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Volume 26 Number 12 SPECTROSCOPY CORPORATE CAPABILITIES ISSUE December 2011<br />

December 2011 Volume 26 Number 12<br />

®<br />

www.spectroscopyonline.com<br />

<strong>2012</strong> <strong>Corporate</strong><br />

<strong>Capabilities</strong><br />

Online FT-IR <strong>Spectroscopy</strong><br />

for Characterizing Chemical<br />

Process Streams<br />

2011 Editorial Index<br />

Application Notes ♦ See page 93


You are<br />

confident<br />

In business and in the research lab, your confidence depends on accurate<br />

analysis from versatile, innovative instruments that improve productivity<br />

and enhance your knowledge. Thermo Scientific spectroscopy integrates<br />

proven technology with robust, simplified operation and software that<br />

removes ambiguity, making the technique more valuable than ever<br />

before. Whatever the future holds, you are confident.<br />

in every<br />

spectroscopic analysis<br />

• www.thermoscientific.com/confident<br />

Nicolet 6700 FT-IR Spectrometer<br />

Combines flexibility and certainty<br />

in FT-IR<br />

DXR Raman Microscope<br />

Gives actionable answers quickly<br />

and precisely<br />

© 2011 Thermo Fisher Scientific Inc. All rights reserved.<br />

Antaris II FT-NIR Analyzer<br />

Delivers laboratory performance on<br />

the production floor<br />

NanoDrop 2000 UV-Visible<br />

Fast and easy micro-volume<br />

measurements


Is AA dead?<br />

Are ICP/MIPS the future for QAQC analysis?<br />

ON-DEMAND WEBCAST:<br />

Register free at www.spectroscopyonline.com/AA<br />

EVENT OVERVIEW:<br />

Atomic Absorption (AA) has been a routine trace elemental<br />

analytical technique for over 50 years, and it<br />

is used extensively throughout the world. With the<br />

appearance of microwave induced plasma spectroscopy<br />

(MIPS) and lower priced optical inductively<br />

coupled plasma spectrometers (ICP-OES), has the day<br />

come when AA is ready to be replaced by faster analysis<br />

techniques?<br />

Key Learning Objectives:<br />

n Understand the cost base and<br />

comparative capabilities of AA, ICP, and<br />

Microwave Induced Plasma <strong>Spectroscopy</strong><br />

(MIPS)<br />

n Get insight into the future prospects for AA<br />

n Gain a greater degree of clarity about<br />

the analytical roadmap available for your<br />

laboratory following the introduction of<br />

MIPS into the market<br />

The web seminar will compare these three technique<br />

options in terms of their costs and their ability to<br />

address different types of samples. Thoughts on the<br />

future of trace elemental analysis in the short term<br />

(1-3 years) and beyond will also be presented. We will<br />

answer the big question: “What is the analysis roadmap<br />

for your laboratory?”<br />

Who Should Attend:<br />

n Current AA users<br />

n Laboratory personnel conducting trace<br />

elemental analysis<br />

n Laboratory managers with future<br />

requirements to do trace elemental<br />

analysis<br />

n Regulatory compliant enforcers<br />

n QA/QC analysts<br />

n Anyone interested in AA, ICP and MIPS<br />

Presented by<br />

Presenter:<br />

Adrian Holley<br />

Marketing Director,<br />

Trace Elemental Analysis<br />

Thermo Fisher Scientific<br />

Moderator:<br />

Laura Bush<br />

Editorial Director<br />

<strong>Spectroscopy</strong><br />

Sponsored by<br />

For questions contact Jamie Carpenter at jcarpenter@advanstar.com


te<br />

4 <strong>Spectroscopy</strong> 26(12) December 2011<br />

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Publisher, efantuzzi@advanstar.com<br />

Stephanie Shaffer<br />

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(508) 481-5885<br />

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Laura Bush<br />

Editorial Director, lbush@advanstar.com<br />

Megan Evans<br />

Managing Editor, mevans@advanstar.com<br />

Stephen A. Brown<br />

Group Technical Editor, sbrown@advanstar.com<br />

Cindy Delonas<br />

Associate Editor, cdelonas@advanstar.com<br />

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Art Director, dward@media.advanstar.com<br />

MARKETING<br />

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MARKET DEvELOPMENT<br />

Tamara Phillips<br />

Direct List Rentals, tphillips@advanstar.com<br />

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Reprints, advanstarreprints@theYGSgroup.com<br />

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©2011 Advanstar Communications Inc. All rights reserved. No part of this publication may<br />

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Advanstar Communications Inc. provides certain customer contact data (such as customers’<br />

names, addresses, phone numbers, and e-mail addresses) to third parties who wish to promote<br />

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To subscribe, call toll-free 877-527-7008. Outside the U.S. call 218-740-6477.<br />

Advanstar Communications Inc. (www.advanstar.com) is a leading worldwide media company<br />

providing integrated marketing solutions for the Fashion, Life Sciences and Powersports<br />

industries. Advanstar serves business professionals and consumers in these industries with its<br />

portfolio of 91 events, 67 publications and directories, 150 electronic publications and Web<br />

sites, as well as educational and direct marketing products and services. Market leading brands<br />

and a commitment to delivering innovative, quality products and services enables Advanstar<br />

to “Connect Our Customers With Theirs.” Advanstar has approximately 1000 employees and<br />

currently operates from multiple offices in North America and Europe.<br />

Joseph Loggia<br />

President, Chief Executive Officer<br />

Theodore S. Alpert<br />

Executive Vice-President, Finance & Chief Financial Officer<br />

Tony Calanca<br />

Executive Vice-President, Exhibitions<br />

Georgiann DeCenzo<br />

Executive Vice-President, Licensing, Market Development & Europe<br />

Chris DeMoulin<br />

Executive Vice-President, Fashion & President MAGIC International<br />

Thomas Ehardt<br />

Executive Vice-President, Chief Administrative Officer<br />

Eric I. Lisman<br />

Executive Vice-President, <strong>Corporate</strong> Development<br />

Daniel Phillips<br />

Executive Vice-President, Powersports, Dental & Veterinary<br />

Andrew Pollard<br />

Executive Vice-President, Fashion & President, PROJECT<br />

Steve Sturm<br />

Executive Vice-President, Chief Marketing Officer<br />

Ron Wall<br />

Executive Vice-President, Pharmaceutical/Science & CBI<br />

Francis Heid<br />

Vice-President, Media Operations<br />

J vaughn<br />

Vice-President, Information Technology<br />

Mike Alic<br />

Vice-President, Electronic Media Group<br />

Nancy Nugent<br />

Vice-President, Human Resources<br />

Ward D. Hewins<br />

Vice-President, General Counsel<br />

David C. Esola<br />

Vice-President, General Manager<br />

Peter Houston<br />

Director of Content


DISTINCTLY<br />

BETTER<br />

MOLECULAR SPEC<br />

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© Agilent Technologies, Inc. 2011<br />

To learn more about Agilent’s Cary Molecular <strong>Spectroscopy</strong> portfolio, visit<br />

www.agilent.com/chem/molecular


6 <strong>Spectroscopy</strong> 26(12) December 2011<br />

®<br />

CONTENTS<br />

Columns<br />

www.spectroscopyonline.com<br />

Volume 26 Number 12<br />

DECEMBER 2011<br />

December 2011<br />

Volume 26 Number 12<br />

THE BASELINE 10<br />

Maxwell’s Equations, Part IV<br />

A discussion of magnetism, leading into Maxwell’s second equation<br />

David W. Ball<br />

FOCUS ON QUALITY 14<br />

USP and the GAMP Guide on Laboratory<br />

Computerized Systems — Is Integration Possible?<br />

Here’s what needs to be done to harmonize these two documents.<br />

R.D. McDowall and C. Burgess<br />

Articles<br />

Temporary Online FT-IR <strong>Spectroscopy</strong> for Process 21<br />

Characterization in the Chemical Industry<br />

Case studies involving fouling and product quality illustrate the effective use of this method.<br />

Serena Stephenson, Lamar Dewald, Esteban Baquero, Wendy Flory, Liane Mikolajczyk, and J.D. Tate<br />

Cover image courtesy of<br />

Frederic Cirou/Getty Images.<br />

2011 Editorial Index 26<br />

<strong>Spectroscopy</strong> presents its annual index of authors and articles.<br />

ON THE WEB<br />

FREE WEB SEMINARS<br />

Is AA Dead? Or Is ICP/MIPS the Future<br />

for QA–QC Analysis?<br />

Adrian Holley, Thermo Fisher Scientific<br />

Raman <strong>Spectroscopy</strong> for<br />

Pharmaceutical Product Development<br />

and Manufacturing<br />

Dimuthu Jayawickrama, Senior Research<br />

Investigator, Bristol-Myers Squibb<br />

Raman <strong>Spectroscopy</strong> and Imaging<br />

in Biomedical Research<br />

Igor Chourpa, Professor of Analytical<br />

Chemistry, University of Tours (France)<br />

RF-GD-OES for Depth Profile Analysis:<br />

A Complementary Technique to SIMS<br />

Fuhe Li, Air Liquide–Balazs NanoAnalysis<br />

spectroscopyonline.com/webseminars<br />

INTERVIEW: MID-IR IMAGING<br />

In a new interview, Rohit Bhargava of the<br />

University of Illinois explains the theory of<br />

resolution in mid-IR imaging.<br />

spectroscopyonline.com/imagingtheory<br />

Join the<br />

<strong>Spectroscopy</strong> Group<br />

on LinkedIn<br />

Application Notes: Mass Spectrometry<br />

Simultaneous Qualitative and Quantitative Analysis of Buspirone 93<br />

and Its Metabolites with the Agilent 6550 iFunnel Q-TOF LC–MS System<br />

Yuqin Dai, Michael Flanagan, and Keith Waddell, Agilent Technologies, Inc.<br />

Application Notes: Molecular <strong>Spectroscopy</strong><br />

Long-Wavelength Dispersive 1064 nm Raman: 94<br />

In-Line Pharmaceutical Compound Identification<br />

Clare Dentinger, Steven Pullins, and Eric Bergles, BaySpec, Inc.<br />

Determination of Low Concentration Methanol in Alcohol by 95<br />

an Affordable High Sensitivity Raman Instrument<br />

Duyen Nguyen and Eric Wu, Enwave Optronics, Inc.<br />

Optical Compensation in Variable Angle Transmission 96<br />

Measurements of Thick Samples<br />

S. L. Berets, Harrick Scientific Products, and M. Milosevic, MeV Consulting<br />

Near Infrared <strong>Spectroscopy</strong> Is a Useful Tool 97<br />

in Photovoltaics Panel Development<br />

Rob Morris and Andrew Tatsch, Ocean Optics<br />

Mid-Infrared Reflectivity Measurements of Diffuse Materials 98<br />

Jenni L. Briggs, PIKE Technologies<br />

<strong>Spectroscopy</strong> (ISSN 0887-6703 [print], ISSN 1939-1900 [digital]) is published monthly by Advanstar Communications, Inc.,<br />

131 West First Street, Duluth, MN 55802-2065. <strong>Spectroscopy</strong> is distributed free of charge to users and specifiers of spectroscopic<br />

equipment in the United States. <strong>Spectroscopy</strong> is available on a paid subscription basis to nonqualified readers at the rate of:<br />

U.S. and possessions: 1 year (12 issues), $74.95; 2 years (24 issues), $134.50. Canada/Mexico: 1 year, $95; 2 years, $150. International:<br />

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offices. POSTMASTER: Send address changes to <strong>Spectroscopy</strong>, P.O. Box 6196, Duluth, MN 55806-6196. PUBLICATIONS MAIL<br />

AGREEMENT NO. 40612608, Return Undeliverable Canadian Addresses to: Pitney Bowes, P. O. Box 25542, London, ON N6C<br />

6B2, CANADA. Canadian GST number: R-124213133RT001. Printed in the U.S.A.


www.spectroscopyonline.com December 2011 26(12) <strong>Spectroscopy</strong> 7<br />

December 2011 Volume 26 Number 12<br />

<strong>2012</strong> <strong>Corporate</strong> <strong>Capabilities</strong><br />

36 1st Detect Corp.<br />

37 Agilent Technologies, Inc.<br />

38 ABB Analytical Measurements<br />

40 Amptek, Inc.<br />

42 Andor Technology<br />

43 Applied Photophysics<br />

44 Avantes, Inc.<br />

45 B&W Tek, Inc.<br />

46 Bruker Daltonics<br />

48 Bruker Corporation<br />

49 CVI Melles Griot<br />

50 EDAX, Inc.<br />

52 Edinburgh Instruments<br />

53 Energetiq Technology, Inc.<br />

54 Enwave Optronics, Inc.<br />

55 Hamamatsu Corporation<br />

56 Glass Expansion<br />

58 Harrick Scientific Products, Inc.<br />

59 Hellma USA, Inc.<br />

60 HORIBA Scientific<br />

61 International Centre for<br />

Diffraction Data<br />

62 Iridian Spectral Technologies Ltd.<br />

64 International Crystal<br />

Laboratories<br />

65 Meinhard<br />

66 Moxtek, Inc.<br />

68 Milestone Inc.<br />

69 Nippon Instruments<br />

North America<br />

70 Ocean Optics<br />

72 OI Analytical<br />

73 OptiGrate Corp.<br />

74 Optometrics Corporation<br />

75 Oriel Instruments<br />

76 Parker Hannifin Corporation<br />

Filtration and Separation Division<br />

77 Photonis USA<br />

78 PerkinElmer, Inc.<br />

80 PerkinElmer, Inc.<br />

82 PIKE Technologies<br />

84 Polymicro Technologies,<br />

A subsidiary of Molex Incorporated<br />

85 Rigaku Corporation<br />

86 Shimadzu Scientific Instruments<br />

88 SPEX CertiPrep<br />

89 Teledyne Leeman Labs<br />

90 Thermo Fisher Scientific<br />

91 Waters Corporation<br />

92 WITec GmbH


8 <strong>Spectroscopy</strong> 26(12) December 2011<br />

www.spectroscopyonline.com<br />

Editorial Advisory Board<br />

Ramon M. Barnes University of Massachusetts<br />

Paul N. Bourassa Unity Home Medical<br />

Deborah Bradshaw Consultant<br />

Kenneth L. Busch Wyvern Associates<br />

Ashok L. Cholli University of Massachusetts at Lowell<br />

David M. Coleman Wayne State University<br />

Bruce Hudson Syracuse University<br />

David Lankin University of Illinois at Chicago, College of Pharmacy<br />

Barbara S. Larsen DuPont Central Research and Development<br />

Ian R. Lewis Kaiser Optical Systems<br />

Jeffrey Hirsch Thermo Fisher Scientific<br />

Howard Mark Mark Electronics<br />

R.D. McDowall McDowall Consulting<br />

Gary McGeorge Bristol-Myers Squibb<br />

Linda Baine McGown Rensselaer Polytechnic Institute<br />

Robert G. Messerschmidt Rare Light, Inc.<br />

Francis M. Mirabella Jr. Mirabella Practical Consulting Solutions, Inc.<br />

John Monti Montgomery College<br />

Thomas M. Niemczyk University of New Mexico<br />

Anthony J. Nip CambridgeSoft Corp.<br />

John W. Olesik The Ohio State University<br />

Richard J. Saykally University of California, Berkeley<br />

Jerome Workman Jr. Unity Scientific<br />

Contributing Editors:<br />

Fran Adar Horiba Jobin Yvon<br />

David W. Ball Cleveland State University<br />

Kenneth L. Busch Wyvern Associates<br />

Howard Mark Mark Electronics<br />

Volker Thomsen Consultant<br />

Jerome Workman Jr. Unity Scientific<br />

Process Analysis Advisory Panel:<br />

James M. Brown Exxon Research and Engineering Company<br />

Bruce Buchanan Sensors-2-Information<br />

Lloyd W. Burgess CPAC, University of Washington<br />

James Rydzak Glaxo SmithKline<br />

Robert E. Sherman CIRCOR Instrumentation Technologies<br />

John Steichen DuPont Central Research and Development<br />

D. Warren Vidrine Vidrine Consulting<br />

European Regional Editors:<br />

John M. Chalmers VSConsulting, United Kingdom<br />

David A.C. Compton Industrial Chemicals Ltd.<br />

<strong>Spectroscopy</strong>’s Editorial Advisory Board is a group of distinguished individuals<br />

assembled to help the publication fulfill its editorial mission to promote the effective<br />

use of spectroscopic technology as a practical research and measurement tool.<br />

With recognized expertise in a wide range of technique and application areas, board<br />

members perform a range of functions, such as reviewing manuscripts, suggesting<br />

authors and topics for coverage, and providing the editor with general direction and<br />

feedback. We are indebted to these scientists for their contributions to the publication<br />

and to the spectroscopy community as a whole.<br />

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www.spectroscopyonline.com<br />

News Spectrum<br />

New Website for PIKE<br />

PIKE Technologies (Madison, Wisconsin) debuted a new<br />

company website, www.piketech.com in October. The company,<br />

which manufacturers sampling accessories for Fourier-transform<br />

infrared (FT-IR), near infrared, and ultraviolet–visible (UV–vis)<br />

spectrometers, offers a list of all PIKE products, information<br />

about spectroscopy theory and sampling techniques, multiple<br />

application notes, and other technology and industry-related<br />

details on its website.<br />

The PIKE home page provides an interactive infrared<br />

crystal properties chart and an FT-IR calculator for wavelength<br />

conversions, sample thickness, and average true range<br />

calculations. The website’s search function generates product<br />

information, and there is an online form available for order<br />

placement and quote requests.<br />

Sabine Becker Wins the <strong>2012</strong><br />

Winter Conference Award in<br />

Plasma Spectrochemistry<br />

J. Sabine Becker, the head of trace and ultratrace analysis in<br />

the Central Division of Analytical Chemistry at the Research<br />

Center Juelich, in Juelich, Germany, has won the <strong>2012</strong> Winter<br />

Conference Award in Plasma Spectrochemistry, sponsored by<br />

Thermo Fisher Scientific (San Jose, California). Thermo Fisher will<br />

present the award and a check for $5000 to Becker during the<br />

<strong>2012</strong> Winter Conference on Plasma Spectrochemistry, to be held<br />

in Tucson, Arizona, January 9–14, <strong>2012</strong>.<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 9<br />

Becker’s career in analytical chemistry has focused<br />

on long-lived radionuclides, ultratrace and high-purity<br />

materials analysis, isotope ratio measurements, and<br />

micro- and nanolocal elemental and trace analyses.<br />

Recently she established BrainMet, an Analytical Center<br />

of Excellence at the Research Centre Juelich for brain<br />

research imaging. Based on laser ablation inductively<br />

coupled plasma mass spectrometry (LA-ICP-MS),<br />

BrainMet has introduced novel imaging techniques for<br />

metals, metalloids, and nonmetals in biological tissues.<br />

The approach provides quantitative mapping of essential<br />

and toxic elements in thin sections of diseased and<br />

healthy medical and biological tissue sections.<br />

The Winter Conference Award in Plasma Spectrochemistry,<br />

established in 2009, recognizes scientists who have<br />

made noteworthy contributions over time or through a<br />

single, significant breakthrough. The award acknowledges<br />

achievements in the conceptualization and development<br />

of novel instrumentation as well as the elucidation of<br />

fundamental events or processes involved in plasma<br />

spectrochemistry. Winners include authors of significant<br />

research papers or books that influence new advancements<br />

or pioneers of outstanding new applications that benefit the<br />

field of plasma spectrochemistry.<br />

Applications for the next Winter Plasma Award in 2014 may<br />

be submitted until December 31, <strong>2012</strong>. Further information is<br />

available at www.thermoscientific.com/wpcaward. ◾<br />

Market Profile: Microvolume UV–vis <strong>Spectroscopy</strong><br />

Microvolume UV–vis is a relatively new segment of<br />

the UV–vis spectroscopy market that has seen very<br />

rapid development. There are a variety of purpose-built<br />

microvolume instruments as well as adaptor accessories<br />

now on the market, most of which are designed for<br />

bioanalysis applications. Several major instrument<br />

vendors compete in the market, although Thermo<br />

Scientific still dominates.<br />

Microvolume UV–vis<br />

spectrophotometers can analyze<br />

sample sizes of under 5 μL, and<br />

in some cases, as small as 0.5<br />

μL. There are now a variety of<br />

microvolume UV–vis instruments<br />

on the market that are specifically<br />

designed for the analysis of such<br />

volumes. Vendors have also<br />

2011 microvolume UV–vis vendor share.<br />

developed a wide range of sampling accessories to allow<br />

for microvolume analysis using conventional UV–vis<br />

instruments. Microvolume spectroscopy was developed<br />

largely to address the needs of those performing<br />

bioanalysis, including the quantitation of DNA, RNA, and<br />

proteins. The conservation of samples is often a major<br />

issue for these end-users.<br />

7% 10% Shimadzu<br />

12%<br />

71%<br />

GE Life Sciences<br />

Other<br />

The market for microvolume UV–vis is expected to<br />

be near $80 million for 2011. Despite broad economic<br />

headwinds coming in <strong>2012</strong>, demand for microvolume<br />

UV–vis should continue to grow due to the expansion of<br />

the biotechnology and clinical analysis industries, as well as<br />

the continued adoption of the technique. Thermo Scientific,<br />

which acquired the first major developer of microvolume<br />

spectrophotometers, Nanodrop,<br />

is the strong leader in the market.<br />

Thermo Scientific<br />

Shimadzu and GE Healthcare are the<br />

other two major competitors. Several<br />

smaller vendors have since developed<br />

their own versions of dedicated<br />

microvolume instruments.<br />

The foregoing data were based<br />

on SDi’s market analysis and<br />

perspectives report entitled Global<br />

Assessment Report, 11th Edition: The Laboratory Life<br />

Science and Analytical Instrument Industry, October<br />

2010. For more information, contact Stuart Press, Vice<br />

President — Strategic Analysis, Strategic Directions<br />

International, Inc., 6242 Westchester Parkway, Suite 100,<br />

Los Angeles, CA 90045, (310) 641-4982, fax: (310)<br />

641-8851, www.strategic-directions.com.


10 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

The Baseline<br />

Maxwell’s Equations, Part IV<br />

The fourth part of this series continues our explanation of Maxwell’s equations, the seminal classical<br />

explanation of electricity and magnetism (and, ultimately, light). For those of you new to the<br />

series, consider reading the last few appearances of this column to get caught up. Alternately, you<br />

can find past columns on our website: www.spectroscopyonline.com/The+Baseline+Column. Words<br />

of warning: For my own reasons, the figures are being numbered sequentially through this series,<br />

which is why the first figure in this column is Figure 26. Also, we’re going to get a bit mathematical.<br />

Unfortunately, that’s par for the course.<br />

David W. Ball<br />

Amagnet is any object that produces a magnetic<br />

field. That’s a rather circular definition (and<br />

saying such is a bit of a pun, when you understand<br />

Maxwell’s equations), but it is a functional one:<br />

A magnet is most simply defined by how it functions.<br />

Technically speaking, all matter is affected by magnets.<br />

It’s just that some objects are affected more than<br />

others and we tend to define magnetism in terms of<br />

the more obvious behavior. An object is magnetic if it<br />

attracts certain metals such as iron, nickel, or cobalt<br />

and if it attracts and repels (depending on its orientation)<br />

other magnets. The earliest magnets occurred<br />

naturally and were called lodestones, a name that<br />

apparently comes from the Middle English “leading<br />

stone,” suggesting an early recognition of the rock’s<br />

ability to point in a certain direction when suspended<br />

freely. By the way, lodestone is simply a magnetic<br />

form of magnetite, an ore whose name comes from<br />

the Magnesia region of Greece, which is itself a part of<br />

Thessaly in central eastern Greece bordering the Aegean<br />

Sea. Magnetite’s chemical formula is Fe 3<br />

O 4<br />

, and<br />

it is actually a mixed FeO–Fe 2<br />

O 3<br />

mineral. Magnetite<br />

itself is not uncommon, although the permanently<br />

magnetized form is, and how it becomes permanently<br />

magnetized is still an open question. (The chemists<br />

among us also recognize Magnesia as giving its name<br />

to the element magnesium. Ironically, the magnetic<br />

properties of Mg are about 1/5000 that of Fe.)<br />

Magnets work by setting up a magnetic field. What<br />

actually is a magnetic field? To be honest, I’m not<br />

sure I can really say, but its effects can be measured<br />

all around the magnet. It turns out that these effects<br />

exert forces that have magnitude and direction: That<br />

is, the magnetic field is a vector field. These forces are<br />

most easily demonstrated by objects that either have a<br />

magnetic field themselves or have an electrical charge<br />

on them, as the exerted force accelerates (changes<br />

the magnitude and direction of the velocity of) the<br />

charge. The magnetic field of a magnet is represented<br />

as B and, again, is a vector field. (The symbol H is also<br />

used to represent a magnetic field, although in some<br />

circumstances there are some subtle differences between<br />

the definition of the B field and the definition<br />

of the H field. Here, we will use B.)<br />

Faraday’s Lines of Force<br />

When Michael Faraday was investigating magnets<br />

starting in the early 1830s, he invented a description<br />

that was used to visualize magnets’ actions: lines of<br />

force. There is some disagreement whether Faraday<br />

thought of these lines as caused by the emanation<br />

of discrete particles or not, but no matter. The lines


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 11<br />

of force are those things that are<br />

visualized when fine iron filings<br />

are sprinkled over a sheet of paper<br />

that is placed over a bar magnet,<br />

as shown in Figure 26. The filings<br />

show some distinct “lines”<br />

in which the iron pieces collect,<br />

although this is more of a physical<br />

effect than a representation of<br />

a magnetic field. There are several<br />

things that can be noted from the<br />

positions of the iron filings in<br />

Figure 26. First, the field seems to<br />

emanate from two points in the<br />

figure, where the iron filings are<br />

most concentrated. These points<br />

represent poles of the magnet. Second,<br />

the field lines exist not only<br />

between the poles, but arc above<br />

and below the poles in the plane of<br />

the figure. If this figure extended<br />

to infinity in any direction, you<br />

would still see evidence — albeit<br />

less and less as you proceed farther<br />

away from the magnet — of<br />

the magnetic field. Third, the<br />

strength of the field is indicated<br />

by the density of lines in any given<br />

space — the field is stronger near<br />

the poles and directly between the<br />

poles, and the field is weaker farther<br />

away from the poles. Finally,<br />

we note that the magnetic field is<br />

three-dimensional. Although most<br />

of the figure shows iron filings on a<br />

flat plane, around the two poles the<br />

iron filings are definitely out of the<br />

plane of the figure, pointing up.<br />

(The force of gravity is keeping the<br />

filings from piling too high, but the<br />

visual effect is obvious.) For the<br />

sake of convention, the lines are<br />

thought of as “coming out” of the<br />

north pole of a magnet and “going<br />

into” the south pole of the magnet,<br />

although in Figure 26 the poles are<br />

not labeled.<br />

Faraday was able to use the concept<br />

of lines of force to explain<br />

attraction and repulsion by two<br />

different magnets. He argued that<br />

when the lines of force from opposite<br />

poles of two magnets interacted,<br />

they joined together in<br />

such a way as to try to force the<br />

poles together, accounting for the<br />

attraction of opposites (Figure<br />

Figure 26: Photographic representation of magnetic lines of force. Here, a magnetic stir bar was<br />

placed under a sheet of paper and fine iron filings were carefully sprinkled onto the paper. While<br />

the concept of lines of force is a useful one, magnetic fields are continuous and are not broken<br />

down into discrete lines like pictured here. (Photo by author, with assistance from Dr. Royce W.<br />

Beal, Mr. Randy G. Ramsden, and Dr. James Rohrbough of the US Air Force Academy Department<br />

of Chemistry).<br />

(a)<br />

Figure 27: Faraday used the concept of magnetic lines of force to describe attraction and<br />

repulsion. (a) When opposite poles of two magnets interact, the lines of force combine to force<br />

the two poles together, causing attraction. (b) When like poles of two magnets interact, the lines<br />

of force resist each other, causing repulsion.<br />

27a). However, if lines of force<br />

from similar poles of two magnets<br />

interacted, they interfered with<br />

each other in such a way as to<br />

repel (Figure 27b). Thus, the lines<br />

of force were useful constructs to<br />

describe the known behavior of<br />

magnets.<br />

Faraday also could use the lines<br />

of force concept to explain why<br />

some materials were attracted by<br />

(b)<br />

magnets (paramagnetic materials<br />

or in their extreme form called<br />

ferromagnetic materials) or repelled<br />

by magnets (diamagnetic<br />

materials). Figure 28 illustrates<br />

that materials attracted by a magnetic<br />

field concentrate the lines<br />

of force inside the material, while<br />

materials repelled by a magnetic<br />

field exclude the lines of force<br />

from the material.


12 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

(a)<br />

(b)<br />

(c)<br />

Magnetic lines<br />

of force<br />

Figure 28: Faraday used the lines of force concept to explain how<br />

objects behave in a magnetic field. (a) Most substances (like glass,<br />

water, or elemental bismuth) actually slightly repel a magnetic field;<br />

Faraday explained that they excluded the magnetic lines of force from<br />

themselves. (b) Some substances (like aluminum) are slightly attracted<br />

to a magnetic field; Faraday suggested that they include magnetic lines of<br />

force into themselves. (c) Some substances (like iron) are very strongly<br />

attracted to a magnetic field, including (according to Faraday) a large<br />

density of lines of force. Such materials can be turned into magnets<br />

themselves under the proper conditions.<br />

N<br />

Magnet<br />

Hypothetical “line of force”<br />

Figure 29: Hypothetical line of force about a magnet. Compare this to<br />

the photo in Figure 26.<br />

As useful as these descriptions were, Faraday was<br />

not a theorist. He was a very phenomenological scientist<br />

who mastered experiments, but had little mathematical<br />

training with which to model his results.<br />

Other scientists were able to do that, some of whom<br />

were based in Germany and France — but the important<br />

contributions came from other scientists in Faraday’s<br />

own Great Britain.<br />

S<br />

Maxwell’s Second Equation<br />

Two British scientists contributed to a better theoretical<br />

understanding of magnetism: William Thomson<br />

(also known as Lord Kelvin) and James Clerk Maxwell.<br />

However, it was Maxwell who did the more<br />

complete job.<br />

Maxwell was apparently impressed with the concept<br />

of Faraday’s lines of force. In fact, the series of four papers<br />

in which he described what later became Maxwell’s<br />

equations was titled “On Physical Lines of Force.” Maxwell<br />

was a very geometry-oriented person; he felt that<br />

the behavior of the natural universe could, at the very<br />

least, be represented by a drawing or picture.<br />

Let’s consider the lines of force pictured in Figure<br />

26. Figure 29 shows one ideal line of force for a<br />

bar magnet in two dimensions. Remember that this<br />

is a thought experiment — a magnetic field is not<br />

composed of individual lines; rather, it is a continuous<br />

vector field. And within a vector field, the field<br />

lines have some direction as well as magnitude. By<br />

convention, the magnetic field vectors are thought of<br />

as emerging from the north pole of the magnet and<br />

entering the south pole of the magnet. This vector<br />

scheme allows us to apply the right-hand rule when<br />

describing the effects of the magnetic field on other<br />

objects, like charged particles and other magnetic<br />

phenomena.<br />

Consider any box around the line of force. In Figure<br />

29, the box is shown by the dotted rectangle. What is<br />

the net change of the magnetic field through the box?<br />

By focusing on the single line of force drawn, we can<br />

conclude that the net change is zero: There is one line<br />

entering the box on its left side, and one line leaving<br />

the box on its right side. This is easily seen in Figure<br />

29 for one line of force and in two dimensions, but<br />

now let’s expand our mental picture to include all<br />

lines of force and all three dimensions. There will always<br />

be the same number of lines of force going into<br />

any arbitrary volume about the magnet as there are<br />

coming out. There is no net change in the magnetic<br />

field in any given volume. This concept holds no matter<br />

how strong the magnetic field and no matter what<br />

size the volume considered.<br />

How do we express this mathematically? Why, using<br />

vector calculus, of course. In the previous discussion<br />

of Maxwell’s first law, we introduced the divergence of<br />

a vector function F as<br />

divergence of F<br />

F y<br />

F x F z<br />

where F Fx i F y j F z k [1]<br />

x y z<br />

Note what the divergence really is; it is the change in<br />

the x-dimensional value of the function F across the x<br />

dimension, the change in the y-dimensional value of<br />

the function F across the y dimension, and the change<br />

in the z-dimensional value of the function F across<br />

the z dimension. However, we have already presented<br />

the argument from our lines of force illustration that<br />

the magnetic field coming in a volume equals the<br />

magnetic field going out of the volume, so that there<br />

is no net change. Thus, using B to represent our magnetic<br />

field:


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 13<br />

B x<br />

B y B z<br />

0<br />

[2]<br />

x y z<br />

That means that the divergence of<br />

B can be written as<br />

No<br />

S<br />

N<br />

div B<br />

B x<br />

B y B z<br />

0<br />

[3]<br />

x y z<br />

S<br />

N<br />

or simply<br />

Yes<br />

div B = 0 [4]<br />

S<br />

N<br />

S<br />

N<br />

This is Maxwell’s second equation<br />

of electromagnetism. It is sometimes<br />

called Gauss’s law for magnetism.<br />

Because we can also write the<br />

divergence as the dot product of<br />

the del operator (∇) with the vector<br />

field, Maxwell’s second equation<br />

becomes<br />

∇•B = 0 [5]<br />

What does Maxwell’s second<br />

equation mean? Because the divergence<br />

is an indicator of the<br />

presence of a source (a generator)<br />

or a sink (a destroyer) of a vector<br />

field, it implies that a magnetic<br />

field has no separate generator or<br />

destroyer points in any definable<br />

volume. Contrast this with an electric<br />

field. Electric fields are generated<br />

by two different particles,<br />

positively charged particles and<br />

negatively charged particles. By<br />

convention, electric fields begin at<br />

positive charges and end at negative<br />

charges. Because electric fields<br />

have explicit generators (positively<br />

charged particles) and destroyers<br />

(negatively charged particles), the<br />

divergence of an electric field is<br />

nonzero. Indeed, by Maxwell’s first<br />

equation, the divergence of an electric<br />

field E is<br />

E [6]<br />

which is zero only if the charge density,<br />

ρ, is zero — and if the charge<br />

density is not zero, then the divergence<br />

of the electric field also is not<br />

zero. Furthermore, the divergence<br />

can be positive or negative depending<br />

on whether the charge density is<br />

a source or a sink.<br />

Figure 30: If you break a magnet, you don’t get two separate magnetic poles (“monopoles,” top),<br />

but instead you get two magnets, each having north and south poles (bottom). This is consistent<br />

with Maxwell’s second law of electromagnetism.<br />

For magnetic fields, however, the<br />

divergence is exactly zero, which<br />

implies that there is no discrete<br />

source (“positive” magnetic particle)<br />

or sink (“negative” magnetic<br />

particle). One implication of that is<br />

that magnetic field sources are always<br />

dipoles; there is no such thing<br />

as a magnetic “monopole.” This<br />

mirrors our experience when we<br />

break a magnet in half, as shown in<br />

Figure 30. We don’t get two separated<br />

poles of the original magnet.<br />

Rather, we get two separate<br />

magnets, complete with north and<br />

south poles.<br />

In the next installment, we will<br />

continue our discussion of Maxwell’s<br />

equations and see how E and<br />

B are related to each other. The<br />

first two equations deal with E and<br />

B separately; we will see, however,<br />

that they are anything but separate.<br />

References<br />

(1) B. Baigrie, Electricity and Magnetism<br />

(Greenwood Press, Westport, Connecticut,<br />

2007).<br />

(2) O. Darrigol, Electrodynamics from<br />

Ampere to Einstein (Oxford University<br />

Press, 2000).<br />

(3) D. Halliday, R. Resnick, and J. Walker,<br />

Fundamentals of Physics 6th Ed. (John<br />

Wiley and Sons, New York, New York,<br />

2001).<br />

(4) E. Hecht, Physics (Brooks-Cole Publishing<br />

Co, Pacific Grove, California,<br />

1994).<br />

(5) J.E. Marsden and A.J. Tromba, Vector<br />

Calculus 2nd Ed. (W.H. Freeman and<br />

Company, 1981).<br />

(6) J.R. Reitz, F.J. Milford, and R.W.<br />

Christy, Foundations of Electromagnetic<br />

Theory (Addison-Wesley<br />

Publishing Company, Reading, Massachusetts,<br />

1979).<br />

(7) H.M. Schey, Div., Grad., Curl.,<br />

and All That: An Informal Text on<br />

Vector Calculus 4th Ed. (W.W.<br />

Norton and Company, New York,<br />

New York, 2005).<br />

David W. Ball is normally<br />

a professor of chemistry<br />

at Cleveland State<br />

University in Ohio. For a<br />

while, though, things will<br />

not be normal: starting<br />

in July 2011 and for the<br />

commencing academic<br />

year, David will be serving as Distinguished<br />

Visiting Professor at the United States Air<br />

Force Academy in Colorado Springs, Colorado,<br />

where he will be teaching chemistry to<br />

Air Force cadets. He still, however, has two<br />

books on spectroscopy available through<br />

SPIE Press, and just recently published two<br />

new textbooks with Flat World Knowledge.<br />

Despite his relocation, he still can be contacted<br />

at d.ball@csuohio.edu. And finally,<br />

while at USAFA he will still be working on<br />

this series, destined to become another<br />

book at an SPIE Press web page near you.<br />

For more information on<br />

this topic, please visit:<br />

www.spectroscopyonline.com/ball


14 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

Focus on Quality<br />

USP and the<br />

GAMP Guide on Laboratory<br />

Computerized Systems — Is<br />

Integration Possible?<br />

The United States Pharmacopeia general chapter on analytical instrument qualification (USP<br />

) and the ISPE’s Good Automated Manufacturing Practice (GAMP) Good Practice Guide<br />

on laboratory computerized systems are the two main sources of guidance for qualifying analytical<br />

instruments and validating computerized systems used in the laboratory. This column<br />

explains the discrepancies between the two documents as well as changes now being made to<br />

both in an attempt to enable an integrated approach to qualification and validation of laboratory<br />

instruments and systems.<br />

R.D. McDowall and C. Burgess<br />

There are many sources of advice on computerized<br />

system validation and analytical instrument qualification<br />

for the laboratory, including regulatory<br />

agencies, such as the United States Food and Drug Administration<br />

(FDA) (1,2); regulatory associations such as<br />

the Pharmaceutical Inspection Convention/Co-operation<br />

Scheme (PIC/S) (3,4); the Official Medicines Control<br />

Laboratories (OMCL) in Europe (5); and pharmacopeias<br />

such as the United States Pharmacopeia (USP) (6). Information<br />

also can be obtained from scientific societies or<br />

associations such as the American Association of Pharmaceutical<br />

Scientists (AAPS) (7), the Parenteral Drug<br />

Association (PDA) (8), the Drug Information Association<br />

(DIA) (9), and the International Society of Pharmaceutical<br />

Engineering (ISPE) (10). All of these organizations<br />

have published guidance on instrument qualification or<br />

computer validation either for a general regulated audience<br />

or specifically for a regulated laboratory.<br />

There are two main sources, however, of regulatory<br />

guidance and advice for qualification of analytical instruments<br />

and validation of computerized systems used in<br />

the laboratory. The first is USP general chapter on<br />

analytical instrument qualification (AIQ) (6), which was<br />

derived from an AAPS meeting on analytical instrument<br />

validation held in 2003. One decision that came from that<br />

conference was that the terminology being used at the time<br />

was incorrect, because the conference name itself should<br />

have referred to analytical instrument qualification. The<br />

white paper published by AAPS in 2004 (7) was the major<br />

input to USP , which became effective in 2008.


