Trends from Ten Years of Soft Error Experimentation
Trends from Ten Years of Soft Error Experimentation
Trends from Ten Years of Soft Error Experimentation
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Trade<strong>of</strong>f Summary<br />
●<br />
System<br />
●<br />
Tester<br />
– Power, cooling<br />
– Only need one<br />
ethernet cable (typ)<br />
– Mix different systems<br />
– Support chips come in<br />
the way<br />
– Needs expert low<br />
level coding<br />
– Cannot be leveraged<br />
– More stable (only DUT<br />
in the beam)<br />
– Codes leveraged <strong>from</strong><br />
early silicon debug<br />
– Multiple external<br />
power supplies<br />
– Cooling hardware<br />
– Can't mix systems<br />
(depends on tester)<br />
March 24, 2009<br />
Sun Microsystems<br />
13
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