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Membrane Cards with Microscrub Technology

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Pyramid Probe Contact Resistance<br />

from Sandia Lifetest (@ 85 C)<br />

3<br />

Lifetest at Sandia on a blank aluminum wafer<br />

(5 mil overtravel at 85 C)<br />

2.5<br />

Resistance (contact + signal line) (ohms)<br />

2<br />

1.5<br />

1<br />

0.5<br />

0<br />

440<br />

430<br />

420<br />

410<br />

400<br />

390<br />

380<br />

370<br />

360<br />

350<br />

340<br />

330<br />

320<br />

280<br />

270<br />

260<br />

250<br />

240<br />

230<br />

220<br />

210<br />

200<br />

190<br />

180<br />

170<br />

160<br />

120<br />

110<br />

100<br />

90<br />

80<br />

70<br />

60<br />

50<br />

40<br />

30<br />

20<br />

10<br />

0<br />

Touchdowns (x 1000)<br />

(box plot <strong>with</strong>out tails comparative to data shown at SWTW '98<br />

page 24)<br />

Advanced Microelectronic Probing Solutions<br />

M<br />

TM<br />

CASCADE<br />

I C R O T E C H

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