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 15<br />

The second source for guidance in a<br />

regulated laboratory comes from ISPE’s<br />

Good Automated Manufacturing Practice<br />

(GAMP) Guide, which is seen by<br />

many as a standard for computerized<br />

system validation. After the publication<br />

of version 4 of this guide in 2001 (11),<br />

ISPE published several “good practice<br />

guides” (GPGs) on specific topics that<br />

were intended to take the principles of<br />

the version 4 guide and tailor them for<br />

a particular subject or focus area. The<br />

GAMP Good Practice Guide on the<br />

Validation of Laboratory Computerized<br />

Systems is one such guide that was published<br />

in 2005 (12).<br />

The major problem with analytical<br />

instruments that are used in a regulated<br />

laboratory is their great variety, complexity,<br />

and variations in intended use.<br />

Furthermore, the software associated<br />

with an instrument can vary from firmware<br />

in basic instruments to servers and<br />

workstations for multiuser networked<br />

data systems.<br />

Writing guidance for the qualification<br />

of this wide range of instrumentation<br />

and software is not easy, as<br />

qualification needs also depend on<br />

the intended use of the instrument<br />

or system. However, as we have both<br />

maintained for a number of years, only<br />

an integrated approach to instrument<br />

qualification and computer validation<br />

— focusing on the key elements that<br />

must be controlled in a single combined<br />

process — is efficient and effective<br />

(13–16). An integrated approach is not<br />

only beneficial from a regulatory and<br />

auditable context, but it also is cost effective<br />

for the business. This approach<br />

is in contrast to conducting an initial<br />

qualification of the instrument and<br />

a separate validation of the software,<br />

which is inefficient and may duplicate<br />

some work. Furthermore, because of<br />

organizational structures, instrument<br />

qualification may be carried out by<br />

the vendor and considerable time may<br />

elapse before the computer validation<br />

is conducted and the system is released<br />

into operational use.<br />

It would be highly advantageous if<br />

the regulations and guidance could all<br />

say similar things and avoid duplicate<br />

tasks. However, with the way the current<br />

versions of USP (6) and the<br />

GAMP 5 & GPG<br />

software-driven<br />

approach<br />

Continuum of<br />

computerized<br />

laboratory<br />

systems<br />

USP <br />

instrument-driven<br />

approach<br />

Apparatus<br />

Group<br />

A<br />

1. Instruments<br />

with<br />

firmware<br />

2. Instruments<br />

with<br />

integral<br />

calculations<br />

Group<br />

B<br />

Figure 1: Mapping USP and GAMP software categories.<br />

GAMP laboratory systems GPG (12) are<br />

written, this is not possible, as we will<br />

illustrate now.<br />

Critique of the GAMP GPG<br />

Laboratory Guide<br />

In 2006, comments were made this column<br />

on the disconnection of the first<br />

edition of the GAMP GPG for validation<br />

of laboratory computerized systems<br />

from the rest of the regulated organization<br />

(13). The version of the GPG at that<br />

time had, from our perspective, the following<br />

issues:<br />

• The guide had an unnecessarily complex<br />

classification of laboratory computerized<br />

systems (13) that did not<br />

match the software-based classification<br />

in the main GAMP guide (17,18).<br />

• According to the GAMP GPG, everything<br />

required validation; there<br />

was no consideration of instrument<br />

qualification.<br />

• There was no linkage with USP<br />

on AIQ.<br />

• There was no reference to the seminal<br />

instrument qualification papers, such<br />

as the discussion of modular and holistic<br />

qualification approaches by Furman<br />

and colleagues (19).<br />

To be fair, the GAMP GPG embraced<br />

a simplified life cycle model that was<br />

a great advance compared to the traditional<br />

V model shown in GAMP 4.<br />

In 2008, GAMP 5 was released (10)<br />

and was an improvement to the previous<br />

version of the guide (11). The new<br />

GAMP 5 was more risk-based and<br />

introduced several life cycle models<br />

depending on the software category.<br />

However, the major problem with this<br />

new version of the GAMP guide was the<br />

removal of category 2 (firmware) from<br />

the categorization of software (17,18).<br />

Category<br />

3<br />

3. Instruments<br />

with<br />

user-defined<br />

programs<br />

4. Instruments<br />

with<br />

commercial<br />

non-config<br />

SW<br />

Group<br />

C<br />

5. Instruments<br />

with<br />

commercial<br />

config SW<br />

Category<br />

4<br />

6. Instruments<br />

with<br />

commercial<br />

config SW+<br />

macros<br />

Category<br />

5<br />

While understandable from a software<br />

system perspective, it is in direct conflict<br />

with USP , in which group B<br />

instruments are firmware-based (6).<br />

Critique of USP <br />

Two earlier “Focus on Quality” columns<br />

commented on USP (13,16). The<br />

classification of analytical equipment<br />

into one of three groups (A, B, and C)<br />

is a simple risk assessment, which is a<br />

good approach, but conflicts with the<br />

more complex GAMP laboratory GPG.<br />

Some of the other problems of <br />

are<br />

• It makes the vendor, rather than the<br />

user, responsible for design qualification<br />

and defining the intended purpose<br />

for a specific laboratory. This is<br />

wrong. Only users can be responsible<br />

for defining their requirements and<br />

selecting the instrument or system<br />

that is appropriate to meet their scientific,<br />

regulatory, and business needs.<br />

The role of a vendor’s specification is<br />

to sell instruments.<br />

• The true role of the vendor is missing<br />

from the data quality triangle in<br />

(16).<br />

• There are subcategories within group<br />

B (instruments) and group C (systems)<br />

that are not covered in the current<br />

version of . This can lead to<br />

noncompliance with 21 CFR 211.68(b)<br />

with regard to checking calculations<br />

embedded in some group B instruments<br />

(16).<br />

• There is no control or guidance in<br />

group B instruments for users to program<br />

routines.<br />

• There is poor software validation<br />

guidance for group C systems that<br />

could result in regulatory observations<br />

for a laboratory.


16 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

No GXP<br />

impact<br />

Group A<br />

apparatus<br />

No qualification or<br />

validation impact<br />

However, qualification is<br />

good analytical science<br />

No qualification or<br />

validation impact<br />

So, where do we go from here?<br />

The next steps will take place on two<br />

fronts: first, a stimulus to the revision<br />

process paper for the update of USP<br />

(20); and second, the drafting of<br />

the second edition of the GAMP GPG<br />

on the validation of laboratory computerized<br />

systems (21), both of which<br />

are planned for publication in the first<br />

quarter of <strong>2012</strong>.<br />

Proposed<br />

risk<br />

assessment<br />

Group B<br />

instruments<br />

Group C<br />

systems<br />

I. Qualification<br />

II. Qualification<br />

and verification<br />

of calculations<br />

III. Qualification<br />

and control of<br />

user-defined<br />

programs<br />

I. Full validation<br />

no instrument<br />

qualification<br />

II. Reduced<br />

validation<br />

no instrument<br />

qualification<br />

III. Full validation<br />

and instrument<br />

qualification<br />

IV. Reduced<br />

validation<br />

and instrument<br />

qualification<br />

Figure 2: Classification of laboratory items under the proposed risk assessment.<br />

USP Stimulus to the<br />

Revision Process<br />

During the AAPS annual meeting in<br />

November 2010, we suggested to the<br />

USP that we write a stimulus to the revision<br />

process paper on . Our proposal<br />

was accepted and we began working<br />

on a draft of the paper, scheduled for<br />

publication in Pharmacopeial Forum in<br />

the January–February <strong>2012</strong> issue (20).<br />

The main aspects of our paper are described<br />

below.<br />

Software Is Important in Analytical<br />

Instrument Qualification<br />

Two key points are necessary for effective<br />

and efficient AIQ. The first is defining<br />

the intended purpose of an item<br />

of laboratory equipment. The second<br />

is identifying the software used in that<br />

equipment. Typically, this software is<br />

either firmware inside an instrument<br />

or on a separate PC running a software<br />

application for controlling the instrument,<br />

as well as acquiring, interpreting,<br />

reporting, and storing the data. Neither<br />

of these software elements is adequately<br />

covered in the current version of<br />

(16).<br />

• The reference to the FDA’s guidance<br />

General Principles of Software Validation<br />

(1) is inappropriate because the<br />

FDA guidance does not consider the<br />

software configuration that is common<br />

with laboratory computerized<br />

systems.<br />

Readers should note that all USP<br />

analytical general chapters will be undergoing<br />

revision between now and<br />

2015, with updates being published in<br />

Pharmacopeial Forum; this revision will<br />

be combined with efforts to harmonize<br />

with chapter with both the Japanese and<br />

European pharmacopeias. New general<br />

chapters will be published in pairs: The<br />

legal requirements will be in chapters<br />

numbered between and and<br />

the corresponding best practice will be<br />

in a general chapter numbered between<br />

and .<br />

AIQ and Computerized System<br />

Validation: Where Are We Now?<br />

With the current versions of USP<br />

and the GAMP GPG on laboratory<br />

computerized systems, if we ask the<br />

question, “Is integration possible?” the<br />

answer is a resounding no. Specifically,<br />

there is no effective and efficient link<br />

between USP , and the GAMP 5,<br />

or indeed the GAMP laboratory GPG.<br />

Mapping USP to GAMP 5<br />

Software Categories<br />

One of the first considerations for revising<br />

should be to close the gap in<br />

the approaches of GAMP 5 and <br />

to reach a unified approach to qualification<br />

and validation, which is shown in<br />

Figure 1. This figure shows our mapping<br />

of the current GAMP software categories<br />

against groups A, B, and<br />

C. Our contention is that there are subcategories<br />

within groups B and C that<br />

are not covered by the current version<br />

of but that should be there to<br />

ensure comprehensive regulatory guidance<br />

(16). It is important to realize that


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 17<br />

USP is driven by an instrument<br />

or hardware approach (classification<br />

into Groups A, B, and C). In contrast,<br />

the GAMP approach is software driven.<br />

When developing laboratory guidance,<br />

we have to consider both sides of the<br />

equation: hardware and software.<br />

Dropping GAMP software category<br />

2 requires category 3 to accommodate<br />

items ranging from simple analytical<br />

instruments with firmware to laboratory<br />

computerized systems with nonconfigurable<br />

commercial software.<br />

Potentially, we would require validating<br />

all group B instruments under<br />

GAMP rather than qualify them under<br />

. Because group A items do not<br />

contain software, there is no comparable<br />

mapping possible with GAMP<br />

5, but we have included this group in<br />

Figure 1 for completeness. We also<br />

have added GAMP software category<br />

5 under category 4 with it offset to<br />

the right in Figure 1 to show that with<br />

some category 4 systems it is possible<br />

to write user-defined macros.<br />

Comprehensive Risk<br />

Assessment Process<br />

The basic risk assessment model in<br />

is the classification of all laboratory<br />

items into one of the groups (A, B,<br />

or C) based on a definition of intended<br />

use. This approach is generally sound,<br />

because apparatus (group A), instruments<br />

(B), and systems (C) are easily<br />

classified. However, there is a weakness<br />

in that the level of granularity offered<br />

is insufficient to classify the variety of<br />

instruments (B) and systems (C) used<br />

in combination with software in the<br />

laboratory today. Figure 1 illustrates<br />

this point by depicting three subtypes<br />

within group B instruments (that is,<br />

firmware, firmware with calculations,<br />

and firmware with the ability for users<br />

to define programs).<br />

Therefore, our basic proposal in the<br />

stimulus to the revision process paper<br />

(20) is to provide better means of<br />

• unambiguously differentiating<br />

between apparatus (group A) and<br />

instruments (group B) based on functionality<br />

• linking the software elements with the<br />

various types of instrument (group B)<br />

and systems (group C), because current<br />

instrumentation is more complex<br />

that the simplistic use of groups A, B,<br />

and C. This will identify subgroups<br />

within groups B and C.<br />

• identifying items used in a regulated<br />

laboratory that are not GXP relevant,<br />

to exclude them from the qualification<br />

and validation process.<br />

We see this risk assessment as essential<br />

for determining the proper business<br />

and regulatory extent of qualification<br />

and validation for a specific instrument<br />

or system with a defined intended use. It<br />

also is a necessary requirement for complying<br />

with US good manufacturing<br />

practice (GMP) regulations, specifically<br />

21 CFR 21.68(b), which requires that<br />

calculations be checked if the instrument<br />

or system has calculations upon<br />

which the user relies (22). This requirement<br />

is not mentioned in the current<br />

version of .<br />

The risk assessment we propose is<br />

based on asking up to 16 closed questions<br />

(with only yes or no answers) that<br />

can classify an item in one of the four<br />

groups listed below and shown diagrammatically<br />

in Figure 2:<br />

1. No GXP impact of the instrument<br />

or system<br />

2. Group A (apparatus) — no formal<br />

qualification impact, only observation<br />

3. Group B (instruments)<br />

• Instrument only: qualification<br />

required (subcategory I)<br />

• Instrument with software:<br />

qualification required and<br />

calculations verified (subcategory<br />

II)<br />

• Instrument with software:<br />

qualification required plus<br />

control of user-defined<br />

programs (subcategory III)<br />

4. Group C (systems)<br />

• Full validation required but<br />

without instrument qualification<br />

(subcategory I)<br />

• Reduced validation required but<br />

without instrument qualification<br />

(subcategory II)<br />

• Full validation and instrument<br />

qualification required<br />

(subcategory III)<br />

• Reduced validation and instrument<br />

qualification required<br />

(subcategory IV).<br />

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18 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

Terminology Is Important<br />

You will notice that we talk in terms of<br />

apparatus, instruments, and systems for<br />

groups A, B, and C, respectively. This is<br />

deliberate and is based on the current<br />

definitions in , and also more accurately<br />

reflects the items found in these<br />

three groups rather than using the allencompassing<br />

term of analytical instruments.<br />

We also recommend that the use<br />

of the ambiguous term equipment be<br />

discontinued in the current context.<br />

4Qs Model Is Replaced by Risk-Based<br />

Qualification and Validation<br />

The 4Qs model of instrument qualification<br />

is confusing because there are two<br />

4Qs models, which we discuss in the<br />

stimulus to the revision process paper:<br />

one for instruments, outlined in ;<br />

and the second for computerized system<br />

validation (CSV), outlined in PDA<br />

Technical Report 32 (8). Also, the FDA<br />

does not use the terms installation qualification<br />

(IQ), operational qualification<br />

(OQ), or performance qualification (PQ)<br />

in the General Principles of Software<br />

Validation (1), as they explain in section<br />

3.1.3 of that document:<br />

While IQ/OQ/PQ terminology has served<br />

its purpose well and is one of many legitimate<br />

ways to organize software validation<br />

tasks at the user site, this terminology<br />

may not be well understood among many<br />

software professionals, and it is not used<br />

elsewhere in this document.<br />

Qualification terminology is also<br />

not well understood in the analytical<br />

laboratory because readers have to be<br />

aware of the context in which a specific<br />

term (qualification or validation)<br />

is used and although we use the same<br />

terms (IQ, OQ, and PQ) they mean<br />

different things depending on whether<br />

we are talking about qualification or<br />

validation (20).<br />

In contrast, both GAMP 5 (10) and<br />

the second edition of the laboratory<br />

GPG (21) use the term verification,<br />

which was adopted from the American<br />

Society for Testing and Materials<br />

(ASTM) Standard E2500 (23), which<br />

includes both the terms qualification<br />

and validation as well as the evergreen<br />

phrase “fit for intended use” throughout.<br />

ASTM E2500 defines verification<br />

as a systematic approach to verify that<br />

manufacturing systems, acting singly or<br />

in combination, are fit for intended use,<br />

have been properly installed, and are<br />

operating correctly. This is an umbrella<br />

term that encompasses all types of approaches<br />

to ensure that systems are fit<br />

for use in qualification, commissioning,<br />

and qualification, verification, system<br />

validation, or others (23).<br />

This definition can be compared to<br />

the one in ANSI –IEEE standard 610.1990<br />

(24), which defines verification as:<br />

1) The process of evaluating a system or<br />

component to determine whether the<br />

products of a given development phase<br />

satisfy the conditions imposed at the start<br />

of that phase; or (2) Formal proof of program<br />

correctness<br />

This Institute of Electrical and Electronics<br />

Engineers (IEEE) standard has<br />

been adopted as an American National<br />

Standards Institute (ANSI) standard.<br />

Therefore, use of the term is mandatory<br />

for all US government departments including<br />

the FDA. If we focus only on the<br />

first IEEE definition, this can be considered<br />

a subset of the ASTM definition<br />

of verification as follows: In software<br />

engineering, which is the context of<br />

IEEE 610, the deliverable or product of a<br />

lifecycle phase, say a functional specification,<br />

is verified against the input to it<br />

(for example, user requirements specification)<br />

to ensure that all requirements<br />

have been developed into software<br />

functions. This is a degree of rigor that<br />

is missing in many laboratory validation<br />

projects.<br />

GAMP Lab Systems Guide:<br />

Second Edition<br />

Since the release of version 5 of the<br />

GAMP guide (10), the 2005 version of<br />

the laboratory GPG has been out of step<br />

with the risk-based approach taken by<br />

the former publication. The GAMP<br />

forum made a decision to revise the<br />

document and publish a second edition<br />

of the GPG (21). A team led by Lorrie<br />

Schuessler of GlaxoSmithKline (GSK,<br />

King of Prussia, Pennsylvania), started<br />

the revision process of the GPG.<br />

Scope of the GPG Second Edition<br />

The remit of the GPG team was to revise,<br />

not reinvent, the document. One<br />

of the key areas was to align the second<br />

edition of the GPG with the terms and<br />

principles of GAMP 5. In doing this,<br />

there was a move from discrete laboratory<br />

computerized system categories<br />

to a risk-based approach, within which<br />

there was an increased emphasis on leveraging<br />

assessments and other services<br />

provided by instrument suppliers. The<br />

team also was tasked with providing<br />

ideas for efficiency in validation activities<br />

and harmonize with USP ,<br />

which was omitted from the first edition<br />

of the GPG.<br />

A draft of the proposed GPG was issued<br />

for public comment in March 2011<br />

and those comments were incorporated<br />

into the revision process. When the<br />

GPG team learned of our planned update<br />

to USP they proposed a collaboration<br />

to align and integrate the two<br />

approaches. We were happy to agree.<br />

We worked closely and openly with a<br />

core team, including Lorrie Schuessler,<br />

Mark Newton, and Paul Smith, to help<br />

draft, review, and revise appendixes to<br />

integrate as much as possible the GAMP<br />

GPG with our proposed update of<br />

(20,21).<br />

Changes in the Second Edition of<br />

the Laboratory Systems GPG<br />

A major change to the laboratory systems<br />

GPG will be the removal of the<br />

categories of laboratory computerized<br />

systems. Depending on your perspective<br />

they were either loved (what?!) or hated<br />

(we’re in this camp). In practice, however,<br />

both the wide range of instruments<br />

and systems as well as the great number<br />

of business processes supported made<br />

use of categories problematic. The same<br />

item could be in several different categories<br />

depending on how it was used in<br />

a particular laboratory — for example, a<br />

sonic bath used for dissolving solutions,<br />

for delivering quantitative sonic energy<br />

or temperature, or in a robot system.<br />

Thus, the wide ranges of use made<br />

single categories misleading and failed<br />

to effectively use the resources needed<br />

for validation. So, now the categories of<br />

laboratory computerized systems have<br />

been replaced with the relative terms<br />

simple, medium, and complex.<br />

The second edition of the GPG is<br />

nearly twice the size of the first edition,<br />

and the majority of the new content is


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 19<br />

contained in the appendixes (21). The<br />

first edition had only three appendixes,<br />

whereas the second edition has 12 appendixes<br />

to describe items in more<br />

detail. Furthermore, where a topic has<br />

been covered in sufficient detail in the<br />

main GAMP guide, the reader is referred<br />

to it.<br />

New Appendixes<br />

The appendixes of the second edition<br />

GPG are listed below:<br />

1. Comparison of USP and<br />

GAMP GPG<br />

2. Categories of Software<br />

3. System Description<br />

4. Application of EU Annex 11 to<br />

Computerized Lab Systems<br />

5. Data Integrity<br />

6. Definition of Electronic Records<br />

and Raw Data<br />

7. Activities for Simple Systems<br />

8. Activities for Medium Systems<br />

9. Networked Chromatography Data<br />

System with Automated HPLC<br />

Dissolution<br />

10. Instrument Interfacing Systems<br />

including LIMS and Electronic<br />

Notebooks<br />

11. Robotics Systems<br />

12. Supplier Documentation and<br />

Services<br />

From our point of view, Appendix 1<br />

is the most important because it brings<br />

together the two approaches in a single<br />

discussion. A good inclusion in the GPG<br />

are discussions on the latest regulatory<br />

requirements: Appendixes 4 and 6 address<br />

the impact of the new EU GMP<br />

regulations of Annex 11 (25) and Chapter<br />

4 (26), respectively. The increased<br />

emphasis by the regulatory agencies on<br />

data integrity also has been addressed,<br />

in Appendix 5, which helps laboratories<br />

meet the challenge of data integrity<br />

in an electronic environment. Validation<br />

activities for simple, medium, and<br />

complex systems are discussed in four<br />

of the appendixes. Finally, there also is<br />

a discussion of supplier documentation<br />

and services and how to leverage and<br />

use them.<br />

AIQ and CSV. Where Will We Be in<br />

the First Quarter of <strong>2012</strong>?<br />

The title of this column asked if integration<br />

of USP and the GAMP<br />

GPG for validation of laboratory computerized<br />

systems was possible. With<br />

the current versions of the two documents,<br />

this is not possible, because of<br />

the divergent approaches explained<br />

earlier.<br />

However, the first quarter of <strong>2012</strong><br />

brings the promise of integration,<br />

because both two publications will be<br />

updated at that time. Our stimulus<br />

to the revision process paper for USP<br />

will be published in Pharmacopeial<br />

Forum and will detail the risk<br />

assessment and the subdivision of<br />

Groups 1, 2, and 3 (20). The second<br />

edition of the GAMP GPG for the<br />

validation of laboratory computerized<br />

systems also will be published (21). In<br />

it, the categories will be eliminated<br />

and replaced with the GAMP software<br />

categories. Both documents have<br />

common elements and approaches,<br />

because the teams have collaborated<br />

to achieve this.<br />

So, back to the question posed in<br />

the title: Is integration possible between<br />

and the GAMP GPG?<br />

Yes, it is, and with the updates of<br />

these two documents, we are moving<br />

toward that ideal. However, life is not<br />

perfect, at least not yet. GAMP software<br />

category 2 needs to be reinstated<br />

for full alignment with Group<br />

B instruments and to allow more<br />

explicit flexibility in the laboratory<br />

computerized systems GPG. Qualification<br />

of laboratory instrumentation<br />

is not a term that is recognized by<br />

GAMP because they have decided to<br />

use verification instead, yet ISPE provides<br />

guidance documents on facility<br />

commissioning and qualification (27)<br />

— so where is the problem? The revision<br />

of USP also uses the term<br />

validation, which is avoided in the<br />

GPG. However, these differences are<br />

easily surmountable with intelligent<br />

interpretation and implementation of<br />

an integrated approach to AIQ and<br />

CSV in your analytical laboratory.<br />

In the future, we hope that we will<br />

have USP providing the regulatory<br />

overview of analytical instrument<br />

qualification and linking to the relevant<br />

requirement chapters of USP that contain<br />

the specific instrument parameters<br />

to qualify. The GAMP laboratory GPG<br />

could then provide guidance on how<br />

to achieve this as well as the validation<br />

of the software elements (from a single<br />

embedded calculation to the whole application<br />

or system) — a unified and<br />

integrated approach.<br />

If this occurs, then the pharmaceutical<br />

industry can meet the existing<br />

approach that ISO 17025 (28) states in<br />

section 5.5.2:<br />

Equipment and its software used for<br />

testing, calibration and sampling shall<br />

be capable of achieving the accuracy<br />

required…<br />

This implies an integrated approach<br />

to ensure that the analytical instrument<br />

and the associated software work,<br />

as specified for the intended purpose.<br />

Nothing more and nothing less.<br />

Acknowledgments<br />

The authors would like to thank the<br />

following parties for their contribution<br />

to developing the stimulus to the revision<br />

process, the second edition of the<br />

GAMP Laboratory GPG, and review of<br />

this column:<br />

• Horatio Pappa, USP<br />

• Members of the GAMP GPG for<br />

Validation of Laboratory Computerized<br />

Systems were Lorrie Schuessler<br />

(GlaxoSmithKline), Mark Newton<br />

(Eli Lilly & Co.), Paul Smith (Agilent<br />

Technologies), Carol Lee (JRF<br />

America), Christopher H. White<br />

(Eisai Inc.), Craig Johnson (Amgen<br />

Inc.), David Dube (Aveo Pharmaceuticals<br />

Inc.), Judy Samardelis<br />

(Qiagen), Karen Evans and Kiet<br />

Luong (GlaxoSmithKline), Markus<br />

Zeitz (Novartis Pharma AG), Peter<br />

Brandstetter (Acondis) Rachel Adler<br />

(Janssen Pharmaceutical), and<br />

Shelly Gutt (Covance Inc.).<br />

• Mark Newton, Paul Smith, Lorrie<br />

Schuessler, and Horatio Pappa for<br />

providing comments on the draft of<br />

this column.<br />

References<br />

(1) Guidance for Industry, General<br />

Principles of Software Validation,<br />

FDA (2002).<br />

(2) Guidance for Industry, Computerized<br />

Systems in Clinical Investigations,<br />

FDA (2007).


20 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

(3) Pharmaceutical Inspection Convention and Co-operation<br />

Scheme (PIC/S), PIC/S PI-011 Computerized Systems<br />

in GXP Environments (2004).<br />

(4) http://www.edqm.eu/en/General-European-OMCL-<br />

Network-46.html. A document for HPLC qualification<br />

was updated in 2011: http://www.edqm.eu/medias/<br />

fichiers/UPDATED_Annex_1_Qualification_of_HPLC_<br />

Equipment.pdf.<br />

(5) Pharmaceutical Inspection Convention and Co-operation<br />

Scheme (PIC/S), Recommendations on Validation Master<br />

Plan, Installation and Operational Qualification, Non-<br />

Sterile Process Validation and Cleaning Validation, PI-<br />

006 (2001).<br />

(6) United States Pharmacopoeia (USP) Analytical<br />

Instrument Qualification.<br />

(7) American Association of Pharmaceutical Scientists<br />

(AAPS) Analytical Instrument Qualification white paper<br />

(2004).<br />

(8) Validation of Computer Related Systems, Technical Report<br />

18, Parenteral Drug Association (PDA) (1994).<br />

(9) Computerized Systems used in Non-Clinical Safety Assessment<br />

— Current Concepts in Validation and Compliance,<br />

Drug Information Association (2008).<br />

(10) Good Automated Manufacturing Practice (GAMP)<br />

Guideline Version 4, ISPE (2001).<br />

(11) Good Automated Manufacturing Practice (GAMP)<br />

Guideline Version 5, ISPE (2008).<br />

(12) GAMP Good Practice Guide on the Validation of Laboratory<br />

Computerized Systems, First Edition, ISPE (2005).<br />

(13) R.D. McDowall, <strong>Spectroscopy</strong> 21(4), 14–30 (2006).<br />

(14) R.D. McDowall, <strong>Spectroscopy</strong> 21(11), 18–23 (2006).<br />

(15) R.D. McDowall, <strong>Spectroscopy</strong> 21(11), 90–95 (2006).<br />

(16) R.D. McDowall, <strong>Spectroscopy</strong> 25(11), 24–29 (2010).<br />

(17) R.D. McDowall, <strong>Spectroscopy</strong> 24(6), 22–31 (2009).<br />

(18) R.D. McDowall, <strong>Spectroscopy</strong> 25(4), 22–31 (2010).<br />

(19) W. Furman, R. Tetzlaff, and T. Layloff, JOAC Int. 77,<br />

1314–1317 (1994).<br />

(20) C. Burgess and R.D. McDowall, Pharmaceutical Forum,<br />

scheduled for Jan-Feb issue in press <strong>2012</strong>.<br />

(21) GAMP Good Practice Guide on the Validation of Laboratory<br />

Computerised Systems, Second Edition, ISPE, in press,<br />

scheduled for publication Q1 <strong>2012</strong>.<br />

(22) US GMP 21 CFR 211.68(b).<br />

(23) ASTM Standard 2500, Standard Guide for Specification,<br />

Design, and Verification of Pharmaceutical and Biopharmaceutical<br />

Manufacturing Systems and Equipment,<br />

American Society for Testing and Materials (2007).<br />

(24) IEEE Standard 610.1990 and American National Standard,<br />

Glossary of Software Engineering Terminology,<br />

IEEE Piscataway (1990).<br />

(25) EU GMP Annex 11 on Computerized Systems (2011)<br />

(26) EU GMP Chapter 4 Documentation (2011).<br />

(27) ISPE Good Practice Guide: Applied Risk Management for<br />

Commissioning and Qualification, ISPE (2011).<br />

(28) ISO 17025, General Requirements for the Competence<br />

of Testing and Calibration Laboratories, ISO, Geneva<br />

(2005).<br />

Chris Burgess has more than 36 years<br />

of experience in the pharmaceutical industry,<br />

primarily with Glaxo in quality assurance<br />

and analytical R&D. He is a qualified<br />

person under EU GMP and a member<br />

of the United States Pharmacopoeia’s<br />

Council of Experts 2010–2015. He also<br />

is a visiting professor of the University<br />

of Strathclyde’s School of Pharmacy and<br />

Biomedical Sciences in Glasgow, Scotland.<br />

R.D. McDowall is the principal of<br />

McDowall Consulting and director of R.D.<br />

McDowall Limited, and the editor of<br />

the “Questions of Quality” column for<br />

LCGC Europe, <strong>Spectroscopy</strong>’s sister magazine.<br />

Direct correspondence to: spectroscopyedit@advanstar.com<br />

For more information on this topic, please visit:<br />

www.spectroscopyonline.com/mcdowall


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 21<br />

Temporary Online FT-IR<br />

<strong>Spectroscopy</strong> for Process<br />

Characterization in the<br />

Chemical Industry<br />

The focus of this paper will be on the use of temporary online Fourier-transform infrared<br />

(FT-IR) spectroscopy in the chemical industry including two case-study applications involving<br />

fouling and product quality. These case studies will be followed by a discussion of the use of<br />

temporary online FT-IR analysis enabling process optimization.<br />

Serena Stephenson, Lamar Dewald, Esteban Baquero, Wendy Flory, Liane Mikolajczyk,<br />

and J.D. Tate<br />

The Dow Chemical Company (Midland, Michigan)<br />

is the world’s largest integrated chemical company<br />

utilizing a wide variety of unique chemistries in<br />

the production of both basic and specialty chemicals.<br />

The diversity of chemical processes and the interrelationships<br />

of production facilities in the integrated chemical<br />

complex provide significant opportunities for process<br />

optimization. Fouling, corrosion, plugging, or out-ofspecification<br />

product occurrences in one manufacturing<br />

plant can have negative effects on the operation of one<br />

or more downstream facilities. Accurate and representative<br />

data for process characterization is a key factor in<br />

making informed decisions regarding the resolution of<br />

process problems. The information-rich nature of optical<br />

spectroscopy and, in particular, Fourier-transform infrared<br />

(FT-IR) spectroscopy is uniquely suited for rapid and<br />

continuous online process characterization.<br />

Sometimes grab samples of the process that are analyzed<br />

in the laboratory provide sufficient data for process<br />

characterization. However, the nature of a process<br />

stream frequently makes collecting representative grab<br />

samples difficult. Gas-phase samples, reactive samples,<br />

and samples under elevated (or depressed) temperature<br />

or pressure are a few examples of samples that are particularly<br />

difficult to collect and analyze by laboratory<br />

analysis. Streams where trace (for example, low parts per<br />

million) levels of water or carbon dioxide are the analytes<br />

of interest are also a particular challenge for grab<br />

sample laboratory analysis because concentration levels<br />

are easily influenced by atmospheric composition. Safety<br />

issues must also be considered when collecting samples<br />

of highly toxic or explosive materials such as phosgene,<br />

acrylates, ethylene oxide, hydrogen chloride, or isocyanates.<br />

Depending on the duration and extent of required<br />

toxic material analyses, properly designed continuous<br />

online analysis can help mitigate associated safety issues.<br />

Additionally, when the process event of interest is<br />

transient occurring over a short time-frame, occurring<br />

at unknown intervals, or if the process is not at steadystate,<br />

a continuous online analysis of a representative<br />

sample provides a richness of insight into the process<br />

that would not be achievable by the infrequent glimpses<br />

into the process that is attainable by grab sample analysis.<br />

Lastly, continuous analyses are an invaluable tool<br />

during new process development and process scale-up<br />

due to the ability to thoroughly characterize the process.<br />

Of the available analytical tools for temporary online<br />

process characterization, FT-IR is among the most powerful.<br />

FT-IR is a fast technique providing fundamental<br />

vibrational information for the components in the stream<br />

and allowing the capture and retention of informationrich<br />

spectra. The raw data obtained from FT-IR are often


22 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

Figure 1: Temporary setup of FT-IR analyzer<br />

for analysis of the ethylene stream in case<br />

study 1 for use with attended operation only.<br />

Figure 2: Temporary setup of FT-IR analyzer<br />

in case study 2 for continuous 24/7 data<br />

collection.<br />

referred to as “traceable” because<br />

analysts can refer to primary and<br />

secondary standards corresponding<br />

to the spectral information from<br />

the process sample. Analysts may<br />

also examine the raw spectral data<br />

for interferences that have not been<br />

present previously or do not match<br />

the anticipated stream composition.<br />

A variety of chemometric modeling<br />

techniques (1) are available to obtain<br />

quantitative information, trending<br />

information, or simple qualitative<br />

stream composition analysis from<br />

the raw spectra depending on the<br />

purpose and requirements of the<br />

particular application.<br />

The insights and data obtained<br />

from continuous online FT-IR can be<br />

applied to optimize process control<br />

models, validate the consistency of<br />

production quality, or inform development<br />

of robust and reliable permanent<br />

process analyzer applications.<br />

The following case studies focus on<br />

process control optimization and<br />

product quality.<br />

Experimental<br />

Before discussing case studies it will<br />

be useful to highlight a few basic<br />

considerations for installing a FT-IR<br />

system in a process environment. Of<br />

course, spectrometer setup, operation,<br />

and data processing must be<br />

appropriately specified for a given<br />

application, but unless the sample is<br />

reliably and safely delivered to the<br />

spectrometer the analysis details are<br />

mute. Process analyzer installation<br />

and methods can be complex (2), but<br />

two major design considerations for<br />

temporary analysis are safety and<br />

sample system design. The first to<br />

consider is safety. Although some<br />

safety concerns associated with handling<br />

samples for laboratory analysis<br />

are mitigated by using a process<br />

analyzer and eliminating routine<br />

grab sampling, a distinct set of other<br />

safety related hazards must be addressed.<br />

Of primary concern is assuring<br />

area classifications are met to<br />

mitigate explosion or exposure risks.<br />

In the first case study, the stream was<br />

comprised mostly of ethylene and the<br />

area classification issue was of critical<br />

importance. Because the FT-IR<br />

system that was used was not classified<br />

for a Class 1 Division 2 area,<br />

operating procedures were developed<br />

designating attended operation with<br />

appropriate area lower explosion<br />

limit (LEL) monitoring and emergency<br />

shutdown plans should the<br />

LEL monitor indicate the presence<br />

of a flammable atmosphere. A picture<br />

of the field setup of the analyzer<br />

is shown in Figure 1. On days when<br />

there was a threat of rain, a canopy<br />

was placed over the whole system.<br />

The preferred option would have<br />

been to package the spectrometer in<br />

a z-purged analyzer enclosure. Cost<br />

and timing constraints prevented the<br />

preferred path of C1D2 packaging for<br />

the analyzer in the ethylene analysis<br />

case study. Figure 2 shows the analyzer<br />

packaged for the product quality<br />

case study where the analyzer was<br />

installed in the field and operating<br />

under nonattended operation 24/7.<br />

In the product quality case study, the<br />

location was a nonclassified area, but<br />

the stream composition was highly<br />

toxic and corrosive. The analyzer<br />

enclosure was exposed to the elements<br />

and vortex coolers were used<br />

to control the temperature inside<br />

the enclosure.<br />

The second set of design considerations<br />

revolve around sample systems<br />

and sample handling panels.<br />

Having a continuous online analysis<br />

is not useful if the analyzer is not<br />

provided with a consistent and representative<br />

process sample for analysis.<br />

Sample systems are an integral<br />

part of the success or failure of a process<br />

analytical system (3). FT-IR and<br />

spectroscopic techniques in general<br />

demand much simpler sample systems<br />

than required by typical process<br />

gas chromatography systems,<br />

but fundamentals such as flow and<br />

pressure as well as avoiding condensation,<br />

particulates, and plugging<br />

are still essential. Key methods for<br />

liquid- and gas-phase sample systems<br />

for FT-IR implementation are different.<br />

Here, the focus is on gas-phase<br />

FT-IR as this technique has repeatedly<br />

been demonstrated to meet the<br />

temporary online stream characterization<br />

requirements in a variety of<br />

Dow processes. When it comes to liquid-phase<br />

analysis, attenuated total<br />

reflectance (ATR) FT-IR techniques<br />

are occasionally used, but probe<br />

fouling and lack of ability to monitor<br />

trace levels can be limiting and<br />

the use of a near-infrared or Raman<br />

system may be preferable. For gasphase<br />

process streams, long-pathlength<br />

FT-IR analysis is a workhorse<br />

for stream characterization. The<br />

two systems that were used in the<br />

case studies discussed below are the<br />

MKS 2032 MultiGas FT-IR system<br />

(MKS Instruments, Andover, Massachusetts)<br />

and the Gasmet DX4000


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 23<br />

FT-IR system (Gasmet Technologies<br />

Oy, Finland). Other FT-IR systems<br />

could also be utilized, but portability<br />

and 24/7 continuous data acquisition<br />

are key requirements.<br />

Case Study — Fouling<br />

The first case study is an application<br />

in a plant trying to solve<br />

plugging and fouling events that<br />

have been occurring regularly<br />

over multiple years. The stream<br />

was primarily ethylene with other<br />

C 2<br />

–C 8<br />

hydrocarbons and unknown<br />

low levels of acrylic acid monomer,<br />

water, and other small organics<br />

thought to be present in concentrations<br />

less than 1 mol%. It was<br />

known that the substance plugging<br />

the equipment at the facility was<br />

polyacrylic acid polymer and that<br />

minimizing the presence of acrylic<br />

acid and water in the stream would<br />

minimize the fouling. Several process<br />

control changes had been tried<br />

throughout the years, based purely<br />

on Aspen process models (Aspen<br />

Abs Arb<br />

(a)<br />

2<br />

0<br />

(b)<br />

2<br />

(c)<br />

0<br />

2<br />

0<br />

(d)<br />

2<br />

0<br />

4000<br />

3000<br />

Technology, Inc., Burlington, Massachusetts),<br />

but the plugging issues<br />

persisted. The unknown was how<br />

various process operating conditions<br />

in surrounding portions of the<br />

Wavenumber (cm -1 )<br />

2000<br />

Figure 3: Spectra of (a) 100% ethylene, (b) 500 ppm water, and (c) 932 ppm acrylic acid, and<br />

