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Standard Operating Procedure (SOP) for Compliance Monitoring ...

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Application of the CEMS at Thermal Power Plants<br />

transport system incorporates additional mechanical components, which require maintenance. In<br />

addition, there can be loss of sample within the transport system. Finally, because of the additional<br />

components, the installation of extractive systems is generally more difficult and more expensive.<br />

<strong>Operating</strong> mode (continuous versus batch). A PM CEMS operates either in true continuous mode or<br />

in a continuous series of short-term batch cycles. Continuous operation is more straight<strong>for</strong>ward. A<br />

batch mode system includes a sample volume measuring system, which should be calibrated<br />

periodically, and it also has additional mechanical components, which require maintenance. Batch<br />

mode systems complicate correlation testing because the sampling at each traverse point should be<br />

timed to coincide with batch cycles.<br />

Extent of current use (extensive versus limited). Certain PM CEMS technologies are currently in<br />

much wider use than others. Widespread use is an indication of the acceptability of a technology <strong>for</strong><br />

PM monitoring applications.<br />

History of use (long versus short). Some technologies are emerging, whereas others have an<br />

established history of use <strong>for</strong> PM monitoring applications.<br />

Effects of changes in particle characteristics (more susceptible versus less susceptible). With the<br />

exception of harmonic oscillation systems, PM CEMS technologies rely on particle characteristics<br />

other than mass. Because some of these particle characteristics are more likely to change than others,<br />

certain types of instruments are more susceptible to drift or calibration shifts than are others.<br />

Specifically, optical instruments (i.e., those based on light scattering, light extinction, or optical<br />

scintillation) generally are sensitive to the particle characteristics that are more likely to change<br />

(particle size, density, composition) than are non-optical instruments (beta gauge, probe<br />

electrification, harmonic oscillation). Also, because probe electrification instruments utilise particle<br />

charge, the devices cannot be used downstream of an electrostatic precipitator (ESP).<br />

Potential interferences (more susceptible versus less susceptible). Some PM CEMS technologies are<br />

more susceptible to interferences. Specifically, other light sources can interfere with the operation of<br />

optical instruments, although optical instruments generally are designed to minimise the effects of<br />

external light sources. The presence of water droplets in a gas stream (e.g., immediately downstream<br />

of a wet scrubber) can also interfere with PM CEMS responses, particularly with optical instruments.<br />

This problem generally limits the applicability of optical systems to dry stacks (i.e., sources controlled<br />

with fabric filters, ESPs, or other dry control devices), unless the systems extract and heat the sample<br />

to eliminate excess moisture.<br />

A1-9

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