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SAXS data reduction for the absolute intensity scale

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<strong>SAXS</strong> <strong>data</strong> <strong>reduction</strong> <strong>for</strong> <strong>the</strong> <strong>absolute</strong> <strong>intensity</strong> <strong>scale</strong><br />

U-Ser Jeng, National Synchrotron Radiation Research Center, Taiwan<br />

Sep. 6. 2004<br />

The <strong>SAXS</strong> <strong>data</strong> normalized <strong>for</strong> scattering cross-section per unit sample volume<br />

is termed as "<strong>absolute</strong> <strong>intensity</strong> I(Q)". The <strong>absolute</strong> <strong>intensity</strong> <strong>scale</strong> <strong>for</strong> <strong>the</strong> <strong>SAXS</strong> <strong>data</strong><br />

is easy in comparing <strong>the</strong> scattering powers between different samples, measured at<br />

different instruments or different sample scattering volumes, and is also very useful in<br />

model fitting. <strong>SAXS</strong> <strong>data</strong> in <strong>the</strong> <strong>absolute</strong> scattering <strong>scale</strong> requires many details during<br />

<strong>the</strong> measurement. In practical measurements, <strong>the</strong> photons collected by <strong>the</strong> detector per<br />

second, namely, <strong>the</strong> scattering <strong>intensity</strong> Is(Q) of a sample is proportional to <strong>the</strong><br />

incident beam <strong>intensity</strong> Io, <strong>the</strong> scattering differential cross-section per unit volume of<br />

<strong>the</strong> sample I(Q) = (dΣ(Q)/dΩ)/V (defined as <strong>the</strong> <strong>absolute</strong> <strong>intensity</strong>, with <strong>the</strong> often used<br />

unit cm -1 ), <strong>the</strong> sample exposure area A (usually <strong>the</strong> beam size), sample thickness t,<br />

sample transmission T, <strong>the</strong> detector view angle <strong>for</strong> accepting photons ∆Ω (detector slit<br />

opening), and <strong>the</strong> detector efficiency e, and can be expressed as<br />

I o<br />

S ( Q)<br />

= I I(<br />

Q)<br />

A t T ∆Ω e.<br />

With Is(Q) measured, we can use (1) to factor out sample geometrical factors (t,<br />

T), and instrument parameters (Io, A, ∆Ω, and e), and extract <strong>the</strong> <strong>absolute</strong> <strong>intensity</strong><br />

I(Q). Such a process is called <strong>SAXS</strong> <strong>data</strong> <strong>reduction</strong>.<br />

During <strong>the</strong> <strong>data</strong> <strong>reduction</strong>, we usually can measure easily <strong>the</strong> sample thickness,<br />

sample transmission. As to o<strong>the</strong>r instrument-related factors, like incident flux, beam<br />

size, view angle, and detector efficiency, we often use a standard sample of known<br />

I(Q) to deduce <strong>the</strong> common instrument factor f (= IoA∆Ωe), using <strong>the</strong> Is(Q) measured<br />

under a specific instrumental setting (<strong>for</strong> instance <strong>the</strong> sample-to-detector distance,<br />

beam size, wavelength, and detector efficiency, <strong>the</strong> detecting view angle <strong>for</strong> each<br />

pixel).<br />

For <strong>data</strong> <strong>reduction</strong>, <strong>the</strong> in<strong>for</strong>mation of sample transmission is needed in Eq. (1).<br />

In optimizing <strong>the</strong> sample thickness in a <strong>SAXS</strong> measurement, we take <strong>the</strong> thickness<br />

derivative to (1), d(Is)/dt=0, and obtain an optimize sample transmission T = e -1 <strong>for</strong><br />

<strong>the</strong> best scattering <strong>intensity</strong>. From <strong>the</strong> optimized T, we can deduce <strong>the</strong> optimum<br />

sample thickness t = 1/µ, where µ is <strong>the</strong> absorption coefficient of <strong>the</strong> sample and can<br />

(1)


e found conveniently from <strong>the</strong> website:<br />

www-cxro.lbl.gov/optical_constants/atten2.html. Stable materials with high scattering<br />

<strong>intensity</strong>, <strong>for</strong> instance polyethylene (PE) of a known peak value I(Q) = 36.6 cm -1 at Q<br />

= 0.0223 Å -1 , can be used as secondary standard samples (see Figure 18). With a<br />

standard sample of known <strong>absolute</strong> I(Q) measured at a <strong>SAXS</strong> instrument, we can<br />

measure all o<strong>the</strong>r related quantities in (1), and determine <strong>the</strong> f factor <strong>for</strong> <strong>the</strong> <strong>SAXS</strong><br />

instrument configuration. Using this f factor in (1) <strong>for</strong> o<strong>the</strong>r samples, we can put <strong>the</strong><br />

scattering <strong>intensity</strong> of <strong>the</strong> samples in <strong>the</strong> <strong>absolute</strong> scattering <strong>intensity</strong> <strong>scale</strong> I(Q).<br />

In practical <strong>data</strong> <strong>reduction</strong>, we still need to consider <strong>the</strong> subtraction of<br />

background scattering, electronic dark current, and correction <strong>for</strong> <strong>the</strong> detector pixel<br />

efficiency. For a normalization <strong>for</strong> <strong>the</strong> time-dependent incoming flux <strong>for</strong> each<br />

measurement, we modify (1) to <strong>the</strong> following:<br />

dΣ(<br />

Q)<br />

I(<br />

Q)<br />

=<br />

dΩ<br />

1<br />

T<br />

s d s emp<br />

d emp<br />

fTmt<br />

Temp<br />

⎥ ⎥ ⎛ ⎞⎡<br />

⎤<br />

= ⎜<br />

⎟<br />

⎟⎢<br />

⎝ ⎠⎢⎣<br />

⎦<br />

(2)<br />

m<br />

( I ( Q)<br />

−cI<br />

( Q)<br />

) / i − ( I ( Q)<br />

−c"<br />

I ( Q)<br />

) / i / I ( Q)<br />

In (2), is, and iemp are <strong>the</strong> monitor counts of <strong>the</strong> incoming beam intensities <strong>for</strong> <strong>the</strong><br />

sample and background <strong>SAXS</strong> measurements. Whereas c and c'' are <strong>the</strong> time ratios of<br />

<strong>the</strong> sample and background scattering measurements to <strong>the</strong> dark current measurement,<br />

respectively. Tm is <strong>the</strong> sample transmission measured and Tem is <strong>the</strong> transmission<br />

measured without sample (air or pure solvent used), whereas Isen(Q) is <strong>the</strong> detector<br />

efficiency <strong>for</strong> <strong>the</strong> corresponding detector pixel. The working procedure <strong>for</strong> <strong>the</strong> <strong>data</strong><br />

<strong>reduction</strong> is detailed in <strong>the</strong> appendix A5.<br />

sen


PE Absolute Intensity dΣ(Q)/dΩ (cm -1 )<br />

10<br />

1<br />

0.1<br />

0.05 0.10<br />

Q (Å -1 )<br />

Figure 18. The commonly used high density polyethylene sample <strong>for</strong> <strong>the</strong> <strong>absolute</strong><br />

<strong>intensity</strong> calibration, with a well calibrated <strong>intensity</strong> at I (Q = 0.0223 Å -1 ) = 36.5 cm -1 .

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