(d) a process spectrum at 150 °C and 1 atm with a 5.11-m pathlength at 0.5-cm -1 resolution and<br />

a 1-min collection time.<br />

plant impacted the residual levels of<br />

acrylic acid and water in the region<br />

where fouling occurred. Attempts<br />

to validate the assumptions used for<br />

the process models using aluminum


24 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

Concentration (ppm)<br />

Arbitrary units<br />

-0.00<br />

2500<br />

4500<br />

4000<br />

3500<br />

3000<br />

2500<br />

2000<br />

1500<br />

1000<br />

500<br />

0<br />

Acrylic acid trial A<br />

Acrylic acid trial B<br />

Water trial A<br />

Water trial B<br />

CO<br />

2500 2400 2300 2200 2100 2000 1900<br />

oxide moisture measurements failed<br />

because the aluminum oxide moisture<br />

analyses used were infrequent,<br />

slow to equilibrate, suffered from<br />

calibration drift because of stream<br />

components fouling the sensor, and<br />

were not reproducible. Additionally,<br />

the aluminum oxide sensor only<br />

provided data on the moisture component,<br />

not the acrylic acid concentration<br />

or any of the other hydrocarbons<br />

or organics that were suspected<br />

to be present.<br />

Time--><br />

Figure 4: Acrylic acid and water trends during two different process trials showing significant<br />

impact on the water concentrations between the two sets of process conditions.<br />

Wavenumber (cm -1 )<br />

DCI<br />

2400 2300 2200 2100 2000 1900<br />

Figure 5: Process spectra containing DCl and some CO 2<br />

compared to reference spectra of CO at<br />

both 8-cm -1 and 1-cm -1 resolution.<br />

To achieve a fast response, quantitative<br />

results, low detection limits,<br />

and multicomponent analysis, a<br />

long-path FT-IR was installed at the<br />

process location with a sample line<br />

comprising 50 ft of ¼-in. diameter<br />

heat traced tubing to minimize condensation<br />

or changes in the sample<br />

between the process pipe and the<br />

analyzer. The process sample was<br />

returned to the plant’s vacuum vent<br />

line. This process drop allowed<br />

for continuous flow at the rate of<br />

~2–3 L/min and a constant pressure<br />

in the FT-IR sample cell. The sample<br />

cell pathlength was 5.11 m and 0.5<br />

cm -1 spectral resolution was used.<br />

Figure 3 shows an example spectrum<br />

of 100% ethylene as well as<br />

water and acrylic acid in the concentration<br />

range of interest. Figure<br />

3 also provides a process spectrum<br />

clearly indicating that both water<br />

and acrylic acid are present in the<br />

process ethylene. A total of six components<br />

were monitored in the ethylene<br />

process stream, including the<br />

water and acrylic acid.<br />

A spectral data point was collected<br />

every minute to capture process fluctuations.<br />

A designed set of experiments<br />

was implemented that systematically<br />

changed the plant’s operating<br />

conditions within acceptable ranges<br />

while levels of acrylic acid and water,<br />

among other components, were monitored.<br />

Figure 4 includes process<br />

trend comparisons between just two<br />

of the process condition experiments<br />

showing a better than threefold difference<br />

in water concentration while<br />

having negligible effects on acrylic<br />

acid levels. The fluctuations within<br />

each of the given trials also correlated<br />

with specific process parameters<br />

and provided insight into process<br />

stability. Other tested process<br />

conditions demonstrated decreases<br />

in residual acrylic acid.<br />

The key information learned from<br />

continuous FT-IR data of acrylic acid<br />

and water, as well as the other components,<br />

in comparison with known<br />

process control parameters was identification<br />

of specific process parameters<br />

that enabled reduction in acrylic<br />

acid and water without adversely affecting<br />

quality or other process operations.<br />

The analytical results were<br />

used to optimize the process control<br />

model based on Aspen simulations.<br />

The new process model was implemented<br />

in the plant for control. Before<br />

implementation of the model,<br />

fouling occurred every 1–2 months<br />

causing 2–3 days of downtime per incident.<br />

Since implementation of the<br />

model more than 1 year ago there has<br />

not been a shutdown caused by the<br />

fouling problem. This case study is


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 25<br />

an excellent example of FT-IR spectroscopy<br />

being used for continuous<br />

online analysis to improve process<br />

operation by providing real-time<br />

data for process correlation. The<br />

plant’s issue was solved without investment<br />

in installation and maintenance<br />

of a permanent FT-IR (or any<br />

other) process analyzer.<br />

Case Study — Product Quality<br />

A second case study, in which gas<br />

phase FT-IR was applied to characterize<br />

a process, was for the purpose<br />

of product quality optimization.<br />

In this case, the goal was product<br />

purity. The stream was very simple<br />

with a single component being<br />

greater than 99.99% pure with contaminants<br />

of interest for continuous<br />

analysis, carbon monoxide (CO) and<br />

carbon dioxide (CO 2<br />

), being present<br />

at levels below 1 ppm under normal<br />

conditions. The major challenge with<br />

analyzing CO 2<br />

by grab sample and<br />

laboratory analysis is atmospheric<br />

contamination of the sample. By<br />

using a continuous online sample<br />

system that is free of leaks, a more<br />

representative sample is achieved. In<br />

this particular case study, the plant<br />

was interested in increasing the purity<br />

of its hydrochloric acid (HCl)<br />

product. The FT-IR data were used to<br />

validate process improvements with<br />

regard to minimizing the CO 2<br />

and<br />

CO content of the product.<br />

Two different FT-IR systems were<br />

applied for the sub-part-per-million<br />

analysis of CO and CO 2<br />

in HCl because<br />

of changing equipment availability.<br />

Both used a 5-m pathlength<br />

multipass cell, a 1-min collection<br />

time, and a 60 °C cell temperature,<br />

and both operated with sample pressures<br />

slightly below atmospheric pressure.<br />

The primary difference between<br />

the two FT-IR systems was spectral<br />

resolution. One system was operated<br />

at 0.5-cm -1 resolution and the other<br />

at 8 cm -1 . Both used modified classical<br />

least squares (CLS) algorithms<br />

for quantitative concentration determination.<br />

There were advantages and<br />

disadvantages of operating under the<br />

different resolutions (5), but both demonstrated<br />

capability for the analysis.<br />

The lower-resolution system required<br />

greater attention to the CLS<br />

model prediction because of spectral<br />

overlap between deuterium chloride<br />

(DCl) and CO. The ro-vibrational<br />

spectra of HCl is well known to have<br />

rotational structure from both the<br />

H 35 Cl and H 37 Cl isotopes. With the<br />

natural abundance of deuterium<br />

being 156 ppm, the spectrum of anhydrous<br />

HCl also contains rotational<br />

structure from the υ=1←0 band of<br />

D 35 Cl and D 37 Cl centered at 2145.163<br />

cm -1 (7) and overlaps the fundamental<br />

CO stretch region. Figure 5<br />

shows the overlap of DCl and CO at<br />

0.5 cm -1 and 8 cm -1 resolution. With<br />

the spectrometer system at 0.5 cm -1<br />

resolution, the best quantitative solution<br />

was to rely on CO transitions<br />

located in the DCl Q-branch gap.<br />

Specifically, the three CO transitions<br />

at 2094.8 (P(12)), 2090.6 (P(13)), and<br />

2086.3 cm -1 (P(14)) were used for the<br />

CO analysis on the 0.5 cm -1 resolution<br />

spectrometer. A modified CLS<br />

method based off of peak areas was<br />

used for quantitative prediction with<br />

the 0.5-cm -1 system. At 8-cm -1 resolution,<br />

a CLS method was developed<br />

and validated assuming a constant<br />

deuterium concentration of 0.0156%<br />

of the HCl concentration and incorporating<br />

HCl concentrations into the<br />

model. This approach also allowed<br />

small pressure and temperature fluctuations<br />

to be accounted for within<br />

the model.<br />

Conclusions<br />

Continuous at-line and online FT-IR<br />

implementation has proven to be effective<br />

for characterizing process<br />

streams that prove challenging from<br />

the perspective of traditional grab<br />

sampling and laboratory analysis.<br />

Care must be taken in sample handling<br />

and implementation to assure<br />

that a representative sample is delivered<br />

to the analyzer.<br />

The value of FT-IR spectroscopy<br />

for process characterization is the information-rich<br />

nature of the data obtained<br />

and how that information is applied<br />

to optimize or troubleshoot the<br />

process. In many cases, a temporary<br />

online setup that provides a few weeks<br />

to a couple of months of stream data is<br />

all that is required for improvements<br />

to be chosen, implemented, and validated.<br />

However, in other cases the information<br />

collected by the temporary<br />

online FT-IR spectrometer indicates<br />

the need for a permanent online analysis<br />

to be used for closed-loop control<br />

or routine monitoring. In these situations,<br />

the stream composition data<br />

from the FT-IR analysis are used to<br />

specify the most robust, reliable, and<br />

economical solution for a permanent<br />

online analysis. In a few cases this<br />

might be a FT-IR system, but more<br />

commonly the permanent solution<br />

is an alternative spectroscopic-based<br />

solution, such as a filter photometer<br />

or tunable diode laser system. Use of<br />

full-spectrum FT-IR stream composition<br />

information while specifying a<br />

permanent analyzer system increases<br />

the success rate of the new application<br />

development and installations of process<br />

analysis technologies.<br />

References<br />

(1) K.R. Beebe, R.J. Pell, and M.B. Seasholtz,<br />

Chemometrics A Practical<br />

Guide (John Wiley & Sons, Inc., New<br />

York, 1998), Chapter 5.<br />

(2) K.J. Clevett, Process Analyzer Technology<br />

(John Wiley & Sons, Inc. New<br />

York, 1986), Chapter 21.<br />

(3) R.E. Sherman, Process Analyzer Sample-<br />

Conditioning System Technology (John<br />

Wiley & Sons, Inc, New York, 2002).<br />

(4) P. Jaakkola, J.D. Tate, M. Paakkunainen,<br />

and P. Saarinen, Appl. Spectrosc.<br />

51, 1159–1169 (1997).<br />

(5) K. P. Huber and G. Herzberg, Molecular<br />

Spectra and Molecular Structure IV.<br />

Constants of Diatomic Molecules (Van<br />

Nostrand-Reinhold, New York, 1979).<br />

Serena Stephenson,<br />

Lamar Dewald, Esteban<br />

Baquero, Wendy Flory, Liane<br />

Mikolajczyk, and J.D. Tate are with<br />

The Dow Chemical Company. Direct correspondence<br />

to: SStephenson@dow.com ◾<br />

For more information on this topic,<br />

please visit our homepage at:<br />

www.spectroscopyonline.com


26 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

Volume 26, 2011<br />

2011 Editorial Index<br />

AUTHORS<br />

A<br />

Acosta, Tayro E. See Misra, Anupam K.<br />

Adar, Fran. “Analytical Vibrational <strong>Spectroscopy</strong> — NIR, IR,<br />

and Raman,” in Molecular <strong>Spectroscopy</strong> Workbench. October,<br />

p. 14.<br />

Adar, Fran. “Entering Raman’s Realm,” in Molecular <strong>Spectroscopy</strong><br />

Workbench. March, p. 22.<br />

Adar, Fran. “Graphene: Why the Nobel Prize and Why Raman?”<br />

in Molecular <strong>Spectroscopy</strong> Workbench. February, p. 16.<br />

Ahmed, Selver; Wunder, Stephanie L.; and Nickolov, Zhorro S.<br />

Raman <strong>Spectroscopy</strong> of Supported Lipid Bilayer Nanoparticles.<br />

Raman Technology for Today’s Spectroscopists, June, p. 8.<br />

Almirall, Jose; and Miziolek, Andrzej. Review of the Third North<br />

American Symposium on Laser-Induced Breakdown <strong>Spectroscopy</strong><br />

(NASLIBS) 2011 Conference. October, p. 48.<br />

Alonso, David E.; Binkley, Joe; and Siek, Kevin. Comprehensive<br />

Analysis of Persistent Organic Pollutants in Complex Matrices<br />

Using GC with High-Performance TOF-MS. Current<br />

Trends in Mass Spectrometry, July, p. 48.<br />

Andrews, Darren. See Matousek, Pavel.<br />

Angel, S. Michael. See Gomer, Nathaniel R.<br />

Artaev, Viatcheslav. See Patrick, Jeffrey S.<br />

Asara, John M. Mass Spectrometry Advances Fossilomics. Current<br />

Trends in Mass Spectrometry, March, p. 18.<br />

Assi, Sulaf; Watt, Robert; and Moffat, Tony. Comparison of<br />

Laboratory and Handheld Raman Instruments for the Identification<br />

of Counterfeit Medicines. Raman Technology for<br />

Today’s Spectroscopists, June, p. 36.<br />

Atkins, P.; Ernyei, L.; Driscoll, W.; Obenauf, R.; and Thomas, R.<br />

Analysis of Toxic Trace Metals in Pet Foods Using Cryogenic<br />

Grinding and Quantitation by ICP-MS, Part I. January, p. 46.<br />

Atkins, P.; Ernyei, L.; Driscoll, W.; Obenauf, R.; and Thomas,<br />

R. Analysis of Toxic Trace Metals in Pet Foods Using<br />

Cryogenic Grinding and Quantitation by ICP-MS, Part<br />

II. February, p. 42.<br />

B<br />

Ball, David W. “Little Points of Light,” in The Baseline. January,<br />

p. 20.<br />

Ball, David W. “Maxwell’s Equations, Part I: History,” in The<br />

Baseline. April, p. 16.<br />

Ball, David W. “Maxwell’s Equations, Part II,” in The Baseline.<br />

June, p. 14.<br />

Ball, David W. “Maxwell’s Equations, Part III,” in The Baseline.<br />

September, p. 18.<br />

Ball, David W. “Maxwell’s Equations, Part IV,” in The Baseline.<br />

December, p. 10.<br />

Balogh, Michael. The Nature and Utility of Mass Spectra. February,<br />

p. 60.<br />

Baquero, Esteban. See Stephenson, Serena.<br />

Bartsch, G. See Pallua, J.D.<br />

Bates, David E. See Misra, Anupam K.<br />

Baumgartner, C. See Pallua, J.D.<br />

Beechem, Thomas E.; and Serrano, Justin R. Raman Thermometry<br />

of Microdevices: Choosing a Method to Minimize Error.<br />

November, p. 36.<br />

Begley, Benjamin; and Koleto, Michael. Single Multipoint Calibration<br />

Curve for Discovery Bioanalysis. Current Trends in<br />

Mass Spectrometry, May, p. 8.<br />

Binkley, Joe. See Alonso, David E.<br />

Binkley, Joe. See Patrick, Jeffrey S.<br />

Bittner, L.K. See Pallua, J.D.<br />

Blank, Thomas B. See Ford, Alan R.<br />

Bloomfield, Matthew. See Matousek, Pavel.<br />

Boeker, Peter. See Haas, Torsten.<br />

Bonn, G.K. See Pallua, J.D.<br />

Brill, Laurence M. Responding to Data Analysis and Evaluation<br />

Challenges in Mass Spectrometry–Based Methods for High-<br />

Throughput Proteomics. Current Trends in Mass Spectrometry,<br />

March, p. 36.<br />

Brouillette, Carl. See Donahue, Michael.<br />

Brueggemeyer, Thomas. See Lanzarotta, Adam.<br />

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Thorley, Fiona. See Matousek, Pavel.<br />

Tichy, Shane E. See Sana, Theodore.<br />

Tombling, Craig. See Matousek, Pavel.<br />

V<br />

Vargis, Elizabeth. See Mahadevan-Jansen,<br />

Anita.<br />

Vélez-Reyes, Miguel. See Hernández-<br />

Rivera, Samuel P.<br />

Veryovkin, Igor. See Zinovev, Alexander.<br />

Vunck, Darius M. See Ford, Alan R.<br />

W<br />

Walch, A. See Pallua, J.D.<br />

Wang, Xinwei. See Nam, Kwan H.<br />

Waterbury, Robert D. See Ford, Alan R.<br />

Watt, Robert. See Assi, Sulaf.<br />

Weesner, Forrest. See Lowry, Steve.<br />

Wells, Greg; Prest, Harry; and Russ IV,<br />

Charles William. Why Use Signal-<br />

To-Noise As a Measure of MS Performance<br />

When It Is Often Meaningless?<br />

Current Trends in Mass Spectrometry,<br />

May, p. 28.<br />

Wikswo, John P. See Enders, Jeffrey R.<br />

Wilbur, Steve. See Burrows, Richard.<br />

Witkowski, Mark. See Lanzarotta, Adam.<br />

Workman, Jr., Jerome. See Mark, Howard.<br />

Wu, Di. See Chen, Xiaojing.<br />

Wunder, Stephanie L. See Ahmed, Selver.<br />

Y<br />

Yang, Li. See Yu, Xiao-Ying.<br />

Yu, HeShui. See Yu, Kate.<br />

Yu, Kate; Ma, Baiping; Yu, HeShui; Kang,<br />

Liping; Zhang, Jie; Gao, Yue; and Millar,<br />

Alan. Comparison of Extracts<br />

from Dry and Alcohol-Steamed Root<br />

of Polygonatum kingianum (Huang<br />

Jing) by Sub-2-µm-LC–TOF-MS.<br />

Current Trends in Mass Spectrometry,<br />

March, p. 30.<br />

Yu, Xiao-Ying; Yang, Li; Zhu, Zihua;<br />

Cowin, James P.; and Iedema, Martin<br />

J. Probing Aqueous Surfaces by TOF-<br />

SIMS. Current Trends in Mass Spectrometry,<br />

October, p. 34.<br />

Z<br />

Zhang, Guangjun. See Zhang, Qianxuan.<br />

Zhang, Jie. See Yu, Kate.<br />

Zhang, Qianxuan; Li, Qingbo; and<br />

Zhang, Guangjun. Scattering Impact<br />

Analysis and Correction for<br />

Leaf Biochemical Parameter Estimation<br />

Using Vis-NIR <strong>Spectroscopy</strong>.<br />

July, p. 28.<br />

Zhang, Zhen Long; Chang, Da Hu; and<br />

Mo, Yu Jun. The pH Dependence of<br />

the SERS Spectra of Methyl Yellow in<br />

Silver Colloid. June, p. 38.<br />

Zhou, Ming. See Carson, William W.<br />

Zhu, Zihua. See Yu, Xiao-Ying.<br />

Zinovev, Alexander; and Veryovkin, Igor.<br />

Mass Spectrometry of Organic Molecules<br />

and Laser-Induced Acoustic Desorption:<br />

Applications, Mechanisms,<br />

and Perspectives. Current Trends in<br />

Mass Spectrometry, July, p. 24.<br />

SUBJECTS<br />

ATOMIC EMISSION SPECTROSCOPY<br />

“Close Enough: The Value of Semiquantitative<br />

Analysis,” in Atomic Perspectives.<br />

Kenneth Neubauer and Laura<br />

Thompson. May, p. 24.<br />

“R&D Opportunities in Arc/Spark Optical<br />

Emission Spectrometry,” in<br />

Atomic Perspectives. Volker B.E.<br />

Thomsen and Jerald L. Spencer.<br />

July, p. 18.<br />

Spectrometers for Elemental Spectrochemical<br />

Analysis, Part IV: Inductively<br />

Coupled Plasma Optical Emission<br />

Spectrometers. Carlos Augusto<br />

Coutinho and Volker Thomsen. September,<br />

p. 44.<br />

“Using ICP-MS and ICP-OES to Measure<br />

Trace Elemental Impurities in<br />

Pharmaceuticals in Compliance with<br />

Proposed Pharmacopeia Chapters,” in<br />

Atomic Perspectives. Matthew Cassup.<br />

March, p. 26.<br />

ATOMIC PERSPECTIVES COLUMN<br />

“Analysis of Flue Gas Desulfurization<br />

Wastewaters by ICP-MS,” in Atomic<br />

Perspectives. Richard Burrows, Steve<br />

Wilbur, and Richard Clinkscales. November,<br />

p. 30.<br />

“Close Enough: The Value of Semiquantitative<br />

Analysis,” in Atomic Perspectives.<br />

Kenneth Neubauer and Laura<br />

Thompson. May, p. 24.<br />

“Measurement Techniques for Mercury:<br />

Which Approach Is Right for You?”<br />

in Atomic Perspectives. David Pfeil.<br />

September, p. 40.<br />

“R&D Opportunities in Arc/Spark Optical<br />

Emission Spectrometry,” in Atomic<br />

Perspectives. Volker B.E. Thomsen<br />

and Jerald L. Spencer. July, p. 18.<br />

“Using ICP-MS and ICP-OES to Measure<br />

Trace Elemental Impurities in Pharmaceuticals<br />

in Compliance with Proposed<br />

Pharmacopeia Chapters,” in Atomic<br />

Perspectives. Matthew Cassup. March,<br />

p. 26.<br />

ATOMIC SPECTROSCOPY<br />

“Analysis of Flue Gas Desulfurization<br />

Wastewaters by ICP-MS,” in Atomic<br />

Perspectives. Richard Burrows, Steve<br />

Wilbur, and Richard Clinkscales. November,<br />

p. 30.<br />

Analysis of Toxic Trace Metals in Pet


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 31<br />

Foods Using Cryogenic Grinding and<br />

Quantitation by ICP-MS, Part I. P. Atkins,<br />

L. Ernyei, W. Driscoll, R. Obenauf,<br />

and R. Thomas. January, p. 46.<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding and<br />

Quantitation by ICP-MS, Part II. P.<br />

Atkins, L. Ernyei, W. Driscoll, R. Obenauf,<br />

and R. Thomas. February, p. 42.<br />

“Close Enough: The Value of Semiquantitative<br />

Analysis,” in Atomic Perspectives.<br />

Kenneth Neubauer and Laura<br />

Thompson. May, p. 24.<br />

The Dynamic World of X-ray Fluorescence.<br />

Laura Bush. July, p. 40.<br />

“LIBS in Forensics,” in Lasers and Optics<br />

Interface. Laura Bush. April, p. 34.<br />

“Measurement Techniques for Mercury:<br />

Which Approach Is Right for You?”<br />

in Atomic Perspectives. David Pfeil.<br />

September, p. 40.<br />

Microwave-Induced Combustion for ICP-<br />

MS: A Generic Approach to Trace Elemental<br />

Analyses of Pharmaceutical<br />

Products. Kwan H. Nam, Robert Isensee,<br />

Gabe Infantino, Karol Putyera,<br />

and Xinwei Wang. April, p. 36.<br />

“R&D Opportunities in Arc/Spark Optical<br />

Emission Spectrometry,” in Atomic<br />

Perspectives. Volker B.E. Thomsen<br />

and Jerald L. Spencer. July, p. 18.<br />

Spectrometers for Elemental Spectrochemical<br />

Analysis, Part IV: Inductively<br />

Coupled Plasma Optical Emission<br />

Spectrometers. Carlos Augusto<br />

Coutinho and Volker Thomsen. September,<br />

p. 44.<br />

“Using ICP-MS and ICP-OES to Measure<br />

Trace Elemental Impurities in<br />

Pharmaceuticals in Compliance with<br />

Proposed Pharmacopeia Chapters,” in<br />

Atomic Perspectives. Matthew Cassup.<br />

March, p. 26.<br />

BASELINE COLUMN<br />

“Little Points of Light,” in The Baseline.<br />

David W. Ball. January, p. 20.<br />

“Maxwell’s Equations, Part I: History,” in<br />

The Baseline. David W. Ball. April, p.<br />

16.<br />

“Maxwell’s Equations, Part II,” in The<br />

Baseline. David W. Ball. June, p. 14.<br />

“Maxwell’s Equations, Part III,” in The Baseline.<br />

David W. Ball. September, p. 18.<br />

“Maxwell’s Equations, Part IV,” in The<br />

Baseline. David W. Ball. December,<br />

p. 10.<br />

BIOLOGICAL AND MEDICAL<br />

ANALYSIS<br />

Optimizing FT-IR Sampling for a Method<br />

to Determine the Chemical Composition<br />

of Microbial Materials. Steve<br />

Lowry. June, p. 30.<br />

Scattering Impact Analysis and Correction<br />

for Leaf Biochemical Parameter<br />

Estimation Using Vis-NIR <strong>Spectroscopy</strong>.<br />

Qianxuan Zhang, Qingbo Li,<br />

and Guangjun Zhang. July, p. 28.<br />

CHEMOMETRICS IN<br />

SPECTROSCOPY COLUMN<br />

“Classical Least Squares, Part IV: Spectroscopic<br />

Theory Continued,” in Chemometrics<br />

in <strong>Spectroscopy</strong>. Howard<br />

Mark and Jerome Workman, Jr. February,<br />

p. 26.<br />

“Classical Least Squares, Part V: Experimental<br />

Results,” in Chemometrics in<br />

<strong>Spectroscopy</strong>. Howard Mark and Jerome<br />

Workman, Jr. May, p. 12.<br />

“Classical Least Squares, Part VI: Spectral<br />

Results,” in Chemometrics in <strong>Spectroscopy</strong>.<br />

Howard Mark and Jerome<br />

Workman, Jr. June, p. 22.<br />

“Classical Least Squares, Part VII: Spectral<br />

Reconstruction of Mixtures,”<br />

in Chemometrics in <strong>Spectroscopy</strong>.<br />

Howard Mark and Jerome Workman,<br />

Jr. October, p. 24.<br />

CHEMOMETRICS<br />

“Classical Least Squares, Part IV: Spectroscopic<br />

Theory Continued,” in Chemometrics<br />

in <strong>Spectroscopy</strong>. Howard<br />

Mark and Jerome Workman, Jr. February,<br />

p. 26.<br />

“Classical Least Squares, Part V: Experimental<br />

Results,” in Chemometrics in<br />

<strong>Spectroscopy</strong>. Howard Mark and Jerome<br />

Workman, Jr. May, p. 12.<br />

“Classical Least Squares, Part VI: Spectral<br />

Results,” in Chemometrics in <strong>Spectroscopy</strong>.<br />

Howard Mark and Jerome<br />

Workman, Jr. June, p. 22.<br />

“Classical Least Squares, Part VII: Spectral<br />

Reconstruction of Mixtures,”<br />

in Chemometrics in <strong>Spectroscopy</strong>.<br />

Howard Mark and Jerome Workman,<br />

Jr. October, p. 24.<br />

An Integration of Modified Uninformative<br />

Variable Elimination and Wavelet<br />

Packet Transform for Variable Selection.<br />

Xiaojing Chen, Di Wu, and Yong<br />

He. April, p. 42.<br />

ENVIRONMENTAL ANALYSIS<br />

“Analysis of Flue Gas Desulfurization<br />

Wastewaters by ICP-MS,” in Atomic<br />

Perspectives. Richard Burrows, Steve<br />

Wilbur, and Richard Clinkscales. November,<br />

p. 30.<br />

“Underwater Mass Spectrometry,” in<br />

Mass Spectrometry Forum. Kenneth<br />

L. Busch. January, p. 30.<br />

EXPLOSIVES<br />

An Optical Nose Approach to Explosive<br />

Detection: One Strategy for Optically<br />

Based Sensing. Tabetha Osborn, William<br />

A. Burns, Joshua Green, and Scott<br />

W. Reeve. January, p. 34.<br />

FOCUS ON QUALITY COLUMN<br />

“Is GMP Annex 11 Europe’s Answer to<br />

21 CFR 11?” in Focus on Quality. R.D.<br />

McDowall. April, p. 24.<br />

“Periodic Reviews of Computerized Systems,<br />

Part I,” in Focus on Quality. R.D.<br />

McDowall. September, p. 28.<br />

“Periodic Reviews of Computerized Systems,<br />

Part II,” in Focus on Quality.<br />

R.D. McDowall. November, p. 20.<br />

“USP and the GAMP Guide on<br />

Laboratory Computerized Systems —<br />

Is Integration Possible?” in Focus on<br />

Quality. R.D. McDowall and Chris<br />

Burgess. December, p. 14.<br />

FOOD AND BEVERAGE ANALYSIS<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding and<br />

Quantitation by ICP-MS, Part I. P. Atkins,<br />

L. Ernyei, W. Driscoll, R. Obenauf,<br />

and R. Thomas. January, p. 46.<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding<br />

and Quantitation by ICP-MS, Part II.<br />

P. Atkins, L. Ernyei, W. Driscoll, R.<br />

Obenauf, and R. Thomas. February,<br />

p. 42.<br />

FORENSIC APPLICATIONS<br />

ICP-MS for Forensic Applications. Laura<br />

Bush. October, p. 57.<br />

“LIBS in Forensics,” in Lasers and Optics<br />

Interface. Laura Bush. April, p. 34.<br />

FUELS<br />

Optimizing FT-IR Sampling for a Method<br />

to Determine the Chemical Composition<br />

of Microbial Materials. Steve<br />

Lowry. June, p. 30.


