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Performance and Reliability - IDEMA

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St<strong>and</strong>ardized Testing for SSD’s <strong>and</strong> HDDs<br />

<strong>Performance</strong> <strong>and</strong> <strong>Reliability</strong><br />

<strong>IDEMA</strong> Technical Symposium<br />

May 2008<br />

Ed Dawson<br />

Flexstar Technology<br />

edawson@flexstar.com<br />

www.flexstar.com


Agenda<br />

<strong>Performance</strong> & <strong>Reliability</strong> Testing<br />

• Why Test<br />

• What is St<strong>and</strong>ardized Testing<br />

• <strong>Reliability</strong> & <strong>Performance</strong> Testing<br />

• Device Specific Tests<br />

• Storage Test Evolution


• Engineering Verification<br />

– EVT DVT etc<br />

– Development debug<br />

• OEM Qualification<br />

– Systems qualification<br />

– <strong>Performance</strong> evaluation<br />

– Four corner testing<br />

– ORT<br />

• Device Manufacturing<br />

– Meet specifications<br />

– <strong>Reliability</strong> / early life failures<br />

– Fast failure analysis<br />

• Field<br />

– Failure analysis<br />

– RMA confirmation<br />

Why Test?


• Engineering Verification<br />

– EVT DVT etc<br />

– Development debug<br />

• OEM Qualification<br />

– Systems qualification<br />

– <strong>Performance</strong> evaluation<br />

– Four corner testing<br />

– ORT<br />

• Device Manufacturing<br />

– Meet specifications<br />

– <strong>Reliability</strong> / early life failures<br />

– Fast failure analysis<br />

• Field<br />

– Failure analysis<br />

– RMA confirmation<br />

Why St<strong>and</strong>ardized Tests?


1<br />

St<strong>and</strong>ardized Testing<br />

Key Features of St<strong>and</strong>ardized Testing<br />

• Accuracy<br />

• Repeatability<br />

– Ability to reliably recreate same test<br />

conditions globally<br />

• Tight control over test conditions<br />

– Environmental<br />

– Test tool environment<br />

• Scripting Based Tests<br />

– Suits individual product requirements<br />

– Easily sharable<br />

• Ability to debug in place<br />

– Interrogate / Trace failure conditions<br />

– Remote testing/debugging<br />

• Provides Data Collection & Correlation<br />

– Consistency across the industry<br />

– Underst<strong>and</strong>able Reports<br />

70,000.00<br />

60,000.00<br />

50,000.00<br />

40,000.00<br />

Rate (KB/s)<br />

30,000.00<br />

20,000.00<br />

10,000.00<br />

0.00<br />

33<br />

65<br />

97<br />

129<br />

161<br />

193<br />

225<br />

257<br />

Serial Number VNRD2AC4CGVRHS<br />

289<br />

321<br />

353<br />

385<br />

417<br />

449<br />

481<br />

513<br />

545<br />

577<br />

609<br />

641<br />

673<br />

Test Points<br />

705<br />

737<br />

769<br />

801<br />

833<br />

865<br />

897<br />

929<br />

961<br />

993<br />

<strong>Performance</strong>


Stop the questioning & finger pointing<br />

by st<strong>and</strong>ardizing<br />

The benefits of st<strong>and</strong>ardized, independent test systems<br />

– St<strong>and</strong>ard test hardware<br />

– Unbiased <strong>and</strong> fair<br />

– Repeatable test solutions<br />

– Common test scripts<br />

– Industry st<strong>and</strong>ard interfaces<br />

– Correlation between<br />

manufactures <strong>and</strong> EOM’s<br />

– Speeds failure analysis<br />

– Investment protection


St<strong>and</strong>ards <strong>and</strong> <strong>Performance</strong> Testing<br />

