Trends from Ten Years of Soft Error Experimentation
Trends from Ten Years of Soft Error Experimentation
Trends from Ten Years of Soft Error Experimentation
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Design Scenarios : Parity<br />
~16 μm<br />
●<br />
Cell: 2.1μm x 0.7μm<br />
● Worst case pattern :<br />
~16μm<br />
●<br />
Design guideline<br />
example<br />
– Cells in same word<br />
should be at 9-word<br />
interleave<br />
March 24, 2009<br />
Sun Microsystems<br />
35