32 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

HISTORY<br />

“Maxwell’s Equations, Part I: History,” in<br />

The Baseline. David W. Ball. April, p. 16.<br />

ICP AND ICP-MS<br />

“Analysis of Flue Gas Desulfurization<br />

Wastewaters by ICP-MS,” in Atomic<br />

Perspectives. Richard Burrows, Steve<br />

Wilbur, and Richard Clinkscales. November,<br />

p. 30.<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding and<br />

Quantitation by ICP-MS, Part I. P. Atkins,<br />

L. Ernyei, W. Driscoll, R. Obenauf,<br />

and R. Thomas. January, p. 46.<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding<br />

and Quantitation by ICP-MS, Part II.<br />

P. Atkins, L. Ernyei, W. Driscoll, R.<br />

Obenauf, and R. Thomas. February,<br />

p. 42.<br />

“Close Enough: The Value of Semiquantitative<br />

Analysis,” in Atomic Perspectives.<br />

Kenneth Neubauer and Laura<br />

Thompson. May, p. 24.<br />

ICP-MS for Forensic Applications. Laura<br />

Bush. October, p. 57.<br />

Microwave-Induced Combustion for ICP-<br />

MS: A Generic Approach to Trace Elemental<br />

Analyses of Pharmaceutical<br />

Products. Kwan H. Nam, Robert Isensee,<br />

Gabe Infantino, Karol Putyera,<br />

and Xinwei Wang. April, p. 36.<br />

Spectrometers for Elemental Spectrochemical<br />

Analysis, Part IV: Inductively<br />

Coupled Plasma Optical Emission<br />

Spectrometers. Carlos Augusto<br />

Coutinho and Volker Thomsen. September,<br />

p. 44.<br />

“Using ICP-MS and ICP-OES to Measure<br />

Trace Elemental Impurities in<br />

Pharmaceuticals in Compliance with<br />

Proposed Pharmacopeia Chapters,” in<br />

Atomic Perspectives. Matthew Cassup.<br />

March, p. 26.<br />

IMAGING AND MICROSCOPY<br />

A Targeted Approach to Detect Controlled<br />

Substances in Suspect Tablets Using Attenuated<br />

Total Internal Reflection Fourier-Transform<br />

Infrared Spectroscopic<br />

Imaging. Adam Lanzarotta, Samuel<br />

Gratz, Thomas Brueggemeyer, and<br />

Mark Witkowski. February, p. 34.<br />

INFRARED SPECTROSCOPY<br />

“Analytical Vibrational <strong>Spectroscopy</strong> —<br />

NIR, IR, and Raman,” in Molecular<br />

<strong>Spectroscopy</strong> Workbench. Fran Adar.<br />

October, p. 14.<br />

An Optical Nose Approach to Explosive<br />

Detection: One Strategy for Optically<br />

Based Sensing. Tabetha Osborn, William<br />

A. Burns, Joshua Green, and Scott<br />

W. Reeve. January, p. 34.<br />

Developing a Career in FT-IR. Megan<br />

Evans. April, p. 58.<br />

Optimizing FT-IR Sampling for a Method<br />

to Determine the Chemical Composition<br />

of Microbial Materials. Steve<br />

Lowry. June, p. 30.<br />

Scattering Impact Analysis and Correction<br />

for Leaf Biochemical Parameter<br />

Estimation Using Vis-NIR <strong>Spectroscopy</strong>.<br />

Qianxuan Zhang, Qingbo Li,<br />

and Guangjun Zhang. July, p. 28.<br />

A Targeted Approach to Detect Controlled<br />

Substances in Suspect Tablets<br />

Using Attenuated Total Internal Reflection<br />

Fourier-Transform Infrared<br />

Spectroscopic Imaging. Adam<br />

Lanzarotta, Samuel Gratz, Thomas<br />

Brueggemeyer, and Mark Witkowski.<br />

February, p. 34.<br />

Temporary Online FT-IR <strong>Spectroscopy</strong><br />

for Process Characterization in<br />

the Chemical Industry. Serena Stephenson,<br />

Lamar Dewald, Esteban<br />

Baquero, Wendy Flory, Liane Mikolajczyk,<br />

and J.D. Tate. December,<br />

p. 21.<br />

INTERVIEWS<br />

Developing a Career in FT-IR. Megan<br />

Evans. April, p. 58.<br />

ICP-MS for Forensic Applications. Laura<br />

Bush. October, p. 57.<br />

LASERS AND OPTICS INTERFACE<br />

COLUMN<br />

“The Importance of Tight Laser Power<br />

Control When Working with Carbon<br />

Nanomaterials,” in Lasers and Optics<br />

Interface. Joe Hodkiewicz. July, p. 22.<br />

“LIBS in Forensics,” in Lasers and Optics<br />

Interface. Laura Bush. April,<br />

p. 34.<br />

“Multiphoton <strong>Spectroscopy</strong>,” in Lasers<br />

and Optics Interface. Youngjae Kim<br />

and Joseph Salhany. January, p. 24.<br />

LASERS<br />

ICP-MS for Forensic Applications. Laura<br />

Bush. October, p. 57.<br />

“The Importance of Tight Laser Power<br />

Control When Working with Carbon<br />

Nanomaterials,” in Lasers and Optics<br />

Interface. Joe Hodkiewicz. July, p. 22.<br />

“LIBS in Forensics,” in Lasers and Optics<br />

Interface. Laura Bush. April, p. 34.<br />

“Multiphoton <strong>Spectroscopy</strong>,” in Lasers<br />

and Optics Interface. Youngjae Kim<br />

and Joseph Salhany. January, p. 24.<br />

Review of the Third North American<br />

Symposium on Laser-Induced Breakdown<br />

<strong>Spectroscopy</strong> (NASLIBS) 2011<br />

Conference. Jose Almirall and Andrzej<br />

Miziolek. October, p. 48.<br />

LIBS<br />

ICP-MS for Forensic Applications. Laura<br />

Bush. October, p. 57.<br />

“LIBS in Forensics,” in Lasers and Optics<br />

Interface. Laura Bush. April, p. 34.<br />

Review of the Third North American<br />

Symposium on Laser-Induced Breakdown<br />

<strong>Spectroscopy</strong> (NASLIBS) 2011<br />

Conference. Jose Almirall and Andrzej<br />

Miziolek. October, p. 48.<br />

MARKET ANALYSIS<br />

The Demand for <strong>Spectroscopy</strong> Instrumentation<br />

Continues Unabated. Lawrence<br />

S. Schmid. August, p. 12.<br />

The <strong>Spectroscopy</strong> Market Hits Its Stride.<br />

Lawrence S. Schmid. March, p. 36.<br />

2011 Salary Survey: The Upside of Science.<br />

Megan Evans. March, p. 30.<br />

MASS SPECTROMETRY FORUM<br />

COLUMN<br />

“Consequences of Finite Ion Lifetimes in<br />

Mass Spectrometry,” in Mass Spectrometry<br />

Forum. Kenneth L. Busch.<br />

September, p. 12.<br />

“Detecting Ions in Mass Spectrometers<br />

with the Faraday Cup,” in Mass Spectrometry<br />

Forum. Kenneth L. Busch.<br />

November, p. 12.<br />

“Hybrid Mass Spectrometers,” in Mass<br />

Spectrometry Forum. Kenneth L.<br />

Busch. March, p. 16.<br />

“Mass Spectrometry for First Responders,”<br />

in Mass Spectrometry Forum.<br />

Kenneth L. Busch. July, p. 12.<br />

“Underwater Mass Spectrometry,” in<br />

Mass Spectrometry Forum. Kenneth<br />

L. Busch. January, p. 30.<br />

MASS SPECTROMETRY<br />

Analysis of Toxic Trace Metals in Pet


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 33<br />

Foods Using Cryogenic Grinding<br />

and Quantitation by ICP-MS, Part<br />

I. P. Atkins, L. Ernyei, W. Driscoll,<br />

R. Obenauf, and R. Thomas. January,<br />

p. 46.<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding<br />

and Quantitation by ICP-MS, Part<br />

II. P. Atkins, L. Ernyei, W. Driscoll,<br />

R. Obenauf, and R. Thomas. February,<br />

p. 42.<br />

“Close Enough: The Value of Semiquantitative<br />

Analysis,” in Atomic<br />

Perspectives. Kenneth Neubauer<br />

and Laura Thompson. May, p. 24.<br />

“Consequences of Finite Ion Lifetimes<br />

in Mass Spectrometry,” in Mass<br />

Spectrometry Forum. Kenneth L.<br />

Busch. September, p. 12.<br />

“Detecting Ions in Mass Spectrometers<br />

with the Faraday Cup,” in Mass<br />

Spectrometry Forum. Kenneth L.<br />

Busch. November, p. 12.<br />

“Hybrid Mass Spectrometers,” in Mass<br />

Spectrometry Forum. Kenneth L.<br />

Busch. March, p. 16.<br />

“Mass Spectrometry for First Responders,”<br />

in Mass Spectrometry Forum.<br />

Kenneth L. Busch. July, p. 12.<br />

The Nature and Utility of Mass Spectra.<br />

Michael Balogh. February, p. 60.<br />

A Targeted Approach to Detect Controlled<br />

Substances in Suspect Tablets<br />

Using Attenuated Total Internal<br />

Reflection Fourier-Transform<br />

Infrared Spectroscopic Imaging.<br />

Adam Lanzarotta, Samuel Gratz,<br />

Thomas Brueggemeyer, and Mark<br />

Witkowski. February, p. 34.<br />

“Underwater Mass Spectrometry,” in<br />

Mass Spectrometry Forum. Kenneth<br />

L. Busch. January, p. 30.<br />

“Using ICP-MS and ICP-OES to Measure<br />

Trace Elemental Impurities<br />

in Pharmaceuticals in Compliance<br />

with Proposed Pharmacopeia Chapters,”<br />

in Atomic Perspectives. Matthew<br />

Cassup. March, p. 26.<br />

MEETING REPORTS<br />

Pittcon 2011 New Product Review. Howard<br />

Mark. May, p. 32.<br />

Review of the Third North American<br />

Symposium on Laser-Induced Breakdown<br />

<strong>Spectroscopy</strong> (NASLIBS) 2011<br />

Conference. Jose Almirall and Andrzej<br />

Miziolek. October, p. 48.<br />

MOLECULAR SPECTROSCOPY<br />

WORKBENCH COLUMN<br />

“Analytical Vibrational <strong>Spectroscopy</strong> —<br />

NIR, IR, and Raman,” in Molecular<br />

<strong>Spectroscopy</strong> Workbench. Fran Adar.<br />

October, p. 14.<br />

“Entering Raman’s Realm,” in Molecular<br />

<strong>Spectroscopy</strong> Workbench. Fran Adar.<br />

March, p. 22.<br />

“Graphene: Why the Nobel Prize and<br />

Why Raman?” in Molecular <strong>Spectroscopy</strong><br />

Workbench. Fran Adar. February,<br />

p. 16.<br />

NEAR-IR SPECTROSCOPY<br />

“Analytical Vibrational <strong>Spectroscopy</strong> —<br />

NIR, IR, and Raman,” in Molecular<br />

<strong>Spectroscopy</strong> Workbench. Fran Adar.<br />

October, p. 14.<br />

“Classical Least Squares, Part V: Experimental<br />

Results,” in Chemometrics in<br />

<strong>Spectroscopy</strong>. Howard Mark and Jerome<br />

Workman, Jr. May, p. 12.<br />

“Classical Least Squares, Part VI: Spectral<br />

Results,” in Chemometrics in <strong>Spectroscopy</strong>.<br />

Howard Mark and Jerome<br />

Workman, Jr. June, p. 22.<br />

“Classical Least Squares, Part VII: Spectral<br />

Reconstruction of Mixtures,”<br />

in Chemometrics in <strong>Spectroscopy</strong>.<br />

Howard Mark and Jerome Workman,<br />

Jr. October, p. 24.<br />

Developing a Career in FT-IR. Megan<br />

Evans. April, p. 58.<br />

An Integration of Modified Uninformative<br />

Variable Elimination and Wavelet<br />

Packet Transform for Variable Selection.<br />

Xiaojing Chen, Di Wu, and Yong<br />

He. April, p. 42.<br />

Scattering Impact Analysis and Correction<br />

for Leaf Biochemical Parameter<br />

Estimation Using Vis-NIR <strong>Spectroscopy</strong>.<br />

Qianxuan Zhang, Qingbo Li,<br />

and Guangjun Zhang. July, p. 28.<br />

OPTICS<br />

An Optical Nose Approach to Explosive<br />

Detection: One Strategy for Optically<br />

Based Sensing. Tabetha Osborn, William<br />

A. Burns, Joshua Green, and Scott<br />

W. Reeve. January, p. 34.<br />

PHARMACEUTICAL APPLICATIONS<br />

Emerging Raman Techniques for Rapid<br />

Noninvasive Characterization of Pharmaceutical<br />

Samples and Containers.<br />

Pavel Matousek, Fiona Thorley, Ping<br />

Chen, Michael Hargreaves, Craig<br />

Tombling, Paul Loeffen, Matthew<br />

Bloomfield, and Darren Andrews.<br />

March, p. 44.<br />

“Is GMP Annex 11 Europe’s Answer to<br />

21 CFR 11?” in Focus on Quality. R.D.<br />

McDowall. April, p. 24.<br />

Microwave-Induced Combustion for ICP-<br />

MS: A Generic Approach to Trace Elemental<br />

Analyses of Pharmaceutical<br />

Products. Kwan H. Nam, Robert Isensee,<br />

Gabe Infantino, Karol Putyera,<br />

and Xinwei Wang. April, p. 36.<br />

A Targeted Approach to Detect Controlled<br />

Substances in Suspect Tablets<br />

Using Attenuated Total Internal Reflection<br />

Fourier-Transform Infrared<br />

Spectroscopic Imaging. Adam<br />

Lanzarotta, Samuel Gratz, Thomas<br />

Brueggemeyer, and Mark Witkowski.<br />

February, p. 34.<br />

“Using ICP-MS and ICP-OES to Measure<br />

Trace Elemental Impurities in<br />

Pharmaceuticals in Compliance with<br />

Proposed Pharmacopeia Chapters,” in<br />

Atomic Perspectives. Matthew Cassup.<br />

March, p. 26.<br />

“USP and the GAMP Guide on<br />

Laboratory Computerized Systems —<br />

Is Integration Possible?” in Focus on<br />

Quality. R.D. McDowall and Chris<br />

Burgess. December, p. 14.<br />

PROCESS CONTROL AND ANALYSIS<br />

Temporary Online FT-IR <strong>Spectroscopy</strong><br />

for Process Characterization in<br />

the Chemical Industry. Serena Stephenson,<br />

Lamar Dewald, Esteban<br />

Baquero, Wendy Flory, Liane Mikolajczyk,<br />

and J.D. Tate. December,<br />

p. 21.<br />

RAMAN SPECTROSCOPY<br />

“Analytical Vibrational <strong>Spectroscopy</strong> —<br />

NIR, IR, and Raman,” in Molecular<br />

<strong>Spectroscopy</strong> Workbench. Fran Adar.<br />

October, p. 14.<br />

Application of Raman <strong>Spectroscopy</strong> to<br />

Lubricants, Lubricated Surfaces, and<br />

Lubrication Phenomena. David W.<br />

Johnson. July, p. 46.<br />

Emerging Raman Techniques for Rapid<br />

Noninvasive Characterization of Pharmaceutical<br />

Samples and Containers.<br />

Pavel Matousek, Fiona Thorley, Ping<br />

Chen, Michael Hargreaves, Craig<br />

Tombling, Paul Loeffen, Matthew


34 <strong>Spectroscopy</strong> 26(12) December 2011 www.spectroscopyonline.com<br />

Bloomfield, and Darren Andrews.<br />

March, p. 44.<br />

“Entering Raman’s Realm,” in Molecular<br />

<strong>Spectroscopy</strong> Workbench. Fran Adar.<br />

March, p. 22.<br />

“Graphene: Why the Nobel Prize and<br />

Why Raman?” in Molecular <strong>Spectroscopy</strong><br />

Workbench. Fran Adar. February,<br />

p. 16.<br />

Improved Principal Component Discrimination<br />

of Commercial Inks Using<br />

Surface-Enhanced Resonant Raman<br />

Scattering. Jeffrey Hirsch, Timothy O.<br />

Deschaines, and Todd Strother. October,<br />

p. 32.<br />

“Multiphoton <strong>Spectroscopy</strong>,” in Lasers<br />

and Optics Interface. Youngjae Kim<br />

and Joseph Salhany. January, p. 24.<br />

The pH Dependence of the SERS Spectra<br />

of Methyl Yellow in Silver Colloid.<br />

Zhen Long Zhang, Da Hu Chang, and<br />

Yu Jun Mo. June, p. 38.<br />

Raman <strong>Spectroscopy</strong> of Carbonaceous<br />

Materials: A Concise Review. Dorina<br />

Magdalena Chipara, Alin Cristian<br />

Chipara, and Mircea Chipara. October,<br />

p. 42.<br />

Raman Thermometry of Microdevices:<br />

Choosing a Method to Minimize<br />

Error. Thomas E. Beechem, and Justin<br />

R. Serrano. November, p. 36.<br />

REGULATORY ISSUES<br />

“Is GMP Annex 11 Europe’s Answer to<br />

21 CFR 11?” in Focus on Quality. R.D.<br />

McDowall. April, p. 24.<br />

“Periodic Reviews of Computerized Systems,<br />

Part I,” in Focus on Quality. R.D.<br />

McDowall. September, p. 28.<br />

“Periodic Reviews of Computerized Systems,<br />

Part II,” in Focus on Quality.<br />

R.D. McDowall. November, p. 20.<br />

“USP and the GAMP Guide on<br />

Laboratory Computerized Systems —<br />

Is Integration Possible?” in Focus on<br />

Quality. R.D. McDowall and Chris<br />

Burgess. December, p. 14.<br />

SAMPLE PREPARATION AND<br />

INTRODUCTION<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding and<br />

Quantitation by ICP-MS, Part I. P. Atkins,<br />

L. Ernyei, W. Driscoll, R. Obenauf,<br />

and R. Thomas. January, p. 46.<br />

Analysis of Toxic Trace Metals in Pet<br />

Foods Using Cryogenic Grinding<br />

and Quantitation by ICP-MS, Part II.<br />

P. Atkins, L. Ernyei, W. Driscoll, R.<br />

Obenauf, and R. Thomas. February,<br />

p. 42.<br />

Microwave-Induced Combustion for ICP-<br />

MS: A Generic Approach to Trace Elemental<br />

Analyses of Pharmaceutical<br />

Products. Kwan H. Nam, Robert Infantino<br />

, Gabe Isensee, Karol Putyera,<br />

and Xinwei Wang. April, p. 36.<br />

SPECTROSCOPIC THEORY<br />

“Classical Least Squares, Part IV: Spectroscopic<br />

Theory Continued,” in Chemometrics<br />

in <strong>Spectroscopy</strong>. Howard<br />

Mark and Jerome Workman, Jr. February,<br />

p. 26.<br />

“Little Points of Light,” in The Baseline.<br />

David W. Ball. January, p. 20.<br />

“Maxwell’s Equations, Part I: History,” in<br />

The Baseline. David W. Ball. April, p.<br />

16.<br />

“Maxwell’s Equations, Part II,” in The<br />

Baseline. David W. Ball. June, p. 14.<br />

“Maxwell’s Equations, Part III,” in The<br />

Baseline. David W. Ball. September,<br />

p. 18.<br />

“Maxwell’s Equations, Part IV,” in The<br />

Baseline. David W. Ball. December,<br />

p. 10.<br />

Raman <strong>Spectroscopy</strong> of Carbonaceous<br />

Materials: A Concise Review. Dorina<br />

Magdalena Chipara, Alin Cristian<br />

Chipara, and Mircea Chipara. October,<br />

p. 42.<br />

SUPPLEMENT: APPLICATIONS OF<br />

ICP & ICP-MS TECHNIQUES FOR<br />

TODAY’S SPECTROSCOPISTS<br />

The Determination of 226 Ra in Nontypical<br />

Soil Samples by ICP-MS. Teresa Switzer,<br />

Otto Herrmann, and Darko Ilic.<br />

November, p. 6.<br />

Ensuring the Safety and Quality of Foodstuffs<br />

Produced in China: The Role of<br />

ICP-MS. Andrew Ryan and Robert<br />

Thomas. November, p. 28.<br />

Overcoming the Challenges Associated<br />

with the Direct Analysis of Trace Metals<br />

in Seawater Using ICP-MS. Shona<br />

McSheehy-Ducos. November, p. 22.<br />

Validating ICP-MS for the Analysis of<br />

Elemental Impurities According to<br />

Draft USP General Chapters <br />

and . Samina Hussain, Amir<br />

Liba, and Ed McCurdy. November,<br />

p. 14.<br />

SUPPLEMENT: CURRENT TRENDS<br />

IN MASS SPECTROMETRY<br />

Advanced Structural Mass Spectrometry<br />

for Systems Biology: Pulling the<br />

Needles from Haystacks. Jeffrey R.<br />

Enders, Cody R. Goodwin, Christina<br />

C. Marasco, Kevin T. Seale, John P.<br />

Wikswo, and John A. McLean. July,<br />

p. 18.<br />

Analytical Strategies in the Development<br />

of Generic Drug Products: The Role<br />

of Chromatography and Mass Spectrometry.<br />

Arindam Roy and Srinivasa<br />

Gorla. October, p. 29.<br />

Comparison of Extracts from Dry and<br />

Alcohol-Steamed Root of Polygonatum<br />

kingianum (Huang Jing) by<br />

Sub-2-µm-LC–TOF-MS. Kate Yu,<br />

Baiping Ma, HeShui Yu, Liping Kang,<br />

Jie Zhang, Yue Gao, and Alan Millar.<br />

March, p. 30.<br />

Comprehensive Analysis of Persistent Organic<br />

Pollutants in Complex Matrices<br />

Using GC with High-Performance<br />

TOF-MS. David E. Alonso, Joe Binkley,<br />

and Kevin Siek. July, p. 48.<br />

Creating a High-Throughput LC–MS-MS<br />

System Using Common Components.<br />

Lance Heinle and Gary Jenkins. October,<br />

p. 16.<br />

Determining High-Molecular-Weight<br />

Phthalates in Sediments Using GC–<br />

APCI-TOF-MS. Frank David, Pat Sandra,<br />

and Peter Hancock. May, p. 42.<br />

Food Metabolomics: Fact or Fiction? Leon<br />

Coulier, Albert Tas, and Uwe Thissen.<br />

May, p. 34.<br />

High-Definition Screening for Boar Taint<br />

in Fatback Samples Using GC–MS.<br />

Torsten Haas, Peter Boeker, Alun Cole,<br />

and Gerhard Horner. July, p. 38.<br />

High-Throughput Quantitative Analysis<br />

of Vitamin D Using a Multiple Parallel<br />

LC–MS System Combined with Integrated<br />

On-Line SPE. Adrian M. Taylor<br />

and Michael J.Y. Jarvis. May, p. 12.<br />

25-Hydroxyvitamin D 2<br />

/D 3<br />

Analysis in<br />

Human Plasma Using LC–MS. Phil<br />

Koerner and Michael McGinley.<br />

March, p. 8.<br />

Imaging Mass Spectrometry: Current<br />

Performance and Upcoming Challenges.<br />

Pierre Chaurand. July, p. 30.<br />

Mass Spectrometry Advances Fossilomics.<br />

John M. Asara. March, p. 18.<br />

Mass Spectrometry in Analytical Lipidomics.<br />

Luis Cuadros-Rodriguez,


www.spectroscopyonline.com<br />

December 2011 <strong>Spectroscopy</strong> 26(12) 35<br />

Alegria Carrasco-Pancorbo, and<br />

Natalia Navas Iglesias. July, p. 8.<br />

Mass Spectrometry of Organic Molecules<br />

and Laser-Induced Acoustic<br />

Desorption: Applications, Mechanisms,<br />

and Perspectives. Alexander<br />

Zinovev and Igor Veryovkin. July, p.<br />

24.<br />

Matrix-Assisted Laser Desorption-<br />

Ionization Imaging Mass Spectrometry<br />

for Direct Tissue Analysis.<br />

J.D. Pallua, G. Schaefer, L.K.<br />

Bittner, C. Pezzei, V. Huck-Pezzei,<br />

S.A. Schoenbichler, S. Meding, S.<br />

Rauser, A. Walch, M. Handler, M.<br />

Netzer, M. Osl, M. Seger, B. Pfeifer,<br />

C. Baumgartner, H. Lindner, L.<br />

Kremser, B. Sarg, H. Klocker, G.<br />

Bartsch, G.K. Bonn, and C.W. Huck.<br />

October, p. 21.<br />

Metabolomics Workflows: Combining<br />

Untargeted Discovery-Based and<br />

Targeted Confirmation Approaches<br />

for Mining Metabolomics Data. Theodore<br />

Sana, Steve Fischer, and Shane<br />

E. Tichy. March, p. 12.<br />

A New Path to High-Resolution HPLC–<br />

TOF-MS — Survey, Targeted, and<br />

Trace Analysis Applications of TOF-<br />

MS in the Analysis of Complex Biochemical<br />

Matrices. Jeffrey S. Patrick,<br />

Kevin Siek, Joe Binkley, Viatcheslav<br />

Artaev, and Michael Mason. May, p.<br />

18.<br />

On- and Off-Line Coupling of Separation<br />

Techniques to Ambient Ionization<br />

Mass Spectrometry. Li Li and<br />

Kevin Schug. October, p. 8.<br />

Probing Aqueous Surfaces by TOF-<br />

SIMS. Xiao-Ying Yu, Li Yang, Zihua<br />

Zhu, James P. Cowin, and Martin J.<br />

Iedema. October, p. 34.<br />

Responding to Data Analysis and Evaluation<br />

Challenges in Mass Spectrometry–Based<br />

Methods for High-<br />

Throughput Proteomics. Laurence<br />

M. Brill. March, p. 36.<br />

Review of the 59th Annual ASMS Conference.<br />

Megan Evans. July, p. 54.<br />

A Sensitive, Specific, Accurate, and Fast<br />

LC–MS-MS Method for Measurement<br />

of Ethyl Glucuronide and Ethyl<br />

Sulfate in Human Urine. Shuguang<br />

Li, Jeff Layne, Sky Countryman, and<br />

Michael McGinley. July, p. 42.<br />

Single Multipoint Calibration Curve<br />

for Discovery Bioanalysis. Benjamin<br />

Begley and Michael Koleto.<br />

May, p. 8.<br />

Time-Resolved SRM Analysis and<br />

Highly Multiplexed LC–MS-MS for<br />

Quantifying Tryptically Digested<br />

Proteins. Richard G. Kay, James W.<br />

Howard, and Steve Pleasance. March,<br />

p. 24.<br />

Why Use Signal-To-Noise As a Measure<br />

of MS Performance When It Is Often<br />

Meaningless? Greg Wells, Harry<br />

Prest, and Charles William Russ IV.<br />

May, p. 28.<br />

SUPPLEMENT: DEFENSE AND<br />

HOMELAND SECURITY<br />

Advances in <strong>Spectroscopy</strong> for Detection<br />

and Identification of Potential Bioterror<br />

Agents. Eric W. Fisher. April, p.<br />

29.<br />

Detecting Explosives by Portable<br />

Raman Analyzers: A Comparison<br />

of 785-, 976-, 1064-, and 1550-nm<br />

(Retina-Safe) Laser Excitation. Michael<br />

Donahue, Hermes Huang, Carl<br />

Brouillette, Wayne Smith, and Stuart<br />

Farquharson. April, p. 24.<br />

Detection of Chemicals with Standoff<br />

Raman <strong>Spectroscopy</strong>. Anupam K.<br />

Misra, Shiv K. Sharma, Tayro E.<br />

Acosta, and David E. Bates. April,<br />

p. 18.<br />

Explosives Sensing Using Multiple<br />

Optical Techniques in a Standoff<br />

Regime with a Common Platform.<br />

Alan R. Ford, Robert D. Waterbury,<br />

Darius M. Vunck, Jeremy B. Rose,<br />

Thomas B. Blank, Ken R. Pohl,<br />

Troy A. McVay, Edwin L. Dottery,<br />

Mikella E. Hankus, Ellen L.<br />

Holthoff, Paul M. Pellegrino, Steve<br />

D. Christesen, and Augustus W.<br />

Fountain III. April, p. 6.<br />

Mid-Infrared Vibrational <strong>Spectroscopy</strong><br />

Standoff Detection of Highly Energetic<br />

Materials: New Developments.<br />

Samuel P. Hernández-Rivera, John R.<br />

Castro-Suarez, Leonardo C. Pacheco-<br />

Londoño, Oliva M. Primera-Pedrozo,<br />

Nicolas Rey-Villamizar, Miguel<br />

Vélez-Reyes, and Max Diem. April,<br />

Digital Edition.<br />

Monitoring of Biological Matrices by<br />

GC–MS-MS for Chemical Warfare<br />

Nerve Agent Detection. Jeffrey M.<br />

McGuire, Jr., Edward M. Jakubowski,<br />

and Sandra A. Thomson. April, p. 12.<br />

SUPPLEMENT: FT-IR TECHNOLOGY<br />

FOR TODAY’S SPECTROSCOPISTS<br />

Contact and Orientation Effects in<br />

FT-IR ATR Spectra. Richard Spragg.<br />

August, p. 18.<br />

GPC-IR Hyphenated Technology to<br />

Characterize Copolymers and to<br />

Deformulate Complex Polymer Mixtures<br />

in Polymer-Related Industries.<br />

William W. Carson and Ming Zhou.<br />

August, p. 28.<br />

NIR Monitoring of a Hot-Melt Extrusion<br />

Process. Brandye Smith-Goettler,<br />

Colleen M. Gendron, Neil MacPhail,<br />

Robert F. Meyer, and Joseph X. Phillips.<br />

August, p. 8.<br />

Using Real-Time FT-IR to Characterize<br />

UV Curable Optical Adhesives. Steve<br />

Lowry and Forrest Weesner. August,<br />

p. 40.<br />

SUPPLEMENT: RAMAN<br />

TECHNOLOGY FOR TODAY’S<br />

SPECTROSCOPISTS<br />

Comparison of Laboratory and Handheld<br />

Raman Instruments for the Identification<br />

of Counterfeit Medicines. Sulaf<br />

Assi, Robert Watt, and Tony Moffat.<br />

June, p. 36.<br />

Looking Below the Surface of Breast<br />

Tissue During Surgery. Anita Mahadevan-Jansen,<br />

Matthew D. Keller,<br />

Elizabeth Vargis, Brittany Caldwell,<br />

The-Quyen Nguyen, Nara de Matos<br />

Granja, Melinda Sanders, and Mark<br />

C. Kelley. June, p. 48.<br />

Raman <strong>Spectroscopy</strong> of Supported Lipid<br />

Bilayer Nanoparticles. Selver Ahmed,<br />

Stephanie L. Wunder, and Zhorro S.<br />

Nickolov. June, p. 8.<br />

Raman <strong>Spectroscopy</strong> Using a Fixed-Grating<br />

Spatial Heterodyne Interferometer.<br />

Nathaniel R. Gomer, Christopher M.<br />

Gordon, Paul Lucey, Shiv K. Sharma, J.<br />

Chance Carter, and S. Michael Angel.<br />

June, p. 22.<br />

X-RAY SPECTROSCOPY<br />

The Dynamic World of X-ray Fluorescence.<br />

Laura Bush. July, p. 40. ◾<br />

For more information on this topic,<br />

please visit our homepage at:<br />

www.spectroscopyonline.com


36 SpectroScopy corporAte cApABILItIeS DECEMBER 2011<br />

1st Detect Corp<br />

www.spectroscopyonline.com<br />

Company Description<br />

1st Detect Corp, a division of Astrotech Corp., is leveraging advances in chemical detection technology<br />

from the space program to offer highly advanced, next generation chemical detection and analysis<br />

instrumentation.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Miniature mass spectrometry<br />

1st Detect Corp<br />

907 Gemini Ave<br />

Houston TX 77058<br />

Telephone<br />

(972) 617-9939<br />

FAx<br />

(713) 558-5963<br />

e-mAIl<br />

info@1stdetect.com<br />

Web sITe<br />

www.1stdetect.com<br />

usA employees:<br />

16<br />

Markets Served<br />

⦁ Security, Defense<br />

⦁ Industrial process control<br />

⦁ Petrochemical<br />

⦁ Pharmceutical<br />

⦁ Environmetal<br />

Major Products/Services<br />

The Miniature Chemical Detector from 1st Detect is an ion-trap mass spectrometer designed for<br />

field-portable and benchtop applications such as industrial process control, security and defense,<br />

first response and critical infrastructure monitoring, and medical diagnostics and analysis. The instrument<br />

has a weight of 15 lb, a mass range of 10–450 amu, and a resolution of less than 1 amu.<br />

It provides ppb level analysis in less than 2 s, with ppt analysis in 30 s with the optional preconcentrator.<br />

The instrument can be operated with power supplies including 120/240 V AC, 24 V DC, or<br />

supplied batteries.<br />

employees ouTsIDe usA:<br />

2<br />

yeAr FounDeD<br />

2007


www.spectroscopyonline.com<br />

Agilent Technologies, Inc.<br />

DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 37<br />

Agilent Technologies, Inc.<br />

5301 Stevens Creek Blvd<br />

Santa Clara, CA 95052<br />

Telephone<br />

(800) 227-9770<br />

FAx<br />

(302) 633-8901<br />

e-mAIl<br />

cag_sales-na@agilent.com<br />

Web sITe<br />

www.agilent.com<br />

number oF us employees<br />

6000<br />

employees ouTsIDe usA<br />

12,500<br />

yeAr FounDeD<br />

1999<br />

Company Description<br />

Agilent Technologies, Inc. (NYSE:A) is a global leader of measurement<br />

technology for life sciences, chemical analysis, communciations,<br />

and electronics. The company’s 18,500<br />

employees serve customers in more than 110 countries. In<br />

fiscal 2010, Agilent had net revenues of $5.4 billion USD.<br />

Agilent’s life sciences group and chemical analysis group are<br />

leading global providers of instrumentation, consumables,<br />

software, and services to analytical chemistry and life science<br />

research laboratories.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ GC<br />

⦁ GC–MS<br />

⦁ LC<br />

⦁ LC–MS<br />

⦁ SFC<br />

⦁ Capillary electrophoresis<br />

Markets Served<br />

⦁ Food safety and quality<br />

⦁ Environmental testing<br />

⦁ Energy/petrochemical<br />

⦁ Forensics<br />

⦁ Pharmaceutical<br />

⦁ Materials science<br />

⦁ Drug discovery<br />

⦁ Genomics<br />

⦁ Proteomics<br />

⦁ Metabolomics<br />

⦁ Emerging life sciences<br />

⦁ Integrated biology<br />

Major Products/Services<br />

1200 Infinity LC systems (including 1290<br />

UHPLC); 7890A GC; 5975C GC–MS; 7000<br />

Series Triple Quadrupole GC–MS; 6100<br />

Series Single Quadrupole LC–MS; 6200<br />

Series Accurate Mass Mass TOF LC–MS;<br />

6400 Series Triple Quadrupole LC–MS;<br />

6500 Series Accruate Mass Q-TOF LC–MS;<br />

7500 Series ICP-MS; OpenLAB chromatography<br />

data systems; OpenLAB ELN electronic<br />

lab notebook; OpenLAB Enterprise<br />

Content Management System; Automation<br />

systems for life sciences; Genomic microarrays,<br />

target enrichment and reagents;<br />

GeneSpring bioinformatics; qPCR; NMR<br />

and MRI systems; Services and support;<br />

Vacuum systems.<br />

Facility<br />

Major facilities in Santa Clara, California;<br />

Wilmington, Delaware; Waldbronn,<br />

Germany; Tokyo, Japan; and Shanghai,<br />

China.


38 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

ABB Analytical Measurements<br />

Markets Served<br />

⦁ Laboratory and academic<br />

⦁ Life sciences<br />

⦁ Pharmaceutical<br />

⦁ Fine chemicals, specialty chemicals,<br />

and commodity chemicals<br />

⦁ Refining and petrochemicals<br />

⦁ Metallurgical<br />

⦁ Semiconductor<br />

⦁ Original equipment manufacturer<br />

(OEM)<br />

⦁ Remote sensing and aerospace<br />

Abb Analytical<br />

measurements<br />

585 boul. Charest E.<br />

Suite 300<br />

Quebec, QC G1K 9H4<br />

Canada<br />

Telephone<br />

(418) 877-2944<br />

FAx<br />

(418) 877-2834<br />

e-mAIl<br />

ftir@ca.abb.com<br />

Web sITe<br />

www.abb.com/analytical<br />

number oF employees<br />

200<br />

yeAr FounDeD<br />

1973<br />

Company Description<br />

ABB Analytical Measurements enables scientists around the<br />

world to perform through excellence in infrared spectroscopy.<br />

ABB is a market leader in Fourier transform infrared (FT-IR and<br />

FT-NIR) in terms of reliability and reproducibility. ABB Analytical<br />

designs, manufactures, and markets high-performance, affordable<br />

spectrometers as well as turnkey analytical solutions and<br />

spectroradiometers for remote sensing. ABB Analytical<br />

capabilities encompass one of the largest portfolios in the world<br />

for laboratory, at-line, and process FT-IR analyzers. They perform<br />

real-time analysis of the chemical composition and/or physical<br />

properties of a process sample stream.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ FT-IR<br />

⦁ FT-NIR<br />

⦁ Spectroradiometry and remote sensing<br />

⦁ Dedicated team of engineers offering simple and<br />

dependable solutions with reliable instruments<br />

⦁ Local point of contact for field service and technical<br />

support in most countries around the world with<br />

inventories for parts on all continents<br />

Major Products/Services<br />

ABB’s advanced solutions combine<br />

analyzers, advanced process control, data<br />

management, and process and application<br />

knowledge to improve the operational<br />

performance, productivity, capacity,<br />

and safety of industrial processes for<br />

customers. For all laboratory or process<br />

needs, ABB can be your partner and single-source<br />

provider of simple, low-cost,<br />

high performance, general-purpose FT-IR<br />

and FT-NIR spectrometers. The company<br />

also markets analyzers for hydrogen and<br />

inclusion measurement in liquid<br />

aluminum.<br />

Facility<br />

Our manufacturing facility located in<br />

Quebec City, Canada, employs more than<br />

200 people, including R&D, manufacturing,<br />

marketing, sales, and administrative groups.<br />

The ABB Group of companies operates in<br />

around 100 countries and employs about<br />

130,000 people.


