syllabus-Mat Charac 2552_280552_ Eng

Advanced Material Characterization (991002) Semester 1/2552
Department of Industrial Chemistry, Faculty of Applied Science
King Mongkut’s University of Technology North Bangkok
COURSE DESCRIPTION
This course presents instrumentation principles and use of various material characterization techniques.
Topics include spectroscopy (NMR, EIS), X-ray methods (XRD, XRF), optical, electron and force microscopies (OPM,
SEM, TEM, AFM), surface analysis (XPS, AES, SIMS), mechanical and electrical properties testing and thermal
analysis (DSC, TGA).
COURSE OBJECTIVES
• To introduce students to the chemical and structural nature of materials as determined using
microscopy, diffraction, spectroscopy and calorimetry.
• To introduce students to various surface analysis techniques and their applications in materials science.
• To teach students the connection between properties and appropriate characterization techniques in
order to determine properties of materials.
COURSE OUTCOMES
At the end of the semester, the students will be able to:
• Describe the use of specific characterization techniques in different applications including the
advantages and disadvantages of the various types of techniques for specific materials analysis.
• Apply the principles of materials science and engineering to the selection of characterization
techniques.
• Enhance their group-working skills through in-class discussions and assignments.
• Analyze and interpret data available in the scientific literature.
GENERAL COURSE INFORMATION
Classroom:
Wednesday 1.00 pm – 4.00 pm
Instructors Course meeting Room e-mail
1. Dr. Walaiporn Prissanaroon Ouajai (WPR) M 2.00 pm – 4.00 pm 78-805 pwalaip@hotmail.com
2. Dr. Tanakorn Ratana (TRN) T 9.00 am – 4.00 pm 78-8064 tanakornr@kmutnb.ac.th
3. Dr. Sirisart Ouajai (SOJ) M 2.00 pm – 4.00 pm 78-807 soj@kmutnb.ac.th
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GRADING Mid-term examination 40%
Final examination 40%
Homework and assignment 20%
LECTURE SCHEDULE
Week Topic Person in charge
1 Orientation All
2 Introduction to surface analysis and X-ray Photoelectron Spectroscopy (XPS) WPR
3 Auger Electron Spectroscopy (AES) WPR
4 Secondary Ion Mass Spectrometry (TOF-SIMS) WPR
5 Microscopic techniques for surface science (AFM, MFM and STM) WPR
6 X-ray Diffraction (XRD) and X-ray Fluorescence (XRF) TRN
7 Nuclear magnetic Resonance Spectroscopy (NMR) TRN
8 Midterm examination
9 Electron Microscopy (SEM, TEM) TRN
10 Electrochemical Impedance Spectroscopy (EIS) TRN
11 Mechanical property analysis I SOJ
12 Mechanical property analysis II SOJ
13 Thermal analysis I SOJ
14 Thermal analysis II SOJ
15 Student presentations TRN, WPR, SOJ
16 Final examination
TEXTBOOKS AND OTHER MATERIALS
1. E.N. Kaufmann (ed.): Characterization of Materials, Vol.1&2, Hoboken, New Jersey, John Wiley & Sons, Inc.,
2003.
2. J.M. Walls and R. Smith (ed.): Surface Science Techniques, Leicestershire, Pergamon, 1994.
3. T. Hatakeyama and Z. Liu (ed.): Handbook of Thermal Analysis, Chichester, John Wiley & Sons, Inc., 1998.
4. Skoog DA and Leary JJ, Principles of Instrumental Analysis, 4 th ed. Orlando: Saunders College Publishing,
1992.
5. Ewing GW, Instrumental Methods of Chemical Analysis, 5 th ed. Singapore, McGraw-Hill Book Co., 1985.
6. Christian GD and O’Reilly JE, Instrumental Analysis, 2 nd ed. Massachusetts: Allyn and Bacon, Inc., 1986.
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