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P1149.7 - Board Test Workshop Home Page

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Key <strong>P1149.7</strong> Objectives<br />

Do more with less<br />

• Operate with fewer pins<br />

• Add instrumentation using the same pins<br />

• TAP power management<br />

• Provide framework for diverse debug technologies<br />

• Preserve gateway to debug of SI errors/defects<br />

Preserve industry investment<br />

•SI IP<br />

• Software IP<br />

• Debug and <strong>Test</strong> Tools<br />

Provide means for innovation/customization<br />

• Pin protocols other than those supporting scan<br />

• Mix and match legacy/new IP<br />

• Equal treatment for all industry IP<br />

GS - BTW - 09/014/2006

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