FT-NIR QA software with intuitive workflow<br />

and superior ease of use?<br />

Absolutely.<br />

Intuitive workflow with integrated MB3600 instrument and accessory control<br />

make running QA applications simple for your operators and reliable for you.<br />

From collecting reference data and designing your QA applications to deployment<br />

of turnkey QA methods Horizon MB QA will guide you every step of the way.<br />

Support for customized messages in any language makes your operators feel<br />

right at home from day one.<br />

Horizon MB QA brings intuitive workflows and superior ease of use<br />

to QA method development and deployment.<br />

Discover how ABB helps its customers overcome their technical challenges:<br />

www.abb.com/analytical<br />

ABB Analytical Measurement<br />

Phone: +1 418-877-2944<br />

1 800 858-3847 (North America)<br />

Email: ftir@ca.abb.com


40 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Amptek, Inc.<br />

Completing Amptek’s XRF portable<br />

solutions for exact measurements are the<br />

USB controlled Mini-X X-ray tube and the<br />

XRF-FP Quantitative Analysis Software.<br />

Please visit our web site for complete<br />

specifications.<br />

Amptek, Inc.<br />

14 DeAngelo Drive<br />

Bedford, MA 01730<br />

Telephone<br />

( 781) 275-2242<br />

FAx<br />

( 781) 275-3470<br />

e-mAIl<br />

sales@amptek.com<br />

Web sITe<br />

www.amptek.com<br />

number oF employees<br />

47<br />

yeAr FounDeD<br />

1977<br />

Company Description<br />

Amptek, Inc. is a recognized world leader in the design<br />

and manufacture of state-of-the-art X-ray and gamma ray<br />

detectors, preamplifiers, instrumentation, and components<br />

for portable instruments, laboratories, satellites, and analytical<br />

purposes. These products provide the user with high<br />

performance and high reliability together with small size<br />

and low power.<br />

Chief Spectroscopic Techniques Supported<br />

X-ray fluorescence (EDXRF), direct spectral measurements,<br />

SEM, PIXE, and TXRF.<br />

Markets Served<br />

Amptek serves wherever X-ray detection is used; for example,<br />

hand-held and table-top XRF analyzers produced by OEMs;<br />

research facilities in universities, commercial enterprises<br />

and the military; nuclear medicine; space; museums;<br />

environmental monitoring; and geological analysis of soils<br />

and minerals.<br />

Major Products/Services<br />

Models Super XR-100SDD and XR-100CR are high<br />

performance X-ray detector systems featuring a wide range of<br />

detection areas and efficiency; resolution of 125 eV FWHM;<br />

and solid-state design. Power and shaping are provided by<br />

the PX5 Digital Pulse Processor. The XR-100 successfully analyzed<br />

the rocks and soil on Mars.<br />

The X-123 is a complete X-ray detector system in one<br />

small box that fits in your hand. The X-123 incorporates<br />

either the Amptek Si-Pin Diode Detector or Super Silicon<br />

Drift Detector; Charge Sensitive Preamplifier; the Amptek<br />

DP5 Digital Pulse Processor and MCA; and the Amptek PC5<br />

Power Supply. This small, low power, easy to operate, highperformance<br />

instrument is ideal for both the laboratory and<br />

OEM industries.<br />

Applications<br />

⦁ X-Ray fluorescence<br />

⦁ Process control<br />

⦁ OEM instrumentation<br />

⦁ RoHS/WEEE compliance testing<br />

⦁ Nondestructive analysis with XRF<br />

⦁ Restricted metals detection<br />

⦁ Environmental monitoring<br />

⦁ Medical and nuclear electronics<br />

⦁ Heavy metals in plastics<br />

⦁ Lead detectors<br />

⦁ Toxic dump site monitoring<br />

⦁ Semiconductor processing<br />

⦁ Nuclear safeguards verification<br />

⦁ Plastic & metal separation<br />

⦁ Coal & mining operations<br />

⦁ Sulfur in oil and coal detection<br />

⦁ Smoke stack analysis<br />

⦁ Plating thickness<br />

⦁ Oil logging<br />

⦁ Electro-optical systems<br />

⦁ Research experiments & teaching<br />

⦁ Art and archaeology<br />

⦁ Jewelry analysis


X-Ray Detectors<br />

t4PMJE4UBUF%FTJHO t64#$POUSPMMFE<br />

t-PX$PTUt&BTZUP6TF<br />

The PERFORMANCE You Need<br />

NEW SUPER SDD<br />

125 eV FWHM<br />

5.9<br />

LF7<br />

55<br />

Fe<br />

Si-PIN<br />

5.9<br />

LF7<br />

55<br />

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NN 2 YN<br />

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$PVOUT<br />

145 eV FWHM<br />

NN 2 YN<br />

TQFBLJOHUJNF<br />

1#3BUJP<br />

&OFSHZ LF7<br />

&OFSHZ LF7<br />

Complete XRF System<br />

The CONFIGURATION You Want<br />

OEM Components for XRF<br />

Complete<br />

X-Ray Spectrometer<br />

Our OEM Technology<br />

Your Products<br />

tTable-top XRF Analyzers<br />

tHand-held XRF Analyzers<br />

APPLICATIONS<br />

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t1SPDFTT$POUSPM t3P)48&&&$PNQMJBODF5FTUJOH<br />

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AMPTEK Inc.<br />

www.amptek.com


42 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Andor Technology<br />

Andor Technology<br />

7 Millennium Way<br />

Springvale Business Park<br />

Belfast BT12 7AL<br />

United Kingdom<br />

Telephone<br />

(800) 296-1579<br />

e-mAIl<br />

marketing@andor.com<br />

Web sITe<br />

www.andor.com<br />

number oF employees<br />

321<br />

employees ouTsIDe usA<br />

270<br />

yeAr FounDeD<br />

1989<br />

Company Description<br />

Andor Technology is a world leader in the manufacturing of<br />

high performance VUV to SWIR modular spectroscopy<br />

detection solutions. Based around best-in-class, researchgrade<br />

CCDs, exclusive electron multiplying CCDs and<br />

intensified CCD detectors, as well as seamlessly configurable<br />

spectrographs and dedicated spectroscopy software, Andor’s<br />

robust detection solutions offer a unique combination of sensitivity,<br />

speed, and ease of use. Andor’s core technology<br />

Ultravac TM combines with the latest cutting-edge technology<br />

in the fields of sensors, electronics, optic, and software to<br />

deliver world-class, market-leading scientific spectroscopy<br />

detection systems to academics and industrial integrators.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Absorption – transmission – reflection (UV-NIR and SWIR)<br />

⦁ Raman (244 to 1064 nm)<br />

⦁ Fluorescence – luminescence (UV-NIR and SWIR)<br />

⦁ Micro-Raman and Micro-fluorescence<br />

⦁ Photon counting<br />

⦁ Single molecule spectroscopy<br />

⦁ Plasma studies<br />

⦁ Laser induced breakdown spectroscopy (LIBS)<br />

Markets Served<br />

In the analytical and life sciences markets, Andor products<br />

are particularly suited to fundamental research in the field of<br />

biology, nanotechnology, material characterization (polymers,<br />

semi-conductors), chemical analysis, and astronomy, as well<br />

as industrial applications such as food and safety, process<br />

control, drug screening, forensic, environment/water monitoring,<br />

and solar panel inspection.<br />

Major Products/Services<br />

Andor’s spectroscopy range features a high<br />

performance CCD platform (Newton) with<br />

dedicated spectroscopy EMCCD for rapid,<br />

light-starved applications. Andor’s most<br />

popular CCD/InGaAs platform is the iDus,<br />

for all general spectroscopy applications,<br />

alongside the market leading ICCD<br />

camera, iStar, for ns gated applications.<br />

The Shamrock family is Andor’s versatile<br />

spectrograph platform, with USB<br />

connectivity and seamless configuration<br />

with a wide range of accessories, including<br />

fiber optics bundles, and interface to<br />

microscopes. Solis software boasts a<br />

dedicated interface, integrating data<br />

acquisition and cameras/spectrometers<br />

simultaneous control. Andor’s X-Ray<br />

detector range features a wide range of<br />

direct/indirect detection options on the<br />

Newton and iKon platform.<br />

Facility<br />

Andor’s purpose-built 4650 m 2<br />

(50,000-square-foot) headquarters is<br />

based in Belfast, Northern Ireland. It<br />

hosts state-of-the-art 3000-square-foot<br />

Class 1000 and 100 clean rooms, and<br />

also provides a unique, 6-Sigma driven<br />

environment for streamlining of products<br />

design, manufacturing, and thorough QC<br />

testing of each system prior to shipment.


www.spectroscopyonline.com DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 43<br />

Applied Photophysics<br />

Applied photophysics<br />

21 Mole Business Park<br />

Leatherhead, Surrey<br />

KT22 7BA<br />

United Kingdom<br />

Telephone<br />

+44 (0) 1372 386537<br />

Toll-free (from USA only)<br />

(800) 543-4130<br />

e-mAIl<br />

Sales Department:<br />

sales@ photophysics.com<br />

Technical Support:<br />

support@ photophysics.com<br />

Web sITe<br />

www.photophysics.com<br />

yeAr FounDeD<br />

1971<br />

Company Description<br />

Applied Photophysics (APL) has firmly established itself as a<br />

global developer and manufacturer of high quality, high performance,<br />

modern spectrometers by providing cutting-edge solutions<br />

and world-class support for bioscience and biopharmaceutical<br />

research both in academia and industry. From research through<br />

development to production, our scientific expertise and innovative<br />

solutions help life science researchers to understand complex biological<br />

systems, allowing them to be at the forefront of discovery.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Circular dichroism (CD) spectroscopy<br />

⦁ Stopped-flow spectroscopy<br />

⦁ Laser-flash spectroscopy<br />

Markets Served<br />

APL offers precision spectrometers to academic and industrial<br />

markets. The Chirascan range of CD spectrometers are now the<br />

instruments of choice for use in drug development, formulation<br />

testing, and quality control. The SX20 and LKS80 spectrometers<br />

are established leaders for stopped-flow and laser-flash research,<br />

addressing applications in protein structure, folding, and conformation,<br />

together with biomolecular reaction kinetics and the study<br />

of chemical reaction mechanisms.<br />

Major Products/Services<br />

Chirascan and Chirascan-plus (CD) spectrometers<br />

Outstanding sensitivity, novel detection technology, powerful<br />

software combine to make these CD spectrometers the world’s<br />

most advanced.<br />

NEW Chirascan-plus ACD spectrometer<br />

The world’s first and only ultra-sensitive,<br />

high-speed, automated CD spectrometer.<br />

This unique instrument significantly extends<br />

the scope and range of CD applications and<br />

delivers a minimum 50-fold increase in<br />

operator productivity.<br />

SX20 stopped-flow spectrometer<br />

The SX20 is the market-leading stopped-flow<br />

reaction analyzer capable of measuring fast<br />

reactions with a minimum of material.<br />

LKS80 nanosecond laser-flash<br />

photolysis spectrometer<br />

The new LKS80 offers even higher<br />

sensitivity than earlier models for studying<br />

by direct measurement the reactions of transient<br />

species such as radicals, excited states<br />

or ions, in chemical and biological systems.<br />

RX2000 rapid-mixing stopped-flow unit<br />

Adds stopped-flow rapid reaction kinetics to<br />

any UV-visible spectrometer or fluorometer.<br />

Pro-Data software<br />

All our products use a common software<br />

suite giving cross-platform compatibility.<br />

Accessories<br />

Maximize the capabilities and take full<br />

advantage of the potential built into your<br />

instrument with a wide range of accessories.<br />

Customer Support<br />

Support is provided for the lifetime of the<br />

product and every instrument comes with a<br />

warranty of at least 12 months that can be<br />

easily extended. A world-class service team is<br />

on hand for support and applications advice.<br />

Facilities<br />

Headquartered close to London, United<br />

Kingdom. APL has recently opened offices<br />

in China and the United States. See<br />

www.appliedphotophysics.com/company/authorized-agents<br />

for our worldwide<br />

distribution network.


44 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Avantes, Inc.<br />

developing research and teaching opportunities.<br />

Our OEM program is designed to work with<br />

our customers to identify needs and customize<br />

an Avantes’ spectroscopy solution based our<br />

customer’s needs and Avantes technical know<br />

experience. Avantes’ continued growth is based<br />

upon a commitment to providing exceptional<br />

technology and superb customer satisfaction.<br />

Avantes, Inc.<br />

9769 W. 119th Ave., Suite 4<br />

Broomfield, CO 80021<br />

Telephone<br />

(303) 410-8668<br />

FAx<br />

(303) 410-8669<br />

e-mAIl<br />

infoUSA@avantes.com<br />

Web sITe<br />

www.avantes.com<br />

number oF employees<br />

50<br />

yeAr FounDeD<br />

1993<br />

Company Description<br />

Avantes is a leading innovator in the development and<br />

application of miniatures pectrometers. Avantes continues<br />

to develop and introduce new instruments for fiber optic<br />

spectroscopy to meet our customer’s application needs.<br />

Avantes instruments and accessories are also deployed<br />

into a variety of OEM applications in a variety of industries<br />

in markets throughout the world. With more than 15 years<br />

of experience in fiber optic spectroscopy and thousands<br />

of instruments in the field, Avantes is eager to help our<br />

customers find their Solutions in <strong>Spectroscopy</strong> ® .<br />

Principal Spectroscopic Techniques Supported<br />

⦁ UV–vis/NIR spectroscopy<br />

⦁ Process control<br />

⦁ Absorbance/transmittance/reflectance<br />

⦁ Laser-induced breakdown spectroscopy<br />

⦁ CIE color spectroscopy<br />

⦁ Portable spectrometers<br />

⦁ Fluorescence spectroscopy<br />

⦁ Custom applications<br />

⦁ Irradiance<br />

⦁ Raman spectroscopy<br />

⦁ OEM application development<br />

Markets Served<br />

Avantes works with customers in a variety of markets, including<br />

chemical, biomedical, aerospace, semiconductor, gemological, paper,<br />

pharmaceutical, and food processing technology. Additionally,<br />

Avantes works with research organizations and universities, aiding in<br />

Major Products/Services<br />

Low-cost, high-resolution, miniature<br />

fiber optic spectrometers:<br />

System solutions and OEM instruments<br />

for applications from 185 nm to 2500<br />

nm. Detector choices: PDA, CMOS, CCD,<br />

back-thinned CCD, and InGaAs. Optical<br />

benches with focal lengths of 45, 50 or 75<br />

mm; revolutionary new ultra-low straylight<br />

optimized optical bench (ULS) and a new<br />

high sensitivity optical bench. Other features:<br />

14 and 16 bit A/D converters, TE cooling,<br />

multi-channel instrument configurations<br />

enabling simultaneous signal acquisition,<br />

USB2 communication, support for multiple<br />

instruments from a single computer, and 14<br />

programmable digital I/O ports.<br />

Standard application solutions:<br />

Irradiance and LED measurements,<br />

gemology, hemometric analysis, thin-film<br />

measurement, color, fluorescence, laserinduced<br />

breakdown spectroscopy, Raman<br />

spectroscopy, and process control.<br />

Light sources:<br />

Tungsten-halogen, Deuterium, LED, and<br />

Xenon calibration sources for wavelength<br />

and irradiance.<br />

Facility<br />

Avantes engineering, manufacturing,<br />

sales, and service headquarters is in the<br />

Netherlands. The company also operates<br />

direct offices in China and North America. In<br />

addition, Avantes has a growing worldwide<br />

distribution network of more than 35<br />

qualified distributors to meet our customer’s<br />

needs worldwide.


www.spectroscopyonline.com<br />

B&W Tek, Inc.<br />

DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 45<br />

Major Products/Services<br />

⦁ Fiber coupled spectrometer modules<br />

⦁ Diode and DPSS Lasers<br />

⦁ Laboratory, portable, and handheld<br />

Raman spectrometers<br />

⦁ Customized design and development<br />

services<br />

⦁ Customized photonic instrumentation<br />

manufacturing<br />

Facilities<br />

B&W Tek boasts three United States facilities<br />

in Delaware (2) and New Jersey (1), a sales<br />

office in Lubeck, Germany, two facilities in<br />

Shanghai, China, and another office in<br />

Saitama, Japan. Most of our engineering,<br />

design, and manufacturing takes place in our<br />

Newark, Delaware headquarters location.<br />

b&W Tek, Inc.<br />

19 Shea Way<br />

Newark, DE 19713<br />

Telephone<br />

(302) 368-7824<br />

FAx<br />

(302) 368-7830<br />

e-mAIl<br />

sales@bwtek.com<br />

Web sITe<br />

www.bwtek.com<br />

number oF employees<br />

USA: 80<br />

Elsewhere: 100<br />

yeAr FounDeD<br />

1997<br />

Company Description<br />

B&W Tek is an advanced instrumentation company producing<br />

optical spectroscopy, laser instrumentation, and portable/lab<br />

grade Raman systems. B&W Tek provides spectroscopy and<br />

laser solutions for the pharmaceutical, biomedical, physical,<br />

chemical, LED lighting, and research communities. Our commitment<br />

to innovating solutions has made B&W Tek a leader<br />

in Raman spectroscopy solutions worldwide. With a strong<br />

vertical integration capability, B&W Tek, Inc. also provides<br />

custom product development, design, and manufacturing. In<br />

addition, B&W Tek has recently introduced the NanoRam TM ,<br />

the most sensitive and repeatable handheld Raman<br />

spectrometer ever designed for identifying harmful, nonconforming<br />

materials before they reach production.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UV<br />

⦁ Visible<br />

⦁ NIR<br />

⦁ Raman<br />

⦁ Microscopy<br />

Markets Served<br />

B&W Tek provides solutions for analytical, industrial, medical,<br />

biophotonic, and diagnostic applications. Our products are used<br />

in markets such as semiconductor, solar, pharmaceuticals, LED<br />

lighting, specialty chemicals, academic labs, government labs, and<br />

medical and biomedical development and manufacturing.


46 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Bruker Daltonics<br />

Markets Served<br />

Bruker Daltonics’ mass spectrometers are<br />

a powerful tool for a wide variety of<br />

applications with different analytical<br />

challenges.<br />

Our analytical systems combine high<br />

performance mass spectrometers,<br />

software, and accessories to deliver<br />

answers for a broad range of areas<br />

including:<br />

⦁ Proteomics and protein analysis<br />

⦁ Clinical diagnostics<br />

⦁ Drug metabolism studies<br />

⦁ Food/environmental applications<br />

⦁ Chemistry support and chemical analysis<br />

⦁ Petroleomics<br />

⦁ Forensics<br />

bruker Daltonics<br />

40 Manning Road<br />

Billerica, MA 01821<br />

Telephone<br />

(978) 663-3660<br />

FAx<br />

(978) 667-5993<br />

e-mAIl<br />

ms-sales@bdal.com<br />

Web sITe<br />

www.bruker.com/ms<br />

Company Description<br />

Bruker Daltonics provides a variety of innovative mass<br />

spectrometry systems. Our powerful, yet easy to implement,<br />

products are specifically designed to meet the rapidly<br />

growing needs of customers in the academic, pharmaceutical,<br />

industrial, and clinical areas.<br />

Consistently and expertly supported, our turn-key system<br />

solutions and complete workflows offer integrated instrument<br />

and software tools which enhance the productivity and<br />

capabilities of any analytical operation.<br />

Bruker Daltonics product lines include platforms representing<br />

many types of separation technologies and mass<br />

spectrometry including:<br />

⦁ Matrix assisted laser desorption ionization time-of-flight<br />

mass spectrometer (MALDI-TOF and MALDI-TOF/TOF)<br />

⦁ Electrospray ionization (ESI), ion trap mass spectrometer<br />

⦁ ESI-TOF, and ESI-quadrupole TOF (qTOF) mass spectrometers<br />

⦁ Ultra high resolution TOF (UHR-TOF) mass spectrometer<br />

⦁ Fourier transform mass spectrometer (FTMS)<br />

⦁ Inductively coupled plasma mass spectrometer (ICP-MS)<br />

⦁ Gas chromatograph with single and triple quadrupole mass<br />

spectrometer (GC–MS)<br />

⦁ Gas chromatograph (GC)<br />

⦁ Nano-LC<br />

Facilities<br />

Bruker Daltonics is headquartered in<br />

Billerica, Massachusetts with a sales,<br />

service, and applications facility in<br />

Fremont, California, as well as major<br />

facilities in Germany (Bremen and Leipzig)<br />

and the United Kingdom. A global network<br />

of demonstration, sales, and service sites<br />

provides complete worldwide support for<br />

all our products and services.


Setting the Benchmark<br />

in ICP-MS: aurora m90<br />

Bruker continues to find new and novel ways to meet your changing<br />

needs. As a leader in elemental analysis you can be assured that when<br />

you buy a Bruker ICP-MS, you’re buying more than just an instrument.<br />

You’re buying a relationship with one of the most respected and<br />

experienced instrument companies in the world.<br />

Contact us today at ms-sales@bdal.com or visit us on the web at<br />

www.bruker.com/ms<br />

Innovation with Integrity<br />

ICP-MS


48 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Bruker Corporation<br />

⦁ Nuclear magnetic resonance (NMR)<br />

⦁ Electron paramagnetic resonance<br />

(EPR)<br />

⦁ Magnetic resonance imaging (MRI)<br />

⦁ Low resolution benchtop NMR<br />

analyzers<br />

⦁ X-ray crystallography (SC-XRD)<br />

⦁ X-ray diffraction (XRD)<br />

⦁ X-ray fluorescence (XRF)<br />

⦁ Handheld X-ray (XRF) spectrometers<br />

⦁ X-ray microanalysis (EDS, EBSD)<br />

⦁ Optical emission spectroscopy (OES)<br />

⦁ CS/ONH-Analysis<br />

⦁ Atomic force microscopy (AFM)<br />

⦁ Scanning probe microscopy (SPM)<br />

⦁ Stylus and optical metrology<br />

bruker Corporation<br />

40 Manning Road<br />

Billerica, MA 01821<br />

Telephone<br />

(978) 663-3660<br />

FAx<br />

(978) 667-5993<br />

e-mAIl<br />

info@bruker.com<br />

Web sITe<br />

www.bruker.com<br />

Company Description<br />

The Bruker name has become synonymous with the excellence,<br />

innovation, and quality that characterizes our comprehensive<br />

range of scientific instrumentation. Our solutions<br />

encompass a wide number of analytical techniques ranging<br />

from magnetic resonance to mass spectrometry, to optical<br />

and X-ray spectroscopy.<br />

These market- and technology-leading products are driving<br />

and facilitating many key application areas such as life<br />

science research, pharmaceutical analysis, applied analytical<br />

chemistry applications, materials research and nanotechnology,<br />

clinical research, molecular diagnostics, and homeland<br />

defense.<br />

Visit our website to discover more about our technologies<br />

and solutions.<br />

Bruker — Innovation with Integrity!<br />

Chief Spectroscopic Techniques Supported<br />

⦁ FT-infrared spectroscopy and microscopy (FT-IR)<br />

⦁ FT-near infrared spectroscopy (FT-NIR)<br />

⦁ Raman spectroscopy and microscopy<br />

⦁ Terahertz spectroscopy and imaging<br />

⦁ Liquid chromatography–mass spectrometry (LC–MS)<br />

⦁ FT-mass spectrometry (FTMS)<br />

⦁ MALDI-TOF (/TOF) mass spectrometry<br />

⦁ Inductively coupled plasma mass spectrometry (ICP-MS)<br />

⦁ Gas chromatography–mass spectrometry (GC–MS)<br />

⦁ Ion mobility spectrometry (IMS)


www.spectroscopyonline.com<br />

CVI melles Griot lasers<br />

2051 Palomar Airport Road, 200<br />

Carlsbad, CA 92011<br />

Telephone<br />

(760) 438-2131<br />

e-mAIl<br />

lasers@cvimellesgriot.com<br />

CVI melles Griot<br />

optics & Assemblies:<br />

200 Dorado Place SE<br />

Albuquerque, NM 87123<br />

Telephone<br />

(505) 296-9541<br />

e-mAIl<br />

optics@cvimellesgriot.com<br />

Web sITe<br />

www.cvimellesgriot.com<br />

AsIA<br />

+81 3 3407-3614<br />

europe<br />

+31 316 333 041<br />

CVI Melles Griot<br />

Company Description<br />

CVI Melles Griot is a leading global supplier of OEM and fast<br />

turn catalog photonics products including lasers at over 38<br />

wavelengths, optics, coatings covering the deep ultraviolet<br />

to the infrared, opto-mechanics, and positioning equipment.<br />

The company’s unique breadth of manufacturing and design<br />

expertise in electronics, lasers, optics, coatings, and thermal<br />

management is evident in everything from simple components<br />

to precision integrated electro-optic assemblies.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ <strong>Spectroscopy</strong>; Microscopy<br />

⦁ Capillary electrophoresis<br />

⦁ Biotech/Medical<br />

⦁ Laser-induced fluorescence<br />

⦁ Pharmaceutical<br />

⦁ Particle characterization<br />

⦁ Semiconductor<br />

⦁ Non-contact inspection<br />

⦁ Industrial<br />

⦁ Interferometry<br />

⦁ Environmental<br />

⦁ Velocimetry<br />

⦁ Government/Military<br />

Markets Served<br />

⦁ Design, development, and manufacturing on 3 continents<br />

⦁ Lasers, optics, thin films, mechanics, drive electronics<br />

⦁ Over 39 years of volume production<br />

⦁ Over 2.9 million lasers and 120 million optics shipped<br />


50 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

EDAX, Inc.<br />

eDAx, Inc.<br />

91 McKee Drive<br />

Mahwah, NJ 07430<br />

Telephone<br />

(201) 529-4880<br />

FAx<br />

(201) 529-3156<br />

e-mAIl<br />

info@amtek.com<br />

Web sITe<br />

www.edax.com<br />

yeAr FounDeD<br />

1962<br />

Company Description<br />

EDAX, Inc. is an ISO-9001 certified manufacturer with over 50<br />

years of experience building instrumentation for the elemental<br />

and structural analysis of materials. EDAX’s founding technology<br />

was the detection and measurement of fluorescent X-rays for<br />

qualitative and quantitative elemental analysis — for example,<br />

elemental analysis on electron beam microscopes. Since that<br />

time, EDAX has sought to expand our product offering through<br />

new technologies and complementary techniques to provide our<br />

customers with the latest analytical instrumentation available.<br />

EDAX continues to be a world leader in materials analysis<br />

providing both stand-alone micro-XRF systems and microscopemounted<br />

tools.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Energy dispersive spectroscopy<br />

⦁ Energy dispersive X-ray fluorescence<br />

⦁ Electron back scatter diffraction<br />

⦁ Wavelength dispersive spectroscopy<br />

Markets Served<br />

EDAX instrumentation for elemental and structural analysis is<br />

found in a broad spectrum of industrial, academic, and government<br />

applications from the field or warehouse to the most<br />

advanced research and development laboratory. Typical markets<br />

served include semiconductor and microelectronics, academic,<br />

and industrial R&D laboratories, ROHS/WEEE, renewable energy,<br />

pharmaceuticals, mining, security, forensics, catalysts,<br />

petrochemicals, metallurgy, and manufacturing operations.<br />

Major Products/Services<br />

⦁ Energy dispersive X-ray fluorescence:<br />

EDAX manufactures micro XRF<br />

analyzers for the laboratory.<br />

⦁ Electron backscatter diffraction: EDAX<br />

supplies instrumentation for materials<br />

structural analysis on SEM electronbeam<br />

microscopes.<br />

⦁ Energy dispersive spectroscopy: EDAX<br />

provides a full range of EDS products<br />

for elemental analysis on SEM and TEM<br />

electron-beam microscopes.<br />

⦁ Wavelength dispersive spectroscopy:<br />

EDAX offers parallel beam WDS products<br />

for elemental analysis on SEM<br />

electron-beam microscopes.<br />

⦁ Fluorescent X-ray detectors: EDAX<br />

supplies Si(Li) detectors and silicon drift<br />

detectors, which are capable of handling<br />

count rates of over 1,000,000 cps<br />

and parallel beam wavelength<br />

dispersive spectrometers.<br />

Facilities<br />

EDAX headquarters is located in Mahwah,<br />

New Jersey, housing sales, technical<br />

support, and manufacturing operations.<br />

EDAX is committed to providing the best<br />

possible support for our customers worldwide<br />

with sales, service, and applications<br />

support offices located in Japan, China,<br />

Singapore, The Netherlands, Germany, the<br />

United Kingdom, and the United States.


is Puts a New Spin on<br />

Micro XRF Analysis Versatility<br />

on-Destructive<br />

Micro to Millimeter<br />

Spot Elemental Analysis<br />

Using Primary Beam<br />

Filters on a Wide Range<br />

of Sample Types<br />

Forensics<br />

Trace Evidence, Solids, Residues,<br />

Powders, Liquids<br />

Industrial<br />

RoHS-WEEE, Quality Control, Failure Analysis,<br />

Coating Thickness/Composition<br />

Antiquities/Museum<br />

Artifact Authentication, Gemstones, Documents


52 SpectroScopy corporAte cApABILItIeS DECEMBER 2011<br />

Edinburgh Instruments<br />

www.spectroscopyonline.com<br />

⦁ Fluorescence spectrometers (lifetime,<br />

phosphorescence only)<br />

⦁ Laser flash photolysis spectrometers<br />

⦁ CO and CO 2<br />

lasers<br />

⦁ Pulsed gas lasers<br />

⦁ Optically pumped lasers<br />

⦁ Picosecond light sources<br />

Facilities<br />

Edinburgh Instruments (EI) is now located<br />

in purpose built 12,800-square-foot facilities<br />

just outside Edinburgh, United Kingdom,<br />

where it employs over 70 people.<br />

The company is involved in the development,<br />

manufacture, and sale of a wide<br />

range of high technology products for the<br />

scientific research and industrial markets.<br />

edinburgh Instruments<br />

2 Bain Square<br />

Kirkton Campus<br />

Livingston EH547DQ<br />

UK<br />

Telephone<br />

44(0) 1506425300<br />

FAx<br />

44(0) 1506425320<br />

e-mAIl<br />

sales@edinst.com<br />

Web sITe<br />

www.edinburghphotonics.com<br />

number oF employees<br />

70<br />

yeAr FounDeD<br />

1971<br />

Company Description<br />

Edinburgh Instruments Ltd. is a global provider of sophisticated<br />

luminescence and fluorescence instrumentation and lasers.<br />

Our products are suitable for a wide range of applications these<br />

include scientific R&D, commercial research, process industries,<br />

environmental monitoring, and other applications. Combined<br />

with our reputation for delivering trustworthy, high-quality, high<br />

performance products our service excellence has helped<br />

establish Edinburgh Instruments as an innovative leading light in<br />

the marketplace. Edinburgh Instruments has a global reputation<br />

for excellence. Excellence in product. Excellence in service.<br />

Excellence in expertise.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Fluorescence spectrometers — steady state, lifetime, and<br />

phosphorescence<br />

⦁ Laser flash photolysis<br />

Markets Served<br />

⦁ Scientific research and industrial markets<br />

⦁ Photophysics<br />

⦁ Photochemistry<br />

⦁ Biophysics<br />

⦁ Biochemistry<br />

⦁ Semiconductor physics<br />

Major Products/Services<br />

⦁ Fluorescence spectrometers (steady state, lifetime,<br />

phosphorescence)<br />

⦁ Fluorescence spectrometers (lifetime only)


www.spectroscopyonline.com<br />

Energetiq Technology, Inc.<br />

DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 53<br />

energetiq Technology, Inc.<br />

7 Constitution Way<br />

Woburn, MA 01801<br />

Telephone<br />

(781) 939-0763<br />

FAx<br />

(781) 939-0769<br />

e-mAIl<br />

info@energetiq.com<br />

Web sITe<br />

www.energetiq.com<br />

yeAr FounDeD<br />

2004<br />

Company Description<br />

Energetiq Technology is a developer and manufacturer of<br />

ultrahigh-brightness light sources that enable the manufacture<br />

and analysis of nano-scale structures and products. Used<br />

in complex scientific and engineering applications such as<br />

analytical instrumentation and leading edge semiconductor<br />

manufacture, Energetiq’s light products are based on new<br />

technology that features broadband output from 170 nm in<br />

the deep UV, through visible and into the near infrared.<br />

Energetiq was founded in 2004 by an experienced<br />

technology development team with deep understanding of<br />

the high power plasma physics needed for high performance<br />

light products. This expertise enables Energetiq to provide<br />

light sources with the highest levels of brightness,<br />

performance, and reliability, as well as long operating life.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UV–vis spectrometry<br />

⦁ Hyperspectral imaging<br />

⦁ Circular dichroism spectroscopy<br />

⦁ Photoemission electron spectroscopy<br />

Markets Served<br />

Energetiq’s light sources are used for analytical spectroscopy,<br />

microscopy, and biological imaging in<br />

the life-sciences; lithography, metrology,<br />

inspection, resist and thin-film processing<br />

of semiconductors, displays and storage<br />

devices; soft X-ray microscopy; and a<br />

variety of R&D applications where<br />

traditional arc-lamps and synchrotron<br />

radiation have commonly been used.<br />

Major Products<br />

UV–vis-NIR, Broadband<br />

⦁ Ultra-high brightness, long-life, LDLS TM<br />

laser-driven light sources:<br />

• EQ-99 (compact, economical,<br />

high brightness)<br />

• EQ-99FC (compact, high brightness,<br />

fiber-coupled output)<br />

• EQ-1000 (high power, high<br />

brightness)<br />

• EQ-1500/1510 (ultra-high<br />

brightness)<br />

• All models feature lifetimes<br />

10× traditional lamps<br />

Facilities<br />

Energetiq Technology provides sales and<br />

service support through its technical staff<br />

in the Woburn, Massachusetts<br />

headquarters and through its network<br />

of representatives and distributors in the<br />

United States, Asia, and Europe, ensuring<br />

quick turnaround for customers. In addition,<br />

the Massachusetts location has a<br />

clean manufacturing facility that provides<br />

Class 1000 assembly capability for optics<br />

assembly and manufacturing for LDLS<br />

products.


54 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Enwave Optronics, Inc.<br />

Major Products/Services<br />

⦁ EZRaman Series for laboratory and field<br />

Raman applications<br />

⦁ ProRaman Series for laboratory, on-line<br />

process monitoring, and other applications<br />

requiring high sensitivity<br />

⦁ MicroSense Series for Raman microscopy<br />

applications<br />

⦁ Frequency-stabilized lasers<br />

⦁ Customized Raman solutions<br />

⦁ OEM products<br />

Facilities<br />

Enwave’s engineering, sales, manufacturing,<br />

and services office is located in<br />

Irvine, California. We also have partners<br />

and distributors in North America, Europe,<br />

Asia, Latin America, and Australia<br />

to meet the needs of our international<br />

customers.<br />

enwave optronics, Inc.<br />

18200 W. McDurmott Street,<br />

Suite A<br />

Irvine, CA 92614<br />

Telephone<br />

(949) 955-0258<br />

FAx<br />

(949) 955-0259<br />

e-mAIl<br />

info@enwaveopt.com<br />

Web sITe<br />

www.enwaveopt.com<br />

number oF employees<br />

US: 8<br />

Outside the US: 15<br />

yeAr FounDeD<br />

2003<br />

Company Description<br />

Enwave Optronics, Inc. is an innovative leader in high performance<br />

and affordable Raman spectroscopy solutions.<br />

The Enwave engineering team has extensive knowledge<br />

in diode laser optical systems and Raman spectroscopy<br />

instrumentation. We specialize in providing solutions for<br />

Raman applications that other vendors are unable to solve.<br />

We provide full design, prototyping, R&D, manufacturing,<br />

and technical support. We are committed to assisting you<br />

resolve your most challenging application needs and to<br />

providing you with the best performance and quality solutions<br />

at the most affordable prices.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Raman spectroscopy<br />

Markets Served<br />

Enwave’s instruments can be found and utilized for a wide<br />

range of applications and in a variety of industries such<br />

as: education, research, environmental, semiconductor,<br />

pharmaceutical, forensics, chemical, paper and pulp, food<br />

and beverage, biotechnology and life sciences, gemology/<br />

mineralogy, and much more!


www.spectroscopyonline.com DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 55<br />

Hamamatsu Corporation<br />

Major Products/Services<br />

⦁ Detectors: photomultiplier tubes,<br />

infrared detectors, photodiodes, and<br />

microchannel plates<br />

⦁ Image sensors: NMOS, CMOS, InGaAs<br />

photodiode arrays, and CCD<br />

⦁ Miniature spectrometers: UV–vis, NIR,<br />

and Raman<br />

⦁ Light sources: xenon lamps, xenon flash<br />

lamps, deuterium lamps, laser diodes,<br />

and quantum cascade lasers<br />

Company Description<br />

Hamamatsu Corporation is the North American subsidiary of<br />

Hamamatsu Photonics K.K. (Japan), a leading manufacturer of<br />

devices for the generation and measurement of infrared,<br />

visible, and ultraviolet light. These devices include<br />

photodiodes, photomultiplier tubes, scientific light sources, infrared<br />

detectors, photoconductive detectors, and image<br />

sensors. The parent company is dedicated to the advancement<br />

of photonics through extensive research. This corporate<br />

philosophy results in state-of-the-art products that are used<br />

throughout the world in scientific, industrial, and commercial<br />

applications.<br />

Facility<br />

Hamamatsu Corporation is a wholly<br />

owned subsidiary of Hamamatsu<br />

Photonics K.K. (Japan). Hamamatsu<br />

Corporation’s headquarters is located in<br />

Bridgewater, New Jersey. In addition, we<br />

have engineers located throughout the<br />

United States to provide you with<br />

technical and sales support.<br />

Hamamatsu Corporation<br />

360 Foothill Road<br />

Bridgewater, NJ 08807<br />

TelepHone<br />

(908) 231-0960<br />

Fax<br />

(908) 231-1539<br />

e-mail<br />

usa@hamamatsu.com<br />

Web siTe<br />

sales.hamamatsu.com<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UV–visible spectroscopy<br />

⦁ IR spectroscopy<br />

⦁ Raman spectroscopy<br />

⦁ Mass spectroscopy<br />

⦁ Atomic absorption spectroscopy<br />

Markets Served<br />

Hamamatsu provides high performance devices for<br />

analytical instruments. These include detectors and light<br />

sources for use in UV–vis, NIR, Raman, TOF-MS, and other<br />

spectrometers. We also provide miniature spectrometers<br />

for medical and biological research, environmental<br />

monitoring, production and process control, semiconductor<br />

inspection, chromatography, food analysis, water content<br />

measurement, and other industries.


56 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Glass Expansion<br />

Major Products/Services<br />

Nebulizers<br />

⦁ SeaSpray — High dissolved solids nebulizer<br />

⦁ MicroMist — Low uptake nebulizer for<br />

all ICPs<br />

⦁ Conikal — An industry standard<br />

⦁ Slurry — For slurries andsSuspensions<br />

⦁ DuraMist — Routine high-precision HF<br />

analyses<br />

⦁ OpalMist — Ideal for geochemistry and<br />

semiconductor industry<br />

⦁ VeeSpray — Handles high particle and<br />

TDS loads best<br />

Glass expansion<br />

4 Barlows Landing Road<br />

Unit #2A<br />

Pocasset, MA 02559<br />

TelepHone<br />

(508) 563-1800<br />

(800) 208-0097<br />

Fax<br />

(508) 563-1802<br />

e-mail<br />

geusa@geicp.com<br />

Web siTe<br />

www.geicp.com<br />

YeaR Founded<br />

1985<br />

Company Description<br />

Glass Expansion has been manufacturing sample introduction<br />

components for ICP emission and mass spectrometers since<br />

the early 1980s. Today we support both new and old instruments<br />

for 16 different manufacturers, representing sample<br />

introduction systems for over 50 different ICP-AES and ICP-MS<br />

models. Glass Expansion has developed unique and proprietary<br />

manufacturing methods, which have resulted in the<br />

production of components of high mechanical strength and<br />

micron-level dimensional accuracy to satisfy the narrowest of<br />

analytical specifications, each and every time. Our products<br />

are recognized worldwide for their excellent precision,<br />

cost-effectiveness, and reproducibility of results.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ ICP-AES<br />

⦁ ICP-MS<br />

Markets Served<br />

Glass Expansion’s products are used widely in private and<br />

government analytical laboratories within agricultural,<br />

environmental, food, forensic, geological, metallurgical,<br />

petrochemical, and pharmaceutical industries. We support<br />

leading ICP models including Thermo Fisher, PerkinElmer,<br />

Teledyne Leeman, Agilent, SPECTRO Ametek, and Horiba<br />

J-Y. Whether you need just a nebulizer, a complete sample<br />

introduction system, or the answer for a tricky sample, we<br />

have the innovative, high-quality products and applications<br />

expertise to assist.<br />

Spray Chambers<br />

⦁ Tracey Cyclonic — An industry standard<br />

⦁ Twister Cyclonic — Reduces solvent<br />

load<br />

⦁ Cinnabar Cyclonic — Low-volume spray<br />

⦁ IsoMist programmable temperature<br />

spray chamber<br />

Torches<br />

⦁ Fully Demountable D-Torches<br />

⦁ Semi-Demountable Torches<br />

⦁ Fixed Quartz Torches<br />

RF Coils<br />

Replacement RF Coils with optional silver<br />

or gold coating.<br />

Accessories<br />

⦁ Niagara Plus and Assist – Enhanced<br />

productivity accessories<br />

⦁ Capricorn – Argon humidifier<br />

⦁ TruFlo – sample uptake monitor<br />

Facilities<br />

Today, Glass Expansion has two global<br />

offices located in Australia and the<br />

United States. Between our two offices<br />

and network of distributors, we service<br />

every region of the globe, 24 hours a<br />

day. This ensures you receive a rapid<br />

response and timely order deliveries<br />

each and every time.


