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Scanning Electron Microscopy

Scanning Electron Microscopy

Scanning Electron Microscopy

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The Parts of an EM<br />

• <strong>Electron</strong> Microscopes (EMs) are similar in operation to optical microscopes except<br />

that they use a focused beam of electrons instead of light to "image" the specimen and<br />

gain information about its structure and composition.<br />

• There are four major regions in an <strong>Electron</strong> Microscope:-<br />

Analytical<br />

Workshop 2012<br />

(1) A stream of electrons is formed (by the electron source/gun) and<br />

accelerated toward the specimen using a positive electrical potential<br />

(2) This stream is confined and focused using metal apertures and magnetic<br />

lenses into a thin, focused, monochromatic beam.<br />

(3) This beam is focused onto the sample using a magnetic lens. In an SEM<br />

the beam is then also scanned across the surface of the sample.<br />

(4) Interactions occur inside the irradiated sample, affecting the electron<br />

beam which are detected and transformed into an image or signal.<br />

• The above happens in all EMs regardless of type.

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