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Texas Journal of Microscopy - Texas Society for Microscopy

Texas Journal of Microscopy - Texas Society for Microscopy

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Multiphase Materials<br />

Characterization<br />

Fully Integrated...Totally Seamless<br />

Powerful Analytical<br />

Tools Optimized <strong>for</strong><br />

Your SEM to Provide<br />

Results with Confidence<br />

• Pegasus...Simultaneous data acquisitions <strong>for</strong><br />

EDS (chemistry) and EBSD (crystallography)–<br />

Includes the patented ChI-Scan s<strong>of</strong>tware to improve<br />

multiphase analysis capability<br />

• Neptune...Complimentary union <strong>of</strong> EDS and<br />

WDS <strong>for</strong> superior X-ray microanalysis–Improves<br />

quantification especially <strong>for</strong> low level concentrations<br />

• Trident...Ultimate materials characterization<br />

system integrates EDS, EBSD, and WDS with no<br />

analytical per<strong>for</strong>mance compromise–Provides<br />

complete solutions <strong>for</strong> all your materials characterization<br />

requirements<br />

Results with Confidence<br />

As the world’s leader in Electron Beam Microanalysis,<br />

EDAX continues to raise the per<strong>for</strong>mance standard with<br />

innovative features that are easy to adapt and provides<br />

results that you can trust to be complete and accurate.<br />

For more in<strong>for</strong>mation on our Seamless Integrated Systems<br />

<strong>for</strong> EDS, EBSD, and WDS visit our web site at<br />

www.EDAX.com/integration or call 1.201.529.4880<br />

82 Tex. J. Micros. 37:2, 2006<br />

Morphology<br />

Chemistry<br />

Crystal Structure

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