What makes<br />

Glass Expansion<br />

different?<br />

We are the world leader in the design of ICP<br />

sample introduction systems. The ICP that<br />

you are using now almost certainly incorporates<br />

sample introduction components based on<br />

original Glass Expansion designs.<br />

We provide a unique no-risk guarantee.<br />

If you find one of our products unsuitable in<br />

any way, you can return it for a credit or refund.<br />

We have a full staff of technical people to<br />

assist you. We have our own laboratory with<br />

four ICP spectrometers (ICP-OES and ICP-MS)<br />

and you can count on expert advice on your<br />

application from our experienced technical staff.<br />

We provide rapid delivery. Most items are held<br />

in stock and we ship immediately after receiving<br />

your order.<br />

To request a copy of our catalog, or sign up for our newsletter, please vist our website:<br />

Glass Expansion<br />

4 Barlows Landing Road<br />

Unit 2A • Pocasset • MA 0255 , USA<br />

Toll Free Phone: 800 208 00 7<br />

Telephone: 508 563 1800<br />

Facsimile: 508 563 1802<br />

Email: geusa@geicp.com<br />

Web: www.geicp.com


58 SPECTROSCOPY CORPORATE CAPABILITIES DECEMBER 2011 www.spectroscopyonline.com<br />

Harrick Scientific Products, Inc.<br />

Major Products/Services<br />

Harrick Scientific offers the most complete<br />

line of spectroscopy sampling products,<br />

including:<br />

⦁ Video MVP — a diamond micro ATR<br />

accessory with built-in camera<br />

⦁ MVP Pro Star — an affordable<br />

monolithic diamond ATR accessory<br />

⦁ Praying Mantis — a diffuse reflectance<br />

accessory available with environmental<br />

chambers/reaction cells<br />

⦁ Seagull — a variable angle specular<br />

reflection and ATR accessory<br />

⦁ VariGATR — a variable angle grazing<br />

angle ATR accessory for monolayers on<br />

Gold and Silicon substrates<br />

⦁ FiberMate 2 — an interface between spectrometers<br />

and fiberoptic applications<br />

⦁ MultiLoop, Omni-Diff, and<br />

Omni-Spec — fiberoptic probes for ATR,<br />

diffuse reflection, and specular<br />

reflection<br />

⦁ A variety of liquid and gas transmission<br />

cells<br />

⦁ Custom design development<br />

Harrick Scientific<br />

Products, Inc.<br />

141 Tompkins Ave,<br />

2nd Floor<br />

Pleasantville, NY 10570<br />

TELEPHONE<br />

(800) 248-3847<br />

FAX<br />

(914) 747-7209<br />

E-MAIL<br />

info@harricksci.com<br />

WEB SITE<br />

www.harricksci.com<br />

NUMBER OF EMPLOYEES<br />

25<br />

YEAR FOUNDED<br />

1969<br />

Company Description<br />

Harrick Scientific Products specializes in designing and manufacturing<br />

instruments for optical spectroscopy. Since being established<br />

in 1969, Harrick Scientific has advanced the frontiers of<br />

optical spectroscopy through its innovations in all spectroscopic<br />

techniques. The founder of the company, Dr. N.J. Harrick, pioneered<br />

ATR (attenuated total reflection) spectroscopy and became<br />

the principal developer of this technique. Harrick Scientific<br />

offers a complete selection of sampling accessories, including<br />

both standard and custom designs, as well as an extensive line of<br />

optical elements.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Transmission<br />

⦁ Specular reflection<br />

⦁ Diffuse reflection<br />

⦁ ATR<br />

⦁ Fiberoptics<br />

Markets Served<br />

Harrick Scientific serves analytical markets worldwide. Harrick’s<br />

customers typically are from research or quality control laboratories<br />

of industrial, governmental, research, and academic institutions<br />

throughout the world. Industries served include chemical,<br />

electronic, pharmaceutical, forensics, and biomedical.<br />

Facilities<br />

Harrick Scientific Products is located 30<br />

miles north of New York City in Pleasantville,<br />

New York. Our products are also<br />

available through FT-IR and UV-Vis spectrometer<br />

manufacturers, as well as distributors<br />

in the United States and throughout<br />

the world.


www.spectroscopyonline.com<br />

Hellma USA, Inc.<br />

DECEMBER 2011 SPECTROSCOPY CORPORATE CAPABILITIES 59<br />

Hellma USA, Inc.<br />

80 Skyline Drive<br />

Plainview, NY 11803<br />

TELEPHONE<br />

(516) 939-0888<br />

WEB SITE<br />

www.hellmausa.com<br />

Mini process probe.<br />

Company Description<br />

Hellma GmbH & Co., founded<br />

in 1922, is the world market<br />

leader in cells, fiber optic<br />

probes, and optical components<br />

made of glass or quartz<br />

which are used for modern<br />

optical analysis. Hellma<br />

Analytics products are available<br />

worldwide through a network<br />

of Hellma Analytics sister companies<br />

and additional<br />

distribution agents.<br />

Major Products/Services<br />

Complete traceability and excellent reliability of measurement<br />

results — with UV–vis calibration standards<br />

from the accredited DKD calibration laboratory of<br />

Hellma<br />

With the accreditation according to DIN EN ISO 17025, Hellma<br />

Analytics is one of the leading accredited calibration laboratories<br />

that produce and certify liquid and glass calibration filters made<br />

for testing spectrophotometers. Increased security and quality<br />

demands among laboratories require an improved traceability<br />

of measurement results to an internationally approved standard.<br />

An accreditation according to DIN EN ISO 17025 ensures the<br />

traceability of calibrations carried out to references of the NIST, by<br />

which an international correlation of measurement results is<br />

assured. Thus, procedures in laboratories gain greater transparency<br />

and improved protection of their measurement results.<br />

Fiber–optical systems<br />

The development of fiber-optical systems has caused a small<br />

revolution in chemical analysis. This technology makes it possible<br />

to carry out photometric measurements not only under<br />

laboratory conditions with cells, but also outside the lab.<br />

Through the development of fiber-optic probes, analysis has<br />

moved directly to the process for measurements with continuous<br />

measurements possible without sampling. This allows for<br />

better control of ongoing processes with much less effort.<br />

TrayCell — Micro Volume Analysis for sample volume<br />

of 0.5 µL to 10 µL<br />

Even in classical analysis the specialists at Hellma Analytics are always<br />

setting new standards. One of the most recent examples: the<br />

fiber-optic ultra-micro measuring cell “TrayCell,” which allows accurate<br />

analysis of DNA, RNA, or proteins in sample volumes of as<br />

low as 0.5 μL. The dimensions of the TrayCell are equivalent to a<br />

standard cell in order to work in all common spectrophotometers.<br />

Features:<br />

⦁ Unique fiber optic ultra-micro measuring cell<br />

⦁ Works with 0.5 μL to 10 μL sample volume<br />

⦁ A single drop measuring sample is<br />

sufficient<br />

⦁ High precision and reproducibility<br />

⦁ Dilution is not necessary<br />

Modern Flow Cytometry requires<br />

highest standards<br />

The heart of every flow cytometer is a<br />

small quartz glass flow channel providing<br />

reliable stability of the fluidic system and<br />

precise optical analysis of single cells. Due<br />

to sophisticated technologies Hellma is<br />

able to manufacture customer specified<br />

channel dimensions down to 50 μm ×<br />

50 μm with any outside dimension and<br />

highly polished surfaces.<br />

Custom Designed Products<br />

In addition to the large range of standard<br />

products, Hellma Analytics also manufactures<br />

special cells and other precision optical<br />

parts according to customer’s specifications.<br />

Hellma Analytics has more than 90 years<br />

experience in the field of glass machining<br />

and fabrication. Our specialists can carry out<br />

complex tasks and give full and competent<br />

advice regarding design ideas and any<br />

alternative possibilities.<br />

Analysis in space — processing at<br />

the cutting edge of technology<br />

A close collaboration with research institutes,<br />

universities, and scientific institutions is<br />

important for Hellma Analytics’ outstanding<br />

engineering competence. Based on this<br />

extensive know-how in processing<br />

techniques, Hellma Analytics is able to find<br />

unique solutions. Excellent examples of<br />

achievements are the individually designed,<br />

custom-made cells being used in the<br />

International Space Station (ISS) or those<br />

which were used in physics research that led<br />

to the winning of the Nobel Prize in 1997<br />

and 2001.


60 SPECTROSCOPY CORPORATE CAPABILITIES DECEMBER 2011 www.spectroscopyonline.com<br />

HORIBA Scientific<br />

Markets Served<br />

⦁ Academia<br />

⦁ Bio<br />

⦁ Chemicals<br />

⦁ Environmental<br />

⦁ Forensic science<br />

⦁ Life sciences<br />

⦁ Medical<br />

⦁ Metals<br />

⦁ Nanotechnology<br />

⦁ OEM<br />

⦁ Optoelectronics<br />

⦁ Paint/Pigments<br />

⦁ Petroleum<br />

⦁ Pharmaceuticals<br />

⦁ Photovoltaics<br />

⦁ Plastics, polymers, etc.<br />

⦁ Semiconductors<br />

⦁ WEEE/RoHS<br />

HORIBA Scientific<br />

3880 Park Avenue<br />

Edison, NJ 08820<br />

TELEPHONE<br />

(732) 494-8660<br />

FAX<br />

(732) 494-5125<br />

E-MAIL<br />

info.sci@horiba.com<br />

WEB SITE<br />

www.horiba.com/scientific<br />

NUMBER OF EMPLOYEES<br />

USA: 700<br />

Elsewhere: 5000<br />

YEAR FOUNDED<br />

1819<br />

Company Description<br />

HORIBA Scientific is the world-leading manufacturer of high performance<br />

optical spectroscopy instrumentation and components.<br />

Our spectrometers offer unsurpassed sensitivity, precision, performance<br />

and features as a consequence of our 194 years of history<br />

and expertise. HORIBA Scientific offers our customers the highest<br />

quality products and solutions, supported by a global network of<br />

scientists, engineers, technicians and customer service professionals.<br />

We are ready to be your partner whether you require components,<br />

custom solutions, OEM solutions and analytical, process or<br />

research spectrometers.<br />

HORIBA Scientific is part of the HORIBA Group, which employs<br />

over 5000 people worldwide, with annual sales in excess of $1.5<br />

billion. Some of our well-known and respected brand names include<br />

HORIBA Jobin Yvon, Sofie, Dilor, Spex ® , and IBH.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Molecular fluorescence spectroscopy<br />

⦁ Optical spectroscopy<br />

⦁ Raman spectroscopy and microscopy<br />

⦁ Ellipsometry and thin film analysis<br />

⦁ Atomic emission spectroscopy<br />

⦁ Fluorescence<br />

⦁ Forensic science<br />

Major Products/Services<br />

⦁ <strong>Spectroscopy</strong> and analysis<br />

⦁ Elemental analyzers<br />

⦁ Ellipsometers<br />

⦁ End-point detectors<br />

⦁ Fluorescence<br />

⦁ Gratings<br />

⦁ ICP & GD spectrometers<br />

⦁ Lifetime fluorescence<br />

⦁ Microscopy<br />

⦁ OEM components<br />

⦁ Particle size analyzers<br />

⦁ Process control<br />

⦁ Raman & FT-IR<br />

⦁ Spectrographs<br />

⦁ Spectrometers and CCDs<br />

⦁ TCSPC<br />

⦁ VUV equipment<br />

⦁ X-Ray fluorescence<br />

⦁ Surface Plasmon Resonance Imaging<br />

(SPRi)<br />

Facilities<br />

HORIBA Scientific manufactures quality<br />

instruments in Edison, New Jersey, as well<br />

as in France and Japan.<br />

Sales, service, and applications facilities<br />

are located around the world. We are an<br />

ISO 9001:2008-certified company.


www.spectroscopyonline.com DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 61<br />

International Centre for Diffraction Data<br />

international Centre for<br />

diffraction data<br />

12 Campus Boulevard<br />

Newtown Square, PA 19073<br />

TelepHone<br />

(610) 325-9814<br />

Fax<br />

(610) 325-9823<br />

e-mail<br />

infox@icdd.com<br />

Web siTe<br />

www.icdd.com<br />

YeaR Founded<br />

1941<br />

Company Description<br />

ICDD is a non-profit scientific organization dedicated to collecting,<br />

editing, publishing, and distributing powder diffraction<br />

data for the identification of crystalline materials. Our mission<br />

is to continue to be the world center for quality diffraction<br />

and related data to meet the needs of the technical community.<br />

We promote the application of materials characterization<br />

methods in science and technology by providing forums<br />

for the exchange of ideas and information. We sponsor the<br />

Pharmaceutical Powder X-ray Diffraction Symposium (PPXRD),<br />

Denver X-ray Conference; its proceedings, Advances in X-ray<br />

Analysis and the journal, Powder Diffraction. ICDD and its<br />

members conduct workshops and clinics on materials characterization<br />

at our headquarters in Newtown Square, Pennsylvania<br />

and at X-ray analysis conferences around the world.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ X-ray Diffraction<br />

⦁ Electron Diffraction<br />

⦁ Electron Backscatter Diffraction<br />

Markets Served<br />

The Powder Diffraction File is designed for materials identification<br />

and characterization. ICDD databases are used worldwide<br />

by scientists in academia, government, and industry who<br />

are actively engaged in the field of X-ray powder diffraction<br />

and related disciplines.<br />

Major Products/Services<br />

PDF-4+ 2011 is our advanced database<br />

with comprehensive material coverage<br />

for inorganic materials. The database is a<br />

powerful tool for phase identification using<br />

physical, chemical, and crystallographic<br />

data. It contains numerous features such<br />

as 316,291 data sets, digitized patterns,<br />

molecular graphics and atomic parameters.<br />

Many new features have been<br />

incorporated into PDF-4+ to enhance the<br />

ability to do quantitative analysis by any<br />

of three methods: Rietveld Analysis, Reference<br />

Intensity Ratio (RIR) method, or Total<br />

Pattern Analysis. PDF-4+ also offers a<br />

suite of electron diffraction tools including<br />

electron diffraction powder pattern simulations,<br />

an interactive spot pattern simulation,<br />

and an electron diffraction backscatter<br />

pattern simulation module.


62 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Iridian Spectral Technologies Ltd.<br />

Company Description<br />

Leader in optical filter solutions, Iridian, is a coating company that works with you in finding cost effective<br />

solutions to your problems. We are one of the leading companies for Raman, confocal fluorescence and<br />

flow cytometry filters. Our coatings reach from UV to LWIR of the optical spectrum. Our dielectric thin-films<br />

provide long term durability and reliability with industry leading optical performance. We provide filters from<br />

small prototype volumes to large volume productions. We are a reliable partner, with high quality standards<br />

and excellent customer service. Our product is state-of-the-art and we set high value on innovation.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Raman spectroscopy<br />

⦁ Confocal fluorescence microscopy<br />

⦁ Flow cytometry<br />

Markets Served<br />

We are a global supplier who addresses the worldwide need of optical filters for OEMs and individual end<br />

users through direct sales support offered and sales through local distribution channels in Europe and Asia.<br />

Iridian provides optical filters and coating services to a wide variety of industrial and research sectors. We are<br />

a global supplier for applications in telecommunications, spectroscopy (Raman, fluorescence, flow cytometry)<br />

and the entertainment industry (filter wheels, glasses for 3D cinema).<br />

iridian spectral<br />

Technologies ltd.<br />

1200 Montreal Rd.<br />

Bldg. M50<br />

Ottawa, Ontario, Canada<br />

TelepHone<br />

(613) 741-4513<br />

Major Products/Services<br />

We offer optical filters and coatings, for UV, visible, and IR applications. Our dielectric thin-film filters provide<br />

long term durability and reliability with industry leading optical performance. Get more signal with less<br />

background with our optical filters for Raman spectroscopy. We provide pass band transmittances of >90%,<br />

exceptional edge steepness, and blocking of >OD6. Capture better images with our single or multi-band<br />

filters for fluorescence spectroscopy and microscopy and flow cytometry. Our filters have high transmission<br />

with sharp cutoffs and excellent isolation providing brighter imaging and improved image contrast.<br />

Facility<br />

Iridian’s operations are located in Canada’s capital: Ottawa, Ontario. Our offices/headquarters and our<br />

manufacturing plant occupy a total space of 40,778 ft 2 out of which: 27,328 square feet is manufacturing<br />

area. We are a Canadian manufacturer.<br />

Fax<br />

(613) 741-9986<br />

e-mail<br />

inquiries@iridian.ca<br />

Web siTe<br />

www.iridian.ca<br />

numbeR oF emploYees<br />

ouTsiTe usa: 124<br />

YeaR Founded<br />

1998


64 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

International Crystal Laboratories<br />

optics; KBr powder; liquid and gas transmission<br />

cells; cuvettes for UV–vis, NIR, and<br />

fluorescence spectroscopy; solid sampling<br />

accessories such as mills, mortars and<br />

pestles, lab presses, and dies for making<br />

KBr pellets for IR spectroscopy; and briquets<br />

for XRF spectroscopy.<br />

Facility<br />

ICL provides customer support at our state<br />

of the art manufacturing plant in Garfield,<br />

New Jersey. We maintain several FT-IR and<br />

UV–vis spectrophotometers for product<br />

quality control. Our plant is now serviced<br />

by a 150 KWH backup generator which<br />

guarantees that we are able to be productive<br />

at all times.<br />

international Crystal<br />

laboratories<br />

11 Erie Street<br />

Garfield, NJ 07026<br />

TelepHone<br />

(973) 478-8944<br />

Fax<br />

(973) 478-4201<br />

e-mail<br />

iclmail@optonline.net<br />

Web siTe<br />

www.internationalcrystal.net<br />

numbeR oF emploYees<br />

25<br />

YeaR Founded<br />

1962<br />

Company Description<br />

ICL is a fully integrated materials technology company that<br />

manufactures IR crystal optics and spectroscopy accessories.<br />

It is the only US manufacturer of KBr, NaCl, and KCl crystals.<br />

KBr beam splitters are an essential component of all FT-IR<br />

spectrophotometers. ICL is a highly regarded vendor to instrument<br />

manufacturers and has received numerous honors such<br />

as “Vendor of the Year” from instrument manufacturers for<br />

on time, defect free product deliveries. ICL is engaged in R&D<br />

projects with major research laboratories, including ongoing<br />

projects with Brookhaven National Laboratory.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ IR<br />

⦁ FT-IR<br />

⦁ UV–vis<br />

⦁ Fluorescence<br />

⦁ XRF<br />

Markets Served<br />

ICL supplies a broad range of optics, supplies, and accessories<br />

for spectroscopy to end-users, dealers, catalog vendors, and<br />

instrument manufacturers worldwide. Customers can access<br />

ICL’s products on-line, through extensive catalogs and a network<br />

of more than 75 dealers who service customers in most<br />

markets throughout the world.<br />

Major Products/Services<br />

ICL products enable spectroscopists to make the most out of<br />

modern spectroscopic instruments. Products include IR crystal


www.spectroscopyonline.com<br />

Meinhard<br />

DECEMBER 2011 SPECTROSCOPY CORPORATE CAPABILITIES 65<br />

Meinhard<br />

700 <strong>Corporate</strong> Circle, Suite L<br />

Golden, Colorado 80401<br />

TELEPHONE<br />

(800) 634-6427<br />

FAX<br />

(303) 279-5156<br />

E-MAIL<br />

sales@meinhard.com<br />

WEB SITE<br />

www.meinhard.com<br />

NUMBER OF EMPLOYEES<br />

25<br />

YEAR FOUNDED<br />

1974<br />

Company Description<br />

Sample introduction components and accessories for ICP-OES<br />

and ICP-MS. Since 1974, Meinhard is the leading manufacturer<br />

of concentric nebulizers in borosilicate glass and quartz. The topperforming<br />

microconcentric High Efficiency Nebulizer operates at<br />

5 to 300 µL/min and 90, 120, 150, or 170 psi for 1 L/min carrier.<br />

A new sample collection device, the ALPXS, is an aerosol-to-liquid<br />

particle extraction system which puts atmospheric particulates directly<br />

into suspension for ICP analysis. As a division of Elemental<br />

Scientific, Meinhard products are available through a worldwide<br />

network of distributors.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ ICP-OES<br />

⦁ ICP-MS<br />

Markets Served<br />

⦁ Agricultural<br />

⦁ Environmental<br />

⦁ Manufacturing<br />

⦁ Materials<br />

⦁ Metals<br />

⦁ Mining<br />

⦁ Petroleum<br />

⦁ Pharmaceuticals<br />

⦁ R & D<br />

Major Products/Services<br />

Nebulizers:<br />

⦁ HEN – highest sensitivity available, and<br />

low liquid flow<br />

⦁ Plus Series – combine the high sensitivity<br />

A-type nozzle with low dead volume for<br />

fast stabilization and rinse-out<br />

⦁ A-type – highest sensitivity in a conventional<br />

nebulizer<br />

⦁ C-type – high solids tolerance<br />

⦁ K-type – high solids tolerance with reduced<br />

carrier flow<br />

Spray Chambers:<br />

⦁ For all ICP instruments, with custom<br />

designs available<br />

Torches:<br />

⦁ For all ICP instruments, with custom designs<br />

available<br />

Accessories:<br />

⦁ ALPXS self-contained, portable air sampler<br />

⦁ Peristaltic pump tubing<br />

Facility<br />

Precision manufacturing of quartz and<br />

glass consumables for ICP-OES and<br />

ICP-MS.


66 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Moxtek, Inc.<br />

Major Products/Services<br />

⦁ ProFlux Wiregrid Polarizers — High<br />

transmission and contrast inorganic<br />

polarizers for UV, visible, and IR<br />

applications.<br />

⦁ MAGNUM Miniature X-ray Sources —<br />

The leading X-ray source technology for<br />

handheld and bench top X-ray analysis<br />

applications.<br />

⦁ XPIN Detectors — The latest generation<br />

of affordable Si-PIN detectors for X-ray<br />

fluorescence spectrometry.<br />

⦁ AP3 and ProLINE Windows — Ultrathin<br />

polymer windows for energy and<br />

wavelength dispersive spectroscopy.<br />

⦁ DuraBeryllium Windows — The most<br />

rugged and reliable beryllium windows<br />

available for X-ray applications.<br />

⦁ MX Series JFET — The lowest noise JFET<br />

available for X-ray detection systems.<br />

Moxtek, inc.<br />

452 W 1260 N<br />

Orem, UT 84057<br />

Telephone<br />

(801) 225-0930<br />

Fax<br />

(801) 221-1121<br />

e-Mail<br />

moxtek@moxtek.com<br />

Web siTe<br />

www.moxtek.com<br />

nuMber oF eMployees<br />

142<br />

year Founded<br />

1986<br />

Company Description<br />

We are a leading supplier of X-ray and optical components<br />

for analytical instrumentation and display electronics.<br />

Products include the new XPIN high-performance Si-<br />

PIN X-ray detectors; MAGNUM ® miniature low-power<br />

X-ray sources; AP3 and DuraBeryllium ® X-ray windows<br />

for EDS; ProLINE windows for WDS; and ProFlux ® wiregrid<br />

polarizers and beam splitters for UV, visible, and<br />

IR spectroscopy. Moxtek is well known for advanced<br />

technology, innovative solutions, and excellent<br />

customer service.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Energy dispersive X-ray spectroscopy<br />

⦁ Wavelength dispersive X-ray spectroscopy<br />

⦁ X-ray diffraction<br />

⦁ Microanalysis<br />

⦁ UV, visible, IR spectrometry<br />

Markets Served<br />

Moxtek, Inc. serves the analytical instrumentation and<br />

projection display markets.<br />

Wiregrid polarizer


68 SPECTROSCOPY CORPORATE CAPABILITIES DECEMBER 2011 www.spectroscopyonline.com<br />

Milestone Inc.<br />

⦁ Commercial testing<br />

⦁ Petrochemical<br />

⦁ Environmental<br />

⦁ Academic<br />

Major Products/Services<br />

⦁ Ethos EZ — the most advanced closed<br />

vessel microwave digestion system<br />

⦁ UltraWAVE — single reaction chamber microwave<br />

digestion in a benchtop package<br />

⦁ UltraCLAVE — single reaction chamber microwave<br />

digestion — ultimate throughput<br />

⦁ DMA-80 — direct mercury analysis with<br />

results in 6 min<br />

⦁ DuoPUR — on demand acid purification<br />

⦁ TraceCLEAN — automated acid reflux<br />

cleaning system<br />

⦁ PYRO — fast, microwave ashing<br />

Milestone Inc.<br />

25 Controls Drive<br />

Shelton, CT 06484<br />

TELEPHONE<br />

(886) 995-5100<br />

FAX<br />

(203) 925-4241<br />

E-MAIL<br />

mwave@milestonesci.com<br />

WEB SITE<br />

www.milestonesci.com<br />

www.milestonesrl.com<br />

NUMBER OF EMPLOYEES<br />

30 (in the US)<br />

100 (outside the US)<br />

YEAR FOUNDED<br />

1988<br />

Company Description<br />

Today’s laboratories are challenged to process more samples at<br />

lower detection levels with fewer available resources. Often the<br />

limitations of the existing sample preparation approach creates a<br />

“bottleneck” in productivity. At Milestone our full suite of<br />

microwave sample prep productivity tools are backed by over<br />

50 patents and 20 years of industry expertise to break these<br />

bottlenecks by providing safe, reliable, and flexible platforms to<br />

enhance your productivity. The key to Milestone’s technological<br />

leadership lies in bringing together individuals from diverse<br />

scientific and engineering disciplines to solve real world problems<br />

with innovative microwave instrumentation. This philosophy has<br />

enabled Milestone to develop an extraordinary range of products<br />

from an unmatched portfolio of over 30 patents.<br />

Over 15,000 customers worldwide look to Milestone to improve<br />

their metals digestions, organic extractions, mercury analysis, and<br />

synthetic chemistry processes. We partner with our customers to<br />

meet their challenges now, and well into the future.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ ICP mass spectrometry (ICP-MS)<br />

⦁ Inductively coupled plasma (ICP-OES)<br />

⦁ Atomic absorption ( AA)<br />

⦁ Mercury analysis<br />

Markets Served<br />

⦁ Pharmaceutical<br />

⦁ Clinical<br />

⦁ Food testing<br />

Facility<br />

Milestone’s Global HQ is based in Bergamo,<br />

Italy with manufacturing and R&D facilities<br />

in Germany and Switzerland. We support<br />

our global customers through direct offices<br />

in China, Japan, Korea, as well as distributor<br />

networks in 70 countries.<br />

Milestone’s North American Headquarters<br />

are located in Shelton, Connecticut to provide<br />

applications, technical, and customer<br />

service support to our clients. Our stocking<br />

facilities are managed for immediate<br />

turn around for consumables, accessories,<br />

and service parts. Our applications lab is<br />

equipped with a full range of productivity<br />

tools and a team of application chemists to<br />

provide customer demonstrations as well<br />

as method development. With a service and<br />

support team to complement our field sales<br />

team, Milestone can look after customer<br />

needs locally.


www.spectroscopyonline.com DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 69<br />

Nippon Instruments North America<br />

requirements. These analyzers provide<br />

simple, highly effective results for such<br />

methods as EPA 245.1.<br />

⦁ Model RA-3420 Mercury Analyzer:<br />

A unique analyzer that performs the<br />

typical EPA Method 245.1 analysis in<br />

a fully automatic sequence, including<br />

sample preparation.<br />

⦁ Model PE-1000 Mercury Analyzer:<br />

A specifically designed mercury analyzer<br />

for direct, automated analysis of<br />

mercury in liquid and gaseous hydrocarbons.<br />

nippon instruments<br />

north america<br />

1511 Texas Ave S #270<br />

College Station, TX 77840<br />

Telephone<br />

(979) 774-3800<br />

Fax<br />

(979) 774-3807<br />

e-Mail<br />

sales@hg-nic.us<br />

Web siTe<br />

www.hg-nic.us<br />

nuMber oF eMployees<br />

19<br />

year Founded<br />

2003<br />

Company Description<br />

Nippon Instruments North America is the regional office for<br />

Nippon Instruments Corporation-Japan. Nippon Instruments<br />

has over 30 years of experience in the design and manufacture<br />

of high-quality mercury analyzers. With an absolute focus<br />

on mercury analyzers, Nippon Instruments offers mercury<br />

analyzers for just about every application. From systems for<br />

most EPA methods to direct mercury analyzers to online<br />

monitoring systems to specially designed systems for the petrochem<br />

industry, Nippon Instruments has a mercury analyzer<br />

for your laboratory.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Atomic absorption spectroscopy<br />

⦁ Atomic fluorescence spectroscopy<br />

Markets Served<br />

Nippon Instruments provides mercury analyzers for EPA compliance<br />

monitoring in the environmental, government, and<br />

industrial markets. We provide highly versatile systems for the<br />

research and education markets, as well as mercury analyzers<br />

that are specifically designed for the unique tasks of the industrial<br />

and petrochem markets.<br />

Major Products/Services<br />

⦁ Model MA-2000 Mercury Analyzer: A direct mercury<br />

analyzer that allows for mercury analysis of just about any<br />

matrix without the need for sample preparation.<br />

⦁ Model RA-3000 Series Mercury Analyzers: Mercury analyzers<br />

with several configurations available to fit various budget<br />

Facilities<br />

Nippon Instruments North America is in<br />

the final stages of building a new office in<br />

College Station, Texas, in order to continue<br />

to expand our capabilities. Nippon Instruments<br />

Corporation currently maintains offices<br />

in Osaka and Tokyo, Japan, as well as<br />

an additional office in Singapore.


70 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Ocean Optics<br />

students’ learning experience. You can find<br />

Ocean Optics products in virtually any application<br />

from food safety to forensics and<br />

from semiconductors to marine biology.<br />

ocean optics<br />

830 Douglas Ave.<br />

Dunedin, FL 34698<br />

Telephone<br />

(727) 733-2447<br />

Fax<br />

(727) 733-3962<br />

e-Mail<br />

info@oceanoptics.com<br />

Web siTe<br />

www.oceanoptics.com<br />

nuMber oF eMployees<br />

250<br />

year Founded<br />

1989<br />

Company Description<br />

Ocean Optics is the inventor of the world’s first miniature<br />

spectrometer and has specified and delivered nearly 200,000<br />

of them over the past 20 years. The company provides solutions<br />

for diverse applications of optical sensing in medical<br />

and biological research, environmental regulation, science<br />

education, production and process control. Ocean Optics also<br />

provides a comprehensive range of complementary technologies,<br />

including chemical sensors, metrology instrumentation,<br />

optical fibers, probes, filters and many more spectroscopic<br />

peripherals and accessories. Our spectrometers and sensors<br />

also are ideal for OEM applications — with modular options<br />

that meet virtually any application requirement.<br />

Chief Spectroscopic Techniques Supported<br />

Absorbance, transmission, reflectance, irradiance, fluorescence,<br />

Raman, UV-vis, NIR, spectroradiometry, color spectroscopy,<br />

laser-induced breakdown spectroscopy (LIBS), fiber<br />

optic chemical sensing, flow injection analysis, elemental<br />

analysis, end-point detection, headspace monitoring, laser<br />

characterization, nondestructive testing, multispectral imaging.<br />

Markets Served<br />

Ocean Optics’ technologies can be found in a diverse range of<br />

industries and disciplines. Our products are used by innovators,<br />

researchers, scientists, OEMs, medical and health care<br />

professionals and manufacturing facilities in every country on<br />

the planet. Military and security concerns have incorporated<br />

Ocean Optics technologies into their equipment and science<br />

educators have made our equipment an integral part of their<br />

Major Products/Services<br />

Spectrometers: UV-vis/NIR, high-resolution,<br />

time-gated fluorescence, spectrofluorometers,<br />

absorbance, laser-induced<br />

breakdown, LED measurement, reflectometer,<br />

Raman, remote sensing, field<br />

measurement<br />

OEM offerings: Spectrometers, sensors,<br />

fibers, and sub-assemblies for embedding<br />

into OEM applications<br />

Optical sensors: Oxygen sensors, pH sensors,<br />

temperature sensing, and transducing<br />

materials<br />

Sampling accessories: Collimating<br />

lenses, cuvettes and holders, standards,<br />

filters and holders, flow cells, cosine correctors,<br />

integrating spheres<br />

Light sources: Deuterium, tungsten halogen,<br />

LED, calibration sources, excitation<br />

sources, lasers<br />

Optical fiber and probes: Premiumgrade<br />

assemblies, bare fiber, custom<br />

options, reflection, transmission and temperature<br />

probes, vacuum feedthroughs,<br />

complete fiber kits<br />

Facility<br />

Ocean Optics is headquartered in<br />

Dunedin, Florida, and has full-service<br />

locations in Europe, Latin America and the<br />

People’s Republic of China. Ocean Optics<br />

is part of Halma, p.l.c., a safety and<br />

environmental technology group<br />

domiciled in the United Kingdom.


