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Jean-Louis Malinge - EEWeb

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TECHNICAL Roger Stout ARTICLE<br />

Back in the days when most electronics components<br />

were packaged in metal cans (or manufactured as axial<br />

leaded devices with equipment housings generally<br />

spacious and un-crowded), matters of device level<br />

thermal management were relatively straightforward<br />

for design engineers. Sadly, thermal management has<br />

become much more of a challenge nowadays – both to<br />

understand and to tackle; with multi-pin plastic packaged<br />

devices in ever-shrinking formats being incorporated<br />

into high component density portable electronics with<br />

considerable pressure being placed on available space<br />

and overall power efficiency.<br />

The following article details some of the key areas of<br />

concern in regard to device level thermal management<br />

in modern electronic products, with explanations of the<br />

fundamental theory behind it as well as some practical<br />

considerations.<br />

First principles<br />

Senior Research Scientist<br />

Thermal<br />

Basics of<br />

Complex<br />

Devices<br />

As we all know from basic thermodynamics, heat energy<br />

will flow from a higher temperature region to a lower<br />

temperature region (this being done through either<br />

conduction, convection, radiation or often a combination<br />

of these). Furthermore, the bigger the temperature<br />

difference witnessed, the greater the flow of heat will be.<br />

Historically, for discrete devices, the ‘junction’ referred to<br />

in the term junction temperature (TJ) was the PN junction<br />

of the device. Though this is true for basic rectifiers,<br />

bipolar transistors, etc, the junction now generally refers<br />

to the hottest point within the device. As we move towards<br />

more complex device constructions where different<br />

parts of the silicon have different functions at different<br />

times, locating the precise position of this point can be<br />

very difficult.<br />

A common misconception often held by engineers is that<br />

a device’s thermal resistance is an intrinsic property of<br />

the package in which it is enclosed. Among the reasons<br />

why this does not hold true is the fact that there is no<br />

isothermal surface, making it impossible to define a<br />

‘case’ temperature. Though the metal can devices of the<br />

past had a relatively good approximation of an isothermal<br />

surface, modern plastic packages tend to exhibit quite<br />

large gradients. Furthermore, in modern package types<br />

<strong>EEWeb</strong> | Electrical Engineering Community Visit www.eeweb.com 17<br />

TECHNICAL ARTICLE

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