syllabus-Mat Charac 2552_280552_ Eng

GRADING Mid-term examination 40%
Final examination 40%
Homework and assignment 20%
LECTURE SCHEDULE
Week Topic Person in charge
1 Orientation All
2 Introduction to surface analysis and X-ray Photoelectron Spectroscopy (XPS) WPR
3 Auger Electron Spectroscopy (AES) WPR
4 Secondary Ion Mass Spectrometry (TOF-SIMS) WPR
5 Microscopic techniques for surface science (AFM, MFM and STM) WPR
6 X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) TRN
7 Nuclear magnetic Resonance Spectroscopy (NMR) TRN
8 Midterm examination
9 Electron Microscopy (SEM, TEM) TRN
10 Electrochemical Impedance Spectroscopy (EIS) TRN
11 Mechanical property analysis I SOJ
12 Mechanical property analysis II SOJ
13 Thermal analysis I SOJ
14 Thermal analysis II SOJ
15 Student presentations TRN, WPR, SOJ
16 Final examination
TEXTBOOKS AND OTHER MATERIALS
1. E.N. Kaufmann (ed.): Characterization of Materials, Vol.1&2, Hoboken, New Jersey, John Wiley & Sons, Inc.,
2003.
2. J.M. Walls and R. Smith (ed.): Surface Science Techniques, Leicestershire, Pergamon, 1994.
3. T. Hatakeyama and Z. Liu (ed.): Handbook of Thermal Analysis, Chichester, John Wiley & Sons, Inc., 1998.
4. Skoog DA and Leary JJ, Principles of Instrumental Analysis, 4 th ed. Orlando: Saunders College Publishing,
1992.
5. Ewing GW, Instrumental Methods of Chemical Analysis, 5 th ed. Singapore, McGraw-Hill Book Co., 1985.
6. Christian GD and O’Reilly JE, Instrumental Analysis, 2 nd ed. Massachusetts: Allyn and Bacon, Inc., 1986.
2