72 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

OI Analytical<br />

Major Products/Services<br />

OI Analytical provides instruments for<br />

spectroscopic analysis including:<br />

⦁ iTOC-CRDS Isotopic Carbon Analyzer<br />

⦁ IonCam Mass Spectrometer<br />

⦁ IonCam 2020 Transportable GC–MS<br />

⦁ IonCCD Array Detector<br />

⦁ DA 3500 Discrete Analyzer<br />

⦁ FS 3100 Automated Chemistry Analyzer<br />

Facilities<br />

OI Analytical operates research and manufacturing<br />

sites in College Station, Texas<br />

and Birmingham, Alabama occupying<br />

88,000 square feet.<br />

oi analytical<br />

151 Graham Road<br />

P.O. Box 9010<br />

College Station, TX 77842<br />

Telephone<br />

(979) 690-1711<br />

(800) 653-1711<br />

Fax<br />

(979) 690-0440<br />

e-Mail<br />

oimail@oico.com<br />

Web siTe<br />

www.oico.com<br />

nuMber oF eMployees<br />

135<br />

year Founded<br />

1969<br />

Company Description<br />

OI Analytical designs, manufactures, markets, and supports<br />

analytical instruments used for sample preparation, detection,<br />

and measurement of chemical compounds and elements. OI<br />

Analytical is based in College Station, Texas, with a second<br />

facility in Birmingham, Alabama.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Total organic carbon-cavity ring down spectroscopy (TOC-<br />

CRDS)<br />

⦁ Mass spectrometry<br />

⦁ Gas chromatography–mass spectrometry (GC–MS)<br />

⦁ Discrete analysis<br />

⦁ Flow injection analysis (FIA)<br />

⦁ Segmented flow analysis (SFA)<br />

Markets Served<br />

Principal markets/industries served include environmental<br />

testing, drinking and wastewater treatment, chemicals and<br />

petrochemicals, pharmaceuticals, food and beverage, homeland<br />

security, and chemical weapons demilitarization.


www.spectroscopyonline.com<br />

OptiGrate Corp.<br />

DECEMBER 2011 SPECTROSCOPY CORPORATE CAPABILITIES 73<br />

OptiGrate Corp.<br />

3267 Progress Drive<br />

Orlando, FL 32826<br />

TELEPHONE<br />

(407) 381-4115<br />

FAX<br />

(407) 384-5995<br />

E-MAIL<br />

info@optigrate.com<br />

WEB SITE<br />

www.optigrate.com<br />

NUMBER OF EMPLOYEES<br />

30<br />

YEAR FOUNDED<br />

1999<br />

Company Description<br />

OptiGrate Corp designs and manufactures ultra-narrow band<br />

optical filters based on volume Bragg grating (VBG) technologies<br />

in proprietary photo-thermo-refractive glass. Filters with<br />

bandwidth as low as 30 pm are formed by holographic techniques<br />

in the bulk of glass material, and demonstrate superior<br />

optical quality, outstanding durability, environmental stability,<br />

and high optical damage threshold. OptiGrate is a pioneer<br />

and world leader in VBG technologies and, for over 10 years,<br />

OptiGrate has delivered holographic optical elements (HOE) to<br />

a large number of government contractors and OEMs in optoelectronics,<br />

analytical, medical, defense, and other industries.<br />

Markets<br />

OptiGrate supplied ultra narrow band filters to hundreds of<br />

customers on 5 continents. These filters are used for: Raman<br />

spectroscopy and microscopy; semiconductor, solid state,<br />

and fiber lasers; hyperspectral and Raman imaging systems;<br />

ultrafast laser systems; optical recording and storage; medical<br />

diagnostics and treatment; etc.<br />

Optical Density<br />

760 770 780 790 800 810<br />

1E+00<br />

1E+01<br />

1E+02<br />

1E+03<br />

1E+04<br />

1E+05<br />

1E+06<br />

1E+07<br />

1E+08<br />

Wavelength [nm]<br />

TFF Notch<br />

2x BNF<br />

Main Product Lines<br />

⦁ Ultra-narrow band optical notch and<br />

bandpass filters with linewidth less than<br />

10 cm -1<br />

⦁ Laser resonator mode selection filters/<br />

mirrors for spectral narrowing and thermal<br />

stabilization of lasers<br />

⦁ Deflectors — transmitting volume Bragg<br />

gratings for angular filtering and deflection<br />

of laser light<br />

⦁ Chirped volume Bragg gratings for compact<br />

and robust stretchers and compressors<br />

of ultra-short laser pulses<br />

⦁ Spectral beam combiner — angular<br />

and spectral filters for high-power laser<br />

spectral beam combining<br />

Facilities<br />

OptiGrate designs, develops, and makes<br />

all products in Orlando, Florida. The<br />

volume Bragg grating filters are manufactured<br />

in a unique, vertically integrated<br />

facility that includes photosensitive glass<br />

production facility, holographic facility,<br />

and laser development facility. Opti-<br />

Grate’s internal capability to develop,<br />

fine-tune, and mass produce photosensitive<br />

glass, the core of VBG technology,<br />

provides better process control and<br />

stability and also enables fabrication of<br />

filters with record characteristics.<br />

Ultra-narrow band BragGrate optical filters enable Raman shift measurements to 5 cm -1<br />

Optical Density<br />

784.5 784.75 785 785.25 785.5<br />

1E+00<br />

1E+02<br />

1E+04<br />

1E+06<br />

1E+08<br />

Wavelength [nm]


74 SpectroScopy corporAte cApABILItIeS DECEMBER 2011<br />

Optometrics Corporation<br />

www.spectroscopyonline.com<br />

optometrics Corporation<br />

8 Nemco Way<br />

Ayer, MA 01432<br />

Telephone<br />

(978) 772-1700<br />

Fax<br />

(978) 772-0017<br />

e-Mail<br />

sales@optometrics.com<br />

Web siTe<br />

www.optometrics.com<br />

nuMber oF eMployees<br />

45<br />

year Founded<br />

1969<br />

Company Description<br />

Optometrics has a distinguished 40 year history of manufacturing<br />

and providing optical components, in particular diffraction<br />

gratings and interference filters, for a wide range of spectroscopic<br />

and laser applications. Optometrics’ goal is to provide advanced<br />

optical components and systems for use in wavelength selection<br />

applications. Products include diffraction gratings, interference<br />

filters, components for military and civilian sighting and ranging<br />

equipment, monochromators, and ruled and holographic wire<br />

grid polarizers and beamsplitters. Optometrics caters, in particular,<br />

to the needs of its OEM customers by offering special services<br />

such as kanban stocking, bar coding capabilities, custom packaging<br />

programs, and higher level pre-aligned optical assemblies.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UV, Visible, IR spectrometry<br />

⦁ Infrared (including FT-IR)<br />

⦁ Fluorescence<br />

⦁ Raman spectroscopy<br />

⦁ Laser<br />

⦁ Liquid chromatography–mass spectrometry<br />

⦁ High performance liquid chromatography<br />

⦁ Color spectroscopy<br />

Markets Served<br />

⦁ Life sciences<br />

⦁ Scientific & analytical instrumentation<br />

⦁ FT-IR accessories<br />

⦁ Environmental & process monitoring<br />

⦁ Homeland security<br />

⦁ Scientific research<br />

⦁ Military<br />

⦁ Laser manufacturers<br />

Major Products/Services<br />

⦁ Diffraction gratings, ruled & holographic,<br />

originals or replicated, reflection and<br />

transmission<br />

⦁ Interference filters from 334–1650 nm<br />

⦁ Ruled & holographic wire grid<br />

polarizers<br />

⦁ Laser gratings<br />

⦁ Monochromators<br />

⦁ Tunable light sources<br />

⦁ Light sources, sample compartments,<br />

stepper motor controllers<br />

⦁ Components for military and civilian<br />

sighting and ranging equipment<br />

⦁ Beamsplitters<br />

⦁ Steep edge laser line longpass filters<br />

⦁ Laser safety eyewear coatings<br />

Facilities<br />

Optometrics’ facility in Ayer, Massachusetts<br />

contains space for offices, engineering,<br />

R&D, and production. Equipment that supports<br />

our broad range of capabilities include<br />

four metal vacuum coating systems,<br />

three filter vacuum systems, two ionassisted<br />

hard coat vacuum systems, three<br />

grating ruling engines, two holographic<br />

laboratories, full replication and lamination<br />

facilities as well as full assembly,<br />

alignment, and test facilities.<br />

A Dynasil Company


www.spectroscopyonline.com<br />

Oriel ® Instruments<br />

DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 75<br />

Major Products/Services<br />

⦁ Light sources from low to high power<br />

and UV to IR<br />

⦁ Monochromators<br />

⦁ Light detection systems (single point<br />

and array based)<br />

⦁ Spectrographs<br />

⦁ Spectrometers<br />

⦁ Photovoltaic metrology devices<br />

⦁ Solar simulators<br />

⦁ Various components designed to make,<br />

manage, and measure light.<br />

Facility<br />

Located in Stratford, Connecticut, including<br />

dedicated engineering, sales,<br />

and manufacturing.<br />

oriel instruments<br />

150 Long Beach Blvd.<br />

Stratford, CT 06615<br />

Telephone<br />

(203) 377-8282<br />

Fax<br />

(203) 378-2457<br />

e-Mail<br />

oriel.sales@newport.com<br />

Web siTe<br />

www.newport.com/Oriel<br />

nuMber oF eMployees<br />

65 (Stratford, CT facility)<br />

nuMber oF WorldWide<br />

2500<br />

year Founded<br />

1965<br />

Company Description<br />

Oriel Instruments, a Newport Corporation brand, was founded<br />

in 1965 and delevoped a reputation as an innovative supplier<br />

of products for the making and measuring of light. Today, the<br />

Oriel brand provides sophisticated broad band light sources<br />

covering the range from UV to IR, pulsed or continuous, and<br />

low to high power. Oriel also offers monochromators,<br />

spectrographs, and a flexible modular FT-IR spectrometer, for<br />

users across many industries with diverse applications. Oriel is<br />

a leader in photovoltaics metrology products with its<br />

offering of solar simulators and quantum efficiency<br />

measurement tools. Oriel brings innovative products and solutions<br />

to Newport Corporation customers around the world.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UV–vis spectroscopy<br />

⦁ NIR spectroscopy<br />

⦁ FT-IR spectroscopy<br />

Markets Served<br />

⦁ Research<br />

⦁ Industrial manufacturing<br />

⦁ Pharmaceuticals<br />

⦁ Food sciences<br />

⦁ Life and health sciences<br />

⦁ Microelectronics<br />

⦁ Aerospace<br />

⦁ Defense


76 SPECTROSCOPY CORPORATE CAPABILITIES DECEMBER 2011<br />

Parker Hannifin Corporation<br />

Filtration and Separation Division<br />

www.spectroscopyonline.com<br />

Parker Hannifin<br />

Corporation<br />

Filtration and Separation<br />

Division<br />

242 Neck Road<br />

Haverhill, MA 01835<br />

TELEPHONE<br />

(978) 858-0505<br />

FAX<br />

(978) 556-7501<br />

WEB SITE<br />

www.labgasgenerators.com<br />

NUMBER OF EMPLOYEES<br />

55,000<br />

YEAR FOUNDED<br />

1924<br />

Company Description<br />

Safety: Parker Balston gas generators completely eliminate the<br />

safety hazards involved with handling high-pressure gas cylinders.<br />

Enjoy hassle-free automation with no tanks to change<br />

and no downtime.<br />

Reliability: Thousands of laboratories worldwide have Parker<br />

Balston gas generators in routine use. Parker Balston gas generators<br />

are recommended and used by major instrument manufacturers.<br />

We offer the best technology at an affordable price from<br />

the brand you trust.<br />

Quality: Each Parker Balston gas generator is manufactured<br />

under a strict total quality management program. We have a<br />

world-class ISO 9001-certified manufacturing facility in the United<br />

States. All Parker Balston gas generators are backed by a complete<br />

satisfaction guarantee. Parker offers preventative maintenance,<br />

extended warranties, and field repair programs for all laboratory<br />

gas generators, as well as a network of highly specialized sales,<br />

aplication, and technical support people.<br />

Parker offers preventative maintenance, extended warranties and<br />

Products: Hydrogen gas generators produce 99.99999% pure<br />

hydrogen for gas chromatographs. Zero air generators produce<br />

zero grade air for gas chromatographs. UHP nitrogen generators<br />

produce 99.9999% pure nitrogen for GCs or ICP spectrometers.<br />

FT-IR gas generators produce dry, CO 2<br />

-free purge gas for FT-IR<br />

spectrometers. Pure air and nitrogen generators produce dry,<br />

ultrapure compressed gas for laboratory instruments, including<br />

LC–MS instruments.<br />

Chief Spectroscopic Techniques<br />

Supported<br />

⦁ Optical<br />

⦁ Atomic<br />

⦁ Infrared<br />

⦁ Mass universal<br />

⦁ Hyphenated techniques<br />

Markets Served<br />

⦁ Agriculture<br />

⦁ Biotechnology<br />

⦁ Chemicals<br />

⦁ Chemical and explosives detection<br />

⦁ Energy<br />

⦁ Environmental<br />

⦁ Inorganic chemicals<br />

⦁ Instrument development<br />

⦁ Life science<br />

⦁ Organic chemicals<br />

⦁ Paints and coatings<br />

⦁ Petrochemicals<br />

⦁ Pharmaceuticals<br />

⦁ Plastics<br />

Major Products/Services<br />

Gas generators for the following analytical<br />

instruments:<br />

⦁ Gas chromatographs<br />

⦁ LC–MS<br />

⦁ FT-IR spectrometers<br />

⦁ ICP emission spectrometers<br />

⦁ TOC analyzers<br />

⦁ Atomic absorption spectrophotometers<br />

⦁ Nuclear magnetic resonance (NMR)<br />

⦁ Rheometers/thermal analyzers<br />

⦁ Sample evaporators/concentrators<br />

Facilities<br />

Parker Hannifin manufactures all gas generator<br />

products in Haverhill, Massachusetts.<br />

Distribution points stretch across the United<br />

States and worldwide, including Canada, the<br />

UK, China, India, Germany, France, Japan, and<br />

Singapore. Parker is pleased to announce<br />

that the Filtration & Separation Division,<br />

Balston Operation has been recommended<br />

for ISO4001:2004 certification by DNV.


www.spectroscopyonline.com<br />

DECEMBER 2011 SPECTROSCOPY CORPORATE CAPABILITIES 77<br />

PHOTONIS USA<br />

PHOTONIS USA<br />

Sturbridge Business Park<br />

660 Main Street<br />

Sturbridge, MA 01566<br />

TELEPHONE<br />

(508) 347-4000<br />

(800) 648-1800<br />

FAX<br />

(508) 347-3849<br />

E-MAIL<br />

sales@usa.photonis.com<br />

WEB SITE<br />

www.photonis.com<br />

NUMBER OF EMPLOYEES<br />

USA: 150<br />

Elsewhere: 900<br />

YEAR FOUNDED<br />

1937<br />

Company Description<br />

PHOTONIS is a leading developer,<br />

manufacturer, and<br />

supplier of scientific detector<br />

products and components<br />

for scientific and analytical<br />

instrumentation systems. We<br />

specialize in ion, electron,<br />

and photon detection with<br />

unrivaled expertise in designing<br />

and delivering standard<br />

and custom products to<br />

meet the most demanding<br />

applications.<br />

Our engineering and<br />

manufacturing expertise<br />

delivers solutions for virtually<br />

every detection application.<br />

With the PHOTONIS<br />

worldwide manufacturing<br />

capability and support network, we can both design and<br />

manufacture your most challenging detection needs.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Mass spectrometry<br />

⦁ Time of flight MS<br />

⦁ Raman spectroscopy<br />

⦁ Nuclear spectroscopy<br />

⦁ UV and X-ray spectroscopy<br />

⦁ Charged particle imaging<br />

⦁ Electron microscopy<br />

⦁ Residual gas analysis/leak detection<br />

⦁ E-beam/X-ray lithography<br />

⦁ Luminescence<br />

⦁ Fluorescence<br />

⦁ Atomic absorption<br />

⦁ Deep UV/X-ray optics<br />

Markets Served<br />

PHOTONIS detection products are found in most of today’s<br />

high technology-based markets, including scientific and<br />

analytical instrumentation, medical diagnostics, chemistry,<br />

scientific research, life sciences, space and geophysical<br />

exploration, environmental and process monitoring, homeland<br />

security, control, and communications.<br />

Major Products/Services<br />

⦁ Micro pore optics<br />

⦁ Channeltron ® electron multipliers<br />

⦁ MAGNUM ® electron multipliers<br />

⦁ Long-Life microchannel plates<br />

⦁ Time-of-flight MCP detectors<br />

⦁ MCP detector assemblies<br />

⦁ FieldMaster ion guides and<br />

drift tubes<br />

⦁ Glass capillary arrays<br />

⦁ Resistive glass products<br />

⦁ Electron generator arrays<br />

⦁ MCP-based pmts<br />

⦁ Image intensifier tubes<br />

⦁ Intensified camera units<br />

⦁ Hybrid photo detectors<br />

⦁ Streak tubes<br />

⦁ High voltage power supplies<br />

⦁ Power tubes<br />

⦁ Neutron and gamma detectors<br />

⦁ Glass-coated wire<br />

⦁ Flexible fiber optics<br />

Facilities<br />

PHOTONIS in Sturbridge, Massachusetts<br />

manufactures Channeltron ® electron<br />

multipliers, microchannel plates, MCP<br />

detectors, ion guides, prototype detectors,<br />

and other custom glass products.<br />

The Lancaster, Pennsylvania facility<br />

manufactures power tubes and other<br />

related products. PHOTONIS in Roden,<br />

Netherlands manufactures image intensifier<br />

tubes, intensified camera units,<br />

and hybrid photo detectors. PHOTONIS<br />

in Brive, France manufactures image intensifier<br />

tubes and related products.


78 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

PerkinElmer, Inc.<br />

⦁ Mass spectrometry: ICP-MS, GC–MS,<br />

LC–MS<br />

⦁ Molecular spectroscopy: FT-IR and<br />

FT-NIR, UV–vis and UV–vis–NIR, Raman<br />

spectroscopy, fluorescence spectroscopy<br />

⦁ Thermal analysis: DSC, TGA, STA, DMA<br />

⦁ Organic elemental analysis: CHN/O,<br />

CHNS/O<br />

⦁ Consumables: Atomic spectroscopy,<br />

chromatography, molecular spectroscopy,<br />

thermal analysis, elemental<br />

analysis<br />

⦁ OneSource ® Laboratory Services<br />

Major Products/Services<br />

PerkinElmer, Inc. offers a wide breadth<br />

of instrumentation and solutions to meet<br />

your analytical measurement needs.<br />

Company Description<br />

PerkinElmer is a global scientific leader providing an extensive<br />

range of technology solutions and services to address the<br />

most critical issues facing humanity. From critical research and<br />

prenatal screening to environmental testing and industrial<br />

monitoring, we’re actively engaged in improving health and<br />

enhancing quality of life all around the world.<br />

Facility<br />

PerkinElmer, Inc. operates globally in 150<br />

countries.<br />

perkinelmer, inc.<br />

940 Winter Street<br />

Waltham, MA 02451<br />

Telephone<br />

(203) 925-4602<br />

Fax<br />

(203) 944-4904<br />

e-Mail<br />

as.info@perkinelmer.com<br />

Web siTe<br />

www.perkinelmer.com<br />

nuMber oF eMployees<br />

3400 (in the US)<br />

3600 (outside the US)<br />

year Founded<br />

1937<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Atomic absorption<br />

⦁ Inductively coupled plasma (ICP-OES and ICP-AES)<br />

⦁ ICP mass spectrometry (ICP-MS)<br />

⦁ Infrared (FT-IR and FT-NIR) spectroscopy<br />

⦁ UV–vis and UV–vis–NIR<br />

⦁ Raman spectroscopy<br />

Markets Served<br />

PerkinElmer is a leading provider of precision instrumentation,<br />

reagents and chemistries, software, and services for a<br />

wide range of scientific and industrial laboratory applications,<br />

including environmental monitoring, food and beverage quality/safety,<br />

and chemical analysis, as well as genetic screening,<br />

drug discovery, and development.<br />

⦁ Atomic spectroscopy: AA, ICP-OES, ICP-MS<br />

⦁ Chromatography: GC and GC custom solutions, GC–MS,<br />

HPLC and UHPLC, LC–MS<br />

⦁ Hyphenated techniques: HPLC–ICP-MS, GC–ICP-MS, HS-<br />

GC, HS-GC–MS, TD-GC, TD-GC–MS, TG-IR, TG-MS, TG-GC–<br />

MS, DSC-Raman


©2011 PerkinElmer, Inc. 400222_02. All rights reserved. PerkinElmer ® is a registered trademark of PerkinElmer, Inc. All other trademarks are the property of their respective owners.<br />

NexION 300 ICP-MS<br />

The NexION 300 ICP-MS: Three Modes Of Operation. One High-Performance Instrument. Nothing keeps<br />

your laboratory moving forward like the revolutionary NexION® 300 ICP-MS. With three modes of operation (Standard,<br />

Collision and Reaction), it’s the only instrument of its kind that can adapt as your samples, analytical needs or data<br />

requirements change. Experience unparalleled flexibility. Enjoy unsurpassed stability. Optimize your detection limits<br />

and analysis times. The NexION 300 ICP-MS. Choose the simplest, most<br />

cost-efficient path from sample to results.<br />

See the NexION at PerkinElmer's Gateway—www.perkinelmer.com/gateway


80 SpectroScopy corporAte cApABILItIeS DECEMBER 2011<br />

PerkinElmer, Inc.<br />

www.spectroscopyonline.com<br />

perkinelmer, inc.<br />

940 Winter Street<br />

Waltham, MA 02451<br />

Telephone<br />

(203) 925-4602<br />

Fax<br />

(203) 944-4904<br />

e-Mail<br />

as.info@perkinelmer.com<br />

Web siTe<br />

www.perkinelmer.com<br />

nuMber oF eMployees<br />

3100 (in the US)<br />

3800 (outside the US)<br />

year Founded<br />

1937<br />

Company Description<br />

PerkinElmer is a global scientific leader providing an extensive<br />

range of technology solutions and services to address the<br />

most critical issues facing humanity. From critical research and<br />

prenatal screening to environmental testing and industrial<br />

monitoring, we’re actively engaged in improving health and<br />

enhancing quality of life all around the world.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Atomic absorption<br />

⦁ Inductively coupled plasma (ICP-OES and ICP-AES)<br />

⦁ ICP mass spectrometry (ICP-MS)<br />

⦁ Infrared (FT-IR & FT-NIR) spectroscopy<br />

⦁ UV-vis & UV-vis-NIR<br />

⦁ Raman spectroscopy<br />

Markets Served<br />

PerkinElmer is a leading provider of precision instrumentation,<br />

reagents and chemistries, software, and services for a<br />

wide range of scientific and industrial laboratory applications,<br />

including environmental monitoring, food and beverage quality/safety,<br />

and chemical analysis, as well as genetic screening,<br />

drug discovery, and development.<br />

Major Products/Services<br />

PerkinElmer, Inc. offers a wide breadth<br />

of instrumentation and solutions to meet<br />

your analytical measurement needs:<br />

⦁ Atomic spectroscopy: AA, ICP-OES,<br />

ICP-MS<br />

⦁ Chromatography: GC & GC Custom Solutions,<br />

GC–MS, HPLC & UHPLC<br />

⦁ Hyphenated techniques: HPLC–ICP-MS,<br />

GC–ICP-MS, HS-GC, HS-GC–MS, TD-GC,<br />

TD-GC–MS, TG-IR, TG-MS, TG-GC–MS,<br />

DSC-Raman<br />

⦁ Mass spectrometry: ICP-MS, GC–MS,<br />

LC–MS<br />

⦁ Molecular spectroscopy: FT-IR & FT-NIR,<br />

UV–vis & UV–vis–NIR, Raman spectroscopy,<br />

fluorescence spectroscopy<br />

⦁ Thermal analysis: DSC, TGA, STA, DMA<br />

⦁ Organic elemental analysis: CHN/O,<br />

CHNS/O<br />

⦁ Consumables: Atomic spectroscopy,<br />

chromatography, molecular spectroscopy,<br />

thermal analysis, elemental<br />

analysis<br />

⦁ OneSource ® Laboratory Services<br />

Facilities<br />

PerkinElmer, Inc. operates globally in 150<br />

countries.


© 2010 PerkinElmer, Inc. 400219_01. All trademarks or registered trademarks are the property of PerkinElmer, Inc. and/or its subsidiaries.<br />

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82 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

PIKE Technologies<br />

⦁ Automation and temperature control<br />

are available for many of our spectroscopy<br />

accessories to speed sampling and<br />

to provide precise thermal analysis.<br />

Markets Served<br />

PIKE products are designed for molecular spectrometers<br />

in the petrochemical, food, forensic,<br />

biochemical, pharmaceutical, semiconductor,<br />

agriculture, and material science industries. In<br />

addition, PIKE specializes in custom design of<br />

products for specific applications. PIKE products<br />

are designed and built with craftsmanship and<br />

care to exceed customer expectations. Visit our<br />

new website and take advantage of our unique<br />

and interactive Crystal Properties Chart and FT-<br />

IR Calculators.<br />

piKe Technologies<br />

6125 Cottonwood Drive<br />

Madison, WI 53719<br />

Telephone<br />

(608) 274-2721<br />

Fax<br />

(608) 274-0103<br />

e-Mail<br />

sales@piketech.com<br />

Web siTe<br />

www.piketech.com<br />

nuMber oF eMployees<br />

42<br />

year Founded<br />

1989<br />

Company Description<br />

PIKE Technologies was established in the summer of 1989, specializing<br />

in the development and manufacture of accessories and<br />

optical systems that enhance the performance of commercial<br />

spectrometers. PIKE concentrates on making the life of laboratory<br />

personnel easier. This is achieved through replacing traditional,<br />

tedious sampling routines with a range of innovative products<br />

and techniques.<br />

Chief Spectroscopic Techniques Supported<br />

PIKE products are designed to work with FT-IR and molecular<br />

spectometers and are based upon the principles of transmission<br />

and reflection spectroscopy measurements. The sampling techniques<br />

offered can be divided into seven major groups:<br />

⦁ Attenuated total reflectance (ATR), for analysis of liquids,<br />

pastes, and soft solid materials.<br />

⦁ Diffuse reflectance (DRIFTS), used in sampling of powders and<br />

solids.<br />

⦁ Specular reflectance, useful in thin film composition and thickness<br />

measurements.<br />

⦁ Microsampling products, FT-IR microscope and beam condensers<br />

to analyze microsamples.<br />

⦁ Integrating spheres, NIR, and Mid-IR versions for FT-IR<br />

spectrometers.<br />

⦁ Transmission supplies, including IR optics, and windows of all<br />

sizes and designs.<br />

Major Products/Services<br />

⦁ MIRacle TM Patented “universal”<br />

sampling accessory - Diamond, ZnSe,<br />

Ge, Si, and AMTIR crystals<br />

⦁ GladiATR TM and GladiATR Vision TM -<br />

Highest performance diamond ATR<br />

⦁ VeeMax TM patented variable angle<br />

specular reflection<br />

⦁ ATR Max TM used for variable depth of<br />

penetration experiments and studies.<br />

⦁ A wide range of fully automated FT-IR<br />

and NIR products with easy to integrate<br />

AutoPRO TM software<br />

⦁ Valu-Line TM Kits combining the most<br />

often used sampling accessories and<br />

transmission kits containing sampling<br />

holders, cells, and optics<br />

⦁ Long Path Gas Cells — 2.4 to 20 m,<br />

heating available.<br />

Facility<br />

PIKE Technologies is located in Madison,<br />

Wisconsin. We distribute direct to our customers<br />

worldwide and OEM worldwide for<br />

packaging with spectrometers of all manufacturers.<br />

Please call or visit our website for<br />

additional contact and product information.


<strong>Spectroscopy</strong> Sampling Solutions<br />

Whether your samples are precious or ordinary, large or small,<br />

hard or soft, liquid or solid, pure or contaminated, PIKE<br />

accessories provide ways and means for their analysis.<br />

We specialize in ATR, diffuse and specular reflectance,<br />

micro sampling, temperature control and sampling<br />

automation. We also provide custom solutions.<br />

Contact us to order the PIKE catalog (or get it on line)<br />

for the complete picture…<br />

FTIR, NIR and UV-Vis sampling made easier<br />

www.piketech.com<br />

sales@piketech.com<br />

tel: 608-274-2721


84 SPECTROSCOPY CORPORATE CAPABILITIES DECEMBER 2011 www.spectroscopyonline.com<br />

Polymicro Technologies,<br />

A subsidiary of Molex Incorporated<br />

Major Products/Services<br />

Polymicro manufactures multimode,<br />

step-index fused silica optical fiber with<br />

polyimide, silicone, acrylate, and other<br />

buffers/coatings; hard clad optical fiber;<br />

dual clad optical fiber; highly stable deep<br />

UV optical fiber; broad spectrum optical<br />

fiber; fiber optic cables and assemblies;<br />

high-strength, high-temperature flexible<br />

fused-silica capillary tubing; light-guiding<br />

capillary; flow cells; square capillary<br />

tubing; windowed capillary tubes; UV<br />

transparent capillary; precision silica and<br />

quartz rods and “cleaved to length” tubing<br />

pieces; multilumen tubing; and microcomponents<br />

such as laser machined<br />

fiber tips, ferrules, sleeves, and laser cut<br />

rods or tubing.<br />

Polymicro Technologies,<br />

A subsidiary of Molex<br />

Incorporated<br />

18019 North 25th Avenue<br />

Phoenix, AZ 85023<br />

TELEPHONE<br />

(602) 375-4100<br />

FAX<br />

(602) 375-4110<br />

E-MAIL<br />

polymicrosales@molex.com<br />

WEB SITE<br />

www.polymicro.com<br />

NUMBER OF EMPLOYEES<br />

115<br />

YEAR FOUNDED<br />

1984<br />

Company Description<br />

For over a quarter century, (since 1984), Polymicro Technologies<br />

delivers CREATIVE . . . INNOVATIVE . . . SOLUTIONS<br />

for the aerospace, analytical, astronomy, automotive, biodefense,<br />

biotechnology, communications, energy, manufacturing,<br />

medical, military, and pharmaceutical industries.<br />

Polymicro is the leader in providing specialty optical fibers<br />

and capillary tubing world wide.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ <strong>Spectroscopy</strong>, UV to mid-IR<br />

⦁ Sensors<br />

⦁ Analytical detectors<br />

⦁ Laser light delivery<br />

⦁ Remote illumination<br />

⦁ Astronomy spectral analysis<br />

Markets Served<br />

Polymicro’s optical fiber, capillary tubing, fiber optic assemblies,<br />

and fiber and tubing arrays are commonly used in academic<br />

labs, national labs, and industry. Polymicro products<br />

find use in aerospace, analytical, astronomy, automotive, biodefense,<br />

biotechnology, communications, energy, manufacturing,<br />

medical, military, and pharmaceutical. Typical applications<br />

include spectroscopy, sensing, analytical detection and analysis,<br />

laser light delivery, remote illumination, process and quality<br />

monitoring and control, in addition to unique applications<br />

from astronomy and aerospace to your laboratory bench.<br />

Facilities<br />

Polymicro has 50,000 sq. ft. of facility<br />

located in the North Phoenix area. At our<br />

location we have several draw towers<br />

that produce a large portion of capillary<br />

tubing and multimode step-index fibers<br />

used throughout the world. Polymicro<br />

has its own glass laboratory, assembly<br />

department, laser machining department,<br />

and sophisticated testing equipment to<br />

meet our customers’ needs for the highest<br />

quality products and service.<br />

To get your copy of our handbook or<br />

inquire about our products, simply e-mail<br />

our technical sales department at<br />

polymicrosales@molex.com. Or you can<br />

fax us at (602) 375-4110.


www.spectroscopyonline.com DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 85<br />

Rigaku Corporation<br />

rigaku Corporation<br />

4-14-4, Sendagaya<br />

Tokyo 151-0051, JAPAN<br />

Telephone<br />

+1(281) 362-2300<br />

Fax<br />

+1(281) 364-3628<br />

e-Mail<br />

info@Rigaku.com<br />

Web siTe<br />

www.Rigaku.com<br />

nuMber oF eMployees<br />

US: 400<br />

Outside US: 700<br />

year Founded<br />

1951<br />

Company Description<br />

Since its inception in 1951, Rigaku has been at the forefront<br />

of analytical and industrial instrumentation technology. Today,<br />

with hundreds of major innovations to their credit, the Rigaku<br />

Group of Companies are world leaders in the fields of protein<br />

and small molecule X-ray crystallography, general X-ray diffraction<br />

(XRD and PXRD), X-ray spectrometry (EDXRF and WDXRF),<br />

X-ray optics, semiconductor metrology, Raman spectroscopy,<br />

automation, computed tomography, nondestructive testing,<br />

and thermal analysis.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ X-ray spectrometry<br />

⦁ Raman spectroscopy<br />

⦁ Energy dispersive X-ray fluorescence (EDXRF)<br />

⦁ Wavelength dispersive X-ray fluorescence (WDXRF)<br />

⦁ Related: X-ray diffraction (XRD)<br />

⦁ Related: X-ray reflectometry (XRR)<br />

Markets Served<br />

Cement, petroleum, mining, refining, pulp and paper, wood<br />

treating, chemicals, pharmaceuticals, biotechnology, forensics,<br />

homeland security, defense, aerospace, energy, metals &<br />

alloys, life sciences, polymers and plastics, inks and dyes,<br />

cosmetics, nanomaterials, photovoltaics, semiconductors, chemistry,<br />

geology and minerals, physics, teaching, and academy.<br />

Major Products/Services<br />

⦁ NEX CG — Cartesian geometry EDXRF<br />

spectrometer<br />

⦁ NEX QC — low cost benchtop EDXRF<br />

analyzer<br />

⦁ Supermini — benchtop WDXRF<br />

spectrometer<br />

⦁ ZSX Primus — 4 kW sequential WDXRF<br />

spectrometer<br />

⦁ ZSX Primus II — 4 kW tube-above<br />

sequential WDXRF<br />

⦁ Simultix 14 — 3 kW (or optional 4 kW)<br />

simultaneous WDXRF spectrometer<br />

⦁ ZSX 400 — large sample sequential<br />

WDXRF spectrometer<br />

⦁ NANOHUNTER — benchtop total reflection<br />

XRF (TXRF)<br />

⦁ MiniFlex II — benchtop X-ray diffractometer<br />

(XRD)<br />

⦁ Xantus — family of portable Raman<br />

spectrometers<br />

⦁ FirstGuard — family of handheld Raman<br />

spectrometers<br />

Facility<br />

Based in Tokyo, Japan, Rigaku is a global<br />

organization with offices, laboratories, and<br />

production facilities around the world.<br />

Major production facilities are located in<br />

Auburn Hills, Michigan; Austin, Texas;<br />

Boston, Massachusetts; Carlsbad, California;<br />

Osaka, Japan; Prague, Czech Republic;<br />

Tokyo, Japan; Tucson, Arizona; The Woodlands,<br />

Texas, and Yamanashi, Japan.


86 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Shimadzu Scientific Instruments<br />

⦁ Compact, high-resolution UV-1800<br />

⦁ Easy-to-use UVmini-1240<br />

⦁ Bioscience-oriented BioSpec-mini<br />

⦁ Micro-volume (1 μL to 2 μL samples)<br />

BioSpec-nano<br />

⦁ Single monochromator UV-2600 with<br />

measurement capabilities to 1400 nm<br />

⦁ Double monochromator UV-2700 with<br />

absorbance level to 8 Abs<br />

⦁ Three-detector UV-3600 UV-VIS-NIR<br />

⦁ SolidSpec-3700 UV-VIS-NIR<br />

Shimadzu Scientific<br />

Instruments<br />

7102 Riverwood Drive<br />

Columbia, MD 21046<br />

Telephone<br />

(800) 477-1227<br />

(410) 381-1227<br />

Fax<br />

(410) 381-1222<br />

e-maIl<br />

webmaster@shimadzu.com<br />

Web SITe<br />

www.ssi.shimadzu.com<br />

number oF employeeS<br />

USA: 335<br />

Worldwide: 9600<br />

year Founded<br />

Shimadzu Scientific<br />

Instruments: 1975<br />

Shimadzu Corporation: 1875<br />

Company Description<br />

Shimadzu Scientific Instruments (SSI) is the North American<br />

subsidiary of Shimadzu Corp., headquartered in Kyoto, Japan.<br />

SSI was established in 1975 to provide analytical solutions to a<br />

wide range of laboratories in the Americas. With a vast installed<br />

base and preferred vendor status at many institutions, SSI’s<br />

instruments are used by top researchers across the globe, customers<br />

who can count on the stability, experience, and support<br />

only Shimadzu offers.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UV–vis<br />

⦁ FT-IR<br />

⦁ Fluorescence<br />

⦁ Atomic (AA/ICP)<br />

⦁ X-Ray (EDX/XRD/XRF)<br />

⦁ GC–MS<br />

⦁ LC–MS-MS<br />

Markets Served<br />

Shimadzu offers more spectroscopy instrumentation, with<br />

more software and accessory options, than any other company.<br />

This flexibility enables spectroscopists in virtually any<br />

laboratory, from biotechnology, pharmaceutical, and industrial<br />

to academic, forensic, and environmental, to select the instrument<br />

best suited to their application. Shimadzu provides free<br />

technical support for the life of the instruments and encourages<br />

customer alliances to further product development.<br />

Major Products/Services<br />

Shimadzu meets your needs for ruggedness, ease of<br />

use, validation, and applications with a variety of UV–vis<br />

spectrophotometers.<br />

FT-IR: Our robust, yet stable, FT-IR spectrophotometers<br />

deliver optimum performance,<br />

sensitivity, and reliability at an exceptional<br />

price, and we offer more of the<br />

sampling accessories you need, including<br />

an automated microscope.<br />

Fluorescence: High-performance spectrofluorophotometer<br />

handles a range of<br />

applications from routine analysis to high<br />

level R&D.<br />

AA/ICP: Simultaneous ICP and our series<br />

of high-quality AA spectrometers offer superior<br />

reliability, precision, sensitivity, and<br />

throughput to deliver maximum performance<br />

and value.<br />

X-ray: Our EDX/XRF/XRD systems are<br />

packed with powerful features to provide<br />

users with versatile, easy-to-use solutions.<br />

Facility<br />

Shimadzu’s U.S. headquarters includes<br />

customer service and technical support,<br />

as well as a customer training and education<br />

center. Ten regional facilities, strategically<br />

located around the U.S., provide<br />

customers with local sales, service, and<br />

technical support.


www.ssi.shimadzu.com<br />

Elevating Excellence in UV-Vis Analyses<br />

From Performance to Price, New Compact, Research-Grade<br />

UV-Vis Spectrophotometers Outclass the Competition<br />

With advanced optical systems engineered to<br />

substantially reduce stray light, Shimadzu’s<br />

new ultra-compact single-monochromator UV-<br />

2600 and double monochromator UV-2700<br />

spectrophotometers offer a number of highperformance<br />

and productivity-enhancing features<br />

to enable confident and convenient use for<br />

routine analysis as well as demanding research<br />

applications. At prices that can’t be beat.<br />

Shimadzu’s UV-2600/2700<br />

spectrophotometers feature:<br />

n<br />

n<br />

n<br />

n<br />

n<br />

n<br />

n<br />

High absorbance level to 8 Abs<br />

Wide measurement range to 1400 nm<br />

Ultra low stray light (0.00005 %T at 220 nm)<br />

Smallest footprint in their class<br />

USB connection<br />

Wide range of accessories and<br />

software packages available<br />

Unbelievable performance/price ratio<br />

For pharmaceutical and<br />

other applications requiring<br />

that hardware be validated,<br />

the UV-2600/2700 Series<br />

provides validation software<br />

as standard.<br />

You have demands. Shimadzu delivers.<br />

Learn more about Shimadzu’s UV-2600/2700.<br />

Call (800) 477-1227 or visit us online at<br />

www.ssi.shimadzu.com/262700<br />

SHIMADZU UV-2600/UV-2700<br />

Order consumables and accessories on-line at http://store.shimadzu.com<br />

Shimadzu Scientific Instruments Inc., 7102 Riverwood Dr., Columbia, MD 21046, USA


88 SpectroScopy corporAte cApABILItIeS DECEMBER 2011<br />

SPEX CertiPrep<br />

www.spectroscopyonline.com<br />

Spex Certiprep<br />

203 Norcross Ave.<br />

Metuchen, NJ 08840<br />

Telephone<br />

(800) 522-7739<br />

Fax<br />

(732) 603-9647<br />

e-maIl<br />

CRMSales@spexcsp.com<br />

Web SITe<br />

www.spexcertiprep.com<br />

year Founded<br />

1954<br />

Company Description<br />

SPEX CertiPrep is a leading manufacturer of Certified Reference<br />

Materials (CRMs) and calibration standards for analytical<br />

spectroscopy and chromatography. We offer a full range of<br />

inorganic CRMs for ICP, ICP-MS, and AA. We are certified by<br />

UL-DQS for ISO 9001:2008 and are proud to be accredited<br />

by A2LA under ISO 17025:2005 and ISO Guide 34-2009. The<br />

scope of our accreditation is the most comprehensive in the industry<br />

and encompasses all of our manufactured products. We<br />

also offer laboratories the option to create their own custom<br />

standards with quick turnaround times, at no additional cost.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ ICP<br />

