A Novel Defect Inspection Method for the TFT-LCD Image Based on ...
A Novel Defect Inspection Method for the TFT-LCD Image Based on ...
A Novel Defect Inspection Method for the TFT-LCD Image Based on ...
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at <strong>on</strong>ce. The tri-modal thresholding functi<strong>on</strong> fT ( x,<br />
y)<br />
is<br />
given by<br />
f T<br />
255<br />
if ( f ( x,<br />
y)<br />
m k<br />
)<br />
<br />
( x,<br />
y)<br />
128<br />
else if ( f ( x,<br />
y)<br />
m k<br />
)<br />
<br />
0<br />
else<br />
(10)<br />
Where, f ( x,<br />
y)<br />
is <str<strong>on</strong>g>the</str<strong>on</strong>g> gray level at positi<strong>on</strong> at ( x , y)<br />
, m , <br />
are <str<strong>on</strong>g>the</str<strong>on</strong>g> mean and standard deviati<strong>on</strong> respectively and k is<br />
c<strong>on</strong>trolled c<strong>on</strong>stant to access <str<strong>on</strong>g>the</str<strong>on</strong>g> amounts of abnormal gray<br />
level. After tri-modal thresholding <str<strong>on</strong>g>the</str<strong>on</strong>g> Bright Muras have<br />
value of 255, <str<strong>on</strong>g>the</str<strong>on</strong>g> Dark Muras have 128 and background<br />
regi<strong>on</strong> have value of 0.<br />
3.4 <str<strong>on</strong>g>Defect</str<strong>on</strong>g> Analysis<br />
The segmented result can have false defects such noise,<br />
neglectful small regi<strong>on</strong>, etc. So reliable defect c<strong>on</strong>firmati<strong>on</strong>,<br />
defect analysis process is needed. In this paper, HVS based<br />
false regi<strong>on</strong> eliminati<strong>on</strong> method is proposed. The noticeable<br />
Luminance difference is given by <str<strong>on</strong>g>the</str<strong>on</strong>g> Weber C<strong>on</strong>stant C Weber<br />
in <str<strong>on</strong>g>the</str<strong>on</strong>g> Weber regi<strong>on</strong> as <str<strong>on</strong>g>the</str<strong>on</strong>g> following Equati<strong>on</strong> (11) [11].<br />
C W eber<br />
L<br />
(11)<br />
L<br />
Where, L, L<br />
are <str<strong>on</strong>g>the</str<strong>on</strong>g> background regi<strong>on</strong> luminance and <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
luminance differences between <str<strong>on</strong>g>the</str<strong>on</strong>g> background regi<strong>on</strong> and<br />
defect regi<strong>on</strong>. We use C value as 0.02 in this paper.<br />
Weber<br />
4 Experimental Results<br />
The proposed method is tested by using <str<strong>on</strong>g>the</str<strong>on</strong>g> 160 real<br />
Muras and 40 generated <strong>on</strong>es. The acquired <str<strong>on</strong>g>TFT</str<strong>on</strong>g>-<str<strong>on</strong>g>LCD</str<strong>on</strong>g><br />
images have 400 m spatial resoluti<strong>on</strong> <str<strong>on</strong>g>for</str<strong>on</strong>g> each pixel and an<br />
8-bit brightness resoluti<strong>on</strong>. To evaluate <str<strong>on</strong>g>the</str<strong>on</strong>g> per<str<strong>on</strong>g>for</str<strong>on</strong>g>mance of<br />
proposed algorithm, <strong>on</strong>e dimensi<strong>on</strong>al line profile, <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
enhanced result image and final segmented Muras al<strong>on</strong>g<br />
with detecti<strong>on</strong> accuracy table are shown in this paper.<br />
The proposed defect detecti<strong>on</strong> results are shown in Fig. 7.<br />
The test image Fig. 7(a) has artificially generated Muras<br />
with various strengths and sizes. In <str<strong>on</strong>g>the</str<strong>on</strong>g> enhanced result<br />
image, Fig. 7(b), <str<strong>on</strong>g>the</str<strong>on</strong>g> defect is more visible than original<br />
image and that are evident in Fig.7 (e),(h),(k) also. The<br />
original image of Fig. 7(g) has much background variati<strong>on</strong>,<br />
so <str<strong>on</strong>g>the</str<strong>on</strong>g> defects are rarely seen in <str<strong>on</strong>g>the</str<strong>on</strong>g> original image. But <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
enhanced image has relatively flattening background and <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
defects are more salient. In <str<strong>on</strong>g>the</str<strong>on</strong>g> test image Fig. 7(j), novel<br />
enhancement result is given and that helps final<br />
segmentati<strong>on</strong> result.<br />
(a) (b) (c)<br />
(d) (e) (f)<br />
(g) (h) (i)<br />
(j) (k) (l)<br />
Fig. 7 The results of proposed methods. (a),(d),(g),(j) are test images,<br />
(b),(e),(h),(k) are enhanced results and (c),(f),(i),(l) are final segmented<br />
results of original image (a),(d),(g),(j) respectively.<br />
The microscopic enhancement results by <str<strong>on</strong>g>the</str<strong>on</strong>g> line profiles are<br />
shown in Fig. 8. Fig. 8 is <str<strong>on</strong>g>the</str<strong>on</strong>g> enhancement results’ profiles<br />
of Fig. 7. By that, <str<strong>on</strong>g>the</str<strong>on</strong>g> effectiveness of our algorithm is seen<br />
more clearly. In <str<strong>on</strong>g>the</str<strong>on</strong>g> filtered line profile results, our proposed<br />
enhancement method can flatten <str<strong>on</strong>g>the</str<strong>on</strong>g> background signal<br />
fluctuati<strong>on</strong> and emphasize <str<strong>on</strong>g>the</str<strong>on</strong>g> defect regi<strong>on</strong>.<br />
The final per<str<strong>on</strong>g>for</str<strong>on</strong>g>mance results are summarized in Table 1.<br />
false-positive and false-negative measure are used to<br />
evaluate <str<strong>on</strong>g>the</str<strong>on</strong>g> accuracy of defect detecti<strong>on</strong> result. There are<br />
some problems to <str<strong>on</strong>g>the</str<strong>on</strong>g> eliminati<strong>on</strong> of defects existing at <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
boundary regi<strong>on</strong> and very weak-small-size defects. Except<br />
such cases, <str<strong>on</strong>g>the</str<strong>on</strong>g> false-positive rate and false-negative rate are<br />
quite acceptable.<br />
Table 1. Experimental results <str<strong>on</strong>g>for</str<strong>on</strong>g> <str<strong>on</strong>g>the</str<strong>on</strong>g> detecti<strong>on</strong> of <str<strong>on</strong>g>the</str<strong>on</strong>g><br />
Muras.<br />
Number of<br />
<str<strong>on</strong>g>Defect</str<strong>on</strong>g>s<br />
False-positive Falsenegative<br />
Artificially<br />
Generated Mura<br />
160 0.04 0.03<br />
Real Mura 40 0.03 0.02