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Scanning Electron Microscopy

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Variable Pressure SEM<br />

•Localised charging is removed by the presence of gas in the sample chamber, effectively allowing the<br />

examination of non conductive samples<br />

•In Low vacuum mode the chamber is isolated from the high vacuum system(A) and is instead pumped<br />

by the additional rotary pump system(B).<br />

Analytical<br />

Workshop 2012

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