⦁ ICP-MS<br />

⦁ IC<br />

⦁ AA<br />

⦁ ISE<br />

⦁ XRF<br />

⦁ XRD<br />

Markets Served<br />

SPEX CertiPrep supplies inorganic Certified Reference<br />

Materials to laboratories worldwide in the following markets:<br />

research and development laboratories, environmental<br />

laboratories, wastewater treatment facilities, government<br />

agencies, industrial laboratories, clinical laboratories,<br />

pharmaceutical manufacturers, colleges and universities,<br />

public utilities, oil refineries, nuclear plants, and wineries,<br />

among others.<br />

Major Products/Services<br />

SPEX CertiPrep’s products include aqueous<br />

and organometallic Certified Reference<br />

Materials for ICP-MS, ICP, and AA; ion<br />

chromatography and ion selective electrode<br />

standards; and inorganic and organic<br />

quality control samples. We also manufacture<br />

a line of contamination control<br />

products including sub-boiling acid stills,<br />

a pipette washer, and OdorEroder odor<br />

control products. Our newest product offering<br />

is a line of consumer safety compliance<br />

standards, which includes standards<br />

for use with USP 232, a RoHS/WEEE check<br />

standard, and extractable metals in plastic<br />

toys standards. Our services include shipment<br />

of stock items within 24–48 h from<br />

our Metuchen, New Jersey facility. Technical<br />

customer service is available Monday<br />

through Friday 8:00 a.m. – 5:30 p.m. EST.<br />

Live chat, along with our complete product<br />

catalog and a technical knowledge base is<br />

also available on our website:<br />

www.spexcertiprep.com.<br />

Facility<br />

Our US headquarters is located in<br />

Metuchen, New Jersey. All of our products<br />

are manufactured and shipped from this<br />

facility. SPEX CertiPrep, Ltd. is the<br />

European subsidiary of SPEX CertiPrep,<br />

Inc. and is located in Middlesex, England.<br />

Distributors located throughout the world<br />

extend SPEX CertiPrep’s global reach.


www.spectroscopyonline.com<br />

Teledyne Leeman Labs<br />

DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 89<br />

Teledyne leeman labs<br />

6 Wentworth Drive<br />

Hudson, NH 03051<br />

Telephone<br />

(603) 886-8400<br />

Fax<br />

(603) 886-9141<br />

e-maIl<br />

leemanlabsinfo@teledyne.com<br />

Web SITe<br />

www.teledyneleemanlabs.com<br />

number oF employeeS<br />

60<br />

year Founded<br />

1981<br />

Company Description<br />

Since its founding in 1981,<br />

Teledyne Leeman Labs has<br />

been an innovator in atomic<br />

spectroscopy and introduced<br />

many concepts that are now<br />

considered industry standards.<br />

Among these was the first use<br />

of an Echelle spectrometer<br />

and the first fully automated<br />

mercury analyzer.<br />

As a leading supplier of<br />

instruments for elemental<br />

analysis, we take great pride<br />

in the quality and value of our products and the depth of our<br />

commitment to our customers.<br />

Key <strong>Spectroscopy</strong> Techniques Offered<br />

⦁ Inductively coupled plasma (ICP) spectrometers<br />

⦁ DC Arc spectrometers<br />

⦁ Mercury analysis of liquids, solids and semi solids via cold<br />

vapor atomic absorption or atomic fluorescence<br />

Markets Served<br />

Leeman Lab’s products are used in applications essential to<br />

QA/QC, environmental analysis, research and development<br />

and commercial production. They are used in many industries<br />

including: aerospace, agriculture, automotive, beverage, biofuels,<br />

electronics, energy, environmental/contract labs, gas, food/food<br />

processing, forensics, geological, metals production, mining,<br />

nuclear, petrochemical, petroleum, pharmaceutical, wastewater<br />

and wear metals/oils.<br />

Major Products/Services<br />

Inductively Coupled Plasma Spectrometers (ICP)<br />

Prodigy is our most powerful and versatile ICP spectrometer.<br />

It brings together a state of the art large format, programmable<br />

array detector (L-PAD) with an advanced high dispersion Echelle<br />

spectrometer to provide exceptional analytical performance.<br />

Prism delivers performance and high sample throughput<br />

efficiency via a simultaneous array detector especially suitable<br />

for QA/QC and environmental analysis applications. Our<br />

Profile Plus<br />

ICP is an excellent step up from atomic absorption<br />

spectrometers and a highly cost effective solution for labs with<br />

moderate sample load.<br />

Mercury Analysis<br />

The Hydra II family of automated mercury analyzers operate<br />

on the principle of cold vapor atomic absorption (CVAAS)<br />

spectrometry or atomic fluorescence<br />

(CVAFS). The Hydra II analyzers can be<br />

configured to perform low (ppb to ppt) to<br />

ultra trace (


90 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

Thermo Fisher Scientific<br />

Markets Served<br />

Our growing portfolio of products includes<br />

innovative technologies for a multitude<br />

of markets including food safety,<br />

environmental testing, materials science,<br />

and pharmaceutical.<br />

Major Products/Services<br />

Thermo Scientific spectroscopy instruments<br />

are ideal for investigative analysis<br />

or quality control applications.<br />

<strong>Spectroscopy</strong> systems are used to determine<br />

the molecular or elemental composition<br />

of a wide range of complex samples,<br />

including liquids, solids, and gases. We offer<br />

an expansive range of techniques, such<br />

as FT-IR, FT-NIR, infrared microsampling,<br />

Raman spectroscopy, AA, ICP, ICP-MS and<br />

ARL OES, XRD and XRF spectrometers.<br />

Thermo Fisher Scientific<br />

Instruments<br />

5225 Verona Road<br />

Madison, WI 53711<br />

Telephone<br />

(800) 532-4752<br />

Fax<br />

(608) 273-5046<br />

e-maIl<br />

analyze@thermofisher.com<br />

Web SITe<br />

www.thermoscientific.com<br />

Company Description<br />

Thermo Fisher Scientific is the world leader in serving science,<br />

enabling our customers to make the world healthier,<br />

cleaner, and safer. Our goal is to make our customers more<br />

productive and to enable them to solve their analytical challenges,<br />

from routine testing to complex research and discovery.<br />

We offer a wide range of products including analytical<br />

instruments, equipment, reagents and consumables, software,<br />

and services for research, analysis, discovery, and diagnostics.<br />

Our manufacturing sites in the United States and<br />

Europe provide products for customers within pharmaceutical<br />

and biotech companies, hospitals and clinical diagnostic<br />

labs, universities, research institutions, and government and<br />

environmental industries.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ AA<br />

⦁ ICP<br />

⦁ ICP-MS<br />

⦁ Combustion analyzers<br />

⦁ FT-IR<br />

⦁ FT-NIR<br />

⦁ UV–vis<br />

⦁ Raman<br />

⦁ EDS/WDS/EBSD<br />

⦁ OES<br />

⦁ XRD<br />

⦁ XRF


www.spectroscopyonline.com<br />

DECEMBER 2011 SpectroScopy corporAte cApABILItIeS 91<br />

Waters<br />

Waters Corporation<br />

34 Maple Street<br />

Milford, MA 01757<br />

Telephone<br />

(508) 478-2000<br />

(800) 252-4752<br />

Fax<br />

(508) 872-1990<br />

Web SITe<br />

www.waters.com<br />

number oF employeeS<br />

USA: 2290<br />

Worldwide: 5200<br />

year Founded<br />

1958<br />

Company Description<br />

Waters Corporation, the premium<br />

brand in the analytical instruments<br />

industry since 1958, creates business<br />

advantages for laboratory-dependent<br />

organizations by delivering practical<br />

and sustainable scientific innovation<br />

to enable significant advancements<br />

in such areas as: healthcare delivery,<br />

environmental management, food<br />

safety, and water quality worldwide.<br />

Waters helps customers make profound<br />

discoveries, optimize laboratory<br />

operations, deliver product<br />

performance, and ensure regulatory<br />

compliance by providing a connected<br />

portfolio of separations and analytical<br />

science, laboratory informatics, mass<br />

spectrometry, as well as thermal analysis products.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ UPLC ® –MS<br />

⦁ UPSFC<br />

⦁ LC–MS<br />

⦁ Mass spectrometry<br />

⦁ Informatics<br />

⦁ Supercritical fluid chromatography (SFC)<br />

⦁ Supercritical fluid extraction (SFE)<br />

⦁ Preparative LC<br />

⦁ Purification solutions<br />

⦁ Thermal analysis<br />

⦁ GC–MS<br />

⦁ Rheology<br />

⦁ Microcalorimetry<br />

⦁ Mycotoxin testing<br />

⦁ Proficiency testing<br />

Markets Served<br />

Waters drives decision-making and improves laboratory effectiveness<br />

within the life sciences, pharmaceutical, environmental,<br />

food and beverage, agriculture, clinical, and chemical industries<br />

by providing the tools to improve the quality of today’s science<br />

and explore the infinite possibilities of tomorrow’s.<br />

Major Products/Services<br />

Instruments<br />

⦁ ACQUITY UPLC ® systems<br />

⦁ ACQUITY UPLC ® H-Class systems<br />

⦁ ACQUITY UPLC ® I-Class systems<br />

⦁ nanoACQUITY UPLC ® with HDX technology<br />

⦁ Alliance ® HPLC systems<br />

⦁ Xevo ® mass spectrometers<br />

⦁ SYNAPT ® mass spectrometers<br />

⦁ PATROL UPLC ® Process Analyzer<br />

⦁ MassTrak Clinical Solutions<br />

⦁ MassTrak Forensic Solutions<br />

⦁ TRIZAIC UPLC ® systems<br />

Chemistries<br />

⦁ ACQUITY UPLC ® columns<br />

⦁ ACQUITY UPLC ® BEH Glycan columns<br />

⦁ ACQUITY UPLC ® CSH columns<br />

⦁ XSelect columns<br />

⦁ Viridis ® SFC columns<br />

⦁ XTerra ® columns<br />

⦁ XBridge columns<br />

⦁ Symmetry ® columns<br />

⦁ TRIZAIC UPLC nanoTile Technology<br />

⦁ Atlantis ® columns<br />

⦁ SunFire columns<br />

⦁ DisQuE sample extraction products<br />

⦁ Oasis ® sample extraction products<br />

⦁ Ostro sample preparation products<br />

⦁ TruView LCMS Certified Vials<br />

Informatics<br />

⦁ Empower chromatography software<br />

(21 CFR Part 11 compliant-ready)<br />

⦁ MassLynx MS software<br />

⦁ NuGenesis ® SDMS software<br />

Services and Support<br />

⦁ Empower -Driven Services<br />

⦁ Compliance Services (IQ,OQ,PQ)<br />

⦁ Waters Quality Parts ®<br />

⦁ Waters Global Services<br />

⦁ Educational Services<br />

Facilities<br />

Waters operates cGMP, ISO 13485: 2003,<br />

and ISO 9001-2008-certified manufacturing<br />

plants in Milford, Massachusetts<br />

(instruments and parts); Manchester, UK<br />

(mass spectrometers); Taunton,<br />

Massachusetts (chemistries); Wexford,<br />

Ireland (chemistries and mass spectrometers);<br />

Waters Milford facility is also<br />

approved for Part 1, Canadian Medical Device<br />

Regulations (CMDR). The company’s<br />

subsidiary, TA Instruments, Inc., is located<br />

in New Castle, Delaware.


92 SpectroScopy corporAte cApABILItIeS DECEMBER 2011 www.spectroscopyonline.com<br />

WITec GmbH<br />

Major Products/Services<br />

WITec alpha300 Confocal Raman<br />

Microscope: The alpha300 R is a Raman<br />

imaging system focusing on high-resolution<br />

as well as high-speed spectra and image<br />

acquisition. The acquisition time for a single<br />

Raman spectrum is in the range of 1 ms or<br />

even below; thus, a complete Raman image<br />

consisting of tens of thousands of spectra<br />

can be obtained in 1 min or less. Differences<br />

in chemical composition, although completely<br />

invisible in the optical image, will be<br />

apparent in the Raman image and can be<br />

analyzed with a resolution down to 200 nm.<br />

WITec Gmbh<br />

Main Address:<br />

Lise-Meitner-Str. 6, 89081<br />

Ulm, Germany<br />

WITec Instruments Corp.<br />

122 McCammon Ave.<br />

Maryville, TN 37804<br />

Telephone<br />

+49 (0) 731 140 700<br />

USA: (865) 984-4445<br />

Fax<br />

+49 (0) 731 140 7020<br />

USA: (865) 984-4441<br />

e-maIl<br />

info@witec.de<br />

Web SITe<br />

www.witec.de<br />

number oF employeeS<br />

35<br />

year Founded<br />

1997<br />

Company Description<br />

WITec is a manufacturer of high-resolution optical and scanning<br />

probe microscopy solutions for scientific and industrial<br />

applications. A modular product line allows the combination<br />

of different microscopy techniques such as Raman, NSOM, or<br />

AFM in one instrument. The company’s product line features<br />

a near-field scanning optical microscope, using unique cantilever<br />

technology, a confocal Raman microscope designed<br />

for highest sensitivity and resolution, and an AFM for material<br />

research and nanotechnology. Focusing on innovations and<br />

constantly introducing new technologies, WITec is the leading<br />

expert for a wide variety of optical, structural, and chemical<br />

imaging tasks.<br />

Chief Spectroscopic Techniques Supported<br />

⦁ Raman spectroscopy<br />

⦁ Confocal Raman imaging<br />

⦁ Ultrafast confocal Raman imaging<br />

⦁ Confocal and near-field fluorescence spectroscopy<br />

⦁ Upgradeable with atomic force and near-field microscopy<br />

capabilities<br />

Markets Served<br />

WITec products are delivered worldwide to academic and<br />

industrial research labs focusing on high-resolution chemical<br />

imaging and materials characterization. Areas of application<br />

for WITec’s confocal Raman imaging systems include polymer<br />

sciences, pharmaceutics, life science, geoscience, thin films<br />

and coating analysis, semiconductors, and nanotechnology.<br />

WITec alpha500 Automated Confocal<br />

Raman & Atomic Force Microscope: The<br />

alpha500 is an automated confocal Raman<br />

and atomic force microscopy system<br />

incorporating a motorized sample stage<br />

for large samples and customized multiarea/multi-point<br />

measurements. It allows<br />

nondestructive chemical imaging with<br />

confocal Raman microscopy as well as<br />

high-resolution topography imaging with<br />

AFM using the integrated piezo scan-stage.<br />

Both modes can be run fully automatically,<br />

guaranteeing the most comprehensive<br />

surface inspection possibilities for systematic<br />

and routine research tasks or highlevel<br />

quality control.<br />

Facilities<br />

WITec Headquarters is located in Ulm,<br />

Germany, and includes the R&D department,<br />

production, sales & marketing, and<br />

administration. WITec Instruments Corp.<br />

in Maryville, Tennessee, is responsible for<br />

North American sales and service activities.


APPLICATION NOTES – DECEMBER 2011 Mass Spectrometry 93<br />

Simultaneous Qualitative and<br />

Quantitative Analysis of<br />

Buspirone and Its Metabolites<br />

with the Agilent 6550 iFunnel<br />

Q-TOF LC–MS System<br />

Yuqin Dai, Michael Flanagan, and Keith Waddell,<br />

Agilent Technologies, Inc.<br />

Timely and rapid assessment of metabolic stability, metabolite<br />

identification, and metabolite profiling is critical for accelerating<br />

lead optimization and enhancing the success rate of drug<br />

candidates entering into development. Traditionally, qualitative<br />

and quantitative analyses are often performed on different types<br />

of LC–MS instruments and in multiple runs. Te ability to obtain<br />

quantitation and identification (qual/quan) in a single analysis<br />

makes metabolic stability, metabolite identification, and metabolite<br />

profiling studies much more efficient. Tis note describes an<br />

integrated qual/quan workflow that is enabled by the sensitivity<br />

enhancement of iFunnel technology implementation on a quadrupole<br />

time-of-flight (Q-TOF) instrument. It demonstrates how Agilent<br />

6550 iFunnel Q-TOF permits high sensitivity, simultaneous<br />

determination of metabolic stability, metabolite identification, and<br />

metabolite profiling in an in vitro buspirone (1 μM) metabolism<br />

study in rat liver microsomes.<br />

An Integrated Qualitative/Quantitative Workflow<br />

Te qual/quan workflow starts with the LC–MS injection of a biological<br />

sample. Using the Agilent 6550 iFunnel Q-TOF LC–MS<br />

system, data acquisition includes a full MS scan followed by three<br />

data dependent auto MS-MS scans. Metabolite identification and<br />

structure elucidation are facilitated by MassHunter Metabolite ID<br />

software. Metabolic stability and metabolite profiling are established<br />

from the same set of data, which are processed in batch<br />

mode by MassHunter Quantitative Analysis software.<br />

Qual/Quan Analysis<br />

Figure 1 illustrates the metabolic stability of buspirone and the<br />

profiles of its metabolites, illustrating broad coverage of the high<br />

and low abundance metabolites across the entire 60-min time<br />

course.<br />

Figure 2 demonstrates the MS and MS-MS spectra of a buspirone<br />

monohydroxyl metabolite from a 10-min incubation<br />

sample. Te sub-ppm mass accuracy of the precursor and fragment<br />

ions, along with the excellent isotopic fidelity (overall score<br />

>99%), provided highly confident metabolite identification and<br />

structure elucidation.<br />

Normalized peak area (%)<br />

100 Buspirone (parent)<br />

90<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

dihydroxy<br />

N-oxide<br />

N, N’-desethyl + O<br />

Incubation time (min)<br />

monohydroxy<br />

trihydroxy<br />

N, N’-desethyl<br />

1-Pyrimidinlypiperazine<br />

0<br />

0 10 20 30 40 50 60<br />

Figure 1: Metabolic stability of buspirone and its metabolite<br />

profiles.<br />

x10 5<br />

2.2 123.0918<br />

2<br />

1.8<br />

1.6<br />

1.4<br />

1.2<br />

1<br />

0.8<br />

0.6<br />

0.4<br />

0.2<br />

0<br />

x10 4 122.0713<br />

C6 H8 N3<br />

4<br />

3.5<br />

3<br />

2.5<br />

2<br />

1.5<br />

1<br />

0.5<br />

0<br />

0.07 ppm<br />

155.1539<br />

O<br />

224.1280<br />

150.1023<br />

C8 H12 N3 178.1212 238.1439 281.1859<br />

-2.01 ppm<br />

C9 H14 N4 C13 H20 N O3 C15 H25 N2 O3<br />

-0.39ppm 0.68 ppm -0.41 ppm<br />

Counts vs. Mass-to-Charge (m/z)<br />

MS spectrum<br />

MS/MS spectrum<br />

402.2499<br />

C21 H32 N5 O3<br />

402.2499<br />

120 140 160 180 200 220 240 260 280 300 320 340 360 380 400 420<br />

Figure 2: Excellent mass accuracy in both MS and MS-MS spectra<br />

and isotopic fidelity.<br />

Conclusions<br />

An efficient qual/quan workflow has been developed using the<br />

Agilent 6550 iFunnel Q-TOF LC–MS system combined with two<br />

powerful software tools: MassHunter Metabolite ID and Quantitative<br />

Analysis. Te 6550 iFunnel Q-TOF LC–MS system enables<br />

the simultaneous quantitation and metabolite identification from<br />

1 μM buspirone incubations with sufficient sensitivity, throughput<br />

(run time of 3.5 min), and high analytical confidence. Tis single<br />

analytical platform also allows rapid generic LC–MS method development<br />

and eliminates the time-consuming MRM optimization<br />

for each analyte that is required on a triple quadrupole instrument.<br />

Agilent Technologies Inc.<br />

2315 Stevens Creek Blvd., Santa Clara, CA 95052<br />

tel. (800) 227-9770; Fax (302) 633-8901<br />

Website: www.agilent.com


94 Molecular <strong>Spectroscopy</strong> APPLICATION NOTES – DECEMBER 2011<br />

Long-Wavelength Dispersive<br />

1064 nm Raman: In-Line<br />

Pharmaceutical Compound<br />

Identification<br />

Clare Dentinger, Steven Pullins, and Eric Bergles,<br />

BaySpec, Inc.<br />

Increased capability for in-line pharmaceutical compound<br />

identification is achieved by using dispersive<br />

1064 nm Raman instruments.<br />

Current practice for in-line monitoring of pharmaceuticals<br />

requires that the identity of the raw material be confirmed.<br />

Tis confirmation is, usually, done in industry by removing a<br />

sample of the raw material and doing off-site analysis. In-line<br />

spectroscopy devices, such as Raman instruments, have the<br />

potential to make identifying pharmaceutical raw materials<br />

faster and easier.<br />

Raman spectroscopy is a powerful technique for compound<br />

identification. Te nondestructive Raman analysis produces<br />

compound specific spectra and enables accurate identification.<br />

However, many pharmaceutical materials show significant fluorescence<br />

when Raman spectrometers with 532 nm or 785 nm<br />

excitation are used (1). Tis fluorescence reduces the signal to<br />

the background noise ratio, can significantly increase the acquisition<br />

time, and reduces the number of peaks available for<br />

compound identification.<br />

New laser, optics, and detector technology originally<br />

developed for the telecommunications industry has allowed<br />

BaySpec, Inc. to develop multiple bench-top Raman instruments<br />

including systems with 1064 nm excitation. Te long<br />

excitation wavelength enables significant reduction in fluorescence<br />

while the deep-cooled detectors and dispersive grating,<br />

with no moving parts, while improving reliability for on-site<br />

compound identification.<br />

Figure 1 shows a picture of BaySpec’s 1064 nm RamSpec<br />

Raman instrument designed for high resolution low signal<br />

sensitivity. Te 1064 nm RamSpec can even measure compounds<br />

in containers that are opaque at visible wavelengths and can be<br />

identified without removing a sample from the container. Figure<br />

2 shows the spectra collected from a drug sample at both<br />

1064 nm excitation and 785 nm excitation. With the 785 nm<br />

excitation a large fluorescence band is seen which obscures all<br />

but the strongest Raman bands. However, when the 1064 nm<br />

excitation was used very clear Raman bands are seen and these<br />

bands would allow for definitive identification of the drug.<br />

Figure 1: BaySpec’s RamSpec 1064 nm instrument.<br />

200 700 1200 1700<br />

Raman shift (cm -1 )<br />

1064<br />

Figure 2: Raman spectra of drug measured with 785 nm excitation<br />

and 1064 nm excitation wavelengths.<br />

Long-wavelength dispersive 1064 nm Raman instruments<br />

are now available from BaySpec. For more information on these<br />

and our complete line of spectroscopic instruments contact:<br />

info@bayspec.com.<br />

785<br />

Reference<br />

(1) M. Mathlouthi and D.V. Luu, Carbohyd. Res. 78, 225 (1980).<br />

BaySpec, Inc.<br />

1101 McKay Drive, San Jose, CA 95131<br />

tel. (408) 512-5928<br />

Website: www.bayspec.com<br />

Email: info@bayspec.com


APPLICATION NOTES – DECEMBER 2011 Molecular <strong>Spectroscopy</strong> 95<br />

60000<br />

Various methanol concentrations in 40% ethanol<br />

Determination of Low<br />

Concentration Methanol in<br />

Alcohol by an Affordable<br />

High Sensitivity Raman<br />

Instrument<br />

50000<br />

40000<br />

30000<br />

20000<br />

10000<br />

0ppm<br />

50ppm<br />

0.05 %<br />

0.25 %<br />

1.25 %<br />

2.5 %<br />

Duyen Nguyen and Eric Wu, Enwave Optronics, Inc.<br />

0<br />

250 450 650 850 1050 1250<br />

Raman Shift (cm -1 )<br />

1450 1650 1850<br />

Low concentration natural methanol exists in most alcoholic<br />

beverages and usually causes no immediate health threat.<br />

Nevertheless, it is possible to have natural occurring methanol<br />

in beverages with concentration as high as 18 g/L of ethanol;<br />

or equivalent to 0.72% methanol in 40% ethanol, in alcohol<br />

(1). Current EU regulation limits naturally occurring methanol<br />

to below 10 g/L of ethanol; or equivalent to 0.4% methanol in<br />

40% ethanol.<br />

Raman spectroscopy has been shown to be an efiective tool<br />

in compositions analysis as well as adulteration identiTcations in<br />

foods (2). In the alcoholic beverage industry, the standard composition<br />

analysis method were more expensive and time-consuming<br />

gas chromatography (3). Here, we present a Raman spectroscopy<br />

method for a quick and lower cost alternative to verify the<br />

existence of low concentration methanol in alcohol.<br />

Experiment<br />

40% ethanol/water solution was prepared using 200-proof<br />

ethanol and distilled water. HPLC grade methanol was added<br />

into the 40% ethanol solution to make samples with methanol<br />

concentration ranging from 50 ppm to 2.5%. An Enwave<br />

Optronics’ ProRaman instrument with laser excitation at 785<br />

nm was used for the measurements. The sample solutions<br />

were measured in quartz cuvette in a sample holder. Figure 1<br />

depicts the results of the measured spectra in the fingerprint<br />

region of the Raman spectra.<br />

Partial least square (PLS) regression method was used for calibration<br />

and prediction model for methanol. ffe spectral region<br />

from 950–1200 cm -1 was chosen for developing the calibration<br />

model. ffe actual vs. predicted concentration value of methanol<br />

is shown in Figure 2. It is shown that the measured data and PLS<br />

prediction match very well with correlation coeflcient R 2 @ 0.997.<br />

Conclusion<br />

An afiordable, high sensitivity ProRaman instrument was used<br />

with PLS method to successfully analyze low concentration methanol<br />

in 40% alcohol. Based on our Tndings, the detection limit<br />

for methanol in 40% of ethanol is much better than 50 ppm and<br />

Figure 1: The fingerprint range spectra of the various solutions.<br />

Predicted value (ppm)<br />

24800<br />

19800<br />

14800<br />

9800<br />

4800<br />

-200<br />

reliable quantitative determination using PLS prediction could<br />

reach 50 ppm of methanol in 40% alcohol.<br />

References<br />

(1) F. Bindler, E. Voges, and P. Laugel, Food Addit. Contam. 5, 343–351<br />

(1988).<br />

Actual vs. Predicted concentrations of methanol in 40% ethanol<br />

(2) W.M. Mackenzie and R.I. Aylott, The Analyst 129, 607–612 (2004).<br />

(3) L.M. Reid, C.P. O’Donnell, and G. Downey, Trends in Food Science &<br />

Technology 17, 344–353 (2006).<br />

y = x + 0.0369<br />

R 2 = 0.997<br />

0 5000 10000 15000<br />

Actual concentration (ppm)<br />

20000 25000<br />

Figure 2: Actual and predicted methanol concentrations using<br />

PLS regression model.<br />

Enwave Optronics, Inc.<br />

18200 McDurmott St., Suite B, Irvine, CA 92614<br />

tel. (949) 955-0258; fax (949) 955-0259<br />

Website: www.enwaveopt.com


96 Molecular <strong>Spectroscopy</strong> APPLICATION NOTES – DECEMBER 2011<br />

Optical Compensation in<br />

Variable Angle Transmission<br />

Measurements of Thick<br />

Samples<br />

(a)<br />

(b)<br />

S. L. Berets 1 and M. Milosevic 2 , 1 Harrick Scientific Products,<br />

Inc., and 2 MeV Consulting<br />

Variable angle transmission spectroscopy is used to extract Tlm<br />

thicknesses and refractive index data. fie sample is placed in<br />

the spectrometer at a known incident angle for analysis. fie infrared<br />

or UV–vis beam refracts through the sample in accordance to Snell’s<br />

Law. Consider two samples (n = 1.5), 1-mm and 10-mm thick. Radiation<br />

passing through these samples at a 45° incident angle will be<br />

offset roughly 0.5 mm and 5 mm, respectively. fiis offset radiation<br />

will be misaligned on the detector, reducing the measured transmittance<br />

regardless of sample absorption.<br />

fiis applications note illustrates this problem and presents the use<br />

of a second thickness-matched sample to refract the beam back so it is<br />

properly centered on the detector.<br />

Experimental<br />

fie sample investigated consisted of two pieces of 13.8-mm thick<br />

Plexiglas cut from the same sheet.<br />

fie measurements were carried out using Harrick’s Variable Angle<br />

Transmission Accessory in a UV–vis spectrometer with a nominally<br />

collimated beam. Spectra were collected from 190 nm to 900 nm<br />

with a full aperture and a 1-nm scan interval. Data were collected<br />

with either one or two samples positioned in the beam path at 0° and<br />

60° incident angles. fie double-transmission spectra were adjusted<br />

for comparison to the single-transmission data.<br />

Results and Discussion<br />

fie results are presented in Figure 2. At normal (0°) incidence, there<br />

is little refraction of the beam, so the measurements with and without<br />

compensation should simply show differences in reflectance losses.<br />

Assuming the samples are plane parallel, the reflectance losses on two<br />

plates should be roughly double that of a single plate at normal incidence.<br />

Here, the transmittances are nearly identical indicating that<br />

the surfaces are not plane parallel, so some radiation is defected away<br />

from the detector.<br />

At 60°, the transmittance of single sample shows very little radiation<br />

reaching the detector. A visual comparison of the white light<br />

beam intensity before and after the sample shows a more intense<br />

transmitted beam than expected for


APPLICATION NOTES – DECEMBER 2011 Molecular <strong>Spectroscopy</strong> 97<br />

Near Infrared <strong>Spectroscopy</strong> Is<br />

a Useful Tool in Photovoltaics<br />

Panel Development<br />

90<br />

80<br />

70<br />

Sample 1<br />

Sample 2<br />

Sample 3<br />

Sample 4<br />

Sample 5<br />

% Reflection: Samples with Film Side Up<br />

60<br />

Rob Morris and Andrew Tatsch, Ocean Optics<br />

With their modest cost, compact size and great<br />

fiexibility, UV-VIS-NIR miniature fiber optic spectro<br />

meters are attractive analytical tools for photovoltaic<br />

materials research and quality control. Typical<br />

applications include analysis of the optical properties<br />

of solar cell materials, spectroradiometric measurement<br />

of solar simulators used in panel testing and<br />

quality control in panel production.<br />

We evaluated NIR spectroscopy as a method to measure the<br />

refiection of photovoltaic panel materials. A manufacturer<br />

of thin fflm photovoltaic panels requested NIR refiectivity analysis<br />

of several coated glass samples. Measurements were conducted<br />

from 1200–2100 nm under ambient lab lighting conditions.<br />

Because the absorbance of photovoltaic panels is so critical,<br />

determining the refiectivity at panel edges and elsewhere is a<br />

good indicator of the light loss at those areas. Te use of antirefiective<br />

coatings and glass dopants are among the approaches<br />

manufacturers may evaluate in improving panel eflciency.<br />

Experimental Conditions<br />

Five coated glass samples were analyzed with an Ocean Optics<br />

NIRQuest256-2.1 Spectrometer conffgured with a 100 µm slit<br />

and optimized for the range from 1200–2100 nm. Te sampling<br />

setup comprised a tungsten halogen light source, 400 µm refiection<br />

probe and an optical stage. A specular refiection standard was<br />

used as a reference. SpectraSuite spectrometer operating software<br />

completed the setup.<br />

Te glass samples were placed on the sample holder uncoated<br />

side down, to ensure that the probe measured the refiection from<br />

the coating through the glass. Te optical stage helped to position<br />

the probe at 90° to measure specular refiectance.<br />

Measurements were taken under overhead lighting conditions.<br />

Te high-powered (20 W) tungsten halogen light source provided<br />

continuous illumination from 360–2000 nm. Te distance from<br />

the tip of the refiection probe to the surface of the sample was measured<br />

at ~7 cm for each sample, to simulate production conditions.<br />

Ocean Optics NIR Spectrometers use a high-performance<br />

InGaAs-array detector in a compact optical bench with thermoelectric<br />

cooler and low-noise electronics. Te NIRQuest256-2.1 is<br />

suited to applications involving higher wavelengths (peak responsivity<br />

is ~1900 nm). Te spectrometer’s rapid integration times —<br />

% Reflection (relative)<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

1250 1350 1450 1550 1650<br />

Wavelength (nm)<br />

1750 1850 1950 2050<br />

Figure 1: NIR specular refiection of photovoltaic materials (coated<br />

glass samples).<br />

spectral acquisition of 1 ms is possible — makes it viable for high<br />

volume production environments.<br />

Results<br />

Te measurements showed good stability with no averaging and<br />

boxcar smoothing. Te refiection spectra for the samples (Figure 1)<br />

demonstrated that refiection values increased as a function of wavelength<br />

comparably across all ffve samples, peaking at about 2000 nm.<br />

Also, the gap between the least refiective and most refiective samples<br />

was relatively narrow at the lower and upper ranges of the wavelength<br />

range, with the greatest variation observed near 1700 nm.<br />

Refiectance intensity of the coated samples ranged from ~25%<br />

at the lower wavelengths to as much as 80% at the higher wavelengths.<br />

Tese values are relative to the response of the specular<br />

refiectance standard, which has nearly “fiat” refiectivity across all<br />

NIR wavelengths.<br />

Conclusions<br />

As developers of photovoltaic materials seek improvement in cell<br />

eflciency, the need for convenient analytical tools to evaluate glass<br />

coatings, dopants and other materials is great. Optical sensing systems<br />

such as NIR spectrometers, thin fflm measurement systems and solar<br />

simulator testing units are easily conffgured for both research lab and<br />

process line applications.<br />

NIR spectroscopy can be used to determine the specular refiectivity<br />

of coated glass samples relative to each other and to known refiectance<br />

standards. As a result, the solar light capturing eflciency of<br />

the ffve sample coatings now can be inferred with the utilized Ocean<br />

Optics spectrometer and accessories.<br />

Ocean Optics, Inc.<br />

830 Douglas Ave., Dunedin, FL 34698<br />

tel. (727) 733-2447; Fax (727) 733-3962<br />

Website: www.oceanoptics.com; Email: info@oceanoptics.com


98 Molecular <strong>Spectroscopy</strong> APPLICATION NOTES – DECEMBER 2011<br />

Mid-Infrared Refiectivity Measurements of<br />

Diffuse Materials<br />

Jenni L. Briggs, PIKE Technologies<br />

The approach to infrared measurements of diffusely<br />

scattering materials often is dictated by the objective<br />

of the analysis. Spectral data from three different<br />

mid-infrared refiectance sampling accessories are<br />

contrasted.<br />

100<br />

95<br />

90<br />

85<br />

80<br />

75<br />

70<br />

Infrared analysis of highly scattering or textured samples is often<br />

accomplished via diffuse refiectance sampling accessories.<br />

Among two of the most popular diffuse refiectance accessories<br />

are the confocal ellipsoidal mirror design, which results in only a<br />

fraction of the refiected light being collected, and the integrating<br />

sphere design (1). Te speciflc accessory used for the measurement<br />

will be determined by the information desired. Te aim of<br />

this application note is to compare mid-infrared spectral data of<br />

a diffuse sample obtained by using various refiection accessories.<br />

Experimental Conditions<br />

A powdered coated metal panel was analyzed using the PIKE<br />

UpIR , a diffuse refiection accessory with an ellipsoidal collection<br />

mirror, or the PIKE mid-infrared IntegratIR , a<br />

gold-coated integrating sphere equipped with a liquid nitrogen<br />

cooled MCT detector. Te sampling surface of the UpIR<br />

is positioned above the FT-IR making it ideal for analyzing<br />

large samples. Additionally, a spectrum was collected using a<br />

10 o specular refiection accessory. Te background and sample<br />

collection time was 20 s, and the resolution was set to 4 cm -1 .<br />

Results<br />

All spectra are shown in Figure 1. Te spectrum of the powdered<br />

coated sample collected with the 10° specular refiection<br />

accessory resulted in refiectivity values near 1% and minimal<br />

chemical information is discernable due to the diffuse characteristic<br />

of this sample. Only the specular component refiecting at<br />

the angle equivalent to the angle of incidence, 10° in this case,<br />

is collected. Specular refiection accessories are appropriate for<br />

specular samples such as mirrors, optical windows, and coatings<br />

on refiective surfaces.<br />

Chemical information from a high quality spectrum is obtained<br />

from the ellipsoidal collection mirror (UpIR) and the integrating<br />

sphere accessory. Terefore, either accessory is suitable for<br />

this purpose. Te refiectivity measurements were different; at 4000<br />

cm -1 65% refiectivity was measured using the integrating sphere<br />

while the refiectivity of the sample collected using the UpIR was<br />

93%. However, only the integrating sphere accessory produces re-<br />

% Reflectance<br />

65<br />

60<br />

55<br />

50<br />

45<br />

40<br />

35<br />

30<br />

25<br />

20<br />

15<br />

10<br />

5<br />

0<br />

4000 3500 3000 2500 2000 1500 1000 500<br />

Wavenumber (cm -1 )<br />

Figure 1: Spectrum of painted panel obtained using an elliptical<br />

collection type accessory (shown in purple), an integrating<br />

sphere ( shown in blue), and a 10 o specular refiection accessory<br />

(shown in red).<br />

liable refiectivity data because it is able to collect close to the entire<br />

available hemispherical (2π steradians) scattered photons.<br />

Te integrating sphere has a highly refiective, close to a Lambertian<br />

surface, such that the light enters the sphere, bounces<br />

around the highly refiective diffuse surface of the sphere wall,<br />

and flnally impinges upon the detector. In addition to refiectivity<br />

measurements as described here, the PIKE IntegratIR may be<br />

used for diffuse transmission measurements. Despite the 100 year<br />

history of the sphere, new applications are continually developed.<br />

Conclusions<br />

For refiectivity measurements of diffuse samples, using an integrating<br />

sphere is preferred, whereas for obtaining only chemical<br />

information a ellipsoidal mirror design diffuse refiection<br />

accessory is adequate.<br />

References<br />

(1) L.M. Hanssen and K.A. Snail, Handbook of Vibrational <strong>Spectroscopy</strong>, Chalmers<br />

and Griffiths, Eds. (2002).<br />

PIKE Technologies<br />

6125 Cottonwood Drive, Madison, WI 53719<br />

tel. (608) 274-2721; fax (608) 274-0103<br />

Website: www.PIKEtech.com


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technical information found in the monthly print edition. The digital edition is delivered<br />

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