Test Fixtures - Feinmetall GmbH
Test Fixtures - Feinmetall GmbH
Test Fixtures - Feinmetall GmbH
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24<br />
Vacuum-<strong>Fixtures</strong><br />
Dual stage contacting for combined ICT and functional test<br />
Dual stage fixtures are used for combining an in-circuit test<br />
and a functional test in one test fixture. For the in-circuit<br />
test the board is contacted by all spring contact probes. Due<br />
to a reduced travel of the following functional test only<br />
the long travel probes are contacting the DUT. The different<br />
travels are realized by shifting plates.<br />
Shifting plate enables<br />
different travels<br />
Shifting actuator<br />
ICT contacting<br />
Dual stage contacting from top<br />
A dual stage contacting is also possible from the top side<br />
of the board. This mechanically sophisticated solution is<br />
realized by a clever design of the shifting plate and allows<br />
different travels even at limited space.<br />
FCT contacting<br />
ICT-Probes<br />
(do not contact during<br />
functional test)<br />
Height proportions and contact probe selection for dual stage fixtures<br />
Combination of probes for<br />
dual stage fixtures:<br />
ICT<br />
FCT<br />
50 mil F050 F051<br />
50 mil F767 F788<br />
75 mil F075/F703 F793<br />
100 mil F100/F585 F588<br />
For realizing dual stage fixtures spring contact probes of different lengths are needed. The projection heights of the<br />
probes need to be selected in a way that for the ICT level all probes are contacting the DUT whereas for the FCT only<br />
the long travel probes are contacting the DUT. Additionally, by chosing shorter or longer versions of each probe the<br />
height differences between wired components and solder pads can be adjusted.
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