VLSIresearch - Semiconductor Wafer Test Workshop
VLSIresearch - Semiconductor Wafer Test Workshop
VLSIresearch - Semiconductor Wafer Test Workshop
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Drivers for Declining ATE &<br />
Material Handling Buy Rates<br />
• End of Functional <strong>Test</strong>ing Era.<br />
– <strong>Test</strong>ers cost less.<br />
• Large Scale Implementation of DFT.<br />
• Modular <strong>Test</strong>er<br />
– Upgrade cards only, higher utilization<br />
• Parallel <strong>Test</strong>ing<br />
• OSATs increasing share of testing.<br />
– Higher utilization, efficiencies due to business model.<br />
• <strong>Test</strong>ing less<br />
– Probe card & socket data does not agree.<br />
<strong>VLSIresearch</strong>.com weSRCH.com chiphistory.org<br />
Copyright © 2009 VLSI Research Inc. All rights reserved. Reprinted with permission from VLSI RESEARCH INC.<br />
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