2.5 · Umax, 3 · Umax, 3.5 · Umax, 4 · Umax Two different input dividers were tested. At channel 1 the surge voltage has been impressed and at channel 2 this voltage has been controlled. The stressed channel has measured the voltage up to the limit of the measurement range. When the voltage fell below the limit of the measurement range the values have been recorded without any time lag. The test objects have passed the test successfully in all voltage levels. Static integral non-linearity (INL) The measuring procedure has been carried out according to clause 1.5.7 of the standard. Requirements INL ≤ ± 0.5 % Result INL ≤ ± 0.025% Static differential non-linearity (DNL) The measuring procedure has been carried out according to clause 1.5.7 of the standard. Requirements DNL ≤ ± 0.8 % Result DNL ≤ ± 0.2 % © HIGHVOLT Prüftechnik Dresden GmbH - 0812 - 5-60-1-3.doc - Subject to change without prior notice
Page 1 and 2: Data Sheet no. 5.60-1/3 Type Test R
Page 3: Step calibration, expanded measurin

Type Test Record for Digital Impulse Analyzers, Type MIA(S) - Highvolt

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