Storage Test Requirements<br />

• Seek, transfer, & throughput performance<br />

• Interface verification<br />

• Specification compliance<br />

• Head-disk interface integrity<br />

• Media scans<br />

• Voltage margins<br />

• Long term reliability<br />

• Environmental & Edge case


<strong>Performance</strong> Testing<br />

General <strong>Performance</strong> Testing<br />

– Seek & Transfer<br />

• Sequential<br />

• R<strong>and</strong>om<br />

• w/ & w/o compare<br />

• etc, etc…<br />

– Multiple streams<br />

– Variable data stream width/ block<br />

size, knee testing


<strong>Performance</strong> Testing<br />

HDD Specific <strong>Performance</strong> Testing<br />

– Radial <strong>Performance</strong><br />

– Seek mode performance<br />

SSD Specific<strong>Performance</strong><br />

– Fragmented Wear Leveling


<strong>Reliability</strong> Testing<br />

Design &<br />

Manufacturing<br />

Targeted test paths<br />

Field &<br />

<strong>Reliability</strong>


<strong>Reliability</strong> Testing<br />

HDD design verification / qualification<br />

( rotational media)<br />

Root Cause<br />

– Design/Components/DRAM<br />

– Component Failures / i.e.<br />

red phosphorous<br />

– Head/Media instability<br />

– Design margin<br />

Test Process<br />

⇒ Pattern reads/writes/verify<br />

⇒ Power cycling<br />

⇒ Extended test at temperature<br />

⇒ Voltage margining<br />

⇒ Temperature Cycling<br />

⇒ Voltage margining & 4 corner


<strong>Reliability</strong> Testing<br />

HDD variable field failure modes<br />

(variable factors in rotational media)<br />

Root Cause<br />

– Contamination<br />

– H<strong>and</strong>ling, head laps<br />

– Lube issues<br />

– Motor bearings<br />

– Growing defect lists<br />

Test Process<br />

⇒ Multiple full media R/W.<br />

⇒ Head/Surface defects<br />

⇒ W/R adjacent tracks<br />

⇒ Dwell at elevated temperature


<strong>Reliability</strong> Testing<br />

SSD design verification / qualification<br />

– Endurance<br />

Root Cause<br />

– <strong>Performance</strong>-mfg. variability<br />

– Bit failures / Data Retention<br />

– Component Failures / i.e.<br />

red phosphorous<br />

– Write splice<br />

– Metadata corruption<br />

– Write performance<br />

– Erase failures<br />

– Design Margin<br />

Test Process<br />

⇒ Multiple writes<br />

⇒ <strong>Performance</strong> verification<br />

⇒ Disturb testing / pattern writes<br />

⇒ Temperature Cycling<br />

⇒ Voltage margining & 4 corner<br />

⇒ Power cycling mid writes<br />

⇒ R<strong>and</strong>om I/O w/ power cycling<br />

⇒ Cold write<br />

⇒ Margined erase<br />

⇒ Four Corners


<strong>Reliability</strong> Testing<br />

SSD testing for variable failures<br />

Root Cause<br />

– Wear leveling performance<br />

– Data Retention<br />

– Reallocation errors<br />

Test Process<br />

⇒ Fragmentation tests<br />

⇒ Temperature & power cycling<br />

⇒ RW tests w/ power cycling<br />

⇒ Write splice, cold writes


Variable Failure Modes<br />

Post Manufacturing Failure Modes<br />

HDD<br />

• Contamination<br />

• H<strong>and</strong>ling<br />

• Head slaps<br />

• Lube Issues<br />

• Motor Bearings<br />

• Environmental<br />

strains<br />

ODD<br />

• Media Failures<br />

• Motor Issues<br />

• Mechanical<br />

• Optical pickup<br />

SSD<br />

• Endurance


AFR Predictions<br />

Predicting a New ERA<br />

• Historically, AFR cannot be correlated to manufacturing<br />

or line integration failure rates.<br />

• AFR will be more predictable in SSD, primarily due to the<br />

eliminating of mechanical failures.<br />

• St<strong>and</strong>ardized front end testing for SSD's will lead to more<br />

a more reliable predicted AFR benefiting storage<br />

integrators.


SSD vs. HDD<br />

What the Customer Expects<br />

(in a world of tests developed by key OEMs)<br />

• Complete functional equivalence <strong>and</strong> independence.<br />

• Interface testing<br />

• <strong>Reliability</strong> demonstration<br />

• <strong>Performance</strong> demonstrations<br />

• Endurance demonstration<br />

• Power on / spin-up / sleep / resume from sleep<br />

compliance.


Summary<br />

What’s the role of organizations like<br />

<strong>IDEMA</strong>?<br />

At a point where test st<strong>and</strong>ards can be developed for<br />

new solid state storage that are reflective of the<br />

technology.


Thank You<br />

Ed Dawson, Flexstar Technology

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