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VIII.2. A Semiconductor Device Primer

VIII.2. A Semiconductor Device Primer

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With these simplifications the number of electrons in the conduction<br />

band in thermal equilibrium is<br />

or<br />

where Nc is the effective density of states at the band edge.<br />

Correspondingly, the hole concentration<br />

In a pure semiconductor<br />

where ni is the number of electrons or holes intrinsic to a pure<br />

semiconductor, i.e. where only source of mobile carriers is thermal<br />

excitation across the band gap without any additional impurity atoms<br />

or crystal imperfections that would allow other excitation<br />

mechanisms.<br />

Silicon (Eg = 1.12 eV): ni= 1.45 . 10 10 cm -3 at 300K<br />

Germanium (Eg = 0.66 eV): ni= 2.4 . 10 13 cm -3 at 300K<br />

For comparison:<br />

n<br />

n<br />

e<br />

e<br />

∝ ( k<br />

=<br />

p =<br />

N<br />

N<br />

c<br />

B<br />

v<br />

T )<br />

e<br />

3/<br />

2<br />

e<br />

−(<br />

E −E<br />

) / k T<br />

e<br />

c<br />

−(<br />

E<br />

n =<br />

p =<br />

F<br />

ni<br />

−(<br />

E −E<br />

) / k T<br />

The purest semiconductor material that has been fabricated<br />

is Ge with active impurity levels of about 3 . 10 10 cm -3 .<br />

F<br />

Introduction to Radiation Detectors and Electronics Copyright © 1998 by Helmuth Spieler<br />

<strong>VIII.2.</strong>a. A <strong>Semiconductor</strong> <strong>Device</strong> <strong>Primer</strong>, Doping and Diodes<br />

c<br />

B<br />

−E<br />

) / k T<br />

v<br />

B<br />

F<br />

B

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