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Collapse of polymer brushes grafted onto planar ... - Wageningen UR

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MORPHOLOGIES IN THIN TRIBLOCK COPOLYMER FILMS<br />

K.S. Lyakhova 1) , A. Horvat 2) , G.J.A. Sevink 2) , A.V. Zvelindovsky 1) , R. Magerle 2) ,<br />

J.G.E.M. Fraaije 1)<br />

1)<br />

S<strong>of</strong>t Condensed Matter Group, Leiden Institute <strong>of</strong> Chemistry,<br />

P.O. Box 9502, 2300 RA Leiden, The Netherlands<br />

2)<br />

Physicalishe Chemie II, University Bayreuth,<br />

D-95440 Bayreuth, Germany<br />

email: e.lyakhova@chem.leidenuniv.nl<br />

ABSTRACT<br />

The physics behind morphology formation in thin block co<strong>polymer</strong> films is not well understood. Recent<br />

experiments with free polystyrene- polybutadiene-polystyrene (SBS) films (in collaboration with Bayreuth<br />

University) result in complex morphologies, with terrace formation at integer domain distance film heights and<br />

connecting structures that are not present in bulk. In an article recently published [1], we compared these<br />

experiments with DDFT simulations for a geometry confined between two hard walls and symmetric <strong>polymer</strong>wall<br />

interaction. We identified two important parameters, the width <strong>of</strong> the slit and the surface interaction, and<br />

two relevant mechanisms: frustration and surface reconstruction. The experiments and the simulations match<br />

perfectly. In the present study, we extend our simulations to the more general case <strong>of</strong> asymmetric <strong>polymer</strong>wall<br />

interactions. The resulting asymmetry in surface reconstruction, combined with frustration, leads to a<br />

much richer phase diagram with many so-called hybrid structures. We compare the results to the symmetric<br />

phase diagram, and identify, similar to the symmetric case, the relevant mechanisms.<br />

Reference<br />

Knoll, A., Horvat, A., Lyakhova, K.S., Kraush, G., Sevink, G.J.A., Zvelindovsky, A.V., Magerle, R., 2002.<br />

Physical Review Letters 89 (3), 035501.

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