Membrane Cards with Microscrub Technology

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Multi-DUT Testing of FlashRAM

●

2 X 5 Multi-DUT

probe layout for

FlashRam devices

500 I/O

25 mm square

Advanced Microelectronic Probing Solutions

M

TM

CASCADE

I C R O T E C H

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Intel Multi-DUT FlashRAM Advanced Microelectronic Probing Solutions M TM CASCADE I C R O T E C H

Multi-DUT Testing of FlashRAM ● ● ● 2 X 5 Multi-DUT probe layout for FlashRam devices 500 I/O 25 mm square Advanced Microelectronic Probing Solutions M TM CASCADE I C R O T E C H

Page 1 and 2: Achieving Low Contact Resistance on
Page 3 and 4: Industry Requirements ● Contact r
Page 5 and 6: Microscrub Principles of Operation
Page 7 and 8: Typical Initial Contact Resistance
Page 9 and 10: Pyramid Probe Tips with MEMs Proces
Page 11 and 12: Pyramid Probe Contact Resistance fr
Page 13 and 14: Comparison of Cantilever (@ 30 C) v
Page 15 and 16: Typical Pyramid Probe and Cantileve
Page 17: One Cantilever, Two Pyramid Scrub M
Page 21 and 22: Acknowledgements ● ● ● NIST/A

Membrane Cards with Microscrub Technology

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